Cathodoluminescence detector including inner and outer tubes sealed from a vacuum chamber of an associated particle beam system
10157726 ยท 2018-12-18
Assignee
Inventors
- Mathieu Kociak (Palaiseau, FR)
- Luiz Fernando Zagonel (Campanas, BR)
- Marcel Tence (Issy les Moulineaux, FR)
- Stefano Mazzucco (Bethesda, MD, US)
Cpc classification
H01J37/023
ELECTRICITY
H01J37/244
ELECTRICITY
H01J37/26
ELECTRICITY
H01J37/228
ELECTRICITY
International classification
H01J37/244
ELECTRICITY
H01J37/22
ELECTRICITY
Abstract
The invention relates to a cathodoluminescence detection system comprising: a collecting optic (112) collecting light radiation (108) from a sample illuminated by a beam of charged particles and reflecting said radiation (108) onto analysis means, said collecting optic (112) being placed in a chamber, called a vacuum chamber, wherein the pressure is below atmospheric pressure; and means (316) for adapting the light radiation, placed downstream of the collecting optic (112) and designed to adapt said light radiation (108) at the inlet of the analysis means. Said system is characterized in that all or part of the adapting means (316) is placed in an environment where the pressure is higher than the pressure in said vacuum chamber.
Claims
1. A cathodoluminescence detection system comprising: a collection optic collecting light radiation coming from a sample illuminated by a charged particle beam and sending said radiation to an analysis device, said collection optic being arranged in a vacuum chamber in which a pressure in the vacuum chamber is below atmospheric pressure, an adjustment device configured to adjust the light radiation arranged downstream of the collection optic and said light radiation at the input of the analysis device, at least part of the adjustment device being arranged in an environment in which a pressure is greater than the pressure in said vacuum chamber, and a first tube in the form of an outer cylinder aligned relative to the axis of the collection optic and integral with said collection optic, said outer cylinder comprising a window seal ensuring that the pressure is maintained in the vacuum chamber in which said collection optic is arranged; and a second tube in the form of an inner cylinder enclosed by and centered in the outer cylinder and configured to receive the adjustment device with a view to injecting said light radiation into an optical fiber or into a detector, said inner cylinder being arranged downstream from said window seal in a direction of a path of the light radiation so that said inner cylinder is at a pressure greater than the pressure in said vacuum chamber.
2. The system according to claim 1, further comprising a seal arranged between said collection optic and the adjustment device and capable of ensuring that said vacuum chamber is leak tight while permitting the light radiation to pass through.
3. The system according to claim 1, wherein the adjustment device comprises at least one lens arranged upstream of an optical fiber and capable of sending the light radiation into said optical fiber.
4. The system according to claim 1, wherein the collection optic comprises a parabolic mirror.
5. The system according to claim 1, wherein the collection optic comprises a plane mirror or an elliptical mirror associated with at least one optical lens.
6. The system according to claim 1, wherein the inner cylinder is removably mounted in the outer cylinder and rotates freely relative to said outer cylinder.
7. The system according to claim 1, wherein the adjustment device is configured to adjust the angle and size of the light radiation collected to the size and numerical aperture of a detector or an optical fiber.
8. The system according to claim 1, wherein the adjustment device comprises a diaphragm arranged to let the light radiation coming from the collection optic through to the analysis device and block at least one undesirable optical signal.
9. The system according to claim 1, further comprising a source of emission of a light beam propagating in the opposite direction to the direction of propagation of the light radiation, said light beam being directed towards the sample by the collection optic.
10. The system according to claim 1, further comprising a light analyzer configured to analyze the light radiation arranged downstream of the adjustment device.
11. The system according to claim 10, wherein the analysis device comprise a spectrometer, a CCD camera or a photomultiplier.
12. The system according to claim 1, wherein the collection optic is mounted movably in at least one dimension, said system also comprising positioning device capable of moving said collection optic in at least one dimension.
13. The system according to claim 12, wherein the positioning device comprise a stage mounted movably in at least one dimension, the collection optic being securely mounted on said stage, said system also comprising at least one positioning component capable of moving said stage in at least one dimension.
14. A microscope comprising: a source (102) of emission of a charged particle beam, and a cathodoluminescence detection system according to claim 1.
15. The microscope according to claim 14, further comprising one of: a bright field detector, a dark field detector, a EELS detector, a camera for imaging or diffraction, or a EDX detector.
Description
(1) Other advantages and characteristics of the invention will become apparent on examination of the detailed description of an embodiment which is in no way limitative, and the attached diagrams, in which:
(2)
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(8)
(9)
(10)
(11) The microscope 100 comprises a source 102 of emission of an electron beam 104 onto a sample 106. In response to this electron beam 104, the sample 106 emits light radiation 108 that can comprise wavelengths ranging from infrared to ultraviolet.
(12) The light radiation 108 is then collected and analysed by a cathodoluminescence detection system 110.
(13) The cathodoluminescence detection system 110 comprises a collection optic 112, means 114 of adjusting the diameter (respectively the angle) of the light beam 108 to the diameter (respectively numerical aperture) of an optical fibre 116 and analysis means 118. The role of the collection optic 112 is to collect the light radiation 108 emitted by the sample 106, the role of the optical fibre 116 is to convey the light radiation 108 collected by the collection optic 112 to the analysis means 118. However, it is necessary to use adjustment means 114 to adjust the light radiation 108 at the output of the collection optic 112 to the input of the optical fibre 116 while preserving the intensity and spectral resolution of the signal.
(14) The analysis means 118 can comprise a spectrometer, a CCD camera or a photomultiplier capable of analysing the light radiation 108 conveyed by the optical fibre 116.
(15) The microscope 100 also comprises a deflection/scanning coil 120 arranged between a condenser lens 122 positioned on the side of the electron source 102 and an objective lens 124 positioned on the opposite side. The deflection coil 120 allows for the surface of the sample 106 to be scanned with the electron beam 104 to perform a spectroscopic examination of the sample 106.
(16) The microscope can also comprise one or more bright field detectors 126, one or more dark field detectors 128 and an EELS detector 130.
(17) In the example shown in
(18) In another embodiment (not shown), the collection optic 112 can comprise a plane mirror combined with a collecting lens or an elliptical mirror optionally combined with a collecting lens instead of the parabolic mirror.
(19) First Aspect of the Invention
(20) A first aspect of the cathodoluminescence system to which the present invention relates will now be described with reference to
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(22)
(23) According to this first aspect, the collection optic 112 is capable of being arranged in a vacuum chamber 302 of the microscope and the adjustment means 114 as well as the optical fibre 116 and the analysis means 118 are arranged in an environment at atmospheric pressure. In other words, the adjustment means 114, the optical fibre and the analysis means are outside the vacuum chamber 302 of the microscope.
(24) To this end, in the example shown in
(25) This outer cylinder 306 enters the vacuum chamber by means of an opening 308 formed in a wall of the vacuum chamber. This opening 308 is arranged opposite the light radiation sent by the collection optic 112.
(26) The outer cylinder 306 and the wall of the vacuum chamber 302 are held together by a leaktight device 310 preserving the pressure level inside the vacuum chamber.
(27) The outer cylinder 306 comprises at its proximal end 308, i.e. the end to which the collection optic 112 is securely attached, a transparent window seal 312 preserving the vacuum level inside the vacuum chamber 302 while letting through the light radiation collected and sent by the collection optic 112. Thus, downstream of the window seal, the inside of the outer cylinder 306 is separated from the vacuum chamber in a leaktight manner and is at atmospheric pressure.
(28) A second cylinder 314, called inner cylinder, is arranged inside the outer cylinder 306 downstream of the window seal 312, i.e. in the part at atmospheric pressure. The axis of symmetry of the inner cylinder 314 merges with the axis of symmetry of the outer cylinder 306 and is therefore perfectly aligned with the optical axis of the collection optic 112. The inner cylinder 314 is removably arranged in the outer cylinder 306 and can rotate freely.
(29) The adjustment means 114 are arranged in this inner cylinder 314. In the present example, shown in
(30) The input of the optical fibre is also arranged inside the inner cylinder downstream of the collecting lens 316 and centred very accurately relative to the optical axis of the collecting lens 316.
(31) The inner cylinder can also comprise any optical component necessary for the examination of the sample, for example a polariser.
(32) The fact that the inner cylinder can rotate freely allows for the orientation of the various optical components to be modified without having to remove them.
(33) Thus, according to this first aspect of the cathodoluminescence detection system, the optical components comprising the adjustment means and the input of the optical fibre can be accessed easily to change, repair or reposition them.
(34) Second Aspect of the Invention
(35) A second aspect of the cathodoluminescence system to which the present invention relates will now be described with reference to
(36)
(37) The collection optic 112 is securely connected to a cylinder 602 by means of two screws 304 at the proximal end 604 of the cylinder 602. The collection optic 112 is located in the vacuum chamber 302 of the microscope 600. The cylinder 602 can also comprise optical adjustment means 114 and the input of the optical fibre 116, which can for example be arranged in a second cylinder removably inserted into the cylinder 602, rotating freely and mounted so that the axis of symmetry merges with the axis of symmetry of the cylinder 602. The cylinder 602 can be the outer cylinder 306 and comprise the inner cylinder 314, as described above.
(38) The cylinder 602 enters the vacuum chamber 302 by means of an opening 604 formed in a wall of the vacuum chamber. This opening 604 is arranged opposite the light radiation sent by the collection optic 112. The diameter of this opening is greater than the outer diameter of the cylinder 602 in order to allow the movement of the outer cylinder in the three dimensions of space. This opening 604 can be the opening 308 described above.
(39) A bellows seal 606 is attached to the cylinder 602 and surrounds the cylinder 602 in a leaktight manner. This bellows seal is moreover attached in a leaktight manner to the wall of the vacuum chamber 302, around the opening 602, by means of a connecting part 608 that hugs the outer shape of the wall of the vacuum chamber around the opening 602. Thus, the connection between the bellows seal 606 and the cylinder 602 is leaktight, as is the connection between the bellows seal 606 and the wall of the vacuum chamber 302. The bellows seal 606 permits the movement of the cylinder 606 in the three directions of space while at all times preserving the leaktightness of each of its connections with the cylinder 602 on the one hand and the wall of the vacuum chamber 302 on the other hand.
(40) The cylinder 602 comprises a window seal (not shown in
(41) The cylinder 602 is securely mounted on a three-dimensional movement device 610 on the side of its distal end 612, i.e. the end on the opposite side to the collection optic 112. This three-dimensional movement device 610 is placed on a stage 612 movably mounted on the wall of the vacuum chamber 302. The device 610 comprises three micrometric screws 614, 616 and 618 used to move the cylinder 602 in the three dimensions of space.
(42) As the collection optic 112 is integral with the cylinder 602, the movement of the cylinder 602 results in the movement of the collection optic 112. Thus, by means of this second aspect of the cathodoluminescence detection system, it is possible for the operator to move the collection optic from the outside of the microscope to position it better in relation to the electron emission source and relative to the sample, to improve the conservation of the intensity of the light radiation collected downstream of the collection optic, together with the spectral resolution of the optical signal.
(43) On reading the present application, it is clear to a person skilled in the art that the first and second aspects of the cathodoluminescence detection system can be combined. As set out above, the cylinder 602 shown in
(44) Third Aspect of the Invention
(45)
(46) The optical path 800 in
(47) The optical path 800 comprises as processing means a lens 804, which can be the lens 316 in
(48) According to the third aspect of the invention, the parabolic mirror, the lens 804 and the spectrometer 806 are selected and positioned so that: the parabolic mirror 802 has a value of p of 2 mm and a thickness of 3 mm; the maximum output angle of the parabolic mirror 802 is zero (parallel beam) and the maximum input angle of the lens 804 is zero (parallel beam); the profile of the radiation coming from the parabolic mirror 802 in the input plane of the lens 804 is 9 mm by 3 mm and the useful input diameter of the lens 802 is 8 mm; taking the centre of the parabolic mirror to be the mid-point between its horizontal and vertical surfaces (parallel to the optical axis of the lens), the offset of the lens 804 relative to the centre of the parabolic mirror is less than 100 microns. The position of the focus of the mirror is under these circumstances calculated to obtain the maximum collection angle for the mirror; and the maximum output angle of the lens 804 is 6.3.
(49) Moreover: the width of the beam at the input of said spectrometer in the dispersive direction is typically 100 or 70 microns and the limit diameter at the input of the spectrometer below which the resolution of the spectrometer no longer depends on the diameter of the waist of the light radiation at the input of the spectrometer is 70 m.
(50) Moreover: the accuracy of the movement in at least one of the two directions of space perpendicular to the optical axis and in the direction of the optical axis is greater than or equal to 1 m, ensuring resolution at the input of the spectrometer better than 30 microns, i.e. less than the limit size at the input of the spectrometer below which resolution deteriorates.
(51)
(52) The optical path 900 in
(53) The optical path 900 also comprises an optical fibre 902, which can be the optical fibre 116 in
(54) The parameters of the optical components of the optical path 900 are identical to the parameters given with reference to
(55) However: the width of the radiation at the input of the optical fibre 902 is, if the object being examined is infinitely small, of the order of 15 microns, and the useful input diameter of the optical fibre is 70 m; the maximum angle of the radiation coming from the lens 804 is 6.3 and the limit angle of incidence at the input of the optical fibre 902 is 6.9; and the offset of the fibre 902 relative to the centre of the lens is less than 100 microns.
(56) Moreover: the width of the beam at the input of said spectrometer in the dispersive direction is 70 m and the limit diameter at the input of the spectrometer below which the resolution of the spectrometer no longer depends on the diameter of the waist of the light radiation at the input of the spectrometer is 70 m.
(57) Moreover: the accuracy of the movement in at least one of the two directions of space perpendicular to the optical axis and in the direction of the optical axis is greater than 1 m, ensuring resolution at the input of the optical fibre better than 30 microns, i.e. less than the limit size at the input of the spectrometer below which resolution deteriorates; and the diameter of each optical fibre divided by the magnification produced on the optical path up to the optical fibre bundle 1002 is 2 m.
(58)
(59) The optical path 1000 in
(60) The optical path 1000 also comprises an optical fibre bundle 1002, made up for example of several optical fibres such as the optical fibre 902 in
(61) The parameters of the optical components of the optical path 1000 are identical to the parameters given with reference to
(62) However: the width of the radiation at the input of the optical fibre bundle 1002 is greater than or equal to 200 microns and the useful input diameter of each optical fibre constituting the optical fibre bundle 1002 is 70 m; the maximum input angle of the radiation coming from the lens 804 is 6.3 and the limit angle of incidence at the input of each optical fibre constituting the optical fibre bundle 1002 is 6.9; and the offset of the optical fibre bundle 1002 relative to the centre of the lens is of the order of one hundred microns.
(63) Moreover: the width of the beam at the input of said spectrometer in the dispersive direction is 70 m and the limit diameter at the input of the spectrometer below which the resolution of the spectrometer no longer depends on the diameter of the waist of the light radiation at the input of the spectrometer is 70 m.
(64) Moreover: the accuracy of the movement in at least one of the two directions of space perpendicular to the optical axis and in the direction of the optical axis is 1 m or better than 1 m, ensuring resolution at the input of the optical fibre better than 30 microns, i.e. less than the limit waist at the input of the spectrometer below which resolution deteriorates; and the diameter of each optical fibre divided by the magnification produced on the optical path up to the optical fibre bundle 1002 is 2 m.
(65) According to the invention, each of these three embodiments allows for the light radiation emitted by the sample to be conveyed to the CCD camera while preserving more light intensity, optimum spectral resolution and the possibility of using the invention in a microscope using charged particles capable of forming nanometric or even angstromic probe beams.
(66) Moreover, the third example shown in
(67) To this end, at the input 1202 of the bundle 1002, the optical fibres constituting the bundle 1002 are arranged in a circular or hexagonal manner around each other. At the output 1204 of the bundle 1002, the optical fibres constituting the bundle 1002 are aligned on top of each other in a direction perpendicular to the dispersive direction of the spectrometer. The input 1202 and the output 1204 of the optical fibre bundle 1002 are shown diagrammatically in
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(69) The three aspects of the present invention can be combined, in twos or all three, in a single cathodoluminescence system.
(70) Of course, the invention is not limited to the examples which have just been described and numerous adjustments can be made to these examples without exceeding the scope of the invention.