Methods for operating electrostatic trap mass analyzers

Abstract

A method of operating an electrostatic trapping mass analyzer, comprising: introducing a sample of ions into a trapping region of the mass analyzer, wherein a trapping field within the trapping region is such that the ions exhibit radial motion with respect to a central longitudinal axis of the trapping region while undergoing harmonic motion in a dimension defined by the central longitudinal axis, the frequency of harmonic motion of a particular ion being a function of its mass-to-charge ratio; superimposing a modulation field onto the trapping field within the trapping region, the modulation field acting to either increase or reduce the harmonic motion energies of the ions by an amount varying according to the frequency of harmonic motion; and acquiring a mass spectrum of the ions in the trapping region by measuring a signal representative of an image current induced by the harmonic motion of the ions.

Claims

1. A method of operating an electrostatic trapping mass analyzer, comprising: introducing a sample of ions from a population of ions into a trapping region of the mass analyzer, wherein an established trapping field within the trapping region is such that ions of the introduced sample of ions are caused to exhibit radial motion with respect to a central longitudinal axis of the trapping region while undergoing harmonic motion in a dimension z defined by the central longitudinal axis of the trapping region, the frequency of harmonic motion of a particular ion being a function of its mass-to-charge ratio; superimposing a multi-frequency periodic modulation field onto the trapping field within the trapping region, wherein the multi-frequency periodic modulation field comprises a plurality of frequencies, each frequency associated with a respective amplitude, wherein the multi-frequency periodic modulation field acts to either increase or reduce the harmonic motion energies of the ions by an amount varying according to the frequency of harmonic motion, and wherein either the frequencies are randomly chosen from a frequency range or the amplitudes are randomly chosen; and acquiring a mass spectrum of the ions in the trapping region by measuring a signal representative of an image current induced by the harmonic motion of the ions.

2. A method as recited in claim 1, wherein the introducing of the sample of ions into the trapping region comprises introducing the sample of ions into a trapping region of a Cassinian trap mass analyzer.

3. A method as recited in claim 2, wherein the trapping region comprises: an outer electrode having an inner surface; and two spindle-shaped inner electrodes having respective spindle axes and respective spindle outer surfaces, wherein the spindle axes are parallel to and equidistant from the longitudinal axis, wherein the outer electrode inner surface and the spindle electrode outer surfaces are disposed and shaped such that a trapping potential corresponding to the trapping field is of the form $U\left(x,y,z\right)=U_0+U_C\mathrm{In}\left[\frac{{\left(x^2+y^2\right)}^2-2b^2\left(x^2-y^2\right)+b^4}{a^4}\right]-\frac{k}{2}\left(x^2+y^2\right)+{\mathrm{kz}}^2$ where x, y and z are Cartesian axes, z is the longitudinal axis, the x-y plane is a plane of mirror symmetry of the trapping region, and U.sub.0, U.sub.c, a, b and k are constants.

4. A method as recited in claim 3, wherein the superimposing of the multi-frequency periodic modulation field onto the trapping field is performed by: applying a periodic voltage waveform between both spindle-shaped inner electrodes and the outer electrode, wherein there is no potential difference between the spindle-shaped inner electrodes.

5. A method as recited in claim 3, wherein the outer electrode comprises two separated outer electrode segments and the superimposing of the multi-frequency periodic modulation field onto the trapping field is performed by: applying a periodic voltage waveform between both spindle-shaped inner electrodes and a one of the outer electrode segments, wherein there is no potential difference between the spindle-shaped inner electrodes.

6. A method as recited in claim 3, wherein the outer electrode comprises two separated electrode segments and the superimposing of the multi-frequency periodic modulation field onto the trapping field is performed by applying a periodic voltage waveform between the separated outer electrode segments.

7. A method as recited in claim 1, wherein the introducing of the sample of ions into the trapping region comprises introducing the ions into a trapping region defined by: an inner spindle electrode having an outer surface that is axially symmetric about the longitudinal axis and that is symmetric about a central equatorial plane that is perpendicular to the longitudinal axis; and a pair of outer electrodes disposed at either side of the equatorial plane and having respective inner surfaces, wherein the outer surface of the inner spindle electrode and the inner surfaces of the outer electrodes are shaped such that a trapping potential corresponding to the trapping field is a quadro-logarithmic potential that is established by application of an electrostatic voltage difference between the inner spindle electrode and the outer electrodes.

8. A method as recited in claim 7, wherein the superimposing of the multi-frequency periodic modulation field onto the trapping field is performed by: applying a periodic voltage waveform across the pair of outer electrodes or between the inner spindle electrode and one of the outer electrodes.

9. A method as recited in claim 7, wherein the superimposing of the multi-frequency periodic modulation field onto the trapping field is performed by: applying a periodic voltage waveform between the inner spindle electrode and both of the outer electrodes, wherein there is no potential difference between the outer electrodes.

10. A method as recited in claim 1, wherein the introducing of the sample of ions into the trapping region comprises introducing the ions into a trapping region defined by: an inner spindle electrode having an outer surface that is axially symmetric about the longitudinal axis and that is symmetric about a central equatorial plane that is perpendicular to the longitudinal axis; and a pair of outer electrodes disposed at either side of the equatorial plane and having respective inner surfaces, wherein the outer surface of the inner spindle electrode and the inner surfaces of the outer electrodes are shaped such that a trapping potential corresponding to the trapping field is a quadro-logarithmic potential that is established by application of an electrostatic voltage difference between the inner spindle electrode and the outer electrodes.

11. A method as recited in claim 10, wherein the superimposing of the multi-frequency periodic modulation field onto the trapping field is performed by: applying a multi-frequency periodic voltage waveform across the pair of outer electrodes, between the inner spindle electrode and one of the outer electrodes or between the inner spindle electrode and both of the outer electrodes.

12. A method as recited in claim 1, wherein the superimposing of the multi-frequency periodic modulation field onto the trapping field is such that a spectral resolution of the mass spectrum is improved as compared to a mass spectrum of the sample of ions obtained using the mass analyzer in the absence of the superimposing of the modulation field onto the trapping field within the trapping region.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) The above noted and various other aspects of the present invention will become apparent from the following description which is given by way of example only and with reference to the accompanying drawings, not drawn to scale, in which:

(2) FIG. 1A is a schematic depiction of a portion of a mass spectrometer system including an electrostatic trap mass analyzer, specifically an ORBITRAP electrostatic trap mass analyzer;

(3) FIG. 1B is an enlarged cross sectional view of the electrostatic trap mass analyzer of FIG. 1A;

(4) FIG. 2A is a depiction of an ideal transient for just a few oscillations of a single frequency component, relating to ions of a particular mass-to-charge (m/z) ratio, as may be measured during operation of the electrostatic trap mass analyzer of FIG. 1A;

(5) FIG. 2B is a depiction of a transient for just a few oscillations of a limited number of frequency components, relating to respective different m/z ratios, as may be measured during operation of the electrostatic trap mass analyzer of FIG. 1A;

(6) FIG. 3A is a schematic depiction of a range of axial oscillation of ions of various m/z ratios within a conventionally-operated electrostatic trap mass analyzer of the type depicted in FIG. 1A and FIG. 1B;

(7) FIG. 3B is a schematic depiction of the ranges of axial oscillation of ions of two respective different m/z ratios within an electrostatic trap mass analyzer of the type depicted in FIG. 1A and FIG. 1B operated in accordance with the present teachings;

(8) FIG. 4A is a flow diagram of a first method of operation of an electrostatic trap mass analyzer in in accordance with the present teachings;

(9) FIG. 4B is a flow diagram of a second method of operation of an electrostatic trap mass analyzer in in accordance with the present teachings;

(10) FIG. 5A is a schematic illustration of a first configuration of electrical connections of a supplemental waveform generator to an electrostatic trap, in accordance with some embodiments of the present teachings;

(11) FIG. 5B is a schematic illustration of a second configuration of electrical connections of a supplemental waveform generator to an electrostatic trap, in accordance with some embodiments of the present teachings; and

(12) FIG. 5C is a schematic illustration of a second configuration of electrical connections of a supplemental waveform generator to an electrostatic trap, in accordance with some embodiments of the present teachings.

DETAILED DESCRIPTION

(13) The following description is presented to enable any person skilled in the art to make and use the invention, and is provided in the context of a particular application and its requirements. Various modifications to the described embodiments will be readily apparent to those skilled in the art and the generic principles herein may be applied to other embodiments. Thus, the present invention is not intended to be limited to the embodiments and examples shown but is to be accorded the widest possible scope in accordance with the features and principles shown and described. The particular features and advantages of the invention will become more apparent with reference to the appended figures taken in conjunction with the following description.

(14) During operation of the mass analyzer 4 shown in FIGS. 1A and 1B, ion injection is presently performed using a fixed ion injection schema, whereby the entry point of ions into the trap is at an ion injection aperture 5 that is offset from the equatorial plane 7 of the trap. With such a configuration, the z-displacement of the injection aperture determines the z-axis oscillation amplitude of all ions which enter and maintain stable orbits. The axial motion of all trapped m/z species thus possess similar z-axis oscillation amplitudes, whereby space charge and ion-ion interactions are non-ideal and contribute negatively to performance aspects such as dynamic range, isotope peak ratio, and peak coalescence. In FIG. 3A, the post-injection z-axis ion oscillation range for essentially all ions (of essentially all m/z ratios) is illustrated by cylinder 36 (note that the cylindrical representation is schematic onlythe zone of occupation of ions of any m/z ratio is more complex than that of a cylindrical surface). The inventors have realized that this conventional mode of operation leads to inefficient use of available trap volume and consequent inhomogeneous space charge density within the electrostatic trap.

(15) Early literature (e.g., U.S. Pat. No. 5,886, 346 and Makarov, Electrostatic Axially Harmonic Orbital Trapping: A High-Performance Technique of Mass Analysis, Anal. Chem., 72(6), 2000, pp. 1156-1162) pertaining to ORBITRAP mass analyzers having a configuration as schematically illustrated in FIGS. 1A and 1B described so-called Mass-Selective Instability (MSI) modes of operation. According to a first MSI mode, termed Parametric Resonance, a supplemental RF sinusoidal voltage is applied between the inner electrode 6 and the outer electrodes 8a, 8b. In this mode of operation, the equations describing z-axis ion motion within the trap are the well-known Mathieu equations. In an alternative MSI mode, termed Resonant Excitation, a supplemental sinusoidal voltage is applied to one of the two outer electrode halves 8a, 8b at the resonant axial frequency of a particular mass whose axial motion is to be excited. In similarity to the parametric resonance MSI method, such resonantly excited ions are ejected axially.

(16) In U.S. Pat. No. 6,872,938 in the names of inventors Makarov et al., said patent hereby incorporated by reference herein, the concepts of parametric resonance and resonance excitation were extended to include ion excitation without ejection as well as de-excitation. According to the teachings of U.S. Pat. No. 6,872,938, fragment ions generated by the process of metastable dissociation (MSD) may be analyzed in an electrostatic trap mass analyzer using de-excitation followed by subsequent excitation. The energetic precursor ions from which the fragments are produced are activated prior to injection into the electrostatic trap and subsequently allowed to dissociate within the electrostatic trap. Prior to the dissociation, the axial motion of the precursor ions is selectively de-excited by application of a supplemental sinusoidal voltage waveform at an appropriate frequency, such as double the frequency of the undamped axial oscillations of the precursor ions. Typically, the supplemental waveform comprises a radio-frequency (RF) waveform. The application of the supplemental sinusoidal voltage decreases the amplitude of axial oscillation of selected ions so that only selected precursor ions are brought onto and restricted to the equatorial plane 7 of the ion trap. The precursor ions are left in this state long enough to allow metastable decay to occur. The z-axis oscillations of the remaining precursor ions as well as of any fragment ions generated by MSD are then excited by application of a broadband supplemental waveform.

(17) The aforementioned techniques of parametric resonance and resonance excitation were described for the purposes of mass spectral scanning by resonant ejection or detection of fragment ions produced by dissociation within an electrostatic trap. Because mass spectral scanning and ion fragmentation are readily performed with other apparatuses, these techniques of parametric resonance and resonance excitation have not been extensively employed in the operation of electrostatic trap mass analyzers. However, the present inventors have realized that the Resonant Excitation and De-Excitation techniques may be employed to advantage so as to at least partially separate the ion occupation regions of ions of differing m/z ratios, thereby reducing localized buildup of charge density within the trap. The reduction of ion density is especially effective at the z-axis oscillation extrema, because these z-axis oscillation extrema are caused to be dispersed along the z-axis according to m/z. Accordingly, the available trap volume is utilized more efficiently through the re-distribution of ion density.

(18) In view of the above observations, FIG. 4A is a flow diagram of a method 40 for operating an electrostatic trap mass analyzer within a mass spectrometer system in accordance with the present teachings. If the form of a supplemental excitation (or de-excitation) voltage waveform may be simply calculated or is already known, as from a prior experiment, then execution of the method 40 may begin at Step 44b, at which the voltage waveform may be calculated or the predetermined or previously stored information relating to the voltage waveform may be retrieved. Otherwise, execution of the method 40 may begin at Step 41. If predetermined or previously stored information is retrieved at Step 44b, such information may have been derived by a prior execution of the method 40 in which the prior sample of ions is a set of calibrant ions. If a supplemental voltage excitation waveform is calculated at Step 44b, the waveform may, in some cases, be calculated as a multi-frequency voltage waveform of which the frequencies or amplitudes (or both) of the various periodic components are chosen as appropriate from a selected range of frequencies and a selected range of amplitudes, respectively. For example, the selected range of frequencies (from which frequencies are chosen for inclusion in the supplemental multi-frequency waveform) may correspond to a range of m/z ratios to be detected in a particular experiment.

(19) In step 41 of the method 40, a first packet of ions is supplied to the electrostatic trap mass analyzer through an aperture (e.g., aperture 5) that is displaced from the equatorial plane of the trap. The ions may be produced by any known ionization technique, such as by thermospray ionization, electrospray ionization, electron ionization, chemical ionization, matrix-assisted laser desorption ionization, photo-induced ionization, etc. The ionization may be performed by an ion source component of the mass spectrometer system. Prior to injection, a population of ions may be accumulated within an accumulation ion trap component of the mass spectrometer system. At least some of the accumulated ions are then provided to the electrostatic trap as a packet that is tightly bunched spatially and temporally through application of a voltage pulse that releases the accumulated ions as the packet. The ion injection into the electrostatic trap is performed through an ion injection aperture that is offset from an equatorial symmetry plane of the electrostatic trap such that ion oscillation within the electrostatic trap begins immediately upon injection (that is, according to the so-called excitation by injection technique).

(20) In the subsequent step 42 of the method 40 (FIG. 4A), the ions of the ion packet of various m/z ratios are allowed to oscillate within the electrostatic ion trap and an image current that tracks the combined ion oscillations of all ion species is measured by detection electrodes and recorded as a transient signal in known fashion. In Step 43, a preliminary mass spectrum is calculated from the measured and recorded transient signal using the enhanced Fourier Transform (eFT) method as taught in U.S. Pat. No. 8,853,620 or, alternatively, any equivalent mathematical method. According to the eFT method, a Fourier transform is first calculated in a conventional way (such as by a Fast-Fourier transform) so as to generate real and imaginary complex spectral components in the frequency domain. Subsequently a frequency spectrum (or a mass spectrum, through a simple transformation of variables) is calculated as a combination of a so-called positive spectrum (which, in many cases, may be any of a Power spectrum, a Magnitude spectrum or estimates thereof) together with an absorption spectrum, which is the real component of the complex spectrum after application of an appropriate phase correction that causes the corrected phase to be zero at a peak center. The derived frequency spectrum (or the mass spectrum) generally comprises a plurality of peaks, where the location of each such peak in the frequency domain provides information about a frequency of oscillation, within the electrostatic trap, of an ion species of a respective m/z ratio. The determined phase corrections provide information about the relative phase offsets between the oscillations of the various ion species (corresponding to respective peaks in the frequency spectrum) and by inference the functional dependence of phase with frequency (and thus m/z).

(21) In the subsequent Step 44a, of the method 40 (FIG. 4A), the phase and frequency information derived in the prior step 43 is used to calculate the frequencies of a supplemental or auxiliary periodic voltage waveform to be applied to the electrodes of the electrostatic trap (for instance, in a later Step 48). The supplemental or auxiliary voltage waveform may consist of a set of superimposed (multiplexed) component periodic waveforms, each component waveform comprising a respective periodic waveform of a frequency that corresponds to the frequency of oscillation (generally, a frequency of a z-axis oscillation as described above) of an ion species of a respective m/z ratio. Each waveform component frequency is related to the oscillation frequency of the ion species to which it corresponds. The waveform component frequency and the ion species oscillation frequency may be identical; however, in some instances the waveform component frequency may be an integral multiple or very close to an integral multiple of the ion species oscillation frequency such as, for example, twice the ion oscillation frequency. The phase of each waveform component may be such that when applied the periodic oscillations of the voltage waveform component add to the ion motion primarily in phase with the oscillations of the corresponding ion species; however, some other pre-determined phase relationship between the ion oscillation and the waveform component may be employed. The waveform component phases may be determined from the phase information generated in step 43. The amplitude of each waveform component corresponds to a degree of excitation or de-excitation to be applied to the oscillations of the corresponding ion species. According to some embodiments, an excitation waveform may not be periodic and may, instead comprise a simple impulse, since an impulse may be considered to comprise a continuous range of component frequencies that may excite oscillations of ions comprising a plurality of m/z values. In such instances, the step 44a may be skipped.

(22) If it is not possible or difficult to multiplex the various waveform components as described above, then each waveform component may be applied within its own respective time segment. The waveform components would then be applied sequentially instead of in a superimposed fashion. In this alternative type of operation, each waveform component is applied to the electrodes at a certain respective segment application time. Each such segment application time is determined such that the phase of the applied periodic waveform component is related to the phase of the oscillations of the corresponding ion species. In general, each segment application time is such that the applied waveform component of the segment is in phase with the oscillations of the corresponding ion species; however, some other pre-determined phase relationship between the ion oscillation and the waveform component may be employed. In this alternative mode of operation, the waveform segment application times may be determined from the phase information generated in step 43.

(23) If (Step 45) a particular execution of the method 40 pertains to a calibration experiment, possibly using a sample including calibrant compounds, then the supplemental voltage waveform information generated in Step 43 may be saved for use in later analyses (Step 52) and the method may terminate at Step 53. Otherwise, execution may proceed to Step 46 at which a new packet of ions from the same general ion population as the first ion packet is injected into the electrostatic trap. The time of the injection is set as time zero (t=0, denoted t.sub.0) for determination of phase offsets to be applied during subsequent provision of a supplemental or auxiliary voltage waveform to the trap electrodes in a later Step 48. This second injection is performed in the same manner as the first injection (step 41).

(24) In optional Step 47 of the method 40 (FIG. 4A), a supplemental or auxiliary broadband de-excitation voltage waveform is applied to the electrodes of the electrostatic trap mass analyzer in order to fully de-excite the z-axis oscillations of all ions to a known starting state in which the ions are temporarily confined to the equatorial plane. This step is then followed by subsequent excitation of z-axis oscillations to a desired oscillation amplitude profile (in Step 48) using the calculated supplemental excitation voltage waveform (Step 44a) or the pre-determined supplemental excitation voltage waveform (Step 44b) or, alternatively, a simple impulse function. The desired oscillation amplitude profile is one which reduces overall charge density within the trap so as to improve trap performance and the quality of mass spectra obtained from the trap. Each component of the voltage waveform serves to either excite the z-axis oscillations of the ion species that are close in frequency to a higher amplitude or, alternatively, de-excite the z-axis oscillations of only the ion species that are close in frequency to a lower amplitude. Such de-excitation only applies if the prior optional broadband de-excitation step (Step 47) has not been executed. The closer in frequency a component of the voltage waveform is to that of any particular m/z the stronger the coupling effect to the motion of that m/z. However all applied waveform frequency components couple to the motion of all ions to greater or lesser extent.

(25) The application of excitation waveforms for excitation of an ion species to a higher average kinetic energy level expands the z-axis oscillation range of the ion species and may also increase or decrease the average radius of orbits around the spindle electrode. Conversely, the application of excitation waveforms to effect de-excitation reduces the z-axis oscillation range of the ion species and may also decrease or increase the average orbital radius for that ion species. Further, application of such excitation and de-excitation waveforms may also increase or decrease the spread in orbital radii around the average orbital radius for that species. Excitation may be achieved by applying the voltage waveform component so as to be of the same frequency as and in phase quadrature with the oscillations of the corresponding ion species; de-excitation may be achieved by applying the voltage waveform component with some other phase or frequency relationship relative to the ion species oscillations, such as out of phase, in phase quadrature with or at twice the ion oscillation frequency.

(26) Now referring to FIG. 3B, there is shown a schematic depiction of the ranges of axial oscillation of ions of two respective different m/z ratios within an electrostatic trap mass analyzer of the type illustrated in FIG. 1A and FIG. 1B and operated in accordance with the present teachings. In FIG. 3B only the extrema are represented in terms of the highest m/z (represented as cylinder 38) and lowest m/z (represented as cylinder 34) observed in the broad band spectrum. Spreading of the z-amplitude maxima as a function of m/z is found to decrease localized buildup of space charge density within the trap volume, especially at the z-axis oscillation extrema which would otherwise be nearly coincident for all ions. The dispersal of the oscillation amplitudes provided by the application of the supplemental waveform improves the quality of the resulting spectra.

(27) The supplemental or auxiliary field may be applied to the electrodes in a variety of ways, as illustrated in FIGS. 5A, 5B and 5C. In each of FIGS. 5A-5C, element 11 is a voltage waveform source that may include various electronic and electrical components such as a digital waveform generator, a power supply, an amplifier, etc. Other electrical components, such as the power supply and controller that maintains and controls the DC voltage difference between inner and outer electrodes, the components that measure image current, etc. are not illustrated in FIGS. 5A-5C. It should also be noted that, in each of these figures, each of electrodes 8a and 8b is cylindrically symmetrical in three dimensions and, thus, each such electrode is formed of a single piece (i.e., not two pieces). In FIG. 5A, the supplemental or auxiliary voltage is supplied across the two outer electrodes 8a, 8b, a configuration which is expected to primarily resonantly excite axial (z-axis) oscillations as previously noted. In FIG. 5B, the supplemental or auxiliary voltage is applied between the inner spindle electrode 6 and the pair of outer electrodes 8a, 8b, a configuration which is also expected to resonantly excite axial oscillations as well as to radially disperse ions according to m/z. In FIG. 5C, the supplemental or auxiliary voltage is applied between the inner spindle electrode 6 and just one of the outer electrodes, either electrode 8a or electrode 8b.

(28) Returning to the discussion of the method 40 of FIG. 4A, Step 49 is another transient signal measurement and recording step, similar to the preceding Step 42 except that, in the Step 49, the measurement is made of ion oscillations that correspond to a more favorable dispersal of the ions throughout the trapping volume, as provided by the application of the supplemental or auxiliary waveform in step 49. Subsequently, a final mass spectrum is calculated in Step 51, using any suitable transformation or calculation technique but, preferably, using the enhanced Fourier Transform technique noted above. The mass spectrum calculated in Step 51 may regarded as a refined mass spectrum, relative to the preliminary mass spectrum calculated in Step 43. Steps 46 through 51 may be repeated, using respective packets of ions, as may be required. Amplitudes of the reported m/z peaks in the calculated spectra m/z may be adjusted according (generally inversely) to their corresponding z-axis oscillation amplitude so that that different m/z peaks produced by the same amount of ion net charge have the same or nearly the same amplitudes.

(29) FIG. 4B is a flow diagram of a second method, method 60, for operating an electrostatic trap in accordance with the present teachings. The method 60 (FIG. 4B) applies to injection of ions on the equatorial plane 7 of an electrostatic trap 4 (see FIG. 1B) as opposed to the previously described method 40 (FIG. 4A) which applies to ion injection through an aperture (e.g., aperture 5) that is displaced from the equatorial plane. In Step 61, a pre-determined supplemental excitation waveform is retrieved. According to some embodiments, the excitation waveform may be periodic and may comprise a set of periodic components of respective frequencies. According to some other embodiments, an excitation waveform may not be periodic and may, instead comprise a simple impulse, since an impulse may be considered to comprise a continuous range of component frequencies that may excite oscillations of ions comprising a plurality of m/z values. In such latter instances, the step 61 may be skipped. In Step 62, the application of any prior supplemental waveform is suspended. In Step 63, a packet of ions is introduced into the electrostatic trap on the equatorial plane of the trap. Because the equatorial plane effectively defines the bottom of the harmonic potential well with regard to z-axis oscillations, all injected ions take up temporary residence in orbits about the spindle electrode 6 within the equatorial plane. Next, in Step 64, a supplemental excitation waveform is applied, as described previously, such that the various ions develop oscillatory motion along the z-axis with different z-axis oscillation extrema as a function of their respective frequencies and m/z ratios. In Step 65, a transient signal is measured and in Step 66, a mass spectrum is calculated, using the transient information in known fashion. Steps 62-66 may then be repeated as many times as necessary in order to repeat mass spectral analysis of a given sample composition or to perform mass spectral analyses of differing sample compositions.

(30) In the above, the present invention has been described with reference to an ORBITRAP mass analyzer which is schematically illustrated in FIGS. 1A-1B. The present invention is also applicable to operation of other forms of electrostatic trap mass analyzer within which ions undergo mathematically orthogonal components of oscillatory motion and wherein the frequency of oscillation of at least one such component is independent of the other oscillation components. For example, the present invention is also applicable to operation of Higher-Order Kingdon traps, as described above, which include Cassinian electrostatic ion trap mass analyzers.

(31) Generally stated, a Cassinian electrostatic ion trap comprises an outer electrode with an ion-repelling electric potential and at least two inner electrodes with ion-attracting potentials, where the outer electrode and the inner electrodes are shaped and arranged in such a way that a harmonic electric potential is formed in one spatial direction and, perpendicular to this spatial direction, an electric potential is formed in which ions move on stable, radial trajectories. For example, a known Cassinian electrostatic ion trap, as described in U.S. Pat. No. 7,994,473, comprises an outer electrode maintained at a first electrical potential and two spindle-shaped inner electrodes both maintained at a same second electrical potential. Together, the outer electrode and inner spindle electrodes generate an electric potential, U, between the electrodes that takes the form of Eq. 4:

(32) $\begin{array}{cc}U\left(x,y,z\right)=U_0+U_C\ln \left[\frac{{\left(x^2+y^2\right)}^2-2b^2\left(x^2-y^2\right)+b^4}{a^4}\right]-\frac{k}{2}\left(x^2+y^2\right)+{\mathrm{kz}}^2& \mathrm{Eq}.4\end{array}$
where, x, y and z are Cartesian coordinates, U.sub.0 is an offset of the potential that is proportional to the voltage between the outer electrode and the inner electrodes, U.sub.C is a scaling factor, and where a, b and k are parameters (constants). The outer electrode and the two spindle-shaped inner electrodes are shaped and arranged such that the inner surface of the outer electrode and the surfaces of the spindle-shaped inner electrodes each correspond to equipotential surfaces of the above electric potential. Accordingly, each spindle electrode is shaped with a diameter that is greatest at its central region and that tapers towards each end. The parameters a and b are related to the radial geometry of the electrode system. The parameter b, which is non-zero, corresponds to the distance between the axis of each spindle and the central z-axis. The parameter k determines the harmonic motion of the ions along the z-axis and is also proportional to the voltage between the outer electrode and the inner electrodes. Specifically, The parameter k, the ion mass m, and the charge z of the ion determine the oscillation frequency of the harmonic oscillation along the z-direction:

(33) $\begin{array}{cc}=\sqrt{\frac{2k}{m/z}}& \mathrm{Eq}.5\end{array}$

(34) As noted in the aforementioned U.S. Pat. No. 7,994,473, one way to obtain mass-dependent data from such a Cassinian electrostatic ion trap is to measure the oscillation frequency of ions along the z-direction. Each ion package oscillating inside the Cassinian electrostatic ion trap induces a periodic signal in an ion detector, which is electronically amplified and measured as a function of time. The ion detector comprises detection elements, such as detection coils, in which ion packages induce voltages as they fly through, or detection electrodes, for example segments of the outer electrode or inner electrodes, in which ion packages induce image charges as they fly past. Thus, in analogy to data acquisition procedures employed during operation of an ORBITRAP orbital trapping electrostatic trap, a Fourier transformation (or other mathematical transformation) can be used to transform a measured time signal of z-axis oscillations into a frequency spectrum, which can be converted into a mass spectrum via the known mass dependence of the z-axis oscillation frequency.

(35) The aforementioned U.S. Pat. No. 7,994,473 teaches that ions may be preferably introduced into a Cassinian electrostatic ion trap of the type described above by introduction of the ions into the plane of symmetry (the medial y-z plane) between the two inner electrodes. Upon introduction, such ions begin oscillations parallel to at least the y-axis. Further, if the ions are introduced into the medial y-z plane at a z-axis coordinate that is not at the minimum of the z-axis harmonic potential, they will also immediately start to oscillate along the z-axis. If, however, the ions may are quasi-continuously introduced directly at the potential minimum of the harmonic potential, the ions move with only small amplitudes along the z-axis according to their initial energy in z-direction. After the ions are introduced and stored in the potential minimum in this fashion, they are excited to harmonic oscillations, for example by using a high frequency electric dipole field along the z-axis.

(36) In an ORBITRAP electrostatic orbital trapping mass analyzer, ions undergo complex motions that may be represented as the superimposition of radial oscillations as well as z-axis axial oscillations upon an orbital motion around a central spindle electrode whose long dimension defines the z-axis. When ions are injected into the medial y-z plane of a Cassinian electrostatic ion trap mass analyzer having an outer electrode and two inner spindle electrodes whose long axes are parallel to the z-axis as described above, the ions undergo complex motions that may be described as a superimposition of radial oscillations within the x-y plane (but confined close to the y-z plane) upon z-axis axial oscillations. The U.S. Pat. No. 7,994,473 also teaches tangential ion injection in which the x-y motion takes the form of an orbit or orbits around the spindle electrodes. The same patent also teaches a more complex apparatus having a set of four spindle electrodes around which ions may orbit in a cloverleaf pattern.

(37) In both the ORBITRAP electrostatic orbital trapping mass analyzer and the Cassinian electrostatic ion trap mass analyzer, the z-axis oscillations are mathematically separable from other oscillations and may be mathematically treated as simple harmonic oscillation parallel to the z-axis, wherein an apparent minimum in the z-axis harmonic potential occurs at a central plane of symmetry of the apparatus. In operation of either apparatus, this apparent simple harmonic motion parallel to the z-axis is used to advantage in order to obtain m/z-dependent data which may be used for the purpose of mass analysis. In operation of either the ORBITRAP electrostatic orbital trapping mass analyzer or the Cassinian electrostatic ion trap mass analyzer, ion injection may be effected either at or away from the apparent z-axis potential minimum (generally corresponding to a medial plane of symmetry of the apparatus). If ion injection occurs away from the minimum, z-axis oscillations begin immediately. If ion injection occurs near the minimum, z-axis motion is initially either mostly or completely suppressed but may be subsequently excited by application of a supplemental excitation voltage or voltage waveform. During operation of either type of electrostatic trap, ion density is greater at the extrema of the z-axis oscillations (the so-called turn-around points, which are separated by about 20 millimeters in the two-spindle trap as noted in U.S. Pat. No. 7,994,473) than at the z-axis potential minimum.

(38) Present orbital trapping electrostatic traps and mass analyzers employing such traps (such as ORBITRAP mass analyzers) are extensions of and improvements to earlier Kingdon traps. As a result of the above-noted similarities between the operation of ORBITRAP mass analyzers and Cassinian trap mass analyzers, the various known Cassinian traps and their derivatives may be referred to as Higher Order Kingdon traps. Moreover, because of these operational similarities, the herein-taught novel operational methods programming of the z-axis oscillation amplitudes through the superimposition of a supplemental modulation field (or fields) onto the main trapping field is applicable to either class of mass analyzer. The U.S. Pat. No. 7,994,473 teaches that the application of supplemental fields may be provided for by providing either the outer electrode or the inner electrode (or both) in the form of a plurality segments which are shaped, arranged and supplied with voltages such that the appropriate electric potential is generated, instead of providing the inner and outer electrodes as respective integral pieces. Accordingly, the supplemental electrical connections illustrated in FIGS. 5A-5C, although strictly applicable to operation of an ORBITRAP mass analyzer, may be modified, as necessary and as would be obvious to one of ordinary skill in the art, in order to provide the required supplemental voltages to a mass analyzer employing a Higher-Order Kingdon trap. For example, whereas only a single spindle electrode is illustrated in each of FIGS. 5A-5C, the multiple spindles of a Higher-Order Kingdon trap would preferably be electrically connected in common. As another example, although U.S. Pat. No. 7,994,473 only specifically illustrates the outer electrode of a Cassinian trap as a single integral piece, one of ordinary skill in the art may readily envisage that the outer electrode may be split into two halves, similar to the way that the outer electrodes are illustrated in FIGS. 5A-5C, such that a supplemental voltage waveform may be applied across the two halves at the same time that a common trapping voltage is being applied in common to the two halves.

(39) The discussion included in this application is intended to serve as a basic description. Although the invention has been described in accordance with the various embodiments shown and described, one of ordinary skill in the art will readily recognize that there could be variations to the embodiments and those variations would be within the spirit and scope of the present invention. The reader should be aware that the specific discussion may not explicitly describe all embodiments possible; many alternatives are implicit. Accordingly, many modifications may be made by one of ordinary skill in the art without departing from the scope and essence of the invention. Neither the description nor the terminology is intended to limit the scope of the invention. Any patents, patent applications, patent application publications or other literature mentioned herein are hereby incorporated by reference herein in their respective entirety as if fully set forth herein.