Wavelength debugging method of multi-channel optical module and the optical module

Abstract

A wavelength debugging method of multi-channel optical module includes: determine the initial temperature of TEC, and plot the temperature-optical power curve of each channel; obtain temperature T.sub.up and T.sub.down corresponding to upper and lower limit values of the target wavelength of each channel and the left and right security boundary temperatures T.sub.left and T.sub.right of each channel; compare T.sub.up, T.sub.down, T.sub.left, T.sub.right of each channel, when the product is qualified, record the middle two values in descending order as T.sub.1 and T.sub.2, respectively; compare the size of T.sub.1 and T.sub.2 of each channel, when the product is qualified, take the maximum value of T.sub.1 of each channel as T.sub.down, and take the minimum value of T.sub.2 of each channel as T.sub.up, the final setting temperature of TEC is calculated as T=(T.sub.down+T.sub.up)/2, and the corresponding wavelength for each channel at this temperature T is the wavelength after debugging for each channel.

Claims

1. A wavelength debugging method of a multi-channel optical module for optical communication, comprising the following steps: 1) determine an initial temperature of a thermoelectric cooler (TEC) of the multichannel optical module, where ?T is a change in temperature of the TEC, record an output optical power and wavelength of each channel of the multi-channel optical module at different temperatures according to a temperature increment of ?T, and plot a temperature-optical power curve of each channel of the multi-channel optical module; 2) obtain temperature T.sub.up and T.sub.down corresponding to upper and lower limit temperature values of a target wavelength of each channel of the multi-channel optical module, as well as a left security boundary temperature T.sub.left and a right security boundary temperature T.sub.right of an optical power flat region in the temperature-optical power curve of each channel; 3) compare the T.sub.up, T.sub.down, T.sub.left, T.sub.right of each channel, if any channel's T.sub.down>T.sub.right, or T.sub.up<T.sub.left, the multi-channel optical module is judged as defective and is repaired; otherwise, proceed to step 4); 4) compare the T.sub.up, T.sub.down, T.sub.left, T.sub.right of each channel, remove maximum and minimum values of the T.sub.up, T.sub.down, T.sub.left, T.sub.right of each channel, and record the remaining two values in ascending order as T.sub.1 and T.sub.2 respectively; 5) compare T.sub.1 and T.sub.2 of each channel, if one or more T.sub.1 of each channel is larger than one or more T.sub.2 of each channel, the multi-channel optical module is judged as defective and repaired; otherwise, proceed to step 6); and 6) take a maximum value of T.sub.1 of each channel and record it as T.sub.down, and take a minimum value of T.sub.2 of each channel and record it as T.sub.up, then, a final setting temperature of TEC is calculated as T=(T.sub.down+T.sub.up)/2, and the corresponding wavelength for each channel at this temperature T is the wavelength after debugging for each channel.

2. The wavelength debugging method of the multi-channel optical module according to claim 1, wherein a selection condition for the initial temperature of the TEC in step 1) is to ensure that the plotted temperature-optical power curve of each channel has a complete flat region, and covers a range of protocol wavelengths for the corresponding channel.

3. The wavelength debugging method of the multi-channel optical module according to claim 1, wherein in step 1), ?T is set to 1? C.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1 is the structure diagram of the optical transmission submodule of the existing typical 100G LR4 optical module;

(2) FIG. 2 is a schematic diagram of the boundary of the protocol wavelength located in the region of rapid drop in optical power in existing applications;

(3) FIG. 3 is a schematic diagram of the boundary of the protocol wavelength located at the edge of the rapid drop in optical power in existing applications;

(4) FIG. 4 is the temperature-optical power curve of the present invention;

(5) FIG. 5 is the temperature-optical power curve of the four channels in the embodiment of the present invention.

DETAILED DESCRIPTION OF THE EMBODIMENTS

(6) The following will provide a clear and complete description of the technical solution in the embodiments of the present invention, in conjunction with the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, not all of them. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in the art without creative labor fall within the scope of protection of the present invention.

(7) This embodiment provides a wavelength debugging method of multi-channel optical module, comprising the following steps: 1) determine the initial temperature of TEC and ?T is used as the stepping, record the output optical power and wavelength of each channel of the optical module at different temperatures, and plot the temperature-optical power curve of each channel of the optical module. Among them, the selection condition for the initial temperature of TEC is to ensure that the obtained temperature-optical power curve of each channel have a complete flat region, and read the range of protocol wavelengths covered by the wavelength of the corresponding channel; ? T is usually set to 1? C.

(8) It should be noted that in the present invention, the definitions of the optical power flat region, the left and right security boundaries of the optical power flat region, and the target wavelength are as follows:

(9) As shown in FIG. 4, when the point with the highest optical power drops to ?P, the left point a and the right point b are the boundaries, the region between point a and point b is defined as the flat region of optical power, point a is defined as the left boundary of the flat region of optical power, point b is defined as the right boundary of the flat region of optical power, and the midpoint c of points a and b is defined as the midpoint of the flat region of optical power. The optical power point d corresponding to the increase of ?t in the abscissa of the left boundary point a is defined as the left security boundary of the optical power flat area, while the optical power point e corresponding to the subtraction of ?t from the abscissa of the right boundary point b is defined as the right security boundary of the optical power flat region. Generally, the value of ?P is 1-2 dBm, and the value of ?t is 1-3? C.

(10) The target wavelength is the wavelength range after scaling ?? in the protocol wavelength range, such as the protocol wavelength range of 1294.53 to 1296.59 nm, then, when ??=0.2 nm, the target wavelength ranges from 1294.73 to 1296.39 nm. 2) obtain the temperature T.sub.up and T.sub.down corresponding to the upper and lower limit values of the target wavelength of each channel of the optical module, as well as the left security boundary temperature T.sub.left and the right security boundary temperature T.sub.right of the optical power flat region in the temperature-optical power curve of each channel.

(11) Taking four channels TOSA as an example, the temperatures corresponding to the upper and lower limit values of the target wavelengths of the four channels are T.sub.up1 and T.sub.down1, T.sub.up2 and T.sub.down2, T.sub.up3 and T.sub.down3, T.sub.up4 and T.sub.down4; the temperatures corresponding to the left security boundary d and the right security boundary e of the optical power of four channels are T.sub.left1 and T.sub.right1, T.sub.left2 and T.sub.right2, T.sub.left3 and T.sub.right3, T.sub.left4 and T.sub.right4. 3) compare the T.sub.up, T.sub.down, T.sub.left, T.sub.right of each channel, if any channel's T.sub.down>T.sub.right, or T.sub.up<T.sub.left, the optical module product is judged as defective and repaired; otherwise, proceed to step 4).

(12) Specifically, take four channels as an example, If T.sub.down1>T.sub.right1, or T.sub.down2>T.sub.right2, or T.sub.down3>T.sub.right3, or T.sub.down4>T.sub.right4, or T.sub.up1<T.sub.left1, or T.sub.up2<T.sub.left2, or T.sub.up3<T.sub.left3, or T.sub.up4<T.sub.left4 appears, debugging fails, and the product is judged as defective and needs to be repaired; if the above situation does not occur, proceed to step (4). 4) compare the T.sub.up, T.sub.down, T.sub.left, T.sub.right of each channel, remove the maximum and minimum values, and record the remaining two values in ascending order as T.sub.1 and T.sub.2 respectively.

(13) Specifically, take four channels as an example, compare the size of T.sub.down1, T.sub.up1, T.sub.left1, T.sub.right1 of each channel, remove the maximum and minimum values, and record the remaining two values in ascending order as T.sub.11 and T.sub.12 respectively, compare the size of T.sub.down2, T.sub.up2, T.sub.left2, T.sub.right of each channel, remove the maximum and minimum values, and record the remaining two values in ascending order as T.sub.21 and T.sub.22 respectively, compare the size of T.sub.down3, T.sub.up3, T.sub.left3, T.sub.right3 of each channel, remove the maximum and minimum values, and record the remaining two values in ascending order as T.sub.31 and T.sub.32 respectively, compare the size of T.sub.down4, T.sub.up4, T.sub.left4, T.sub.right4 of each channel, remove the maximum and minimum values, and record the remaining two values in ascending order as T.sub.41 and T.sub.42 respectively. 5) compare the size of T.sub.1 and T.sub.2 of each channel, if one or more T.sub.1 of each channel is larger than one or more T.sub.2 of each channel, the optical module product is judged as defective and repaired; otherwise, proceed to step 6); Specifically, take four channels as an example, compare the size of T.sub.1, T.sub.21, T.sub.31, T.sub.41 with T.sub.12, T.sub.22, T.sub.32, T.sub.42, if one or more of T.sub.11, T.sub.21, T.sub.31, T.sub.41 are larger than one or more of T.sub.12, T.sub.22, T.sub.32, T.sub.42, debugging fails, and the product is judged as defective and needs to be repaired. 6) take the maximum value of T.sub.1 of each channel and record it as T.sub.down, and take the minimum value of T.sub.2 of each channel and record it as T.sub.up, then, the final setting temperature of TEC is calculated as T=(T.sub.down+T.sub.up)/2, and the corresponding wavelength for each channel at this temperature T is the wavelength after debugging for each channel.

(14) Specifically, take four channels as an example, T.sub.down takes the maximum value of T.sub.11, T.sub.21, T.sub.31, T.sub.41, while T.sub.up takes the minimum value of T.sub.12, T.sub.22, T.sub.32, T.sub.42.

(15) Taking the four channel optical module as an example, the wavelength debugging method of the multi-channel optical module of the invention is described in detail, and the specific process is as follows: 1. Obtain the protocol wavelength range of four channels, as shown in Table 1; determine the target wavelength range of the four channels based on the protocol wavelengths of the four channels, the target wavelength is the wavelength range after scaling ?? in the protocol wavelength range, take ??=0.2 nm, the target wavelength range of four channels is shown in Table 2.

(16) TABLE-US-00001 TABLE 1 Protocol wavelength range of 4 channels Lower limit of protocol Upper limit of protocol Channel wavelength (nm) wavelength (nm) CH1 1294.53 1296.59 CH2 1299.02 1301.09 CH3 1303.54 1305.63 CH4 1308.09 1310.19

(17) TABLE-US-00002 TABLE 2 Target wavelength range of 4 channels Lower limit of target Upper limit of target Channel wavelength(nm) wavelength (nm) CH1 1294.73 1296.39 CH2 1299.22 1300.89 CH3 1303.74 1305.43 CH4 1308.29 1309.99 2. The initial temperature of TEC is 35? C., and ?T=1? C. is used as the stepping, change the temperature of the TEC, test the output optical power and corresponding wavelength of four channels, record the output optical power and corresponding wavelength data of the four channels, as shown in Table 3; and based on the data recorded in Table 3, the TEC temperatures corresponding to the upper and lower limits of the target wavelengths for the four channels are obtained, as shown in Table 4, based on the data recorded in Table 3, the temperature-optical power curves of the four channels are obtained, as shown in FIG. 5, in FIG. 5, T.sub.left and T.sub.right represent the TEC temperature corresponding to the left boundary and the TEC temperature corresponding to the right boundary of the optical power flat region, respectively; according to FIG. 5, the TEC temperatures corresponding to the left and right security boundaries of the four channel optical power flat regions, namely T.sub.left and T.sub.right, are obtained, as shown in Table 5.

(18) TABLE-US-00003 TABLE 3 Output optical power and corresponding wavelength of four channels at different temperatures TEC optical wavelength optical wavelength optical wavelength optical wavelength temperature power of of power of of power of of power of of (?C) Ch1 (dBm) Ch1 (nm) Ch2 (dBm) Ch2 (nm) Ch3 (dBm) Ch3 (nm) Ch4 (dBm) Ch4 (nm) 37 38 ?9.4 1307.04 39 ?9.7 1303.25 ?4.3 1307.13 40 ?10.1 1294.16 1299.21 ?4.6 1303.34 ?1.3 1307.22 41 ?5 1294.25 ?10 1299.30 ?1.6 1303.43 ?0.3 1307.31 42 ?2 1294.34 ?4.9 1299.39 ?0.6 1303.52 0.2 1307.40 43 ?1 1294.43 ?1.9 1299.48 ?0.1 1303.61 0.6 1307.49 44 ?0.5 1294.52 ?0.9 1299.57 0.3 1303.70 0.7 1307.58 45 ?0.1 1294.61 ?0.4 1299.66 0.4 1303.79 0.79 1307.67 46 0 1294.70 0 1299.75 0.49 1303.88 0.85 1307.76 47 0.09 1294.79 0.1 1299.84 0.55 1303.97 0.9 1307.85 48 0.15 1294.88 0.19 1299.93 0.6 1304.06 0.93 1307.94 49 0.2 1294.97 0.25 1300.02 0.63 1304.15 0.9 1308.03 50 0.23 1295.06 0.3 1300.11 0.62 1304.24 0.93 1308.12 51 0.25 1295.15 0.33 1300.20 0.61 1304.33 0.92 1308.21 52 0.23 1295.24 0.35 1300.29 0.6 1304.42 0.91 1308.30 53 0.22 1295.33 0.33 1300.38 0.58 1304.51 0.9 1308.39 54 0.21 1295.42 0.32 1300.47 0.55 1304.60 0.88 1308.48 55 0.2 1295.51 0.31 1300.56 0.51 1304.69 0.85 1308.57 56 0.18 1295.60 0.3 1300.65 0.48 1304.78 0.81 1308.66 57 0.15 1295.69 0.28 1300.74 0.45 1304.87 0.78 1308.75 58 0.11 1295.78 0.25 1300.83 0.42 1304.96 0.75 1308.84 59 0.08 1295.87 0.21 1300.92 0.37 1305.05 0.72 1308.93 60 0.05 1295.96 0.18 1301.01 0.33 1305.14 0.67 1309.02 61 0.02 1296.05 0.15 1301.10 0.27 1305.23 0.63 1309.11 62 ?0.03 1296.14 0.12 1301.19 0.07 1305.32 0.57 1309.20 63 ?0.07 1296.23 0.07 1301.28 ?0.25 1305.41 0.37 1309.29 64 ?0.13 1296.32 0.03 1301.37 ?0.7 1305.50 0.05 1309.38 65 ?0.33 1296.41 ?0.03 1301.46 ?1.4 1305.59 ?0.4 1309.47 66 ?0.65 1296.50 ?0.23 1301.55 ?4.3 1305.68 ?1.1 1309.56 67 ?1.1 1296.59 ?0.55 1301.64 ?9.6 1305.77 ?4 1309.65 68 ?1.8 1296.68 ?1 1301.73 ?9.3 1309.74 69 ?4.7 1296.77 ?1.7 1301.82 1309.83 70 ?10 1296.86 ?4.6 1301.91 1309.92 71 ?9.9 1302.00 1310.01

(19) TABLE-US-00004 TABLE 4 TEC temperature corresponding to the upper and lower limits of target wavelengths of four channels TEC temperature T.sub.down TEC temperature T.sub.up corresponding to corresponding to the lower limit of the upper limit of Channel target wavelength (? C.) target wavelength (? C.) CH1 46 65 CH2 40 59 CH3 44 63 CH4 52 71

(20) TABLE-US-00005 TABLE 5 left and right security boundaries of the flat region of optical power of four channels TEC temperature T.sub.left TEC temperature T.sub.right corresponding to the left corresponding to the right security boundary of the security boundary of the flat region of flat region of Channel optical power (? C.) optical power (? C.) CH1 44 66 CH2 45 67 CH3 43 65 CH4 42 64 3. According to the data in Tables 4 and 5, it can be concluded that T.sub.11=46? C., T.sub.12=65? C., T.sub.21=45? C., T.sub.22=59? C., T.sub.31=44? C., T.sub.32=63? C., T.sub.41=52? C., T.sub.42=64? C.; Compare T.sub.11, T.sub.12, T.sub.13, and T.sub.14 to obtain their maximum value T.sub.down=52? C., compare T.sub.12, T.sub.22, T.sub.32, and T.sub.42 to obtain their minimum value T.sub.up=59? C., and finally TEC set temperature T=(T.sub.down+T.sub.up)/2=(52+59)/2=55.5? C.

(21) The above examples are only illustrative examples of the present invention and do not constitute a limitation on the scope of protection of the present invention. Any design that is the same or similar to the present invention belongs to the scope of protection of the present invention.