Tunable power amplifier with wide frequency range
10116270 ยท 2018-10-30
Assignee
Inventors
- Aritra Banerjee (Dallas, TX, US)
- Nathan R. Schemm (Rowlett, TX, US)
- Rahmi Hezar (Allen, TX)
- Lei Ding (Plano, TX)
- Baher Haroun (Allen, TX)
Cpc classification
H01G5/40
ELECTRICITY
H03F2203/21157
ELECTRICITY
H03F2200/111
ELECTRICITY
H03F2200/546
ELECTRICITY
H03F2200/537
ELECTRICITY
H01L2223/6655
ELECTRICITY
B81B2207/99
PERFORMING OPERATIONS; TRANSPORTING
B81B7/02
PERFORMING OPERATIONS; TRANSPORTING
H03F2200/378
ELECTRICITY
H03F2200/391
ELECTRICITY
H03F1/0294
ELECTRICITY
International classification
H03F1/02
ELECTRICITY
H03F1/56
ELECTRICITY
B81B7/02
PERFORMING OPERATIONS; TRANSPORTING
Abstract
A circuit includes an amplifier configured to amplify an input signal and generate an output signal. The circuit also includes a tuning network configured to tune frequency response of the amplifier. The tuning network includes at least one tunable capacitor, where the at least one tunable capacitor includes at least one micro-electro mechanical system (MEMS) capacitor. The amplifier could include a first die, the at least one MEMS capacitor could include a second die, and the first die and the second die could be integrated in a single package. The at least one MEMS capacitor could include a MEMS superstructure disposed over a control structure, where the control structure is configured to control the MEMS superstructure and tune the capacitance of the at least one MEMS capacitor.
Claims
1. A circuit comprising: an amplifier to amplify an input signal and generate an output signal; and a tuning network to tune a frequency response of the amplifier, the tuning network comprising at least one tunable microelectromechanical system (MEMS) capacitor, the at least one tunable MEMS capacitor comprising a MEMS superstructure disposed over a control structure, the control structure being arranged to control the MEMS superstructure and tune a capacitance of the at least one tunable MEMS capacitor, the control structure comprising an electrode, and the MEMS superstructure comprising at least one substantially planar membrane positioned parallel to the electrode.
2. The circuit as specified in claim 1, wherein: the amplifier comprises a first die; the at least one tunable MEMS capacitor comprises a second die; and the first die and the second die are integrated in a single package.
3. The circuit as specified in claim 1, wherein the control structure is arranged to electrostatically control a position of the MEMS superstructure.
4. The circuit as specified in claim 1, wherein the tuning network comprises multiple tunable MEMS capacitors.
5. A method comprising: amplifying an input signal and generating an output signal using an amplifier; and tuning a frequency response of the amplifier using a tuning network coupled to the amplifier, the tuning network comprising at least one tunable microelectromechanical system (MEMS) capacitor, the at least one tunable MEMS capacitor comprising a MEMS superstructure disposed over a control structure that controls the MEMS superstructure and tunes a capacitance of the at least one tunable MEMS capacitor, the control structure comprising an electrode, and the MEMS superstructure comprising at least one substantially planar membrane positioned parallel to the electrode.
6. The method as specified in claim 5, wherein: the amplifier comprises a first die; the at least one tunable MEMS capacitor comprises a second die; and the first die and the second die are integrated in a single package.
7. The method as specified in claim 5, wherein the control structure electrostatically controls a position of the MEMS superstructure.
8. The method as specified in claim 5, wherein the tuning network comprises multiple tunable MEMS capacitors.
9. A system comprising: an amplifier comprising first, second, third and fourth power amplifiers; and a tuning network comprising: first, second, third and fourth inductors coupled to the first, second, third and fourth power amplifiers, respectively; and first, second and third tunable capacitors each comprising a respective micro-electro mechanical system (MEMS) capacitor in a package with the amplifier, the first tunable capacitor being coupled to the first and second inductors, the second tunable capacitor being coupled to the third and fourth inductors, and the third tunable capacitor being coupled between the first and second tunable capacitors.
10. The system of claim 9, wherein the package has at least one metal layer, and the inductors comprise spiral inductors comprising the at least one metal layer.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) For a more complete understanding of this disclosure and its features, reference is now made to the following description, taken in conjunction with the accompanying drawings, in which:
(2)
(3)
(4)
(5)
DETAILED DESCRIPTION
(6)
(7) As noted above, a radio frequency (RF) power amplifier and its matching network are typically designed for operation at a fixed carrier frequency. Operations at other carrier frequencies or over a frequency range of interest can be problematic for conventional RF power amplifiers. In accordance with this disclosure, a power amplifier is provided on or over a die (such as a complementary metal-oxide-semiconductor or CMOS die) and integrated with tunable capacitors (such as micro-electro mechanical system or MEMS capacitors) and inductors in the same package. The MEMS capacitors are used to achieve higher amplifier performance and may be based on the DIGITAL LIGHT PROCESSING (DLP) technology from TEXAS INSTRUMENTS INC. of Dallas, Tex.
(8)
(9) As described in more detail below, one or multiple MEMS capacitors 10 are used in a power amplifier's tuning network. This is beneficial since MEMS capacitors provide high RF power handling capability, wide tuning ranges, and good RF performances such as high quality factor, small insertion loss and high linearity compared to varactor diodes or ordinary switched capacitor banks. MEMS capacitors can also be used in smaller packages. As particular examples, a tunable MEMS capacitor (array of MEMS capacitors 10) may have a tolerance of 0.1 pF, a Q>100 at 1 GHz, and a Q>50 at 2 GHz, and the linearity may be IIP3>75 dBm. These values can help to achieve superior performance of a power amplifier at these frequencies. For example, if the variable capacitor has a high insertion loss, then the power amplifier loses output power and efficiency degrades.
(10) In some implementations, the controller 18 provides digital levels of the control voltage V+ to individual MEMS capacitor 10 of a tunable capacitor array so that the capacitance can be set in steps. For example, in some implementations, the capacitance of a tunable MEMS capacitor array can be programmed and digitally tuned in 0.17 pF steps and have a range of 1 pF to 6.5 pF. Note, however, that other values and ranges can be provided as desired.
(11)
(12) As shown in
(13) Each of the power amplifiers P.sub.1-P.sub.4 represents any suitable type(s) of switching power amplifier(s), such as a class-D or class-E amplifier. Each of the inductors L.sub.1-L.sub.4 represents any suitable inductive structure having any suitable inductance. In some implementations, the inductors L.sub.1-L.sub.4 have substantially equal inductances. Each of the tunable capacitors C.sub.1-C.sub.2 and C.sub.out represents any suitable tunable capacitor(s), such as multiple MEMS capacitors 10 configured in parallel or other arrangement. In some implementations, the capacitors C.sub.1-C.sub.2 are tuned to have substantially equal capacitances. Note that each MEMS capacitor array forming the tunable capacitors C.sub.1-C.sub.2 and C.sub.out could have its own controller 18, or multiple MEMS capacitor arrays forming the tunable capacitors C.sub.1-C.sub.2 and C.sub.out could share a common controller 18. The load resistor R represents any suitable resistive structure having any suitable resistance.
(14)
(15) In addition, LC circuits tuned to specific harmonic frequencies can be connected between the drains of the cascode transistors N.sub.1 of differential sides for waveform shaping, and those capacitors are also built using MEMS and can be tuned over wide frequency range of interest. Inductors or capacitors can be connected between the drains of the cascode transistors N.sub.1 of S.sub.1 and S.sub.2 sides for improving back-off efficiency.
(16)
(17) Parameters and results of the high-power implementation of the power amplifier 20 are shown in
(18)
(19) Parameters and results of the low-power implementation of the power amplifier 20 are shown in
(20)
(21)
(22) Multiple MEMS modules 36 form each capacitor C.sub.1-C.sub.2, and one MEMS module 36 forms the capacitor C.sub.out. Each MEMS module 36 could include three tunable MEMS capacitor banks coupled in parallel. The MEMS modules 36 forming each capacitor C.sub.1-C.sub.2 are coupled in parallel so that all nine MEMS capacitor banks are coupled in parallel. Note, however, that the number of MEMS modules 36 and the number of MEMS capacitor banks in each MEMS module 36 are for illustration only. Each MEMS module 36 can include a semiconductor die that is separate from the die 22.
(23) In the illustrated example, the MEMS modules 36 are positioned on the upper surface 34 of the substrate 32 and are radially positioned around the CMOS die 22. A controller 18 may be provided for each MEMS module 36 to control the capacitance of that MEMS module 36, or a controller 18 could be provided in the package 30 to control the capacitance of multiple MEMS modules 36. In any case, each of the MEMS modules 36 can be digitally programmed by remote control signals provided to the package 30.
(24) The capacitor C.sub.out is positioned at a central portion of the package 30 between the two capacitors C.sub.1-C.sub.2, which are positioned at opposing ends of the package 30. The interconnects between the CMOS die 22, the inductors L.sub.1-L.sub.4, and the MEMS modules 36 can be formed by strip lines as the package 30 may operate at frequencies over 1 GHz. The CMOS die 22 is positioned in a central portion of the substrate 32 to help reduce or minimize distance, and thus associated parasitics, introduced by the interconnects between the CMOS die 22 and the tuning network formed by the inductors L.sub.1-L.sub.4 and the tunable capacitors C.sub.1-C.sub.2 and C.sub.out. Input terminals of the power amplifier 20 can be formed proximate the CMOS die 22 to reduce or minimize parasitics. The external control signals that program the capacitors C.sub.1-C.sub.2 and C.sub.out may be provided at any location on the package 30.
(25) In this example, three MEMS modules 36 form each MEMS capacitor C.sub.1-C.sub.2, and one MEMS module 36 forms the MEMS capacitor C.sub.out. Each MEMS capacitor C.sub.1-C.sub.2 is programmable, such as between 9 pF and 58.5 pF, and the MEMS capacitor C.sub.out is programmable, such as between 3 pF and 19.5 pF. Note, however, that other values could also be supported. Also, in other embodiments, more or fewer MEMS modules 36 may be used to form the programmable MEMS capacitors C.sub.1-C.sub.2 and C.sub.out of the power amplifier 20, where more MEMS modules 36 are used to create MEMS capacitors having a greater capacitance tuning range.
(26) Although
(27) It may be advantageous to set forth definitions of certain words and phrases used throughout this patent document. The terms include and comprise, as well as derivatives thereof, mean inclusion without limitation. The term or is inclusive, meaning and/or. The phrase associated with, as well as derivatives thereof, may mean to include, be included within, interconnect with, contain, be contained within, connect to or with, couple to or with, be communicable with, cooperate with, interleave, juxtapose, be proximate to, be bound to or with, have, have a property of, have a relationship to or with, or the like. The phrase at least one of, when used with a list of items, means that different combinations of one or more of the listed items may be used, and only one item in the list may be needed. For example, at least one of: A, B, and C includes any of the following combinations: A, B, C, A and B, A and C, B and C, and A and B and C.
(28) While this disclosure has described certain embodiments and generally associated methods, alterations and permutations of these embodiments and methods will be apparent to those skilled in the art. Accordingly, the above description of example embodiments does not define or constrain this disclosure. Other changes, substitutions, and alterations are also possible without departing from the spirit and scope of this disclosure, as defined by the following claims.