Method and apparatus for characterization of X-ray energy outputs of medical X-ray generators

Abstract

A method for continuously evaluating an X-ray unit. The method includes placing an X-ray sensor converter having a photo diode and a scintillation crystal in a path of an X-ray beam emitted by the X-ray unit, using the X-ray sensor converter to convert an X-ray beam energy into an electric signal, providing an amplifier connected to the X-ray sensor converter, conveying the electric signal from the X-ray sensor converter to the amplifier, amplifying the electric signal with the amplifier, and measuring a spectrum of the X-ray tube energy by continuously sampling and quantifying the amplified electric signal.

Claims

1. A method for continuously evaluating an X-ray unit, the method comprising the steps of: placing an X-ray sensor converter having a photo diode and a scintillation crystal in a path of an X-ray beam emitted by the X-ray unit; using the X-ray sensor converter to convert an X-ray beam energy into an electric signal; providing an amplifier connected to the X-ray sensor converter; conveying the electric signal from the X-ray sensor converter to the amplifier and amplifying the electric signal with the amplifier; measuring a spectrum of an energy emitted by the X-ray unit by continuously sampling and quantifying the amplified electric signal, said step of measuring the spectrum comprising presenting discrete values of the amplified electric signal as a continuous waveform over a predetermined period of time; displaying the results of the step of measuring the spectrum of the X-ray tube as a continuous graph representing the continuous waveform of variations of an X-ray voltage; and analyzing the continuous graph to determine a specific voltage emitted by the X-ray tube over a particular time interval.

2. The method according to claim 1, further comprising a step of evaluating performance of the X-ray tube using results of said step of analyzing the continuous graph.

3. The method according to claim 2, wherein said step of evaluating performance comprises detecting at least one of high voltage source and high voltage transformer malfunction, high voltage rectifier malfunction, thermal overload detector malfunction, pulse duration timer and automatic exposure control malfunction, tube malfunction and aluminum filter malfunction.

4. The method according to claim 3, further comprising issuing an emergency warning to an X-ray operator when one of said malfunctions is detected.

5. The method according to claim 1, further comprising a step of calculating a precise radiation exposure dosage for a particular patient using results of said step of analyzing the continuous graph.

6. A method for continuously evaluating an X-ray unit, the method comprising the steps of: placing an X-ray sensor converter having a photo diode and a scintillation crystal in a path of an X-ray beam emitted by the X-ray unit; using the X-ray sensor converter to convert an X-ray beam energy into an electric signal; providing an amplifier connected to the X-ray sensor converter; conveying the electric signal from the X-ray sensor converter to the amplifier and amplifying the electric signal with the amplifier; measuring a spectrum of an energy emitted by the X-ray unit by continuously sampling and quantifying the amplified electric signal; providing a unified statistical global monitoring system; and enabling said statistical global monitoring system to gather, store, compare, process, and report about a particular X-ray system malfunction on a global scale.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) The invention is illustrated by way of examples which are not a limitation, and the figures of the accompanying drawings in which references denote corresponding parts, and in which:

(2) FIG. 1 is a schematic diagram of characterization of X-Ray energy outputs; and

(3) FIG. 2 is the X-ray outputs graph.

DETAILED DESCRIPTION OF THE INVENTION

(4) As illustrated in the attached FIG. 1, an X-ray Sensor Converter XSC 10, having a Si-PIN photo diode PD and a Cesium Iodide (Thallium doped) scintillation crystal 12, is placed in the X-ray beam 14 emitting from an X-ray tube 16. The scintillation crystal 12 absorbs the energy of the X-ray beam and re-emits the absorbed energy in the form of light (i.e., photons), which is then converted by the photo diode PD into an electric signal (i.e., electrons) via the photoelectric effect. XSC 10 is thus used to digitize the spectrum emitted from the X-ray tube energy.

(5) The electric signal is then supplied from the XSC 10 to a high speed photodetector circuit HSPC 18. The HSPC 18 uses load resistance RL 20 to convert the electric signal from XSC 10 (with a reverse voltage applied) to a first voltage. A high speed operational amplifier is then utilized to amplify the first voltage. The signal carrying the amplified first voltage is then supplied to analog-to-digital converter ADC 22. In the preferred embodiment, the ADC 22 is a digital oscilloscope system, which includes a sampling module S/H 24 and a quantization module 26. The modules 24 and 26 convert a continuous physical quantity of X-ray energy, i.e., the signal voltage, to a digital number that represents the quantity's amplitude of this signal, which is then recorded by this digital oscilloscope system. The sampling performed by module 24 and quantization performed by module 26 of the ADC 22 allows the system of the present invention to record 1 mega-sample of tube energy per second, and, consequently, allows the Pkv to be registered in small incremental intervals of time (1 S). This digital oscilloscope system allows for the discrete voltage signals to be observed as a continuous waveform over a long period of time.

(6) Digital information obtained in this manner is then processed by a digital storage system DSS 28, which preferably includes at least one local database LDB 30, and stores the obtained digital information of X-ray tube energy signal (as a discrete-time signal) for a particular X-ray tube study, for example, on a digital media as a digital media file DMF 32.

(7) Typical sampling rates of X-ray outputs energy obtained using the method of the present invention are higher than can currently be recorded on a permanent medium, therefore DSS 28 preferably stores the obtained data on a solid state memory at a high sampling rate and then transfers it to a permanent memory later at a slower rate. This approach is necessary when sampling rates exceed 1 Msr/s. The sampling rates attainable with this approach are limited only by the speed of ADC 22.

(8) Data processing software DPS 32 reads data of each X-ray study from the digital media for further processing such as analyzing, reporting and issuing emergency warnings. Raw and analyzed data is preferably stored in the LDB 30. Thus, the intensity-time relationship of the x-ray beam for any particular individual X-ray unit can be retrieved and compared at any time. The x-ray waveform can then be observed to find a wide variety of problems present in the studied X-rays.

(9) Cloud storage provider and manager CSPM 34 connects the apparatus to the central database when internet connection is present (Wi-Fi or wired). It sends the data of a particular X-ray study to the central database and retrieves the previously stored records for any particular X-ray machine for general analysis via a general analysis system GAS 36.

(10) The big advantage of this method is that by analyzing a series of X-ray studies for the same X-ray machine, calculations of kVp accuracy and stability of individual x-ray unit during the entire lifetime of its operation can be achieved. Thus, the present method allows for a continuous study of a particular X-ray unit over a long period of time, rather than at a random discrete time period, generating a more accurate data of the radiation exposure at this particular unit.

(11) An X-Ray output oscilloscope is included in the present system to calibrate and troubleshoot any problems with X-ray generators.

(12) One of the advantages of the present system is that it can graphically and continuously show an output of a particular X-Ray unit, as shown, for example, in FIG. 2. Where a conventional kVp meter may show an average or a random kVp, the oscilloscope reveals a precise nature of the kVp, i.e., a continuously oscillating kVp. In other words, the present system measure a precise shaping and timing of the kVp pulse that is extremely important especially in an exposure determination.

(13) In accordance with the preferred embodiment, the system measures the following X-Ray parameters: peak kilovoltage (kVp); effective kV; mAs; exposure doses; dose rates; and exposure time. The system further records pulses and waveforms, test data and data analyses.

(14) The value of an x-ray tube kVp is the most critical determinant. A small variation in this variable will have a greater effect on the final radiographic or fluoroscopic image than will any equivalent variation in any of the other parameters such as tube current (mA), exposure time or target film distance. The x-ray intensity reaching the image receptor after the beam passes through the patient varies approximately as the fifth power of kVp. The kVp affects not only the intensity of the energy reaching the image receptor but also the subject contrast of the image.

(15) Variations between a specified (i.e., what the value of kVp is supposed to be for a particular unit) and an actual kVp occur for several reasons:

(16) The X-ray generator was not set properly upon installation;

(17) Excessive power line voltage drops;

(18) Tube current drifts have changed the voltage drop across the high voltage transformer secondarily. The tube voltage has changed even though the primary voltages have remained constant. (Line voltage compensator circuits must be set properly.)

(19) Component Failure.

(20) The system of the present invention provides a measurement of the peak electrical potential across the X-ray tube during its operation. The system measures and records kVp each time an X-ray energy is emitted. Thus, the system allows its operator to detect and analyze variations of the actual kVp value in real time, and to diagnose the underlying problems with the X-ray generator as they occur.

(21) The effective kV is the kV that will give the same contrast as a DC exposure with an ideal ripple, while the peak kV is the largest kV over the duration of the exposure.

(22) If the time values of exposure are correct and if the mA settings are within calibration limits, then exposures of the same mAs value should yield the same quality of radiograph, and the same cumulative exposure quantifications provided that there is the same patient's size. If the preceding test confirmed the correctness of the time values then the images of the step wedges should be the same for each exposure. This test may be done concurrently with the IVC above by exposing the step wedge with the top. High sensitivity of X-ray sensor of apparatus allows accurate measurement at electrical currents down to approximately 10 mA. Normal accuracy is obtained at 15 to 200 mA.

(23) Industry standards and some regulations use the concept of effective dose in which all the individual doses to the irradiated organs or parts of the body is multiplied by a factor and then added together. The resulting value may not exceed the dose limit for the effective dose that a patient is allowed to receive. Dose is a measure of the X-Ray intensity integrated for the entire X-Ray exposure time over the (8 mm8 mm) 64 mm.sup.2 area. The dose equivalent of a patient in the X-Ray beam, so far as body dose or effective dose, is the comprehensive dose for the organ or body. This can be estimated by deducing the area of the X-ray beam in mm.sup.2 as constant over the entire area.

(24) Since, measurements are very sensitive to the distance from the X-ray head (because the X-ray intensity change is proportional to the square of the distance from the X-ray head), the distance is subject to the initial conditions.

(25) To measure a dose, the beam must operate for a certain period of time. The dose rate represents the measured dose for the amount of time required to complete the dose measurement. The dose rate is equal to the measured dose mathematically scaled by exposure time and is given as mR and uGy per second. A measurement of the amount of radiation measured at a site over a specific period of time, produces the concept of dose. Not all the radiation particles generated during the x-ray are used to produce the resulting images, and because radiation can cause damage to the human body, medical personnel try to get the best possible image with the smallest possible dose of radiation. The concept of dose can mean different things according to the where and how the measurement is made, particularly with respect to the site where the dose is measured.

(26) Because the system of the present invention continuously measures the actual kVp of a particular X-ray tube, it produces a dose graph, which instantaneously shows an accurate dose for the entire X-ray exposure time.

(27) The output and beam quality are evaluated using a fixed and reproducible geometry. The actual output of an X-ray system may change over time as a result of component failure, absence of a required filter, drift from calibrated values or other causes. The beam quality test conducted by the present system verifies that the half-value layer is sufficient to reduce patient exposure to low-energy radiation and assures that filters, which may have been removed for mammography or tube inspection, are in place for normal radiography.

(28) This present system also measures the effective value of the maximum and peak accelerating voltage that occur during any part of the X-Ray exposure and reads and displays the peak effective value of the accelerating voltage (kVp effective) during the rest of the X-ray exposure.

(29) Accurate measurement and verification of the exposure time is very important, especially where an X-ray machine is not supplied with an AEC system (Automatic Exposure Control also called Photo Timing), or where the study of a patient is conducted without AEC X-ray exposures. The system of the present invention measures the exposure time each time an X-ray measurement is made and displays the exposure time in milliseconds (ms).

(30) The present system is also designed to accurately measure even short exposure times in order to minimize wear on the X-ray head and exposure to service personnel.

(31) Similarly, the present system is designed to accurately measure scattered radiation exposure by changing the sensitivity of the sensors to minimize potential X-ray exposure to service personnel. In this case, more than one device in various locations depending on the need can be used to determine and measure scattered radiation exposure.

(32) Some x-ray units, particularly older models take a relatively long time to reach peak exposure. In this case, the system also includes an auto waiting system for postponing the start of X-ray measurements.

(33) Recorded data is processed and reported in several aspects. In the preferred embodiment, the outputs of X-ray energy are represented in a graph where the X axis is time (mks) and the Y axis is kVp value.

(34) The analysis of the presented graph allows defining the following defects of the equipment:

(35) High voltage source and high voltage transformer;

(36) High voltage rectifier;

(37) Thermal overload detector;

(38) Pulse duration timer and Automatic exposure control (AEC);

(39) Tube Failure: X-ray tubes can fail in a number of different ways. Most tube failures occur as the result of thermal wear on the internal component parts. The wear usually develops over a period of time. However, an instantaneous load significantly above the tube rating can cause a tube to fail immediately. Common types of tube failure include worn rotor bearings, a cracked or pitted anode, gassing of the tube, and an open cathode filament; and

(40) Aluminum Filter Failure.

(41) In the preceding specification, the invention has been described with reference to specific exemplary embodiments thereof. It will however, be evident that various modifications and changes may be made thereto without departing from the broader spirit and scope of the invention as set forth in the claims that follow. The specification and drawings are accordingly to be regarded in an illustrative manner rather than a restrictive sense.