ANALYSIS APPARATUS, ANALYSIS METHOD AND ANALYSIS PROGRAM

Abstract

An analysis apparatus, an analysis method, and an analysis program by which even unskilled ones can perform quantitative analysis of a composition of high-performance cement with high precision. An analysis apparatus 100 for performing quantitative analysis of components of cement, includes: a content percentage conversion unit 120 for converting content percentages of major elements of a cement sample to content ratios of main crystal phases composing the cement sample by predetermined formulae, the content percentages being obtained as an elemental analysis result; a scale factor estimation unit 140 for estimating initial values of scale factors of Rietveld analysis from the content ratios of main crystal phases obtained in the conversion; and a Rietveld analysis unit 150 for performing Rietveld analysis with respect to an X-ray diffraction measurement result of the cement sample using the initial values of scale factors previously been estimated to calculate content percentages of respective phases of the cement sample.

Claims

1. An analysis apparatus for performing quantitative analysis of components of cement, comprising: a content percentage conversion unit for converting content percentages of major elements of a cement sample to content ratios of main crystal phases composing the cement sample by predetermined formulae, the content percentages being obtained as an elemental analysis result; a scale factor estimation unit for estimating initial values of scale factors of Rietveld analysis from the content ratios of main crystal phases obtained in the conversion; and a Rietveld analysis unit for performing Rietveld analysis with respect to an X-ray diffraction measurement result of the cement sample using the initial values of scale factors having been estimated to calculate content percentages of respective phases of the cement sample.

2. The analysis apparatus according to claim 1, wherein the main crystal phases are four phases of C3S, C2S, C3A and C4AF.

3. The analysis apparatus according to claim 1, wherein the Rietveld analysis unit for practicing Rietveld analysis with keeping at least crystal structure parameters constant.

4. The analysis apparatus according to claim 1, wherein the predetermined formula is a Bogue formula or a deformed formula based on the Bogue formula.

5. The analysis apparatus according to claim 1, wherein the elemental analysis result is a result obtained by X-ray fluorescence analysis of the cement sample.

6. The analysis apparatus according to claim 1, wherein the scale factor estimation unit for specifying an initial value of the scale factor with respect to each of phases previously identified on the basis of the content ratios of main crystal phases obtained by the conversion.

7. An analysis method for performing quantitative analysis of components of cement, comprising the steps of: converting content percentages of major elements in a cement sample to content ratios of main crystal phases composing the cement sample by predetermined formulae, the content percentages being obtained as an elemental analysis result; estimating initial values of scale factors of Rietveld analysis from the content ratios of main crystal phases obtained by the conversion; and performing Rietveld analysis with respect to an X-ray diffraction measurement result of the cement sample using the estimated initial values of scale factors to calculate content percentages of respective phases of the cement sample.

8. A non-transitory computer readable recording medium having recorded thereon an analysis program for performing quantitative analysis of components of cement, the analysis program comprising: processing of converting content percentages of major elements in a cement sample to content ratios of main crystal phases composing the cement sample by predetermined formulae, the content percentages being obtained as an elemental analysis result; processing of estimating initial values of scale factors of Rietveld analysis from the content ratios of main crystal phases obtained by the conversion; and processing of performing Rietveld analysis with respect to an X-ray diffraction measurement result of the cement sample using the estimated initial values of scale factors to calculate content percentages of respective phases of the cement sample.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0019] FIG. 1 illustrates a schematic view showing the analysis apparatus of the present invention;

[0020] FIG. 2 illustrates a block diagram showing a functional configuration of the analysis apparatus of the present invention;

[0021] FIG. 3 illustrates a flow chart showing operations of the analysis apparatus of the present invention;

[0022] FIG. 4 illustrates a view showing a profile fitting example in the Rietveld analysis; and

[0023] FIG. 5 illustrates a table showing analysis results.

DESCRIPTION

[0024] Next, embodiments are explained with reference to the drawings. To make the explanation be understood easily, the same reference number is given to the same constituent component in respective drawings, and explanations overlapping with each other are omitted.

Configuration of Analysis Apparatus

[0025] FIG. 1 illustrates a schematic view showing an analysis apparatus 100. The analysis apparatus 100 is, for example, a PC on which an analysis program has been installed, to calculate content percentages of respective components of a cement sample. By performing feedback from the obtained respective components of the cement sample and adjusting an input amount of a raw material, exact quality control of a cement product may be performed.

[0026] The analysis apparatus 100 analyzes a cement sample by combining a formula derived on the basis of a theory such as the Bogue formula with the Rietveld analysis. That is, analysis values of respective crystal phases obtained according to formulae are converted to scale factors for use in the Rietveld analysis, while relative values thereof are kept, and these are used as initial values of the analysis. As the result, the scale factor obtained according to the formula is the same irrespective of who the analyst is, and, even when a person not having sufficient knowledge performs the Rietveld analysis, highly quantitative precision can be actualized with respect to cement components.

[0027] FIG. 2 illustrates a block diagram showing the functional configuration of the analysis apparatus 100. The analysis apparatus 100 includes a storage unit 110, a content percentage conversion unit 120, a crystal phase identification unit 130, a scale factor estimation unit 140, and a Rietveld analysis unit 150.

[0028] The storage unit 110 stores an elemental analysis result and an X-ray diffraction measurement result of a cement sample, having been taken in. The elemental analysis result means content percentages of major elements in the cement sample, which is preferably obtained by X-ray fluorescence analysis. Hereby, the elemental analysis result can be obtained easily and rapidly in a broad range without being influenced by a chemical state. The X-ray diffraction measurement result means a diffraction intensity profile by respective crystal phases.

[0029] The content percentage conversion unit 120 converts content percentages of major elements in the cement sample to content ratios of main crystal phases composing the cement sample by prescribed formulae. The prescribed formula is preferably the Bogue formula or Taylor formula that is a deformed formula of the Bogue formula. Hereby, content ratios of respective phases of the cement can be analyzed stably with high precision. Note that, details of the formula are described later.

[0030] As the main crystal phases, selection of C.sub.3S (Alite), C.sub.2S (Belite), C.sub.3A (Aluminate) and C.sub.4AF (Ferrite) is preferable, which are major four phases of mineral species. Hereby, content percentages of main components of a cement product can be determined efficiently, which makes it possible to perform exact quality control in accordance with a type of cement.

[0031] The crystal phase identification unit 130 identifies crystal phases contained in the cement sample from the X-ray diffraction measurement result. As the result, for example, the above-described major four components and other minor components can be identified.

[0032] The scale factor estimation unit 140 estimates an initial value of a scale factor of the Rietveld analysis from each of the content ratios of the main crystal phases having been obtained by the conversion. Hereby, quantitative analysis of components of various types of high-performance cement, which has been difficult according to the Bogue formula alone, can be performed with high precision. Moreover, stable and highly precise analysis can be performed with respect to the Rietveld analysis that depends on the initial value, without generating different results due to degrees of skill of persons. Users do not have to perform trial and error for setting the initial value, and a workload is reduced.

[0033] The scale factor estimation unit 140 preferably estimates the initial value of scale factor with respect to the previously identified crystal phase on the basis of the content ratios of the main crystal phases having been obtained by conversion, while keeping content ratios of main crystal phases. Hereby, appropriate setting of the initial value of scale factor becomes easy, which makes highly precise and efficient calculation of content percentages capable. Details of mathematical formulae and processing for use in the estimation are described later.

[0034] The Rietveld analysis unit 150 performs the Rietveld analysis with respect to the X-ray diffraction measurement result of the cement sample, using the estimated initial value of scale factor. The Rietveld analysis unit 150 preferably practices the Rietveld analysis, with fixing crystal structure parameters (atomic coordinate, site occupancy rate, atomic displacement parameter). By assuming the crystal structure to be constant in this way, the Rietveld analysis can be performed efficiently. Details of the Rietveld analysis are described later.

Operations of Analysis Apparatus

[0035] Next, operations of the analysis apparatus 100 configured as described above are explained. FIG. 3 illustrates a flow chart showing operation of the analysis apparatus 100. First, the analysis apparatus 100 takes in and stores the elemental analysis result (Step S1). The elemental analysis result is obtained as content percentages of elements of the cement sample, which can be obtained by X-ray fluorescence analysis. The elemental analysis result is obtained, for example, as a CSV file, which is easily utilized as data. On the other hand, the analysis apparatus 100 takes in and stores an X-ray diffraction measurement result (Step S2). The X-ray diffraction measurement result is, for example, a diffraction intensity profile obtained from a powder sample.

[0036] Next, the diffraction intensity profile is read, and, from peak positions thereof, crystal phases of the cement sample are identified (Step S3). Subsequently, the elemental analysis result is read (Step S4), to which predetermined formulae are applied to convert content percentages of major elements in the cement sample to content ratios of major crystal phases (Step S5).

[0037] For example, quantitative values of respective crystal phases can be calculated, following the Bogue formulae below. Each of the formulae represents the composition with compounds represented by respective chemical formulae of major crystal phases.

C.sub.3S=4.07CaO(7.60SiO.sub.2+6.72Al.sub.2O.sub.3+1.43Fe.sub.2O.sub.3+2.85SO.sub.3)

C.sub.2S=2.87SiO.sub.20.754C.sub.3S

C.sub.3A=2.65Al.sub.2O.sub.31.69Fe.sub.2O.sub.3

C.sub.4AF=3.04Fe.sub.2O.sub.3

[0038] In place of the Bogue formulae, Taylor formulae (deformed Bogue formulae) shown below can also be used.

C.sub.3S=4.641200CaO8.838681SiO.sub.27.094597Al.sub.2O.sub.31.554488Fe.sub.2O.sub.3

C.sub.2S=3.724144CaO+10.29531SiO.sub.2+5.343733Al.sub.2O.sub.3+1.065700Fe.sub.2O.sub.3

C.sub.3A=0.117872CaO0.369269SiO.sub.2+3.669829Al.sub.2O.sub.33.955085Fe.sub.2O.sub.3

C.sub.4AF=0.023283CaO0.055816SiO.sub.20.867256Al.sub.2O.sub.3+5.621492Fe.sub.2O.sub.3

[0039] From content ratios of main crystal phases obtained by the conversion in this way, initial values of scale factors of the Rietveld analysis are estimated (Step S6). For example, a scale factor s can be determined using the following formula.

W.sub.i=s.sub.iZ.sub.iM.sub.iV.sub.i/s.sub.nZ.sub.nM.sub.nV.sub.n

[0040] W: a mass fraction of a crystal phase

[0041] s: a scale factor

[0042] Z: the number of molecules within a unit cell

[0043] M: molecular weight

[0044] V: the volume of a unit cell

[0045] i: an i-th crystal phase

[0046] Note that, even in a case where structure information is not known, a content percentage of a crystal phase can be determined when an RIR value is given. The RIR value is an abbreviation of a Reference Intensity Ratio, and is an intensity ratio when a sample to be tested and aluminum oxide are mixed in the equivalent amount. By using the RIR value, content percentages of respective crystal phases in cement may be calculated even when a crystal structure is unidentified.

[0047] Subsequently, the Rietveld analysis is performed with respect to the X-ray diffraction measurement result of the cement sample using the estimated initial value of the scale factor, to calculate quantitative values (Step S7). For example, a calculation profile of a following formula can be fitted for the measurement profile.

y.sub.i.sup.cal=A(2.sub.i)s.sub.nP.sub.n,hI.sub.n,h.sub.n(2.sub.i2.sub.hT(2.sub.i))+y.sub.b(2.sub.i)

[0048] s.sub.n: a scale factor

[0049] 2.sub.h: a Bragg angle

[0050] A(2.sub.i): intensity correction of absorption, irradiation area

[0051] P.sub.n,h: orientation correction

[0052] I.sub.n,h: integrated intensity

[0053] .sub.n: profile function

[0054] T(2.sub.i): angle correction

[0055] y.sub.b(2.sub.i): background function

[0056] n: sum with respect to respective crystal phases

[0057] h: sum with respect to Miller index

[0058] FIG. 4 illustrates a view showing a profile fitting example in the Rietveld analysis. In the example shown in FIG. 4, the NIST2688 standard sample is set as an analysis object. In the example shown in FIG. 4, Rwp, which is the most general R factor in the Rietveld analysis, is 3.88%. Rwp shows weighted degree of concordance including background. On one hand, S is 2.05. When a statistically expected ideal limit value of Rwp is represented by Re, S is defined by Rwp/Re, and, when S=1, it means that refinement is perfect. In the profile fitting in the Rietveld analysis, fitting up to this degree is performed.

[0059] As described above, by applying the scale factor having been estimated using a predetermined formula to the Rietveld analysis of cement, a sufficiently converged analysis result can be obtained without estimation of the initial value of the scale factor by a user. Further, with respect to a component having a small content percentage, too, an analysis result having high precision can be obtained, irrespective of who is the user.

[0060] Above described operations are performed by executing a program on the analysis apparatus 100. Specifically, a formula for use in cement analysis may be incorporated in X-ray diffraction software, content ratios of respective crystal phases in a cement sample may be determined from an elemental analysis result having been read according to the formula, and the content ratios may be converted to scale factors of the Rietveld analysis, which may be used as initial values of the Rietveld analysis.

EXAMPLES

[0061] Using the above-described analysis apparatus 100, actually a cement sample of Portland cement was analyzed. For a same cement sample, X-ray fluorescence analysis and X-ray diffraction measurement were performed. Then, with respect to an obtained elemental analysis result and X-ray diffraction measurement result, each of following (1)-(4), that is, (1) Rietveld analysis using an initial value obtained from the Bogue formula, (2) Rietveld analysis on the basis of an initial value set by software, (3) Rietveld analysis on the basis of an initial value set by a user, and (4) analysis by the Bogue formula alone, was performed to determine corresponding content percentages of crystal phases.

[0062] FIG. 5 illustrates a table showing analysis results. An obtained analysis result nearer to the standard value represents higher precision of the analysis. As shown in FIG. 5, in the analysis in the above-described (1), quantitative precision of ordinary 2% or less for respective crystal phases is accomplished with respect to any component. In contrast, analysis results in (2)-(4), at least one component deviates largely from the standard value. As described above, it has been proved that results with sufficient precision are obtained in the analysis method of the present invention.