METHOD OF REMOVING ARSENIC FROM A LIQUID
20190016609 ยท 2019-01-17
Inventors
- Muataz A. Hussien (Doha, QA)
- Ahmed Mohammed Fard (Doha, QA)
- Tarik Rhadfi (Doha, QA)
- Hugues Preud'Homme (Lons, FR)
- Marwan K. Khraisheh (Lexington, KY, US)
- Nidal Hilal (Swansea, GB)
Cpc classification
B01J20/0274
PERFORMING OPERATIONS; TRANSPORTING
B01J20/0259
PERFORMING OPERATIONS; TRANSPORTING
B01J20/3085
PERFORMING OPERATIONS; TRANSPORTING
International classification
Abstract
A method for removing arsenic from a liquid includes adding a two-dimensional metal carbide adsorbent to the liquid to adsorb the arsenic from the liquid. The two-dimensional metal carbide adsorbent can include at least one MXene, having the formula M.sub.n+1X.sub.n, where n=1, 2 or 3, where M is an early transition metal, such as scandium (Sc), titanium (Ti), vanadium (V), chromium (Cr), yttrium (Y), zirconium (Zr), niobium (Nb), molybdenum (Mo) or the like, and X is either carbon or nitrogen. The MXene may be Ti.sub.3C.sub.2.
Claims
1. A method of removing arsenic from a liquid, comprising the steps of: providing an MXene, having the formula M.sub.n+1X.sub.n, where n is an integer ranging between 1 and 3 inclusive, M is an early transition metal, and X is selected from the group consisting of carbon and nitrogen; and adding the MXene to a liquid, the MXene adsorbing arsenic from the liquid.
2. The method of removing arsenic from a liquid as recited in claim 1, wherein the MXene comprises Ti.sub.3C.sub.2.
3. The method of removing arsenic from a liquid as recited in claim 2, wherein the step of providing the MXene comprises room temperature exfoliation of Titanium (III) Aluminum Carbide (II) (Ti.sub.3AlC.sub.3) using hydrofluoric (HF) acid.
4. The method of removing arsenic from a liquid as recited in claim 1, wherein the liquid comprises water.
5. The method removing arsenic from a liquid as recited in claim 1, wherein the liquid comprises a solution including lead (Pb) and chromium (Cr (VI)).
6. A method of removing arsenic from a liquid, comprising the steps of: performing room temperature exfoliation of Titanium (III) Aluminum Carbide (II) (Ti.sub.3AlC.sub.3) using hydrofluoric (HF) acid to produce Ti.sub.3C.sub.2; and adding the Ti.sub.3C.sub.2 to a liquid including arsenic, the Ti.sub.3C.sub.2 adsorbing the arsenic from the liquid.
7. The method of removing arsenic from a liquid as recited in claim 6, wherein the liquid comprises water.
8. The method of removing arsenic from a liquid as recited in claim 6, wherein the liquid comprises a solution including lead (Pb) and chromium (Cr (VI)).
9. The method of removing arsenic from a liquid as recited in claim 6, wherein a pH value of the Ti.sub.3C.sub.2 ranges from about 3.5 to about 3.7.
10. The method of removing arsenic from a liquid as recited in claim 6, wherein a pH value of the Ti.sub.3C.sub.2 is 5.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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[0027] Similar reference characters denote corresponding features consistently throughout the attached drawings.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0028] The method for removing arsenic from a liquid includes using an adsorbent including a two-dimensional nano material to adsorb arsenic from the liquid. The liquid can be water and arsenic can be present in the water as an oxo-anion in two dominant forms, namely arsenite (As (III)) and arsenate (As (V)). The two-dimensional nano material can include at least one compound from a group of layered ternary carbides and nitrides, known as MAX phases. MAX phases have the general formula M.sub.n+1AX.sub.n where n=1, 2 or 3, where M is an early transition metal, such as scandium (Sc), titanium (Ti), vanadium (V), chromium (Cr), yttrium (Y), zirconium (Zr), niobium (Nb), molybdenum (Mo) or the like, A is an A-group element, such as aluminum (Al), silicon (Si), Indium (In), tin (Sn) or the like, and X is either carbon or nitrogen. Of the MAX phases, MXene, having the formula M.sub.n+1X.sub.n, is a preferred adsorbent of arsenic. MXenes are produced by selectively etching out the A element from a MAX phase.
[0029] MXenes have good structural and chemical stabilities, a large specific surface area, reducibility, good dispensability, hydrophilic surfaces, reversible adsorption properties, outstanding electrical conductivities, and are environmentally friendly. Of the MXene's, Titanium (III) Carbide (II) (Ti.sub.3C.sub.2) is a preferred two-dimensional metal carbide adsorbent. As described in detail below, Ti.sub.3C.sub.2 nanosheets can be prepared by an intercalation and exfoliation process. The Ti.sub.3C.sub.2 include nanosheets with few layers. The present inventors have found that when Ti.sub.3C.sub.2 is added to contaminated water, arsenic can be removed therefrom. The removal capacity can be 0.8 mg/g, with a residual concentration far below the standard limit (10 g/L) set by the World Health Organization for drinking water. It has been further found that Ti.sub.3C.sub.2 can efficiently remove arsenic from water that is also contaminated with other heavy metals, such as chromium six (Cr (VI)) and lead (Pb (II)).
[0030] In experiment, the Ti.sub.3C.sub.2 adsorbent was prepared by room temperature exfoliation of Ti.sub.3AlC.sub.3 using hydrofluoric acid:
[0031] The MAX phase (Ti.sub.3AlC.sub.2) was synthesized by mixing commercial Ti.sub.2AlC and TiC in a 1:1 molar ratio using ball-milling for 20 h. The MAX phase was then sintered under an inert environment using a tube furnace up to 1300 C. with a heating rate of 5 C./min. The resulting powder is then exfoliated by 50 wt. % HF to selectively remove the Al layer from the sintered MAX phase (which is now changed to Ti.sub.3C.sub.2T.sub.x). The agglomerated MXene (Ti.sub.3C.sub.2T.sub.x) was then dispersed by dispersing Ti.sub.3C.sub.2T.sub.x powder in ethanol solution and ultra-sonication under argon for 1 h at 60% amplitude. The dispersed Ti.sub.3C.sub.2T.sub.x nanosheets were then collected using centrifugation and drying overnight. All chemicals used in this study were reagent grade. TraceCERT (Sigma-Aldrich) 1000 mg/L As in nitric acid was used as the arsenic standard solution (Sigma-Aldrich). To adjust the pH of the solutions HCl and NaOH are used. 37% HCl solution from VWR AnalaR NORMAPUR (VWR International) was diluted to prepare a 0.1 M solution of HCl. A 0.1 M solution of NaOH is also used to adjust the pH using sodium hydroxide from VWR AnalaR NORMAPUR. In this context, and for the sake of simplicity, all Ti.sub.3C.sub.2T.sub.x notation has been replaced by MXene.
[0032] The Ti.sub.3C.sub.2 adsorbent was added to a sample of contaminated water and adsorption of the arsenic contaminant from the water was found to have a removal efficiency of up to 85%. The arsenic concentration in the water was analyzed using a Brucker Aurora Elite Inductive Coupled Plasma-Mass Spectrometer (ICP-MS). To prepare the samples for analysis, untreated and treated water samples were preserved and diluted 100 times with 1% w/w HNO.sub.3/H.sub.2O prior to the testing. The arsenic concentration was analyzed in helium collision mode (67 ml/min) using a dwell time of 30 msec, 10 replicates and a plasma power of 1450 W.
[0033] Surface imaging of the MXene sample was performed using Field-emission scanning electron microscopy (FE-SEM) on a JEOL JSM-7610F (JEOL Inc. Japan) which was combined with EDS (OXFORD instruments, INCAx-Max20, United Kingdom) for elemental analysis. AXIS Ultra DLD X-ray photoelectron spectroscopy (XPS) was used to analyze the element compositions of samples and also to identify the oxidation states for each element with their surface chemical bonding. The zeta potentials of the MXene nanosheets were measured using Zetasizer (Nano ZS 90, Malvern Instruments Ltd., Malvern, UK) equipped with a 4.0 mW internal laser, which works on the principle of dynamic light scattering (DLS). The zeta potential measurements were performed at room temperature (25 C.), with a scattering angle of 90.
[0034] Powder X-ray diffraction (XRD) patterns were recorded using a MiniFlex X-ray diffractometer manufactured by the Rigaku Americas Corporation of Texas. The powder X-Ray diffraction patterns were measured with Cu K radiation at =1.54 at a rate of 0.4%, over Bragg angles ranging between 10-90. The operating voltage and current were maintained at 40 kV and 15 mA, respectively.
[0035] The adsorption capacity of the Ti.sub.3C.sub.2 adsorbent to adsorb arsenic was evaluated using batch tests at different pH values, ranging from 3 to 8. 10 mL of ultra-pure water contaminated with 1 ppm (1 mg/L) of arsenic (in the form of NaAsO.sub.2), was mixed with 10 mg of the Ti.sub.3C.sub.2 adsorbent and left for 24 hours. The solution was mixed with a magnetic shaker at room temperature. One sample was taken immediately after 20 seconds of rigorous shaking, and other samples were taken, respectively, after 10 minutes, 30 minutes, 60 minutes, 90 minutes, 120 minutes and 1,440 minutes to determine the optimum contact time. At each sampling interval, 100 L of solution were taken and centrifuged using a micro-centrifuge at a speed of 3,000 rpm for 5 minutes. The filtrate was taken for analysis using inductively coupled plasma mass spectrometry (ICP-MS) (BRUCKER AURORA ELITE COUPLED PLASMA-MASS SPECTROPHOTOMETER). The samples, taken at the different times given above, were dosed and preserved with 1:3 HNO.sub.3/H.sub.2O prior to the testing.
[0036] The pH of the solution was adjusted using 0.1 M HCl and 0.1 M NaOH solutions to study the effect of pH on adsorption capacity and removal efficiency. Different MXene loadings in 50 ml polypropylene conical tubes containing 20 ml arsenic solution with concentration of 1 ppm were used. The tubes were shaken using a mechanical shaker at a speed of 100 rpm. In the second part of the experiments, the effect of contact time on the removal efficiency of arsenic by MXene was examined using 1 ppm arsenic solution, 100 mg MXene and different pH values. Samples at different time intervals were collected and analyzed for arsenic using ICP-MS. After measuring the initial pH of the solution, an acid or a base was added drop-by-drop to achieve a pH of 3, 5, 6 or 8. A similar protocol was used to adjust the pH of the solution using a trimethylamine organic base.
[0037] Adsorption capacity (AC) and removal efficiency (RE) of arsenic in the solution by the Ti.sub.3C.sub.2 water contaminant adsorbent were found and expressed mathematically as
where C.sub.i (mg/L) is the initial concentration of arsenic in the solution, C.sub.f (mg/L) is the final concentration of arsenic in the solution, V (L) is the volume of the solution containing arsenic, and W.sub.g is the amount of the Ti.sub.3C.sub.2 arsenic adsorbent in the solution. As noted above, the arsenic analysis was conducted using inductively coupled plasma mass spectrometry. The samples, taken at the different times given above, were dosed and preserved with 1:3 HNO.sub.3/H.sub.2O prior to the testing.
[0038] Scanning electron microscopy (SEM) was performed using FEI QUANTA 200 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE (ESEM) with a resolution of 5 nm and a magnification of 200K to observe the morphology and structure of material. Samples were kept on aluminum stub and gold sputtered prior to imaging. AXIS Ultra DLD X-ray photoelectron spectroscopy (XPS) was used to analyze samples for elements on the surface and also to identify the oxidation sheets for each element with their surface chemical bonding.
[0039] The measurement of zeta potential and particle size of the nanoparticles was carried out using a ZETASIZER (NANO ZS 90, Malvern Instruments Ltd., Malvern UK) equipped with a 4.0 mW internal laser, which works on the principle of dynamic light scattering (DLS). The measurements were performed at room temperature (25 C.), with scattering angle of 90. The intensity-weighed mean diameter of the bulk population of particles was given by the z-average diameter value of the particles.
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[0041] The 2p XPS analysis of the Ti.sub.3C.sub.2 MXene after arsenic adsorption (pH 6) is shown in
[0042] From the spectra shown in
[0043] An analysis of particle size and zeta potential was performed by observing the change in size and potential of the Ti.sub.3C.sub.2 MXene. The average particle size of the Ti.sub.3C.sub.2 MXene is shown in
[0044] The zeta potential of the Ti.sub.3C.sub.2 MXene is shown in
[0045] Analysis of the zeta potential was also performed by observing the change in surface charge as function of pH. The pH-dependent zeta potential analysis of the MXene is shown in
[0046] The sudden change in the sign of the zeta potential may be due to the desorption of arsenic (As) ions from the surface of the MXene. The adsorption of As ions is more dominant in a neutral environment compared to a basic environment. Thus, when arsenic is desorbed from the MXene's surface, the surface of the MXene becomes less negative. When arsenic ions are adsorbed on the surface of the MXene, the electrical double layer interactions cause a heterogeneous distribution of charges on the surface which, in turn, causes a reduction on the effect of the double layer repulsion during the adsorption process.
[0047] Changes in the zeta potential from adjusting the pH can be usefully utilized for MXene regeneration. As shown in
[0048] The pH value of the Ti.sub.3C.sub.2 MXene in solution ranges between 3.5 and 3.7. This is in contrast to other carbon adsorbents, such as activated carbon or carbon nanotubes, where the pH is mostly in the range of 5-7. The pH of the medium is an important factor which significantly affects arsenic removal.
[0049] It is possible that pH can affect the As (III) speciation and the MXene surface charge in the liquid medium. It is predicted that the MXene possesses positive charge density at low pH and then changes to a negative charge density at higher pH values. The As (III) in aqueous media also shows similar characteristics, where their surface charges change with a changing pH. Thus, As (III) adsorption varies with a changing value of pH. This phenomenon occurs due to electrostatic attraction between the negatively charged surface of the adsorbent and the positively charged As (III). ICP-MS results show that at a pH of 3 and at a pH of 8, Ti residual is higher than that of mid-range pH. It is believed that at a very low pH and a very basic pH, the Ti may separate from the MXene structure, causing damage. Thus, the optimal pH for the MXene solution is about 5. The pH of 5 for the MXene solution is improved by the TiO bond, which shows high sorption affinity toward metallic ions. The As (III) is partly attached to the surface of the MXene by covalent bonds with the TiO bond, forming TiOAs (III), as shown in
[0050] Kinetic experiments were carried out by determining the As (III) solution contents at various time intervals. The contact time was varied from 0 hours to 2 hours using 10 mg of the Ti.sub.3C.sub.2 MXene with an initial As (III) concentration of 1 mg/L (1 ppm).
[0051] Using an organic base to adjust the pH of the solution proved to show better performance in removing As (III), as shown in
[0052] In order to examine the potential of interaction between arsenic and other elements in mixed solution with the MXene, another set of experiments were performed under optimized condition. Two other heavy metals, namely lead (Pb) and chromium (Cr (VI)), were tested. The influence of these elements on adsorption of arsenic can be seen in
[0053] Additionally, the porous structure of Ti.sub.3C2T.sub.x was analyzed using the adsorption-desorption of liquid N.sub.2 at 77 K. The specific surface area of delaminated Ti.sub.3C.sub.2T.sub.x increases sharply with sonication from 3.5 m.sup.2/g to 13 m.sup.2/g due to the unstacking of Mxene layers. Unstacking of the MXene layers provide extra surface area (i.e., extra active sites) for adsorption of arsenic ions. The adsorption-desorption isotherms are shown in
[0054] To investigate the physical and chemical properties of the MXene with respect to temperature, thermogravimetric analysis (TGA) with a heating rate of 10 C./min in air and nitrogen was used. TGA was performed using an SDT Q600 manufactured by TA Instruments of Delaware. The thermogravimetric analysis (TGA) and differential thermal analysis (DTA) curve of Ti.sub.3C.sub.2T.sub.x is shown in
[0055] Further, field-emission gun scanning electron microscope (FEG-SEM) images of the MXene samples, both before and after adsorption by arsenic ions, are respectively shown in
[0056] As noted above, the adsorption of arsenic from water is highly pH-dependent. Arsenic adsorption is highly dependent on pH, where maximum adsorption occurs in the highly acidic pH range. Adsorption of arsenic keeps decreasing as the pH values of the solution increase, where the minimum adsorption occurs at a pH of 8. This can be correlated to the zeta potential of the MXene in a water environment. As described above with reference to
[0057] In the pH range of 2-3, H.sub.3AsO.sub.4 and H.sub.2AsO.sup.4 are the dominant arsenic species, while as the pH increases to 6, H.sub.2AsO.sup.4 and HAsO.sub.4.sup.2 are the main arsenic species in water. At higher basic pH, arsenic species such as HAsO.sub.4.sup.2 and AsO.sub.4.sup.3 are the dominant species. Therefore, at a pH less than pHZPC (2.41), the surface of MXene is positively charged and tends to attract negatively charged arsenic species. On the other hand, when the pH goes above the pH.sub.ZPC, the hydroxyl group on the surface of the MXene gets deprotonated and become negatively charged. This change in charge causes less adsorption for the arsenic species in water. The final arsenic concentration decreases with increasing adsorbent dosage. The maximum removal of arsenic using the MXene was obtained at 100 mg.
[0058] MXene dosage is another important factor which plays a major role in the arsenic uptake and can control the capacity of MXene at a given concentration. The removal efficiency of arsenic by MXene increases with increasing adsorbent dosage. The maximum removal efficiency was found to be at pH 3 with 100 mg of MXene. As a general rule, as the amount of adsorbent increases, the free adsorption sites on the surface of adsorbent available for the removal of contaminants increases proportionally. Further, in the case of MXene, after the exfoliation process by HF, MXene's surface is terminated mainly by OH, F, and O groups. These functional groups, along with the free adsorption sites on the surface of MXene, provide environments for ions to be adsorbed freely on the surface of MXene, either by chemical bonding between functional groups on the surface of MXene and the ions (chemisorption) or physically by van der Waal forces (physisorption). The chemical bonding between arsenic ions and functional groups was illustrated in the XPS analysis shown in
[0059] As shown in the SEM images in
[0060] The third and last possible route for arsenic adsorption is through an ion-exchange process. The presence of functional groups such as OH and F may act as a capturing site for arsenic adsorption by an ion exchange reaction. This is evident from the XPS analysis, where As was captured by functional groups, such as OH and F groups. The arsenic will be attracted to the functional groups and undergo ion exchange. These groups are mostly negatively charged, forming TiAs and OAs bonding.
[0061] In order to challenge the adsorption of arsenic by the MXene, a solution containing As (III), Pb (II), Cr (IV), Sr (II) and Ba (II) with 1 ppm concentration was prepared. The MXene performance was tested under batch mode. The removal efficiency of the MXene for each ion is shown in
[0062] The distribution coefficient (K.sub.D) can be used as a mathematical indication to demonstrate the selectivity and affinity of an ion towards an adsorbent. The distribution coefficient (K.sub.D) is calculated as
where C.sub.i and C.sub.e are initial and equilibrium concentrations, respectively, V is the volume of solution, and in is the mass of adsorbent. The calculated distribution coefficient was in the following order: Ba>Sr>Ca>Pb>Cr>>As, with K.sub.D values of 68 mg/mL, 64.3 mg/mL, 63.9 mg/mL, 61.5 mg/mL, 36 mg/mL and 3.6 mg/mL, respectively.
[0063] As noted above with respect to
[0064] It is to be understood that the method of removing arsenic from a liquid is not limited to the specific embodiments described above, but encompasses any and all embodiments within the scope of the generic language of the following claims enabled by the embodiments described herein, or otherwise shown in the drawings or described above in terms sufficient to enable one of ordinary skill in the art to make and use the claimed subject matter.