METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR GROWTH DEVICE
20240327980 ยท 2024-10-03
Inventors
Cpc classification
C23C16/45561
CHEMISTRY; METALLURGY
C23C16/45512
CHEMISTRY; METALLURGY
C23C16/45587
CHEMISTRY; METALLURGY
C23C16/52
CHEMISTRY; METALLURGY
H01L21/0262
ELECTRICITY
International classification
C23C16/455
CHEMISTRY; METALLURGY
C23C16/52
CHEMISTRY; METALLURGY
Abstract
The present application provides a method for a manufacturing semiconductor structure and a semiconductor growth device. The semiconductor growth device includes: a reaction chamber; a growth main pipe, where an end of the growth main pipe is connected to the reaction chamber; a vent main pipe; a first mixing main pipe to an M.sup.th mixing main pipe, where M is an integer greater than or equal to 1; a first reaction gas source group to an N.sup.th reaction gas source group, where N is an integer greater than or equal to 2; a first switching valve group to an N.sup.th switching valve group, where a k.sup.th switching valve group is adapted for controlling transport of gas from a k.sup.th reaction gas source group to a j.sup.th mixing main pipe, k is an integer greater than or equal to 1 and less than or equal to N, and j is an integer greater than or equal to 1 and less than or equal to M; and a first growth vent switching valve to an M.sup.th growth vent switching valve, where a j.sup.th growth vent switching valve is adapted for switching the gas in the j.sup.th mixing main pipe to be transported to the growth main pipe or the vent main pipe. The use of the semiconductor growth device helps to improve the steepness of an interface in a growth process of a semiconductor structure.
Claims
1. A semiconductor growth device, comprising: a reaction chamber; a growth main pipe, where an end of the growth main pipe is connected to the reaction chamber; a vent main pipe; a first mixing main pipe to an M.sup.th mixing main pipe, where M is an integer greater than or equal to 1; a first reaction gas source group to an N.sup.th reaction gas source group, where N is an integer greater than or equal to 2; a first switching valve group to an N.sup.th switching valve group, where a k.sup.th switching valve group is adapted for controlling transport of gas from a k.sup.th reaction gas source group to a j.sup.th mixing main pipe, k is an integer greater than or equal to 1 and less than or equal to N, and j is an integer greater than or equal to 1 and less than or equal to M; and a first growth vent switching valve to an M.sup.th growth vent switching valve, where a j.sup.th growth vent switching valve is adapted for switching the gas in the j.sup.th mixing main pipe to be transported to the growth main pipe or the vent main pipe.
2. The semiconductor growth device according to claim 1, where M is equal to 1; and the k.sup.th switching valve group is adapted for switching the gas in the k.sup.th reaction gas source group to be transported to the first mixing main pipe or the vent main pipe.
3. The semiconductor growth device according to claim 2, further including: a first mixing branch pipe group to an N.sup.th mixing branch pipe group, where the first mixing branch pipe group to the N.sup.th mixing branch pipe group are all connected to the first mixing main pipe; a first gas source connection pipe group to an N.sup.th gas source connection pipe group, where a k.sup.th gas source connection pipe group is connected to the k.sup.th reaction gas source group; and a first vent branch pipe group to an N.sup.th vent branch pipe group, where the k.sup.th switching valve group is adapted for switching gas in the k.sup.th gas source connection pipe group to be transported to a k.sup.th mixing branch pipe group or a k.sup.th vent branch pipe group.
4. The semiconductor growth device according to claim 3, where the k.sup.th mixing branch pipe group includes a first k.sup.th sub-mixing branch pipe to a Q.sub.k.sup.th k.sup.th sub-mixing branch pipe; a k.sup.th vent branch pipe group includes the first k.sup.th sub-vent branch pipe to a Q.sub.k.sup.th k.sup.th sub-vent branch pipe; a k.sup.th gas source connection pipe group includes the first k.sup.th sub-gas source connection pipe to a Q.sub.k.sup.th k.sup.th sub-gas source connection pipe; and a k.sup.th switching valve group includes the first k.sup.th sub-switching valve to a Q.sub.k.sup.th k.sup.th sub-switching valve; and a q.sub.k.sup.th k.sup.th sub-switching valve is adapted for switching gas in a q.sub.k.sup.th k.sup.th sub-gas source connection pipe to be transported to a q.sub.k.sup.th k.sup.th sub-mixing branch pipe or a q.sub.k.sup.th k.sup.th sub-vent branch pipe, where q.sub.k is an integer greater than or equal to 1 and less than or equal to Q.sub.k.
5. The semiconductor growth device according to claim 1, where M is greater than or equal to 2, and M is less than or equal to N; and the k.sup.th switching valve group is adapted for switching the gas in the k.sup.th reaction gas source group to be transported to the j.sup.th mixing main pipe or the vent main pipe.
6. The semiconductor growth device according to claim 5, further including: a first mixing branch pipe group to an N.sup.th mixing branch pipe group, where a k.sup.th mixing branch pipe group includes Q.sub.k*M k.sup.th sub-mixing branch pipes, an (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe to an (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe are respectively correspondingly connected with the first mixing main pipe to the M.sup.th mixing main pipe, and q.sub.k is an integer greater than or equal to 1 and less than or equal to Q.sub.k; a k.sup.th vent branch pipe group includes a first k.sup.th sub-vent branch pipe to a Q.sub.k.sup.th k.sup.th sub-vent branch pipe; and the k.sup.th switching valve group includes a first k.sup.th sub-switching valve to a Q.sub.k.sup.th k.sup.th sub-switching valve; and a q.sub.k.sup.th k.sup.th sub-switching valve is adapted for switching gas in a q.sub.k.sup.th k.sup.th sub-reaction gas source to be transported to any k.sup.th sub-mixing branch pipe in the (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe to the (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe or transported to a q.sub.k.sup.th k.sup.th sub-vent branch pipe.
7. The semiconductor growth device according to claim 6, further including: a first gas source connection pipe group to an N.sup.th gas source connection pipe group, where a k.sup.th gas source connection pipe group includes a first k.sup.th sub-gas source connection pipe to a Q.sub.k.sup.th k.sup.th sub-gas source connection pipe, and a q.sub.k.sup.th k.sup.th sub-gas source connection pipe is connected to the q.sub.k.sup.th k.sup.th sub-reaction gas source; and the q.sub.k.sup.th k.sup.th sub-switching valve is adapted for switching gas in the q.sub.k.sup.th k.sup.th sub-gas source connection pipe to be transported to any k.sup.th sub-mixing branch pipe in the (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe to the (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe or transported to the q.sub.k.sup.th k.sup.th sub-vent branch pipe.
8. The semiconductor growth device according to any one of claims 1 to 7, further including: a first growth connection pipe to an M.sup.th growth connection pipe, where the first growth connection pipe to the M.sup.th growth connection pipe are all connected to the growth main pipe; and a first vent connection pipe to an M.sup.th vent connection pipe, where the first vent connection pipe to the M.sup.th vent connection pipe are all connected to the vent main pipe, where the j.sup.th growth vent switching valve is adapted for switching the gas in the j.sup.th mixing main pipe to be transported to a j.sup.th growth connection pipe or a j.sup.th vent connection pipe.
9. The semiconductor growth device according to claim 1, where the semiconductor growth device includes a metal organic chemical vapor deposition device.
10. A method for manufacturing a semiconductor structure, using the semiconductor growth device according to any one of claims 1 to 9, and including: controlling, by a k.sub.1.sup.th switching valve group, transport of gas from a k.sub.1.sup.th reaction gas source group to a j.sub.1.sup.th mixing main pipe, where the j.sub.1.sup.th mixing main pipe contains a k.sub.1.sup.th reaction mixed gas, and k.sub.1 is an integer greater than or equal to 1 and less than or equal to N; switching, by a j.sub.1.sup.th growth vent switching valve, the k.sub.1.sup.th reaction mixed gas in the j.sub.1.sup.th mixing main pipe to be transported to a growth main pipe; after the switching, by a j.sub.1.sup.th growth vent switching valve, the k.sub.1.sup.th reaction mixed gas in the j.sub.1.sup.th mixing main pipe to be transported to a growth main pipe, switching all of first to M.sup.th growth vent switching valves to be in communication with a vent main pipe to perform growth interruption in a reaction chamber; controlling, by a k.sub.2.sup.th switching valve group, transport of gas from a k.sub.2.sup.th reaction gas source group to a j.sub.2.sup.th mixing main pipe, where the j.sub.2.sup.th mixing main pipe contains a k.sub.2.sup.th reaction mixed gas, k.sub.2 is an integer greater than or equal to 1 and less than or equal to N, k.sub.2 is not equal to k.sub.1, and j.sub.2 is equal or not equal to j.sub.1; and after the growth interruption, switching, by a j.sub.2.sup.th growth vent switching valve, the k.sub.2.sup.th reaction mixed gas in the j.sub.2.sup.th mixing main pipe to be transported to the growth main pipe.
11. The method for manufacturing a semiconductor structure according to claim 10, where M is equal to 1; and the step of controlling, by a k.sub.1.sup.th switching valve group, transport of gas from a k.sub.1.sup.th reaction gas source group to a j.sub.1.sup.th mixing main pipe is: controlling, by the k.sub.1.sup.th switching valve group, transport of the gas from the k.sub.1.sup.th reaction gas source group to the first mixing main pipe; the step of switching, by a j.sub.1.sup.th growth vent switching valve, the k.sub.1.sup.th reaction mixed gas in the j.sub.1.sup.th mixing main pipe to be transported to a growth main pipe is: switching, by the first growth vent switching valve, the k.sub.1.sup.th reaction mixed gas in the first mixing main pipe to be transported to the growth main pipe; and during the growth interruption or after the growth interruption, controlling, by the k.sub.2.sup.th switching valve group, transport of the gas from the k.sub.2.sup.th reaction gas source group to the j.sub.2.sup.th mixing main pipe; the step of controlling, by a k.sub.2.sup.th switching valve group, transport of gas from a k.sub.2.sup.th reaction gas source group to a j.sub.2.sup.th mixing main pipe is: controlling, by the k.sub.2.sup.th switching valve group, transport of the gas from the k.sub.2.sup.th reaction gas source group to the first mixing main pipe; and the step of switching, by a j.sub.2.sup.th growth vent switching valve, the k.sub.2.sup.th reaction mixed gas in the j.sub.2.sup.th mixing main pipe to be transported to the growth main pipe is: switching, by the first growth vent switching valve, the k.sub.2.sup.th reaction mixed gas in the first mixing main pipe to be transported to the growth main pipe.
12. The method for manufacturing a semiconductor structure according to claim 10, where M is greater than or equal to 2, and M is equal to N; and j.sub.2 is not equal to j.sub.1, k.sub.1 is equal to j.sub.1, and k.sub.2 is equal to j.sub.2.
13. The method for manufacturing a semiconductor structure according to claim 10, where M is greater than or equal to 2, and M is less than N; and the method further includes: before or after the controlling, by a k.sub.1.sup.th switching valve group, transport of gas from a k.sub.1.sup.th reaction gas source group to a j.sub.1.sup.th mixing main pipe, controlling, by a k.sub.3.sup.th switching valve group, transport of gas from a k.sub.3.sup.th reaction gas source group to a j.sub.3.sup.th mixing main pipe, where the j.sub.3.sup.th mixing main pipe contains a k.sub.3.sup.th reaction mixed gas; and switching, by a j.sub.3.sup.th growth vent switching valve, the k.sub.3.sup.th reaction mixed gas in the j.sub.3.sup.th mixing main pipe to be transported to the growth main pipe, where j.sub.3 is equal to j.sub.1; or, before or after the controlling, by a k.sub.2.sup.th switching valve group, transport of gas from a k.sub.2.sup.th reaction gas source group to a j.sub.2.sup.th mixing main pipe, controlling, by a k.sub.3.sup.th switching valve group, transport of gas from a k.sub.3.sup.th reaction gas source group to a j.sub.3.sup.th mixing main pipe, where the j.sub.3.sup.th mixing main pipe contains a k.sub.3.sup.th reaction mixed gas; and switching, by a j.sub.3.sup.th growth vent switching valve, the k.sub.3.sup.th reaction mixed gas in the j.sub.3.sup.th mixing main pipe to be transported to the growth main pipe, where j.sub.3 is equal to j.sub.2, k.sub.3 is an integer greater than or equal to 1 and less than or equal to N, and k.sub.3 is not equal to k.sub.1 and is not equal to k.sub.2.
14. The method for manufacturing a semiconductor structure according to claim 10, where a duration of the growth interruption ranges from 1 second to 10 seconds.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0022] To describe the technical solutions in specific embodiments of the present application or the prior art more clearly, the following briefly introduces the accompanying drawings required for describing the specific embodiments or the prior art. Apparently, the accompanying drawings in the following description show some embodiments of the present application, and a person of ordinary skill in the art may still derive other drawings from these accompanying drawings without creative efforts.
[0023]
[0024]
[0025]
[0026]
[0027]
[0028]
DETAILED DESCRIPTION
[0029] There are multiple reasons for the poor steepness of a heterogeneous interface grown by MOCVD, including the interdiffusion of components caused by a high growth temperature, the retention of a residual material at a boundary layer, inconsistent time of introducing source materials, inconsistent decomposition temperatures of source materials, and the like.
[0030] The growth of InGaAs/AlGaAs superlattices is used as an example. TMGa_1 (a first-way TMGa source) and trimethylindium (TMIn) are used as a group-III source for InGaAs, and trimethylaluminum (TMAl) and TMGa_2 (a second-way TMGa source) are used as a group-III source for AlGaAs, AsH3 is used as a group-V source for both, and the flow rate of AsH3 is kept constant in a growth process.
[0031] In an actual growth process, when the growth is switched from InGaAs to AlGaAs or from AlGaAs to InGaAs, there are interference of several factors, resulting in a non-steep InGaAs/AlGaAs heterogeneous interface.
[0032] One of the important factors is the asynchrony of the switching of the group-III sources. In an optimal case, the switching of the group-III sources needs to be synchronous. That is, the turning off of TMIn and TMGa_1 and the turning on of TMAl and TMGa_2 should be simultaneous at the instant of switching a growth material from InGaAs to AlGaAs. In an actual case, there is a certain difference in the switching time of the run/vent valves that control the switching of the four source materials. That is, the four valves are not turned on or off at the same time. As a result, gas components in a run pipe are unstable at the instant of switching. In addition, the four run/vent valves cannot be at the same position on a gas pipe, and have different distances from a reaction chamber. As shown in
[0033] Another important factor is the retention effect of a source material on a growth surface. A source material in a gas flow in the reaction chamber is diffused to the growth surface using a concentration gradient, and it takes some time to establish a stable concentration gradient.
[0034] To increase the steepness of a heterogeneous interface, the present applicant has explored a method to increase the steepness of the heterogeneous interface after a painstaking search. The method can effectively suppress several factors that reduce the steepness of the interface, for example, inconsistent time of introducing source materials and the retention of a residual source material on a sample surface, thereby increasing the steepness of the heterogeneous interface.
[0035] An embodiment of the present application provides a semiconductor growth device, and growth interruption is combined, so that the asynchrony of switching of gas sources can be effectively eliminated, thereby improving the steepness of a heterogeneous interface.
[0036] The following clearly and completely describes the technical solutions in the present application with reference to the accompanying drawings. Apparently, the described embodiments are some rather than all of the embodiments of the present application. All other embodiments obtained by persons of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.
[0037] In the description of the present application, it needs to be understood that orientation or location relationships indicated by terms center, up, down, left, right, vertical, horizontal, inside, and outside are based on orientation or location relationships shown in the accompanying drawings, and are only used to facilitate description of the present application and simplify description, but are not used to indicate or imply that the apparatuses or elements must have specific orientations or are constructed and operated by using specific orientations, and therefore, cannot be understood as a limit to the present application. In addition, the terms first, second, and third are used only for description, but are not intended to indicate or imply relative importance.
[0038] In the description of the present application, it needs to be noted that unless otherwise expressly specified and defined, mounted, connected, and connection, should be understood in a broad sense, for example, fixedly connected, detachably connected or integrally connected; or mechanically connected or electrically connected; or connected directly or indirectly through an intermediate, or two elements communicated internally, or connected in a wireless manner, or connected in a wired manner. For a person of ordinary skill in the art, specific meanings of the terms in the present application should be understood according to specific conditions.
[0039] In addition, the technical features involved in different embodiments of the present application described below can be combined with each other as long as they do not constitute a conflict between them.
Embodiment 1
[0040] An embodiment of the present application provides a semiconductor growth device, including: [0041] a reaction chamber 100; [0042] a growth main pipe 110, where an end of the growth main pipe 110 is connected to the reaction chamber 100; [0043] a vent main pipe 120; [0044] a first mixing main pipe to an M.sup.th mixing main pipe, where M is an integer greater than or equal to 1; [0045] a first reaction gas source group to an N.sup.th reaction gas source group, where N is an integer greater than or equal to 2; [0046] a first switching valve group to an N.sup.th switching valve group, where a k.sup.th switching valve group is adapted for controlling transport of gas from a k.sup.th reaction gas source group to a j.sup.th mixing main pipe, k is an integer greater than or equal to 1 and less than or equal to N, and j is an integer greater than or equal to 1 and less than or equal to M; and [0047] a first growth vent switching valve to an M.sup.th growth vent switching valve, where a j.sup.th growth vent switching valve is adapted for switching the gas in the j.sup.th mixing main pipe to be transported to the growth main pipe or the vent main pipe.
[0048] The k.sup.th reaction gas source group includes a plurality of k.sup.th sub-reaction gas sources. Specifically, the k.sup.th reaction gas source group includes Q.sub.k k.sup.th sub-reaction gas sources. The Q.sub.k k.sup.th sub-reaction gas sources are respectively a first k.sup.th sub-reaction gas source to a Q.sub.k.sup.th k.sup.th sub-reaction gas source. The Q.sub.k k.sup.th sub-reaction gas sources have different gas. Q.sub.k is an integer greater than or equal to 2.
[0049] Referring to
[0050] In a specific embodiment, the k.sup.th reaction gas source group includes two k.sup.th sub-reaction gas sources. The first reaction gas source group 140 includes two first-sub-reaction gas sources. The two first-sub-reaction gas sources have different gas. For example, one of the two first-sub-reaction gas sources is a first sub-Ga gas source, and the other is a first sub-indium gas source. The second reaction gas source group 150 includes two second-sub-reaction gas sources. The two second-sub-reaction gas sources have different gas. For example, one of the two second-sub-reaction gas sources is a second sub-Ga gas source, and the other is a second sub-Al gas source.
[0051] It needs to be noted that the k.sup.th reaction gas source group may include more than two k.sup.th sub-reaction gas sources. A quantity of k.sub.1.sup.th sub-reaction gas sources is equal to or not equal to a quantity of k.sub.2.sup.th sub-reaction gas sources, and k.sub.2 is not equal to k.sub.1. k.sub.1 is an integer greater than or equal to 1 and less than or equal to N, and k.sub.2 is an integer greater than or equal to 1 and less than or equal to N.
[0052] In the first switching valve group to the N.sup.th switching valve group, the k.sup.th switching valve group includes Q.sub.k k.sup.th sub-switching valves. The Q.sub.k k.sup.th sub-switching valves are respectively a first k.sup.h sub-switching valve to a Q.sub.k.sup.th k.sup.th sub-switching valve. A quantity of k.sup.th sub-switching valves in the k.sup.th switching valve group is equal to a quantity of k.sup.th sub-reaction gas sources in the k.sup.th reaction gas source group. One k.sup.th sub-switching valve corresponds to one k.sup.th sub-reaction gas source.
[0053] Referring to
[0054] Referring to
[0055] The first mixing main pipe 131 can select the k.sup.h reaction gas source group through the k.sup.th switching valve group to introduce a gas. When it is selected to introduce gas in a k.sub.1.sup.th reaction gas source group into the first mixing main pipe, gas in a k.sub.2.sup.th reaction gas source group is not introduced into the first mixing main pipe, where k.sub.2 is not equal to k.sub.1, k.sub.1 is an integer greater than or equal to 1 and less than or equal to N, and k.sub.2 is an integer greater than or equal to 1 and less than or equal to N. When N is equal to 2 and gas in the first reaction gas source group 140 is introduced into the first mixing main pipe 131, gas in the second reaction gas source group 150 is not introduced into the first mixing main pipe 131. When gas in the second reaction gas source group 150 is introduced into the first mixing main pipe 131, gas in the first reaction gas source group 140 is not introduced into the first mixing main pipe 131.
[0056] Referring to
[0057] The semiconductor growth device further includes: a first mixing branch pipe group to an N.sup.th mixing branch pipe group, where the first mixing branch pipe group to the N.sup.th mixing branch pipe group are all connected to the first mixing main pipe 131; a k.sup.th mixing branch pipe group includes a plurality of k.sup.th sub-mixing branch pipes, where specifically, the k.sup.th mixing branch pipe group includes Q.sub.k k.sup.th sub-mixing branch pipes, and the Q.sub.k k.sup.th sub-mixing branch pipes are respectively a first k.sup.th sub-mixing branch pipe to a Q.sub.k.sup.th k.sup.th sub-mixing branch pipe; a first vent branch pipe group to an N.sup.th vent branch pipe group, where a k.sup.th vent branch pipe group includes Q.sub.k k.sup.th sub-vent branch pipes, the k.sup.th sub-vent branch pipes are connected to the vent main pipe 120, and the Q.sub.k k.sup.th sub-vent branch pipes are respectively a first k.sup.th sub-vent branch pipe to a Q.sub.k.sup.th k.sup.th sub-vent branch pipe, where the k.sup.th switching valve group is adapted for switching gas in the k.sup.th gas source connection pipe group to be transported to a k.sup.th mixing branch pipe group or a k.sup.th vent branch pipe group; and a q.sub.k.sup.th k.sup.th sub-switching valve is adapted for switching gas in a q.sub.k.sup.th k.sup.th sub-reaction gas source to be transported to a q.sub.k.sup.th k.sup.th sub-mixing branch pipe or a q.sub.k.sup.th k.sup.th sub-vent branch pipe. q.sub.k is an integer greater than or equal to 1 and less than or equal to Q.sub.k.
[0058] The semiconductor growth device further includes: a first gas source connection pipe group to an N.sup.th gas source connection pipe group, where the k.sup.th gas source connection pipe group is connected to the k.sup.th reaction gas source group; specifically, the k.sup.th gas source connection pipe group includes Q.sub.k k.sup.th sub-gas source connection pipes, the Q.sub.k k.sup.th sub-gas source connection pipes are respectively a first k.sup.th sub-gas source connection pipe to a Q.sub.k.sup.th k.sup.th sub-gas source connection pipe, and a q.sub.k.sup.th k.sup.th sub-switching valve is adapted for switching gas in a q.sub.k.sup.th k.sup.th sub-gas source connection pipe to be transported to a q.sub.k.sup.th k.sup.th sub-mixing branch pipe or a q.sub.k.sup.th k.sup.th sub-vent branch pipe.
[0059] Referring to
[0060] The semiconductor growth device further includes: a first growth connection pipe to an M.sup.th growth connection pipe, where the first growth connection pipe to the M.sup.th growth connection pipe are all connected to the growth main pipe 110; and a first vent connection pipe to an M.sup.th vent connection pipe, where the first vent connection pipe to the M.sup.th vent connection pipe are all connected to the vent main pipe 120. The j.sup.th growth vent switching valve is adapted for switching the gas in the j.sup.th mixing main pipe to be transported to a j.sup.th growth connection pipe or a j.sup.th vent connection pipe.
[0061] Referring to
[0062] It needs to be noted that the gas in the first mixing main pipe 131 is transported from the k.sup.th sub-mixing branch pipe to the first growth vent switching valve.
[0063] The semiconductor growth device further includes: a first growth branch pipe group to an N.sup.th growth branch pipe group connected to the growth main pipe 110, where a k.sup.th growth branch pipe group includes Q.sub.k k.sup.th sub-growth branch pipes (not shown); a first additional vent branch pipe group to an N.sup.th additional vent branch pipe group, where a k.sup.th additional vent branch pipe group includes Q.sub.k k.sup.th sub-additional vent branch pipes; and a first additional switching valve group to an N.sup.th additional switching valve group, where a k.sup.th additional switching valve group includes Q.sub.k k.sup.th sub-additional switching valves, a q.sub.k.sup.th k.sup.th sub-switching valve is adapted for switching gas in a q.sub.k.sup.th k.sup.th sub-reaction gas source to be transported to a q.sub.k.sup.th k.sup.th sub-mixing branch pipe or a q.sub.k.sup.th k.sup.th sub-additional vent branch pipe, and the q.sub.k.sup.th k.sup.th sub-additional vent branch pipe transports gas to the q.sub.k.sup.th k.sup.th sub-vent branch pipe or a q.sub.k.sup.th k.sup.th sub-growth branch pipe through a q.sub.k.sup.th k.sup.th sub-additional switching valve.
[0064] The growth main pipe 110 has a first end and a second end opposite to each other in an extension direction of the growth main pipe 110, the first end is connected to the reaction chamber 100, and the second end is sealed. When the first growth branch pipe group to the N.sup.th growth branch pipe group are provided, connections between the first growth branch pipe group to the N.sup.th growth branch pipe group and the growth main pipe 110 are all arranged between the first end and the second end.
[0065] The semiconductor growth device includes a metal organic chemical vapor deposition device.
Embodiment 2
[0066] Differences between this embodiment and the previous embodiment lie in that: M is greater than or equal to 2, and M is less than or equal to N; and the k.sup.th switching valve group is adapted for switching the gas in the k.sup.th reaction gas source group to be transported to the j.sup.th mixing main pipe or the vent main pipe.
[0067] The k.sup.th reaction gas source group includes a plurality of k.sup.th sub-reaction gas sources. Specifically, the k.sup.th reaction gas source group includes Q.sub.k k.sup.th sub-reaction gas sources. The Q.sub.k k.sup.th sub-reaction gas sources are respectively a first k.sup.th sub-reaction gas source to a Q.sub.k.sup.th k.sup.th sub-reaction gas source. The Q.sub.k k.sup.th sub-reaction gas sources have different gas. Q.sub.k is an integer greater than or equal to 2. The plurality of k.sup.th sub-reaction gas sources have different gas.
[0068] The k.sup.th switching valve group includes a plurality of k.sup.th sub-switching valves. Specifically, the k.sup.th switching valve group includes Q.sub.k k.sup.th sub-switching valves. The Q.sub.k k.sup.th sub-switching valves are respectively a first k.sup.th sub-switching valve to a Q.sub.k.sup.th k.sup.th sub-switching valve. A quantity of k.sup.th sub-switching valves in the k.sup.th switching valve group is equal to a quantity of k.sup.th sub-reaction gas sources in the k.sup.th reaction gas source group. One k.sup.th sub-switching valve corresponds to one k.sup.th sub-reaction gas source.
[0069] In this embodiment, the semiconductor growth device further includes: a first mixing branch pipe group to an N.sup.th mixing branch pipe group, where a k.sup.th mixing branch pipe group includes a plurality of k.sup.th sub-mixing branch pipes, and any j.sup.th mixing main pipe in a first mixing main pipe to an M.sup.th mixing main pipe is connected to some k.sup.th sub-mixing branch pipes in the plurality of k.sup.th sub-mixing branch pipes. Specifically, the k.sup.th mixing branch pipe group includes Q.sub.k*M k.sup.th sub-mixing branch pipes; the j.sup.th mixing main pipe is connected to Q.sub.k k.sup.th sub-mixing branch pipes; and a k.sup.th vent branch pipe group includes Q.sub.k k.sup.th sub-vent branch pipes. An (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe to an (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe are respectively correspondingly connected to the first mixing main pipe to the M.sup.th mixing main pipe. Any two k.sup.th sub-mixing branch pipes in the (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe to the (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe are connected to different mixing main pipes. q.sub.k is an integer greater than or equal to 1 and less than or equal to Q.sub.k; the k.sup.th vent branch pipe group includes the first k.sup.th sub-vent branch pipe to the Q.sub.k.sup.th k.sup.th sub-vent branch pipe; and the k.sup.th switching valve group includes the first k.sup.th sub-switching valve to the Q.sub.kh k.sup.th sub-switching valve. A q.sub.k.sup.th k.sup.th sub-switching valve is adapted for switching gas in a q.sub.k.sup.th k.sup.th sub-reaction gas source to be transported to any k.sup.th sub-mixing branch pipe in the (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe to the (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe or transported to a q.sub.k.sup.th k.sup.th sub-vent branch pipe.
[0070] That the (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe to the (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe are respectively correspondingly connected to the first mixing main pipe to the M.sup.th mixing main pipe refers to that the (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe is connected to the first mixing main pipe, an (M*(q.sub.k?1)+2).sup.th k.sup.th sub-mixing branch pipe is connected to a second mixing main pipe, the (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe is connected to the M.sup.th mixing main pipe, and the like.
[0071] The semiconductor growth device further includes: a first gas source connection pipe group to an N.sup.th gas source connection pipe group, where the k.sup.th gas source connection pipe group includes Q.sub.k k.sup.th sub-gas source connection pipes, the Q.sub.k k.sup.th sub-gas source connection pipes are respectively a first k.sup.th sub-gas source connection pipe to a Q.sub.k.sup.th k.sup.th sub-gas source connection pipe, and a q.sub.k.sup.th k.sup.th sub-gas source connection pipe is connected to the q.sub.k.sup.th k.sup.th sub-reaction gas source. The q.sub.k.sup.th k.sup.th sub-switching valve is adapted for switching gas in the q.sub.k.sup.th k.sup.th sub-gas source connection pipe to be transported to any k.sup.th sub-mixing branch pipe in the (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe to the (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe or transported to the q.sub.k.sup.th k.sup.th sub-vent branch pipe.
[0072] Referring to
[0073] Referring to
[0074] The semiconductor growth device further includes: a first growth connection pipe to an M.sup.th growth connection pipe, where the first growth connection pipe to the M.sup.th growth connection pipe are all connected to the growth main pipe; and a first vent connection pipe to an M.sup.th vent connection pipe, where the first vent connection pipe to the M.sup.th vent connection pipe are all connected to the vent main pipe. The j.sup.th growth vent switching valve is adapted for switching the gas in the j.sup.th mixing main pipe to be transported to a j.sup.th growth connection pipe or a j.sup.th vent connection pipe.
[0075] Referring to
[0076] The semiconductor growth device further includes: a first growth branch pipe group to an N.sup.th growth branch pipe group connected to the growth main pipe 110, where a k.sup.th growth branch pipe group includes Q.sub.k k.sup.th sub-growth branch pipes (not shown); a first additional vent branch pipe group to an N.sup.th additional vent branch pipe group, where a k.sup.th additional vent branch pipe group includes Q.sub.k k.sup.th sub-additional vent branch pipes; and a first additional switching valve group to an N.sup.th additional switching valve group, where a k.sup.th additional switching valve group includes Q.sub.k k.sup.th sub-additional switching valves, a q.sub.k.sup.th k.sup.th sub-switching valve is adapted for switching gas in a q.sub.k.sup.th k.sup.th sub-reaction gas source to be transported to any k.sup.th sub-mixing branch pipe in the (M*(q.sub.k?1)+1).sup.th k.sup.th sub-mixing branch pipe to the (M*q.sub.k).sup.th k.sup.th sub-mixing branch pipe or transported to a q.sub.k.sup.th k.sup.th sub-additional vent branch pipe, where the q.sub.k.sup.th k.sup.th sub-additional vent branch pipe transports gas to the q.sub.k.sup.th k.sup.th sub-vent branch pipe or a q.sub.k.sup.th k.sup.th sub-growth branch pipe through a q.sub.k.sup.th k.sup.th sub-additional switching valve.
[0077] For the same content in this embodiment and the previous embodiment, details are not described again.
[0078] It needs to be noted that Embodiment 1 and Embodiment 2 above further include a common gas source. The common gas source is adapted for being introduced into the growth main pipe 110. Before, during, and after the growth interruption, the common gas source is introduced continuously. For example, the common gas source includes AsH.sub.3.
Embodiment 3
[0079] This embodiment provides a method for a manufacturing semiconductor structure, using the foregoing semiconductor growth device, and including the following steps.
[0080] Step S1: A k.sub.1.sup.th switching valve group controls transport of gas from a k.sub.1.sup.th reaction gas source group to a j.sub.1.sup.th mixing main pipe, where the j.sub.1.sup.th mixing main pipe contains a k.sub.1.sup.th reaction mixed gas, and k.sub.1 is an integer greater than or equal to 1 and less than or equal to N.
[0081] Step S2: A j.sub.1.sup.th growth vent switching valve switches the k.sub.1.sup.th reaction mixed gas in the j.sub.1.sup.th mixing main pipe to be transported to a growth main pipe.
[0082] Step S3: After switching the k.sub.1.sup.th reaction mixed gas in the j.sub.1.sup.th mixing main pipe to be transported to a growth main pipe, the j.sub.1.sup.th growth vent switching valve switches all of first to M.sup.th growth vent switching valves to be in communication with a vent main pipe to perform growth interruption in a reaction chamber.
[0083] Step S4: A k.sub.2.sup.th switching valve group controls transport of gas from a k.sub.2.sup.th reaction gas source group to a j.sub.2.sup.th mixing main pipe, where the j.sub.2.sup.th mixing main pipe contains a k.sub.2.sup.th reaction mixed gas, k.sub.2 is an integer greater than or equal to 1 and less than or equal to N, k.sub.2 is not equal to k.sub.1, and j.sub.2 is equal or not equal to j.sub.1.
[0084] Step S5: After the growth interruption, a j.sub.2.sup.th growth vent switching valve switches the k.sub.2.sup.th reaction mixed gas in the j.sub.2.sup.th mixing main pipe to be transported to the growth main pipe.
[0085] When M is equal to 1, the step of controlling, by a k.sub.1.sup.th switching valve group, transport of gas from a k.sub.1.sup.th reaction gas source group to a j.sub.1.sup.th mixing main pipe is: controlling, by the k.sub.1.sup.th switching valve group, transport of the gas from the k.sub.1.sup.th reaction gas source group to the first mixing main pipe; the step of switching, by a j.sub.1.sup.th growth vent switching valve, the k.sub.1.sup.th reaction mixed gas in the j.sub.1.sup.th mixing main pipe to be transported to a growth main pipe is: switching, by the first growth vent switching valve, the k.sub.1.sup.th reaction mixed gas in the first mixing main pipe to be transported to the growth main pipe; and during the growth interruption or after the growth interruption, controlling, by the k.sub.2.sup.th switching valve group, transport of the gas from the k.sub.2.sup.th reaction gas source group to the j.sub.2.sup.th mixing main pipe; the step of controlling, by a k.sub.2.sup.th switching valve group, transport of gas from a k.sub.2.sup.th reaction gas source group to a j.sub.2.sup.th mixing main pipe is: controlling, by the k.sub.2.sup.th switching valve group, transport of the gas from the k.sub.2.sup.th reaction gas source group to the first mixing main pipe; and the step of switching, by a j.sub.2.sup.th growth vent switching valve, the k.sub.2.sup.th reaction mixed gas in the j.sub.2.sup.th mixing main pipe to be transported to the growth main pipe is: switching, by the first growth vent switching valve, the k.sub.2.sup.th reaction mixed gas in the first mixing main pipe to be transported to the growth main pipe.
[0086] The semiconductor growth device in
[0087] When M is greater than or equal to 2 and M is equal to N, j.sub.2 is not equal to j.sub.1, k.sub.1 is equal to j.sub.1, and k.sub.2 is equal to j.sub.2.
[0088] In other embodiments, optionally, M is greater than or equal to 2, and M is less than N. In this case, any j.sup.th mixing main pipe can be selected for gas in a q.sub.k.sup.th k.sup.th sub-reaction gas source for mixing and transporting gas. In this case, the method further includes: before or after the controlling, by a k.sub.1.sup.th switching valve group, transport of gas from a k.sub.1.sup.th reaction gas source group to a j.sub.1.sup.th mixing main pipe, controlling, by a k.sub.3.sup.th switching valve group, transport of gas from a k.sub.3.sup.th reaction gas source group to a j.sub.3.sup.th mixing main pipe, where the j.sub.3.sup.th mixing main pipe contains a k.sub.3.sup.th reaction mixed gas; and switching, by a j.sub.3.sup.th growth vent switching valve, the k.sub.3.sup.th reaction mixed gas in the j.sub.3.sup.th mixing main pipe to be transported to the growth main pipe, and growth interruption is also set between the step of switching, by a j.sub.3.sup.th growth vent switching valve, the k.sub.3.sup.th reaction mixed gas in the j.sub.3.sup.th mixing main pipe to be transported to the growth main pipe and the step of switching, by a j.sub.1.sup.th growth vent switching valve, the k.sub.1.sup.th reaction mixed gas in the j.sub.1.sup.th mixing main pipe to be transported to a growth main pipe; and j.sub.3 is equal to j.sub.1. In another embodiment, the method further includes: before or after the controlling, by a k.sub.2.sup.th switching valve group, transport of gas from a k.sub.2.sup.th reaction gas source group to a j.sub.2.sup.th mixing main pipe, controlling, by a k.sub.3.sup.th switching valve group, transport of gas from a k.sub.3.sup.th reaction gas source group to a j.sub.3.sup.th mixing main pipe, where the j.sub.3.sup.th mixing main pipe contains a k.sub.3.sup.th reaction mixed gas; and switching, by a j.sub.3.sup.th growth vent switching valve, the k.sub.3.sup.th reaction mixed gas in the j.sub.3.sup.th mixing main pipe to be transported to the growth main pipe, and growth interruption is also set between the step of switching, by a j.sub.3.sup.th growth vent switching valve, the k.sub.3.sup.th reaction mixed gas in the j.sub.3.sup.th mixing main pipe to be transported to the growth main pipe and the step of switching, by a j.sub.2.sup.th growth vent switching valve, the k.sub.2.sup.th reaction mixed gas in the j.sub.2.sup.th mixing main pipe to be transported to a growth main pipe; and j.sub.3 is equal to j.sub.2.
[0089] k.sub.3 is an integer greater than or equal to 1 and less than or equal to N, and k.sub.3 is not equal to k.sub.1 and is not equal to k.sub.2.
[0090] A duration of the growth interruption ranges from 1 second to 10 seconds.
[0091] It needs to be noted that in a process of performing step 1 to step 5, the common gas source is introduced continuously into the growth main pipe 110.
[0092] A k.sub.1.sup.th reaction mixed gas entering a reaction chamber reacts to form a k.sub.1.sup.th semiconductor film, and a k.sub.2.sup.th reaction mixed gas entering the reaction chamber reacts to form a k.sub.2.sup.th semiconductor film. Interruption processing is performed between the step of forming the k.sub.1.sup.th semiconductor film and the step of forming the k.sub.2.sup.th semiconductor film. The interruption processing helps to eliminate the retention of a residual source material after the reaction of the k.sub.1.sup.th reaction mixed gas on the k.sub.1.sup.th semiconductor film, to facilitate faster establishment of a stable concentration gradient of the k.sub.2.sup.th reaction mixed gas in the reaction chamber. Next, the interruption processing allows the k.sub.1.sup.th reaction mixed gas to be fully mixed in a j.sub.1.sup.th mixing main pipe before entering the reaction chamber. Therefore, gas in different k.sub.1.sup.th sub-reaction gas sources in a k.sub.1.sup.th reaction gas source group enters the reaction chamber at the same time. In summary, the steepness of an interface between the k.sub.1.sup.th semiconductor film and the k.sub.2.sup.th semiconductor film is improved.
[0093] A growth rate of an epitaxial layer is reduced and a growth interruption is increased, so that a gas pause time can be reduced, thereby helping to establish a stable concentration gradient more quickly.
[0094] Obviously, the foregoing embodiments are merely examples for clear description, rather than a limitation to implementations. For a person of ordinary skill in the art, other changes or variations in different forms may also be made based on the foregoing description. All implementations cannot and do not need to be exhaustively listed herein. Obvious changes or variations that are derived there from still fall within the protection scope of present application.