ADVANCED WARNING FOR SOLAR FLARES FROM PHOTOSPHERE IMAGE ANALYSIS
20220365243 · 2022-11-17
Inventors
Cpc classification
G06V20/46
PHYSICS
G06V10/25
PHYSICS
G06V10/28
PHYSICS
International classification
G06V10/25
PHYSICS
G06V10/50
PHYSICS
Abstract
A method for quantifying disorder and extracting a corresponding numerical value of an order parameter from contrast analysis applied to optical images acquired of the solar photosphere. Temporal variation of the order parameter may be utilized to predict events such as solar flares, which have the ability to disrupt both communication systems and satellite orbits. The degree of order of the photosphere may be monitored to predict solar flares and other solar events. The method may utilize a spin-based (Ising/Potts) model of disorder.
Claims
1. A method of predicting solar events, the method comprising: repeatedly extracting numerical values corresponding to an order parameter from a plurality of sets of solar atmosphere data measured over time; predicting a solar event if a change in the extracted numerical values satisfies prediction criteria.
2. The method of claim 1, wherein: the prediction criteria comprises a predefined increase in numerical values corresponding to the order parameter.
3. The method of claim 2, wherein: the prediction criteria comprises a predefined increase in numerical values corresponding to the order parameter over a predefined interval of time.
4. The method of claim 3, wherein: the plurality of sets of solar atmosphere data comprise images of the Sun; and the numerical values corresponding to order parameter are extracted from a series of images of the Sun.
5. The method of claim 4, wherein: at least some of the images of the Sun include bright regions and dark regions; and including: extracting the numerical values corresponding to order parameter comprises thresholding the images of the Sun to determine an area of the bright regions; and including: selecting regions of interest of the images of the Sun; and determining a squared order parameter value (S.sup.2) by calculating a ratio of the area of the bright regions to a total area of the regions of interest of each image of the Sun.
6. The method of claim 5, wherein: thresholding the images of the Sun includes converting the images to greyscale images; and including: calculating a pixel intensity histogram for each of the greyscale images; fitting the pixel intensity histogram with first and second curves that sum to an overall curve fit of the pixel intensity histogram, wherein the first and second curves represent pixel intensity distributions from disordered and ordered regions, respectively, and wherein a higher one of the first and second curves has a peak that is higher than the other of the first and second curves; determining an intersection of the first and second curves; determining a distance comprising a number of standard deviations that the intersection is away from the peak of the higher one of the first and second curves; setting a threshold to a value of a highest center point value of the higher one of the first and second curves less the floor of that number of standard deviations; performing a binary threshold on each greyscale image to form a binary image; and calculating an order parameter squared (S.sup.2) value for each greyscale image by counting the number of bright pixels in the binary image and dividing the number of bright pixels in the binary image by the total number of pixels contained in each greyscale image.
7. The method of claim 6, including: selecting a region of interest prior to calculating a pixel intensity histogram; and wherein: the pixel intensity histogram is calculated for the region of interest; and the S.sup.2 value is calculated for the region of interest.
8. The method of claim 3, wherein: the predefined increase in numerical values corresponding to order parameter comprises an increase of at least 5% over a period of 30 minutes or less.
9. The method of claim 3, wherein: the predefined increase in numerical values corresponding to order parameter comprises an increase of at least 0.04.
10. The method of claim 1, wherein: the numerical values corresponding to order parameter comprise a squared order parameter (S.sup.2).
11. The method of claim 10, including: fitting a curve to the S.sup.2 values, wherein the curve comprises S.sup.2 values over time; and wherein: the prediction criteria comprises a slope in the curve that meets or exceeds a predefined slope.
12. The method of claim 1, wherein: the photosphere data comprises frames from a solar photosphere movie.
13. The method of claim 1, wherein: the image data comprises frames from a movie comprising a sequence of images of a specific layer of the solar atmosphere.
14. The method of claim 1, including: utilizing a computer to repeatedly extract numerical values corresponding to an order parameter from a plurality of sets of solar atmosphere data measured over time; utilizing a computer to predict a solar event if a change in the extracted numerical values satisfies prediction criteria.
15. A computer-implemented method of predicting solar events, the method comprising: utilizing a computer to repeatedly extract numerical values corresponding to an order parameter from sets of digital solar atmosphere data measured over time; utilizing a computer to predict a solar event if a change in the extracted numerical values satisfies prediction criteria.
16. The method of claim 15, wherein: the prediction criteria comprises a predefined increase in numerical values corresponding to the order parameter.
17. The method of claim 16, wherein: the prediction criteria comprises a predefined increase in numerical values corresponding to the order parameter over a predefined interval of time.
18. The method of claim 3, wherein: the sets of solar atmosphere data comprise digital images of the Sun; and the numerical values corresponding to order parameter are extracted from a series of digital images of the Sun utilizing a computer.
19. The method of claim 4, wherein: at least some of the digital images of the Sun include bright regions and dark regions; and including: extracting the numerical values corresponding to order parameter comprises utilizing a computer to threshold the digital images of the Sun to determine an area of the bright regions; and including: selecting regions of interest of the digital images of the Sun; and utilizing a computer to determine a squared order parameter value (S.sup.2) by calculating, using a computer, a ratio of the area of the bright regions to a total area of the regions of interest of each digital image of the Sun.
20. The method of claim 19, wherein: thresholding the digital images of the Sun includes utilizing a computer to convert the digital images to greyscale digital images; and including: utilizing a computer to calculate a pixel intensity histogram for each of the greyscale images; utilizing a computer to fit the pixel intensity histogram with first and second curves that sum to an overall curve fit of the pixel intensity histogram, wherein the first and second curves represent pixel intensity distributions from disordered and ordered regions, respectively, and wherein a higher one of the first and second curves has a peak that is higher than the other of the first and second curves; utilizing a computer to determine an intersection of the first and second curves; utilizing a computer to determine a distance comprising a number of standard deviations that the intersection is away from the peak of the higher one of the first and second curves; utilizing a computer to set a threshold to a value of a highest center point value of the higher one of the first and second curves less the floor of that number of standard deviations; utilizing a computer to perform a binary threshold on each greyscale digital image to form a binary digital image; and calculating an order parameter squared (S.sup.2) value for each greyscale digital image by counting the number of bright pixels in the binary digital image and dividing the number of bright pixels by the total number of pixels contained in each greyscale digital image.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0011] The patent or application file contains at least one drawing executed in color. Copies of this patent or patent application publication with color drawing(s) will be provided by the Office upon request and payment of the necessary fee.
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DETAILED DESCRIPTION
[0025] It is to be understood that the processes described herein may assume various alternative step sequences, except where expressly specified to the contrary. It is also to be understood that the specific data and processes illustrated in the attached drawings, and described in the following specification, are simply exemplary embodiments of the inventive concepts defined in the appended claims. Hence, specific dimensions and other physical characteristics relating to the embodiments disclosed herein are not to be considered as limiting, unless the claims expressly state otherwise.
[0026] Known spin-based models of disorder (e.g., Ising/Potts models) and its corresponding quantitative measure have been utilized in various contexts. The present disclosure involves quantifying the order parameter of the photosphere of the Sun. The degree of order (e.g., the squared order parameter (S.sup.2) of the solar atmosphere) may be monitored to predict solar flares and other significant solar events.
[0027] In modeling disorder in the Sun's photosphere, hydrogen (H) and helium (He) atoms present in the photosphere represent the two “spins” in the Ising model. Other elements may be present in the photosphere, and they may be included in a model according to the present disclosure by adding each element as an additional spin. In general, this does not result in changes or errors in the extraction of the order parameter (S.sup.2) from the data.
[0028] As discussed in more detail below, the squared order parameter (S.sup.2) can be extracted from solar atmosphere images by thresholding image data into dark and bright regions (areas), followed by dividing the number of bright pixels by the total number of pixels within a region of interest. As also discussed in more detail below, a disorder analysis, according to the present disclosure, may be accomplished by software that is capable of performing near real-time, semi-automated image analysis from streaming or “live” sources. In one example (
[0029] With further reference to
[0030] The portion of
[0031] This process may be utilized to provide/generate an early warning to protect critical communication systems and power grids. Warnings are currently performed in the case of solar flares through “weather” modeling, which may not be sufficiently accurate. A disorder-based analysis, according to the present disclosure, may provide approximately one hour of warning, which may be sufficient to issue a protective directive to earth-orbiting satellites, other space probes in the solar system, and earth-based power grids, thereby reducing the disruption that otherwise occurs during a solar flare event. The disorder analysis may also be utilized to predict types of solar events or eruptions such as Coronal Mass Ejections (“CME”), which take longer to travel to earth, but may also be extremely disruptive.
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[0033] In general, an image will include bright regions and dark regions, and the squared order parameter (S.sup.2) value of a sample is equal to the percentage of bright regions to the total image area. The bright and dark areas corresponding to the ordered and disordered regions, respectively, can be determined by thresholding the image near the average pixel intensity of the bright regions. This pixel value can be found by fitting the pixel intensity histogram with two curves representing the pixel intensity distribution from the disordered and ordered regions. The image threshold is generally chosen at the peak of the curve in
[0034]
[0035] In the examples discussed above, changes in squared order parameter (S.sup.2) sufficient to predict a solar flare occurred approximately one hour before the solar flares. However, it may be possible to predict solar flares more than an hour prior to the solar flare utilizing measurements and calculations of the order parameter according to other aspects of the present disclosure. Also, the information extracted from squared order parameter (S.sup.2) analysis of the full disk and smaller area images of the Sun can also provide information that could be used to enhance modeling of solar dynamics. For example, a “heatmap” type plot of squared order parameter (S.sup.2) can be generated from an image, including a full disk image, by dividing the thresholded image into a two-dimensional mesh of equal area triangles. The squared order parameter (S.sup.2) value of each region can then be calculated by taking the fraction of bright pixels to the total number of pixels within the segment to produce a map of squared order parameter (S.sup.2) across the image.
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and the potential energy associated with ordering is ½kS.sup.2, where m and k are constants related to the characteristics of disorder within the system. Adding in a damping force that is proportional to order parameter (S), a simple damped harmonic oscillator Lagrangian of the form =(T−U)e.sup.αt can be constructed in terms of order parameter (S), specifically:
[0037] The oscillations seen in the order parameter (S) plot in
[0038] The ability to extract a value for the order parameter of the solar atmosphere may provide several advantages. Previous work has demonstrated that the order parameter can be related to specific system properties when those properties are dominated by pair interactions (see, e.g., Makin, R. A. et al., “Alloy-free band gap tuning across the visible spectrum,” Physical Review Letters 122, 256403, 2019; and Makin, R. A. et al., Revisiting semiconductor band gaps through structural motifs: An Ising model perspective,” Physical Review B 102, 115202, 2020). In the case of semiconductors, one such property is the band gap energy of the material, which exhibits a linear relationship with squared order parameter (S.sup.2). Using a cluster expansion up to pair-wise terms along with a spin-based representation of the system, such as the Ising-model, a system level property P can be expressed in terms of squared order parameter (S.sup.2) as:
P(x, S)=S.sup.2[P(0.5,1)−P(x, 0)]+P(x, 0) (2)
[0039] In the context of the solar atmosphere, the mean polar field strength appears to exhibit a linear relationship with squared order parameter (S.sup.2) as predicted by Eq. 2. For example,
[0040] For contiguous time periods of approximately one year in length, the measured mean polar field strength values all lie on the same S.sup.2 line—highlighted for three such time periods in
[0041] With reference to
[0042] The process 10 further includes calculating a pixel intensity histogram of the selected region (see, e.g.,
[0043] At step 24, a root-finding algorithm (e.g., Newton's method) is used to find the) standard deviations that the intersection is away from the curve where the highest center point is calculated. The threshold value is set to the value of the highest center point value minus the floor of that number of standard deviations.
[0044] At step 28, a binary threshold is performed on the region of interest in the image using the threshold calculated in step 26. An example of the results of thresholding are shown in
[0045] Although only a few embodiments of the present innovations have been described in detail in this disclosure, those skilled in the art who review this disclosure will readily appreciate that many modifications are possible (e.g., variations in the process used to extract order parameter (S) and squared order parameter (S.sup.2), the order of the steps, values of parameters, use of colors, orientations, etc.) without materially departing from the novel teachings and advantages of the subject matter recited. Also, as used herein, the term “order parameter” may generally refer to the order parameter (S), order parameter (S.sup.2), and/or other variables or values that incorporate or relate to the order parameter as described herein.
[0046] It will be understood that any described processes or steps within described processes may be combined with other disclosed processes or steps within the scope of the present device. The exemplary processes disclosed herein are for illustrative purposes and are not to be construed as limiting.
[0047] The above description is considered that of the illustrated embodiments only. Modifications of the process will occur to those skilled in the art and to those who use the process. Therefore, it is understood that the embodiments shown in the drawings and described above are merely for illustrative purposes and not intended to limit the scope of the invention, which is defined by the following claims as interpreted according to the principles of patent law, including the Doctrine of Equivalents.