Non-circular aperture reflective imager
10107682 ยท 2018-10-23
Assignee
Inventors
Cpc classification
G01J3/021
PHYSICS
G02B17/0636
PHYSICS
G02B17/0615
PHYSICS
G02B17/008
PHYSICS
International classification
Abstract
Reflective imager sub-systems that have a non-circular entrance pupil and provide substantially increased throughput to a detecting component of a system are disclosed.
Claims
1. An optical system comprising: an entrance pupil, said entrance pupil having a substantially non-circular shape, said entrance pupil being hereinafter referred to as a non-circular entrance pupil; and an optical system having at least one reflective optical element, said optical system being configured to receive electromagnetic radiation received from the non-circular entrance pupil, said optical system being configured to image electromagnetic radiation from the entrance pupil onto an image plane; said optical system having at least one optical element having an aperture that is an off-axis section; said entrance pupil having a first physical size in a first plane containing said off-axis section; said entrance pupil having a second physical size in a second plan that is perpendicular to said first plane; and said second physical size being larger than said first physical size.
2. The optical system of claim 1 wherein said entrance pupil is elliptical in shape.
3. The optical system of claim 1 further comprising at least one detecting element located substantially at the image plane.
4. An optical system comprising: an entrance pupil, said entrance pupil having a substantially non-circular shape, said entrance pupil being hereinafter referred to as a non-circular entrance pupil; and a first optical sub-system having at least one reflective optical element, said first optical sub-system being configured to receive electromagnetic radiation from the non-circular entrance pupil, said first optical sub-system being substantially afocal, and said first optical sub-system configured to collimate electromagnetic radiation received from the entrance pupil onto an exit pupil; said first optical sub-system having at least one optical element having an aperture that is an off-axis section; said entrance pupil having a first physical size in first plane containing said off-axis section; said entrance pupil having a second physical size in a second plane that is perpendicular to said first plane; and said second physical size being larger than said first physical size.
5. The optical system of claim 4 wherein said entrance pupil is elliptical in shape.
6. The optical system of claim 4 further comprising a second optical sub-system, said second optical sub-system being optically disposed to receive electromagnetic radiation from said first optical sub-system.
7. The optical system of claim 6 wherein said second optical sub-system is a multispectral imaging system.
8. The optical system of claim 6 wherein said second optical sub-system is a hyperspectral imaging system.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION
(4) Reflective imager components that provide substantially increased throughput to a detecting component of a system are disclosed hereinbelow.
(5) The following detailed description presents the currently contemplated modes of carrying out the teachings. The description is not to be taken in a limiting sense, but is made merely for the purpose of illustrating the general principles of the teachings, since the scope of the teachings is best defined by the appended claims.
(6) As used herein, the singular forms a, an, and the include the plural reference unless the context clearly dictates otherwise.
(7) In some optical systems, it is often desirable for the imager component of the system to provide substantially increased throughput to the detecting component of the system. This can sometimes be difficult to achieve, particularly for reflective imagers, as a result of the obscuring nature of reflective systems as well as tradeoffs in size, spatial resolution, and other considerations.
(8) For example, consider some applications of imaging sensors in which it is desirable to have a fine spatial resolution on the ground while simultaneously collecting as much imagery in as short a time as possible. Additionally, line scanning imagers, multispectral imagers, or hyperspectral imagers, which can have separate resolution requirements in the two orthogonal spatial dimensions, typically referred to as across-slit and along-slit dimensions, can benefit from an increased throughput and spatial resolution in one dimension over the other.
(9) Additionally, the aperture size, or optical speed, of many typical off-axis reflective imaging systems are limited by the folding or packaging of the mirrors to avoid obscuration of the light. However, in the dimension orthogonal to the direction of folding, these limitations can be substantially relaxed. By increasing the aperture in this orthogonal direction, the overall throughput of the sensor can be significantly increased, and the resolution of the optical system can be increased in this same dimension. The non-circular aperture reflective imager of the disclosed teachings provides a compact imager consistent with meeting these requirements.
(10) Reference is made to
(11) Reference is made to
(12) Reference is made to
(13) The embodiment of the present teachings 100 illustrated in
(14) For example, the embodiment of the present teachings 100 used as the fore-optics of a slit-based spectrometer could provide for an increased spatial resolution in the along-slit dimension where the larger dimension of the non-circular aperture is substantially parallel to the along-slit dimension. This would also provide a substantially larger throughput to the spectrometer that would result in an overall increase in its sensitivity.
(15) Reference is made to
(16) Reference is made to
(17) The embodiment of the present teachings 200 illustrated in
(18) For example, the embodiment of the present teachings 100 used as the fore-optics of a second optical sub-system, such as a slit-based spectrometer, could provide for an increased spatial resolution in the along-slit dimension where the larger dimension of the non-circular aperture is substantially parallel to the along-slit dimension (see
(19) Any number of optical elements, reflective or refractive, can be used in the embodiments of the present teachings, and the non-circular entrance pupil shape can be any shape other than circular, including but not limited to, elliptical and rectangular shapes.
(20) For the purposes of describing and defining the present teachings, it is noted that the term substantially is utilized herein to represent the inherent degree of uncertainty that may be attributed to any quantitative comparison, value, measurement, or other representation. The term substantially is also utilized herein to represent the degree by which a quantitative representation may vary from a stated reference without resulting in a change in the basic function of the subject matter at issue. When used in regard to angular relationships which would require an exact determination, a feat not achievable in practice due to measurement inaccuracies, one skilled in the art would know that the accuracy required may depend on the size of the system and would be able to determine the required accuracy.
(21) Although the teachings have been described with respect to various embodiments, it should be realized these teachings are also capable of a wide variety of further and other embodiments within the spirit and scope of the appended claims.