Nanowire-based superconducting electrostrictive device
10177298 ยท 2019-01-08
Assignee
Inventors
- Benjamin J. Taylor (Escondido, CA)
- Teresa H. Emery (San Diego, CA, US)
- Susan Anne Elizabeth Berggren (San Diego, CA, US)
- Anna M. Leese de Escobar (Encinitas, CA, US)
Cpc classification
B82Y10/00
PERFORMING OPERATIONS; TRANSPORTING
H10N60/30
ELECTRICITY
H10N30/206
ELECTRICITY
B82Y30/00
PERFORMING OPERATIONS; TRANSPORTING
H10N60/128
ELECTRICITY
H10N60/84
ELECTRICITY
B82Y99/00
PERFORMING OPERATIONS; TRANSPORTING
International classification
Abstract
A Josephson junction device and methods for manufacture can include an untwinned YBa.sub.2Cu.sub.3O.sub.x nanowire having crystallographic a- and b-axes. The nanowire can be established from YBa.sub.2Cu.sub.3O.sub.x film (6.0x7.0) using a photolithography process, followed by an ion milling process, to yield the YBa.sub.2Cu.sub.3O.sub.x nanowire. The crystallographic b-axis of the nanowire can be parallel to the long dimension of the nanowire. First and second gate structures can be placed on opposite sides of the nanowire across from each other, to establish first and second microgaps. A gate voltage can be selectively applied across the first and said second gate structures, which can further establish a selective electric field across the first and second microgaps. The electric field can be parallel to the nanowire crystallographic a-axis, to selectively cause an at will Josephson junction effect.
Claims
1. A Josephson junction, comprising: untwinned YBa2Cu3Ox film, said film having an a-axis and a b-axis; a nanowire having a nanowire thickness, said nanowire formed in said untwinned YBa2Cu3Ox film; a first gate structure and a second gate structure placed on opposite sides of said nanowire, said first gate structure establishing a first microgap and said second gate structure establishing a second microgap with said nanowire; said first microgap having a first microgap width, said second microgap having a second microgap width, said first microgap width, said second microgap width and said nanowire thickness being approximately equal; and, a gate voltage selectively applied to said first gate structure and said second gate structure, said gate voltage further establishing a selective electric field across said first microgap and said second microgap that is parallel to said a-axis to cause an at will Josephson junction effect.
2. The Josephson junction of claim 1, wherein said untwinned YBa2Cu3Ox film has an Ox value in the range between 6.0 and 7.0 (6.0x7.0).
3. The Josephson junction of claim 1, where said nanowire thickness is between fifteen and twenty-five nanometers (15 nmt25 nm).
4. The Josephson junction of claim 3 where said selective gate voltage is 6 mV.
5. The Josephson junction of claim 4 wherein said selective electric field is one hundred kilovolts per meter (100 kV/m).
6. The Josephson junction of claim 1, wherein said nanowire is formed in said YBa2Cu3Ox film by defining said nanowire using photolithography, followed by etching away unneeded portion of said YBa2Cu3Ox film using an ion milling process to yield said nanowire.
7. A method for selectively establishing a Josephson junction, comprising the steps of: A) forming an untwinned YBa2Cu3Ox film having an a-axis and a b-axis; B) establishing a nanowire in said YBa2Cu3Ox film; C) placing a first gate structure and a second gate structure across from each other, on either side of said nanowire, to establish a first microgap and a second microgap; and, D) selectively establishing an electric field across said first microgap and said second microgap, said electric field being co-linear with said a-axis.
8. The method of claim 7 wherein said step D) is accomplished by selectively activating a gate voltage across said first gate structure and said second gate structure.
9. The method of claim 8, wherein said gate voltage is 6 mV.
10. The method of claim 9, wherein said selective electric field is 100 kV/m.
11. The method of claim 7, wherein said step A) is accomplished to result in an untwinned YBa2Cu3Ox film with an Ox value in the range between 6.0 and 7.0 (6.0x7.0).
12. The method of claim 7, wherein said step B) is further accomplished by: B1) defining said nanowire in said untwinned YBa2Cu3Ox film using photolithography; and, B2) ion milling unneeded portions of said untwinned YBa2Cu3Ox film so that only said nanowire from said step B1) remains.
13. The method of claim 12, where the resulting thickness of said nanowire is between fifteen and twenty-five nanometers (15 nmt25 nm).
14. A device, comprising: a first gate structure; a second gate structure spaced apart from said first gate structure to establish an interstice there between; a gate voltage, said gate voltage establishing an electric field across said interstice; and, a nanowire inserted into said interstice to form a first microgap having a first microgap width and a second microgap having a second microgap width, said nanowire having a long dimension and a nanowire thickness, said nanowire thickness, said first microgap width and said second microgap width being approximately equal, said nanowire being formed from an untwinned YBa2Cu3Ox film having a crystallographic a-axis and a crystallographic b-axis that are orthogonal, said long dimension being parallel with said crystallographic b-axis.
15. The device of claim 14, wherein said untwinned YBa2Cu3Ox film with an Ox value in the range between 6.0 and 7.0 (6.0x7.0).
16. The device of claim 14, wherein said nanowire is formed by defining said nanowire on said YBa2Cu3Ox film using a photolithography process, followed by etching away unneeded portions of said YBa2Cu3Ox film using an ion milling process, so that only said nanowire remains.
17. The device of claim 16, where the resulting thickness of said nanowire is between fifteen and twenty-five nanometers (15 nmt25 nm).
18. The device of claim 14, wherein said gate voltage is 6 mV.
19. The device of claim 18, wherein said selective electric field is 100 kV/m.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) The novel features of the present invention will be best understood from the accompanying drawings, taken in conjunction with the accompanying description, in which similarly-referenced characters refer to similarly-referenced parts, and in which:
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DETAILED DESCRIPTION OF THE EMBODIMENTS
(9) A Josephson junction (JJ) can be a boundary region of material that can provide a weak link between two fully superconducting regions through which paired superconducting electrons can tunnel via a quantum mechanical process. Recently, the prior art reported the development of a 3-terminal, nanowire-based superconducting electro-thermal device, referred to as an nTron, which has no Josephson junctions, but which can perform the same circuit functions as a JJ. The nTron can use a localized, Joule-heated hotspot that is formed in the gate to modulate current flow in a perpendicular superconducting channel. A particular advantage of the nTron is that it exhibits sensitivity sufficient to detect single flux quanta, but does not require integration into superconducting loops (SQUIDs) and so can avoid the issue of trapped flux in electromagnetically noisy environments.
(10) The present invention according to several embodiments can also be structured to accomplish a Josephson junction effect, while avoiding the above-cited issue of trapped flux, but without heating of the device, by applying an electric field across certain Yttrium Barium Copper Oxide (YBCO) materials in a certain manner, to take advantage of YBCO material properties. To do this, and referring initially to prior art
(11) Through the application of uniaxial pressure to a substrate upon which a film of over-doped YBCO (YBCO having an oxygen content close to O.sub.7) has been deposited under unique thermal and atmospheric conditions, a high level of crystalline order in the a-b plane (i.e., in the direction of the crystallographic a-axis and crystallographic b-axis in
(12) Referring now to
(13) One ion milling process that could be used can be described more fully in U.S. patent Ser. No. 15/638,928 by Benjamin J. Taylor et al. for an invention entitled In-Plane Josephson Junction Array Terahertz Laser, which is assigned to the same assignee as the present invention. The contents of the '928 application are hereby incorporated by reference herein. Other processes could also be used. With respect to the untwinned YBa.sub.2Cu.sub.3O.sub.x film, film 14 can have an O.sub.x value in the range between 6.0 and 7.0 (6.0x7.0).
(14) Once nanowire 12 is formed, and referring now primarily to
(15) With the above structure, an electric field E can be established across interstice 21. To do this a voltage potential can be established across gate structures 20a, 20b, as shown in
(16) With the structure and orientation of structure, the electric field produced by the voltage gate terminals can induce an electrostrictive response in nanowire 12, as depicted by an electrostrictive region 26 in nanowire 12 (
(17) For the alternative embodiments of the present invention, and referring now to
(18) Referring now to
(19) Referring again to
(20) The device of the present invention according to several embodiments can be similar to the nTron with respect to performing the functions of a conventional Josephson junction, and also having the advantage of avoiding flux trapping issues. However, the component and methods of the present invention can be distinct in that an input gate elective field E can be used to induce changes in the conductivity of the YBCO nanowire 12, which can effectively create an at will Josephson junction at electrostrictive Josephson junction region 26. The device has potential applications in classical and quantum communications. This structure and cooperation of structure can allow the device and methods to perform the functions of a Josephson junction, but does not have the same inherent performance degrading flux-trapping issues that can be inherent in the prior art devices. Additionally, because the device 10 uses a controlled gating electric field E, the Josephson junction-like function can be rapidly turned on and off at will, creating a re-configurable circuit element. Such a function can serve as a logic element.
(21) The use of the terms a and an and the and similar references in the context of describing the invention (especially in the context of the following claims) is to be construed to cover both the singular and the plural, unless otherwise indicated herein or clearly contradicted by context. The terms comprising, having, including and containing are to be construed as open-ended terms (i.e., meaning including, but not limited to,) unless otherwise noted. Recitation of ranges of values herein are merely intended to serve as a shorthand method of referring individually to each separate value falling within the range, unless otherwise indicated herein, and each separate value is incorporated into the specification as if it were individually recited herein. All methods described herein can be performed in any suitable order unless otherwise indicated herein or otherwise clearly contradicted by context. The use of any and all examples, or exemplary language (e.g., such as) provided herein, is intended merely to better illuminate the invention and does not pose a limitation on the scope of the invention unless otherwise claimed. No language in the specification should be construed as indicating any non-claimed element as essential to the practice of the invention.
(22) Preferred embodiments of this invention are described herein, including the best mode known to the inventors for carrying out the invention. Variations of the preferred embodiments may become apparent to those of ordinary skill in the art upon reading the foregoing description. The inventors expect skilled artisans to employ such variations as appropriate, and the inventors intend for the invention to be practiced otherwise than as specifically described herein. Accordingly, this invention includes all modifications and equivalents of the subject matter recited in the claims appended hereto as permitted by applicable law. Moreover, any combination of the above-described elements in all possible variations thereof is encompassed by the invention unless otherwise indicated herein or otherwise clearly contradicted by context.