DEVICE AND METHOD FOR DETECTING PHOTONS AND CHARGED PARTICLES AND USE OF SAME

Abstract

The invention relates to a solution for determining events related to photons and charged particles useful in therapies that use methodologies related to hadron therapy. In one aspect of the invention, it relates to a device having a sandwich-type structure of photon-detecting panels (1) and charged particle-detecting panels (2), which can be suitably associated with respective sensors. Also included is a method for detecting photons and charged particles that uses the aforementioned device. Lastly, a specific use of the object of the invention in hadron therapy is described.

Claims

1. A device for detecting photons and charged particles, characterised in that it comprises: a first photon-detecting panel (11), which causes a Compton scattering of incident radiation with charged particles, such that the wavelength thereof increases, losing part of their energy, generating a signal, a central charged particle-detecting panel (22), following the first photon-detecting panel (11) on a side opposite that of the incident radiation and that identifies charged particles generated in the first photon-detecting panel (11), generating a signal, and a second photon-detecting panel (12), following the central charged particle-detecting panel (22), on a side opposite that of the first photon-detecting panel (11), wherein scattered photons and/or charged particles generated in the first photon-detecting panel (11) interact, generating a signal.

2. The device for detecting photons and charged particles of claim 1, further comprising a frontal charged particle-detecting panel (21) located between the incident radiation and the first photon-detecting panel (11), which identifies charged particles from the incident radiation or the environment, generating a signal.

3. The device for detecting photons and charged particles of claim 2, further comprising a rear charged particle detector (23) that detects charged particles generated by the interaction of photons in the second photon-detecting panel (12).

4. The device for detecting photons and charged particles of claim 3, further comprising a second central charged particle-detecting panel (22).

5. The device for detecting photons and charged particles of claim 1, further comprising a third photon-detecting panel (13) positioned after the second photon-detecting panel (12), and a rear charged particle-detecting panel (23) positioned between the second photon-detecting panel (12) and the third photon-detecting panel (13).

6. The device for detecting photons and charged particles of claim 5, further comprising a frontal particle-detecting panel (21) positioned between the source of radiation and the first photon-detecting panel (11).

7. The device for detecting photons and charged particles of claim 5, further comprising a rear charged particle-detecting panel (26) positioned after the third photon-detecting panel (13).

8. The device for detecting photons and charged particles of claim 5, further comprising a front particle-detecting panel (21) positioned between the source of radiation and the first photon-detecting panel (11), and a rear charged particle-detecting panel (26) positioned after the third photon-detecting panel (13).

9. The device for detecting photons and charged particles of claim 4, further comprising a second frontal charged particle-detecting panel (21), a second rear charged particle-detecting panel (23), a third photon-detecting panel (13) following the rear particle-detecting panels (23), and two rear charged particle-detecting panels (26), following the third photon-detecting panel (13).

10. The device for detecting photons and charged particles of claim 2, further comprising pairs of lateral charged particle detectors (24), a first pair being positioned perpendicularly to each side of the first photon detector (11) and a second pair being positioned perpendicularly to each side of the second photon detector (12).

11. The device for detecting photons and charged particles of claim 2, further comprising pairs of aligned charged particle detectors (25), the aligned charged particle detectors (15) of each pair positioned aligned one next to the other, one of the pairs being positioned between the first photon detector (11) and the central charged particle detector (22), and a second pair positioned following the second photon detector (12).

12. The device for detecting photons and charged particles, according to any of the preceding claims, further comprising a first signal detector associated with each photon detector (11, 12, 13) and a second signal detector associated with each charged particle-detecting panel (21, 22, 23, 24, 25, 26).

13. The device for detecting photons and charged particles, according to any of the preceding claims, wherein the photon-detecting panels (11, 12, 13) are detectors based on a scintillator material selected from LaBr3, CeBr3, GAGG or a semiconductor detector selected from CdTe and CZT.

14. A method for detecting photons and charged particles that makes use of the device described in any of the preceding claims, characterised in that it comprises the steps of: determining a signal level in at least one of the charged particle-detecting panels (21, 22, 23, 24, 25, 26) by means of signal detector, and defining as a negative event when the signal level determined in the preceding step is different from 0.

15. A use of the device described in any one of claims 1 to 13 for monitoring radiation doses in hadron therapy.

16. A use of the device described in any one of claims 1 to 13 for image reconstruction.

Description

DESCRIPTION OF THE DRAWINGS

[0031] To complement the description that is being made and for the purpose of helping to better understand the features of the invention according to a preferred practical exemplary embodiment thereof, a set of drawings is attached as an integral part of said description in which the following is depicted in an illustrative and non-limiting manner:

[0032] FIGS. 1A and 1B show a schematic view of a first embodiment of the device object of the invention.

[0033] FIG. 2 shows a schematic view of a second embodiment of the device object of the invention.

[0034] FIG. 3 shows a schematic view of a third embodiment of the device object of the invention.

[0035] FIG. 4 shows a schematic view of a fourth embodiment of the device object of the invention.

[0036] FIG. 5 shows a schematic view of a fifth embodiment of the device object of the invention.

[0037] FIG. 6 shows a schematic view of a sixth embodiment of the device object of the invention.

[0038] FIG. 7 shows two graphs showing the recorded coincidence values as a function of the thickness of each Si detector of the charged particle detector, for incident 3 MeV (left) and 6 MeV (right) photons.

[0039] FIG. 8 shows two graphs showing the percentage of noise events that the charged particle detector is capable of detecting for incident 3 MeV (left) and 6 MeV (right) photons.

[0040] FIG. 9 shows two graphs showing the percentages of primary photons (from the beam) that interact in the silicon for 3 MeV and 6 MeV on the left and right, respectively.

[0041] FIG. 10 shows an example of noise reduction in a 2D image of a simulated Bragg peak.

PREFERRED EMBODIMENT OF THE INVENTION

[0042] In a first preferred embodiment of the device corresponding to a first aspect of the invention, which can be seen in FIG. 1A, there is a device for detecting photons and charged particles, which has a sandwich-type structure, on which a source of radiation impinges, wherein there is, firstly, a first photon-detecting panel (11) that causes a Compton scattering of the incident photons, so that the wavelength thereof increases, losing part of their energy before passing towards a following panel.

[0043] After the first photon-detecting panel (11), on a side opposite that of the source of radiation, a central charged particle-detecting panel (22) is located, which detects charged particles generated by the interaction of photons in the first photon-detecting panel (11), generating a signal, giving the option both to reject and to take into account this information to reconstruct an event, contributing to more precisely determining the energy deposited in the first photon-detecting panel (11) and whether the event is valid or invalid. This improves the results of the device.

[0044] Finally, in this first embodiment, the device comprises a second photon-detecting panel (12), following the central charged particle-detecting panel (22), on a side opposite that of the incident source of radiation, wherein the photons scattered in the first photon-detecting panel interact. The central charged particle-detecting panel (22) also makes it possible to distinguish whether the particles impinging on the second photon-detecting panel (12) are photons or charged particles.

[0045] Additionally, in a second embodiment, and as shown in FIG. 1B, the device may comprise a frontal charged particle-detecting panel (21), preferably made of a material comprising Silicon, and located between the incident source of radiation and the first photon-detecting panel (11), which detects charged particles, both from the incident radiation and from the environment, generating a signal when charged particles pass through said frontal detecting panel (21).

[0046] In a possible third embodiment of the invention, such as the one shown replicated in FIG. 2, the device comprises, in addition to the two photon-detecting panels (11, 12) with scintillator crystals (in this case made of LaBr3, but it can be made of LaBr3, CeBr3, or a CdTe or CZT semiconductor detector), and the frontal charged particle detector (21) and central charged particle detector (22), made up of silicon detectors, a rear charged particle-detecting panel (23), which detects charged particles of the incident radiation that pass through the second photon-detecting panel (12), generating a signal.

[0047] In an exemplary embodiment carried out by means of simulation, a 3/6 MeV photon or electron beam is made to impinge and the events that give rise to signals in both photon-detecting panels (11, 12) coinciding in time are recorded, and it is studied whether the Silicon charged particle detectors (21, 22) fulfil their function of helping to distinguish charged particles from photons, i.e., valid events from background noise.

[0048] In a fourth embodiment of the invention shown in FIG. 3, the device further comprises a second central charged particle-detecting panel (22).

[0049] In a fifth embodiment of the invention, the device further comprises a third photon-detecting panel (13). Between the three photon-detecting panels (11, 12, 13), a central charged particle-detecting panel (22) and a rear charged particle-detecting panel (23) can be arranged between the second and third photon-detecting panels (22, 23). In addition, a frontal charged particle-detecting panel (21) can be located between the source of radiation and the first photon-detecting panel (11) and/or a rear charged particle-detecting panel (26) can be located after the third photon-detecting panel (13).

[0050] Alternatively, in this fifth embodiment, as shown in FIG. 4, between the source of radiation and the first photon-detecting panel (11), two frontal charged particle-detecting panels (21) and two central charged particle-detecting panels (22) can be located between the first photon detector (11) and the second photon-detecting panel (12). After the latter, two rear charged particle-detecting panels (23) are positioned.

[0051] In a sixth alternative embodiment of the invention, shown in FIG. 5, in addition to the elements of the first embodiment described in FIG. 1B, the device comprises two pairs of lateral charged particle detectors (24). Each of the lateral charged particle detectors (24) of each pair is positioned on either side of either the first photon detector (11) or the second photon detector (12), perpendicular thereto. In this way, they are able to detect charged particles of the incident radiation that pass through the photon-detecting panels (11, 12) and that deviate from a perpendicular trajectory thereto.

[0052] In a seventh embodiment of the invention, reflected in FIG. 6, which comprises all the elements of the first embodiment shown in FIG. 1B, the device additionally comprises two pairs of aligned charged particle detectors (25), the detectors of each pair are positioned one next to the other, and each of the pairs of aligned charged particle detectors (25) are located following the first photon detector (11) and the second photon detector (12). In this way, these detectors are able to detect the charged particles that pass through the photon-detecting panels (11, 12) that deviate from the perpendicular trajectory thereto.

[0053] Additionally, and in all the embodiments described above, the device may comprise a first signal detector associated with each photon detector (11, 12, 13) and a second signal detector associated with each charged particle-detecting panel (21, 22, 23, 24, 25, 26).

[0054] Two possible cases for implementing the method object of a second aspect of the invention are provided in this document: a first case wherein charged particles reach the device, and a second case wherein gamma radiation impinges on the scintillator crystal of the first photon-detecting panel (11) and the secondary particles generated cause the event to be invalid.

[0055] To simulate the first case, a beam of gamma rays or 3 MeV electrons is made to impinge on the device of FIG. 3, which comprises four charged particle-detecting panels (21, 22, 23) between which each of the photon-detecting panels (11, 12) are respectively arranged, on the surface of the frontal charged particle-detecting panel (21), on the left in FIG. 3.

[0056] In this case, the photon detectors (11, 12) are made of LaBr3, measure 32×35 mm2 and are 10 mm thick, separated from each other by 30 mm. The events that give rise to signals in both photon detectors (11, 12) coinciding in time are recorded and it is studied whether the charged particle detectors (21, 22, 23) fulfil their function of helping to distinguish valid events from background noise.

[0057] When analysing the results, it is observed that 0.715% of the events produce interaction in the two photon-detecting panels (11, 12) in coincidence and therefore are recorded by the device as potentially valid events. However, these events would correspond to noise, since the interaction is not due to photons. Out of them, almost all of the events (0.714%) produce a signal in the frontal charged particle-detecting panel (21), which is located in front of the first photon-detecting panel (11) on the side of incidence of the radiation of the charged particle-detecting panel (11), so they are easily rejected.

[0058] In order to illustrate the efficiency of the device in different situations, in the second case various simulations were carried out, with 3 MeV or 6 MeV photon beams that impinge on the device and varying the thickness of the photon detectors (11, 12) between 50 microns and 1000 microns.

[0059] The percentage of events detected in three cases is studied:

[0060] In a first case, referred to in the graphs of FIG. 7, of a total of simulated events (1 million for each thickness of the charged particle-detecting panels (21, 22, 23)), depending on the thickness of the charged particle-detecting panels (21, 22, 23) for incident 3 MeV and 6 MeV photons corresponding to the graph on the left and right, respectively. The recorded values are suitable for two photon-detecting panels (11, 12) in coincidence with the dimensions and geometry studied, and include both good events and bad or noisy events.

[0061] In a second case, referred to in the graphs of FIG. 8 for incident 3 MeV and 6 MeV radiation photons, in the graph on the left and right, respectively, among the events recorded as coincidences in each case, percentage of noise events that the frontal charged particle-detecting panel (21) is able to detect. These noise events would degrade the response of the first photon detector (21), but due to the frontal charged particle-detecting panel (21) they can be detected and removed from the analysis.

[0062] In a third case, referred to in the graphs of FIG. 9, among the events recorded as coincidences in each case, percentage of primary photons (from the incident radiation beam) that interact in the frontal charged particle-detecting panel (21) (for 3 MeV and 6 MeV on the left and right, respectively). These events are unwanted noise events that are generated by including the frontal charged particle-detecting panel (21) in the device.

[0063] The object of the invention is able to detect, by means of the frontal charged particle-detecting panel (21), a significant percentage of noise events that would degrade its response (virtually all of the incident charged particles and 20-30% of the recorded coincidences), and can be removed. Noise events generated by introducing the frontal charged particle-detecting panel (21), which in turn can degrade the performance of the device, are kept at low levels. Therefore, performance is improved compared to the devices that incorporate only photon-detecting panels.

[0064] FIG. 10 shows the noise reduction in an image of a simulated Bragg peak. In the image on the left, all events are included. In the image on the right, the events with interaction in Silicon have been removed. As can be seen in FIG. 10, due to the use of the present invention, there is a significant noise reduction in the image.

[0065] The images in FIG. 10 have been obtained with a device based on an embodiment like the one in FIG. 3, wherein there is a first photon-detecting panel (11) between two charged particle-detecting panels (21, 22), and a second photon-detecting panel (12) between two other charged particle-detecting panels (22, 23).