Method for producing piezoelectric element
11515470 · 2022-11-29
Assignee
Inventors
Cpc classification
H10N30/508
ELECTRICITY
International classification
Abstract
Provided is a method for producing a piezoelectric element in which a piezoelectric body substrate piece is subjected to polarization treatment and a piezoelectric element is produced. The method includes a first step in which the piezoelectric body substrate piece is held on a flat plate-shaped slightly adhesive sheet and a second step in which voltage is applied to the piezoelectric body substrate piece held on the slightly adhesive sheet and the piezoelectric body substrate piece is subjected to polarization treatment.
Claims
1. A piezoelectric element manufacturing method for manufacturing a piezoelectric element by applying a polarization treatment to an unpolarized piezoelectric substrate piece, the method comprising: a first step of applying the polarization treatment to a plurality of unpolarized piezoelectric pieces that are temporarily holding on a flat-plate-shaped slightly adhesive sheet, the flat-plate-shaped slightly adhesive sheet being bonded on a base material to form a tray; and a second step of simultaneously applying a voltage to the unpolarized piezoelectric substrate pieces held on the slightly adhesive sheet to apply the polarization treatment to the unpolarized piezoelectric substrate pieces, wherein the slightly adhesive sheet has a surface resistance equal to or greater than 10.sup.16 ohms, a Young's modulus of 5.0 to 10.0 MPa, and a heat conductivity equal to or greater than 0.05 W/mK.
2. The piezoelectric element manufacturing method according to claim 1, wherein the unpolarized piezoelectric substrate piece has a first terminal and a second terminal formed on one surface thereof, the first step holds, on the slightly adhesive sheet, another surface of the unpolarized piezoelectric substrate piece that is opposite to the one surface, and the second step applies the voltage between the first terminal and the second terminal of the unpolarized piezoelectric substrate piece.
3. The piezoelectric element manufacturing method according to claim 1, wherein the unpolarized piezoelectric substrate piece has a size having a length of 0.2 to 0.4 mm, a width of 0.8 to 1.2 mm, and a thickness of 0.05 to 0.2 mm.
4. The piezoelectric element manufacturing method according to claim 1, wherein, when the unpolarized piezoelectric substrate pieces are subjected to the polarization treatment, a strain of 1500 to 4000 ppm in a d31 direction occurs with an electric field of 2.0 to 4.0 kV/mm.
5. The piezoelectric element manufacturing method according to claim 1, wherein the base material is flat in at least a plane on which the slightly adhesive sheet is bonded, and the slightly adhesive sheet is bonded within the plane.
6. The piezoelectric element manufacturing method according to claim 1, wherein the slightly adhesive sheet holds the unpolarized piezoelectric substrate pieces and does not hinder a strain of the unpolarized piezoelectric substrate pieces that occurs when the voltage is applied.
7. The piezoelectric element manufacturing method according to claim 1, wherein the slightly adhesive sheet has a heat resistant temperature equal to or higher than 90° C. and a holding power equal to or less than 0.50 kgf/cm.sup.2.
Description
BRIEF DESCRIPTION OF DRAWINGS
(1)
(2)
(3)
(4)
(5)
(6)
DESCRIPTION OF EMBODIMENTS
(7) An embodiment of the piezoelectric element manufacturing method of the present invention will now be described referring to
(8) As shown in
(9) Then, in the piezoelectric element manufacturing method of this embodiment, as shown in step S1 of
(10) The piezoelectric substrate pieces 20 are obtained by cutting a large-sized piezoelectric substrate (not shown) into a plurality of pieces. As shown in
(11) As shown in
(12) Thus, in step S1, as shown in
(13) As shown in
(14) In the conventional polarization treatment processes, a mainstream approach is to first apply polarization treatment to a substrate, i.e., to a large-sized piezoelectric substrate, and then divide the substrate into individual pieces. However, applying polarization treatment to a large-sized substrate causes breakage and distortion. Accordingly, in this embodiment, the polarization treatment is applied to the pieces obtained by dividing the piezoelectric substrate, i.e., to the piezoelectric substrate pieces 20. When each piezoelectric substrate piece 20 undergoes the polarization treatment, a strain of 1500 to 4000 ppm occurs in d31 direction (a direction along the electrode surface) at an electric field of 2.0 to 4.0 kV/mm.
(15) It is hence preferred that the slightly adhesive sheet 30 has such a holding power as not to hinder the strain of the plurality of piezoelectric substrate pieces 20 that occurs during the polarization treatment in step S2. That is, the holding of the piezoelectric substrate pieces 20 by the slightly adhesive sheet 30 corresponds to physical adhesion (secondary bond, intermolecular bond), which is one of the adhesion principles.
(16) Preferably, the slightly adhesive sheet 30 has a surface resistance equal to or greater than 10.sup.16 ohms, a Young's modulus of 5.0 to 10.0 MPa, a heat conductivity equal to or greater than 0.05 W/mK, a holding power equal to or less than 0.50 kgf/cm.sup.2, and a heat resistant temperature equal to or higher than 90° C. The holding power of the slightly adhesive sheet 30 is preferably 0.10 kgf/cm.sup.2 or higher.
EXAMPLES
First Example
(17) A first example examined a preferable relationship between the heat resistant temperature and holding power of the slightly adhesive sheet 30 constituting the tray 34.
(18) Specifically, samples 1 to 9 (slightly adhesive sheets 30) were prepared and bonded respectively on base materials 32 to make nine trays 34 corresponding to the samples 1 to 9. Then, material, heat resistant temperature (° C.), holding power (kgf/cm.sup.2), and polarizability of the samples were examined. Material of the base material 32 was aluminum.
(19) [Samples 1 to 9]
(20) The samples 1 to 9 all had a thickness “ta” (see
(21) <Measurement Methods>
(22) (Heat Resistant Temperature)
(23) Heat resistant temperatures (° C.) of the samples 1 to 9 were measured as shown below.
(24) [Measurement Device]
(25) Handy-Type Thermometer
(26) [Measurement Method]
(27) Trays corresponding to the samples 1 to 9 (slightly adhesive sheets 30) were set on a hot plate and the temperature was measured by putting the probe of the thermometer in direct contact at a center of the samples 1 to 9. The current supplied to the hot plate was controlled such that the measurement temperature varies at intervals of 10 (° C.). Then, the upper limit temperature (measurement temperature) at which no bubbles occur at the boundary between the sample 1 to 9 and the base material was obtained as the heat resistant temperature.
(28) (Holding Power)
(29) Holding powers (kgf/cm.sup.2) of the samples 1 to 9 were measured as shown below.
(30) [Measurement Device]
(31) Force Gauge
(32) [Measurement Method]
(33) Nine trays were prepared where the samples 1 to 9 (slightly adhesive sheets 30) were respectively bonded on the upper surfaces of nine base materials. A cylindrical probe made of steel and having a 1-cm.sup.3 contact surface (with a circular outer circumference and rough surface) was pressed against the sample 1 to 9 of each tray (slightly adhesive sheet 30) for 15 seconds at a load of 100 gf. Subsequently, the probe was drawn up at a constant speed of 0.2 mm/s, and the maximum load indicated by the force gauge when the probe separates apart from the sample 1 to 9 (slightly adhesive sheet 30) was obtained as the holding power of the sample 1 to 9.
(34) (Polarizability)
(35) Polarizability was obtained by placing piezoelectric elements directly on the samples 1 to 9 and performing polarization treatment actually. That is, for each of the samples 1 to 9, the operation described above was performed 100 times and the average was obtained as the polarizability of each of the samples 1 to 9.
(36) [Polarization Device]
(37) LCR Meter
(38) [Measurement Method]
(39) Polarization treatment was actually applied to the piezoelectric elements and polarizability was calculated on the basis of capacitance value before polarization and capacitance value after polarization.
Polarizability=post-polarization capacitance value/pre-polarization capacitance value
<Evaluation>
(40) Samples that exhibited polarizability larger than 1.00 were evaluated to be suitable for polarization treatment and were regarded as acceptance. That is, as the results of evaluation, samples with polarizability larger than 1.00 were evaluated as “O” and samples with polarizability of 1.00 or less were evaluated as “x”. Table 1 of
(41) The results of evaluation show that preferred slightly adhesive sheets 30 have heat resistant temperatures equal to or higher than 90° C. and holding powers equal to or less than 0.50 kgf/cm.sup.2.
Second Example
(42) A second example examined the yield and retry rate of an example and a comparative example.
(43) In the example, the slightly adhesive sheet 30 of the sample 1 was used as the tray 34 having no partitions as shown in
(44) The comparative example used the tray 102 (see
(45) [Evaluation]
(46) In the example and comparative example, the ratio of the number of normally polarized piezoelectric substrate pieces to the 100 piezoelectric substrate pieces, i.e., (the number of normal pieces/100)×100(%) was calculated as the yield. As a result, the example showed a ratio of 80% and the comparative example 60%.
(47) Further, the retry rate of polarization treatment was examined for the example and the comparative example. The comparative example showed 200 retries per 1000 test pieces, resulting in a retry rate of 0.2. In contrast, the example showed 30 retries per 1000 test pieces, resulting in a low retry rate of 0.03. A tray 34 having no partitions as shown in
(48) “Retry” in the example and comparative example means that polarization treatment is conducted again when the property value measured by bringing the probe into contact with the piezoelectric element was not correct. “Retry rate” means the rate of the number of retries to the number of test pieces, i.e., the number of retries/the number of test pieces.
(49) The results above showed that fixing the piezoelectric substrate pieces 20 on the slightly adhesive sheet 30 offers improved yield and decreased retry rate and thus enables more efficient manufacture of piezoelectric elements 10, as compared to the case where the piezoelectric substrate pieces 100 are held only with the frame of the tray 102, using the tray 102 without the slightly adhesive sheet 30 as shown in
(50) The piezoelectric element manufacturing method according to the present invention is not limited to the above-described embodiments and various configurations are of course possible without departing from the essence and gist of the present invention.