A HIGH-BANDWIDTH THERMOELECTRIC THIN-FILM UV, VISIBLE LIGHT AND INFRARED RADIATION SENSOR AND A METHOD FOR MANUFACTURING THEREOF
20220364929 · 2022-11-17
Assignee
Inventors
- Martins RUTKIS (Salaspils pagasts, LV)
- Aivars VEMBRIS (Riga, LV)
- Kaspars PUDZS (Baldone, LV)
- Janis BUSENBERGS (Riga, LV)
Cpc classification
International classification
Abstract
The invention relates to UV, visible light and infrared radiation sensors, in particular to high-bandwidth thin-film electromagnetic radiation sensors, operating using the principle of thermoelectric effect. According to one embodiment the sensor comprises: a thermoelectric active layer, an electrode layer one and an electrode layer two, wherein the electrode layer one is located below the thermoelectric active layer and the electrode layer two is located above the thermoelectric active layer, whereby the sensor is designed so that the thermal gradient can be created and the electrical voltage can be measured perpendicular to the thermoelectric active layer, between the electrode layer one and the electrode layer two, wherein the material of the thermoelectric active layer is low molecular weight organic compound, selected so that its thermal conductivity would be less than 1 W/(m K{circumflex over ( )}2), Seebeck coefficient modulus would be greater than 100 μV/K and its molecular weight is less than 900 Da.
Claims
1.-10. (canceled)
11. A thermoelectric thin-film UV, visible light and infrared radiation sensor, having signal rise time <10 ns and fall time <1 μs, comprising: a 100-1000 nm thick thermoelectric active layer, an electrode layer one and an electrode layer two, wherein the electrode layer one is located below the thermoelectric active layer and the electrode layer two is located above the thermoelectric active layer, whereby the sensor is designed so that the thermal gradient can be created and the electrical voltage can be measured perpendicular to the thermoelectric active layer, between the electrode layer one and the electrode layer two, wherein the material of the thermoelectric active layer is low molecular weight organic compound, selected from the group consisting of metal phthalocyanines, perylene derivatives and polyacene derivatives, so that its thermal conductivity would be less than
12. The sensor according to claim 11, further comprising an absorption layer, located on the electrode layer two.
13. The sensor according claim 11, wherein the electrode layer one has a thickness greater than 100 μm, so that it can serve also as a conductive substrate.
14. The sensor according claim 11, wherein the electrode layer one and the electrode layer two are made of copper, aluminium, gold, silver or their alloys.
15. The sensor according claim 11, wherein the sensor further comprises a substrate having
16. A method for the manufacture of the thermoelectric thin-film UV, visible light and infrared radiation sensor having signal rise time <10 ns and fall time <1 μs, according to any one of claims 1-5, comprising the following steps: providing an electrode one having an electrical resistance of less than 15 Ω/square; depositing a 100-1000 nm thick thermoelectric active layer on the top of the electrode one by thermal evaporation in vacuum; wherein the material of the thermoelectric active layer is selected from the group consisting of metal phthalocyanines, perylene derivatives and polyacene derivatives; providing an electrode two having an electrical resistance of less than 15 Ω/square, on top of the thermoelectric active layer by physical vapour deposition in vacuum; and optional step of (iv) applying an absorption layer on top of the electrode two.
17. The method according to claim 16, wherein the material, selected for the electrode layer one and the electrode layer two is selected from the group consisting of copper, aluminium, gold, silver and their alloys.
18. The method according to claim 16, the method further comprising the step (i′) of providing a substrate having
19. The method according to claim 16, the method further comprising the step (v) of applying an electrically non-conductive insulation layer of necessary shape on the electrode one before step (ii) to define the conductive area of the electrode one.
Description
SHORT DESCRIPTION OF DRAWINGS
[0012]
[0013]
[0014]
[0015]
[0016]
[0017]
[0018]
b—sensor substrate with applied electrode layer one, c—with applied thermoelectric active layer, d—applied the electrode layer two, f—applied optional light absorption layer.
[0019]
and electrically conductive (electrical resistivity 15 Ω/square) substrate, b—substrate with applied insulating layer, c—with applied thermoelectric active layer, d—applied the electrode layer two, f—applied optional light absorption layer.
DETAILED DESCRIPTION OF THE INVENTION
[0020] The operation of the sensor according to the present invention is based on the thermoelectric effect perpendicular to the plane of the thin-film, i.e. in the direction of the smaller dimension of the thermoelectric active layer, in which also the electrical voltage is measured. The existing sensor structure allows to develop active area sensors of different sizes, which active area is not limited to the size of the sensor structure, as it is in the known MEMS systems.
[0021] The proposed high-bandwidth thermoelectric thin-film UV, visible light and infrared radiation sensor (
Seebeck coefficient modulus would be greater than
and its molecular weight is less than 900 Da. Thermal resistance and Seebeck coefficient of layer 3 determine the response to the generated heat from absorbed radiation. The thermal resistance must be sufficiently high to produce high enough thermal gradient, therefore thickness of organic thermoelectric active layer 3 need to be greater than 100 nm if the thermal conductivity is close to
On the other hand, the thicker the layer, the lower the bandwidth, so the thickness of organic thermoelectric active layer 3 should not exceed 1000 nm.
[0022] According to another embodiment (
[0023] The sensor according to yet another embodiment (
and electrical resistivity >15 Ω/square, to which the electrode one 2 is attached along its surface, which is opposite to the electrode one 2 surface to which the thermoelectric active layer 3 is deposited.
[0024] The UV/visible light/infrared radiation falling on the sensor heats up the electrode layer two 4 (
and Seebeck coefficient modulus is high
the generated thermal gradient is high enough to produce ample electric voltage by TE effect. The voltage further could be amplified with high performance amplifiers. As the thermoelectric active layer 3 has a thickness of less than 1 μm, the propagation of heat between the electrodes 2 and 4 is rapid, enabling the development of a high-bandwidth radiation sensor.
[0025]
[0026] The method for the manufacture of the high-bandwidth thermoelectric thin-film UV, visible light and infrared radiation sensor, comprising the following steps: (i) providing an electrode one 2 having an electrical resistance of less than 15 Ω/square; ii depositing a 100-1000 nm thick thermoelectric active layer 3 on the top of the electrode one 2 by thermal evaporation in vacuum; (iii) providing an electrode two 4 having an electrical resistance of less than 15 Ω/square, on top of the thermoelectric active layer 3 by physical vapour deposition in vacuum; and optional step of (iv) applying an absorption layer 5 on top of the electrode two 4.
[0027] According to another embodiment the method further comprises the step (i′) of providing a substrate 1 having a
and resistivity >15 Ω/square, the substrate 1 on which the electrode one 2 is deposited by physical vapour deposition along its surface, which is opposite to the electrode one 2 surface to which the thermoelectric active layer 3 is to be deposited or is deposited.
[0028] According to yet another embodiment the method further comprises the step (v) of applying an electrically non-conductive insulation layer of necessary shape on the electrode one 2 before step (ii) to define the conductive area of the electrode one 2.
[0029] In the manufacture of the sensor, thin-film technologies in vacuum are used. An electrode one 2 of the required shape (
[0030] When a thermally conductive and electrically conductive substrate 6 is used (
[0031] Examples of Implementation of the Invention
[0032] Table 1 provides a list of potentially suitable materials for sensor productions. Sensor could be made by various combinations of materials, but the main properties that organic thermoelectric materials should have are low thermal conductivity of formed thin film
and high Seebeck coefficient modulus
Preferred electrode material is copper due to its high thermal conductivity and relatively low cost.
TABLE-US-00001 TABLE 1 List of materials, that could be used to produce the sensor Electrode one Organic TE active layer Electrode two Aluminium Copper phthalocyanine Aluminium Cu Zinc phthalocyanine Cu Gold Other metal phthalocyanine derivatives Gold Silver Pentacene Silver Alloys Tetrathiotetracene Alloys Other polyacene derivatives Perylene derivatives
[0033] Some examples are detailed below. Example 1—sensor on electrically non-conducting substrate. The electrode layer one 2 consisting of Cr layer with a thickness of 10 nm and a Cu layer with a thickness of 190 nm is applied to the Si substrate 1. Cr is used to improve adhesion. A 500 nm thick tetrathiotetracene layer is applied over the electrode layer one 2 as the thermoelectric active layer 3. A 100 nm thick Cu electrode layer two 4 is applied above it.
[0034] Example 2—sensor on the conductive substrate. On the Cu substrate 6, an insulating layer 7 is formed from the photoresist SU-8 by a lithographic method. Above the exposed Cu layer, a 500 nm thick tetrathiotetracene layer is applied as the thermoelectric active layer 3. A 100 nm thick Cu electrode layer two 4 is applied above it.
[0035] The proposed sensor has a relatively simple design with operating principle (thermal gradient and electric voltage) in smallest dimension perpendicular to the thin film plane using organic TE active materials with low thermal conductivity. No buffer layer is required in these sensors where electric field is measured perpendicular to the plane of the thin film. Another and very important advantage of the invention over the sensors known to date is that it is possible to make a large-area sensor without reducing its high-bandwidth. Moreover, such a sensor is almost one order faster than the prior art ones due to the different voltage measurement direction.
SOURCES OF INFORMATION
[0036] [1] A. G. Kozlov, “Optimization of thin-film thermoelectric radiation sensor with comb thermoelectric transducer,” Sensors Actuators A Phys., vol. 75, no. 2, pp. 139-150, May 1999. [0037] [2] A. G. Kozlov, “Optimization of thin-film thermoelectric radiation sensor with separate disposition of absorbing layer and comb thermoelectric transducer,” Sensors Actuators A Phys., vol. 84, no. 3, pp. 259-269, September 2000. [0038] [3] L. M. Goncalves et al., “Fabrication of flexible thermoelectric microcoolers using planar thin-film technologies,”J. Micromechanics Microengineering, vol. 17, no. 7, pp. S168-S173, July 2007. [0039] [4] Z. Dashevsky, E. Rabih, V. Kasiyan, A. Halfin, and M. P. Dariel, “Development of thin film thermoelectric sensors for a wide spectral range in the MEMS configuration,” in 2006 25th International Conference on Thermoelectrics, 2006, pp. 180-183. [0040] [5] R. Lenggenhager, H. Baltes, and T. Elbel, “Thermoelectric infrared sensors in CMOS technology,” Sensors Actuators A Phys., vol. 37-38, no. C, pp. 216-220, June 1993. [0041] [6] D. Xu, Y. Wang, B. Xiong, and T. Li, “MEMS-based thermoelectric infrared sensors: A review,” Front. Mech. Eng., vol. 12, no. 4, pp. 557-566, 2017.