Method for microwave processing of photosensitive polyimides
10139728 ยท 2018-11-27
Assignee
Inventors
Cpc classification
H01L21/02118
ELECTRICITY
C08J2379/04
CHEMISTRY; METALLURGY
C08J2379/08
CHEMISTRY; METALLURGY
H01L21/311
ELECTRICITY
International classification
G03F7/038
PHYSICS
H01L21/311
ELECTRICITY
Abstract
A method for curing photosensitive polyimide (PSPI) films includes the steps of: depositing a PSPI film on a selected substrate, and curing the film by microwave heating at a selected temperature from about 200 to 340? C. in a selected atmosphere containing an oxygen concentration from about 20 to 200,000 ppm. The process atmosphere may be static or flowing. The addition of oxygen improves the removal of acrylate residue and improves the T.sub.g of the cured film, while the low processing temperature characteristic of the microwave process prevents the oxygen from damaging the polyimide backbone. The method may further include the steps of photopatterning and developing the PSPI film prior to curing. The process is particularly suitable for dielectric films on silicon for electronic applications.
Claims
1. A method for curing photopolymer films, comprising: depositing a photopolymer film on a substrate; supplying a known amount of oxygen gas (O.sub.2) or adjusting a pressure to provide a selected atmosphere containing an oxygen concentration in a range from about 20 to 200,000 ppm; and curing the photopolymer film by microwave heating for a selected time in the selected atmosphere.
2. The method of claim 1, wherein the photopolymer is a photosensitive polyimide (PSPI).
3. The method of claim 2, wherein the PSPI comprises a polyamic acid (PAA) precursor resin modified with a photosensitive methacrylate alcohol to form a photosensitive polyamic ester (PAE).
4. The method of claim 3, wherein the photosensitive methacrylate alcohol comprises one or more compositions in the methacrylate family (RCH.sub.2CH.sub.2OC(O)CH?C(CH.sub.3).sub.2) of monomers and oligomers, where R indicates any selected organic moiety attached at the indicated position.
5. The method of claim 1, wherein the selected time is from about 60 to about 180 minutes.
6. The method of claim 1, wherein the selected atmosphere contains an oxygen concentration in the range from about 200 to 200,000 ppm.
7. The method of claim 1, wherein the photopolymer is a polybenzoxazole (PBO).
8. A method for curing photopolymer films, comprising: depositing a photopolymer film on a substrate; photopatterning the photopolymer film; developing the photopatterned photopolymer film; and curing the developed photopolymer film by microwave heating for a selected time in a selected atmosphere containing an oxygen concentration from about 20 to 200,000 ppm, wherein the oxygen concentration is maintained by at least one of supplying a known amount of oxygen gas to the atmosphere or adjusting the pressure of the atmosphere.
9. The method of claim 8, wherein the photopolymer is a photosensitive polyimide (PSPI).
10. The method of claim 9, wherein the PSPI comprises a polyamic acid (PAA) precursor resin modified with a photosensitive methacrylate alcohol to form a photosensitive polyamic ester (PAE).
11. The method of claim 10, wherein the methacrylate alcohol comprises one or more compositions in the methacrylate family (RCH.sub.2CH.sub.2OC(O)CH?C(CH.sub.3).sub.2) of monomers and oligomers, where R indicates any selected organic moiety attached at the indicated position.
12. The method of claim 8, wherein the selected time is from about 60 to about 180 minutes.
13. The method of claim 8, wherein the selected atmosphere contains an oxygen concentration in the range from about 200 to 200,000 ppm.
14. The method of claim 8, wherein the photopolymer is a polybenzoxazole (PBO).
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) The drawings accompanying and forming part of this specification are included to depict certain aspects of the invention. A clearer conception of the invention, and of the components and operation of systems provided with the invention, will become more readily apparent by referring to the exemplary, and therefore non-limiting embodiments illustrated in the drawing figures, wherein like numerals (if they occur in more than one view) designate the same elements. The features in the drawings are not necessarily drawn to scale.
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
DETAILED DESCRIPTION OF THE INVENTION
(10) In order to better understand and control the processing of PSPI films on silicon wafers, Applicants conducted a series of experiments.
(11) In a comparison of standard convection oven and microwave (VFM) curing, a commercial photosensitive polyimide (PSPI) film [HD4100, HD MicroSystems, Wilmington, Del.] was deposited as a 5 ?m thick film on a standard silicon wafer. For this example thickness, a coating was spun on for 30 seconds at 4000 rpm and soft-baked at 90? C. for 100 seconds plus 100? C. for 100 seconds. Films were then treated by either VFM or convection heating for various times at various temperatures. It can be seen in
(12) A surprising result was obtained when evaluating the removal of acrylate residue at these very low cure temperatures in an air environment. Removal of most of the acrylate residue produces a glass transition temperature (T.sub.g) of 315-325? C. as determined by penetration mode Thermal Mechanical Analysis (p-TMA) for the same PSPI. As shown in
(13) However, when attempting to conduct this process in a very low-oxygen environment, which is more typical of standard semiconductor processing, the results were not replicated; specifically, the excellent removal of acrylate residues at low cure temperatures did not occur reliably. Applicants therefore speculated that a controlled amount of oxygen might be useful to drive the acrylate removal, and controlled amounts of oxygen were therefore added to the process.
(14) It is important to note that adding oxygen would normally be very deleterious in the conventional (convection heated) process, because at conventional processing temperatures (?375? C.) there would be oxidative decomposition of the polyimide backbone, which would degrade film properties. By contrast, the inventive use of oxidation to assist the decomposition of acrylate resins at the lower cure temperatures characteristic of the VFM process (?250? C.) is very unlikely to induce oxidative decomposition of the polyimide backbone, and in fact none of the VFM-cured samples in
(15) The role of oxygen in the decomposition of the acrylate residues is also supported by data collected during the high temperature (340? C.) VFM cure evaluations shown in
(16) Since the low activation energies found in microwave induced chemical reactions have not been found to cause thermal decomposition, when oxygen is available to the sensitive radical-generating acrylate residues during VFM curing there might be an autoxidation effect that progressively causes oxidation of the alkyl portions of the acrylate and then releases carbon dioxide and other gases to complete the removal of these residues from the PSPI films at such surprisingly low temperatures.
(17) The surprising combination of low temperature VFM curing with oxygen assist makes available for the first time a practical way to fully cure at very low temperatures, including acrylate removal, photo-sensitive polyimide films that are currently the most commonly used polymer dielectric material within the microelectronics industry. The addition of oxygen (in air or with flow) appears to have no negative effects on the films at these temperatures. Low temperature cure enables the advantages listed above including the protection of temperature sensitive materials and processing steps and lower stressed films.
Example
(18) As shown with a specific example in
(19) In contrast, the same level of imidization requires convection heating to 375? C. for 300 minutes. Under those conditions with oxygen, oxidative damage to the polyimide would occur.
Example
(20) As shown in
Example
(21) As shown in
(22) As shown in
(23) Although Applicants prefer to use VFM processing because of the ease of creating a highly uniform power density throughout a large processing volume, it will be appreciated that in some instances fixed-frequency MW curing may be used, for example if the component to be processed is small and/or a single-mode cavity is used to create a uniform energy density over a selected working volume. Furthermore, Applicants do not intend to limit themselves to any particular type of microwave system or microwave generator.
(24) It will be further understood that the discussion of particular commercial film-forming materials deposited on silicon wafers is exemplary only and is not intended to limit the invention to the use of silicon as the substrate nor to limit the invention to any particular manufacturer's PSPI material or any particular manufacturer's photosensitive polymer.
(25) The invention may be applicable to many chemical systems analogous to the specific example compositions described herein. Specifically, as noted, compositions may involve the modification of some sites of the polyamic acid (PAA) precursor resin with a photosensitive methacrylate alcohol to form a photosensitive polyamic ester (PAE) as shown in
(26) It will further be appreciated that the invention may be more generally applied to other photosensitive chemistries, for example, polybenzoxazoles (PBO), provided that the photosensitive moiety is at least partially removable during subsequent processing and does not form a permanent part of the polymer backbone.