Abstract
A device for handling a test contact in which the device includes a contact head provided with a test contact receptacle at its contact end, the test contact receptacle having a positioning unit having at least two, preferably three, positioning surfaces for coming into positioning contact with a test contact and for positioning the test contact relative to the contact end of the contact head. The at least one positioning surface of the positioning unit being formed as a base contact surface and at least one more positioning surface of the positioning unit being formed as an edge contact surface. Furthermore, a manufacturing system is also provided for manufacturing a test contact arrangement for testing semiconductor components.
Claims
1. A device for handling a test contact, the device comprising a contact head provided with a test contact receptacle at its contact end, the test contact receptacle having a positioning unit having at least two positioning surfaces for coming into positioning contact with a test contact and for positioning the test contact relative to the contact end of the contact head, wherein the at least one positioning surface of the positioning unit is formed as a base contact surface and at least one more positioning surface of the positioning unit is formed as an edge contact surface.
2. The device for handling a test contact according to claim 1, wherein the positioning unit has at least one stop edge, which forms the edge contact surface.
3. The device for handling a test contact according to claim 2, wherein the stop edge has an edge thickness which is equal to the material thickness of the test contact or greater than the material thickness of the test contact.
4. The device for handling a test contact according to claim 2, wherein a stop body protruding from the base contact surface comprises the stop edge.
5. The device for handling a test contact according to claim 4, wherein the stop body has at least two legs.
6. The device for handling a test contact according to claim 4, wherein the positioning unit has at least one stop body on either side of the base contact surface.
7. The device for handling a test contact according to claim 1, wherein the positioning unit comprises a contact body laterally projecting from the base contact surface.
8. The device for handling a test contact according to claim 1, wherein the base contact surface has a base contact surface height, the stop body has a stop body height and the contact body has a contact body height, the base contact surface height being greater than the stop body height and/or greater than the sum of the stop body height and the contact body height.
9. The device for handling a test contact according to claim 1, wherein the positioning unit has a total width and the base contact surface has a base contact surface width, the base contact surface width being less than the total width.
10. The device for handling a test contact according to claim 1, wherein the positioning unit is formed in one piece.
11. The device for handling a test contact according to claim 1, wherein the contact head has at least one transmission channel for transmitting thermal energy and/or to transfer a negative pressure, the contact end of the contact head being provided with the test contact receptacle in the area of a channel mouth of the transmission channel.
12. The device for handling a test contact according to claim 11, wherein the base contact surface of the positioning unit at least partly encloses an opening cross section of the channel mouth.
13. A manufacturing system for manufacturing a test contact arrangement for testing semiconductor components using a device according to claim 1 and having at least one test contact formed in the manner of a cantilever, the test contact having a fastening base which can establish contact with the base contact surface and a contact arm which is connected to the fastening base.
14. The manufacturing system according to claim 13, wherein the fastening base of the test contact covers the channel mouth when contact is established with the base contact surface.
15. The manufacturing system according to claim 13, wherein the test contact has a projection disposed below the contact arm, the projection being able to establish contact with the edge contact surface and/or the projection being able to establish contact with the contact body.
Description
BRIEF DESCRIPTION OF THE FIGURES
[0031] Embodiments of the invention are schematically illustrated in the drawings and are described in an exemplary manner hereinafter.
[0032] FIG. 1 shows an isometric view of a schematic illustrative example of a device according to the invention with received test contact.
[0033] FIG. 2 shows a detailed front view of the device according to the invention according to FIG. 1 without test contact.
[0034] FIG. 3 shows a detailed front view of the device according to the invention according to FIG. 1.
[0035] FIG. 4 shows a detailed isometric view of the device according to the invention according to FIG. 1.
[0036] FIG. 5 shows a detailed lateral view of the device according to the invention according to FIG. 1.
DETAILED DESCRIPTION
[0037] FIG. 1 shows a device 10 according to the invention for handling a test contact 100 having a test contact 100 according to the invention, whereby a manufacturing system 50 is formed. For receiving the test contact 100, test contact receptacle 14 having positioning unit 18 is disposed on contact end 16 of contact head 12. To mount test contact 100 on positioning unit 18, test contact 100 can be subjected to a negative pressure via transmission channel 34.
[0038] FIG. 2 shows a device 10 according to the invention for handling a test contact 100. For receiving test contact 100, test contact receptacle 14 is disposed on contact end 16 of contact head 12. Test contact receptacle 14 comprises a positioning unit 18, which has a base contact surface 20, an edge contact surface 22 and an additional contact surface 24. A test contact 100 can be brought into contact with positioning unit 18 in such a manner that test contact 100 is brought into full contact with base contact surface 20 and also with additional contact surfaces 24 on either side of base contact surface 20. In order to block a vertical shift of test contact 100 in the present illustrative example, in this case equivalent to the longitudinal extension of transmission channel 34, positioning unit 18 has two stop bodies 28, which are disposed on either side of base contact surface 20, in addition to contact bodies 36 projecting on either side, said stop bodies 28 each forming an edge contact surface 22 with which an edge of test contact 100 can be brought into contact. According to the shown illustrative example, edge contact surface 22 is oriented perpendicular to base contact surface 20 and faces downward in the shown position of use. Stop body 28 forming edge contact surface 22 is essentially L-shaped in the present embodiment and has legs 30, 32, first leg 30 laterally projecting from base contact surface 20 and second leg 32 projecting from the plane of base contact surface 20. Thus, a test contact 100 can be positioned easily on positioning unit 18 by applying said test contact 100 to base contact surface 20 and sliding it until it reaches stop body 28. For mounting test contact 100 on positioning unit 18, a negative pressure can be applied to test contact 100 via transmission channel 34. As can be seen in a combined view of FIGS. 2 and 3, test contact 100 fully closes channel mouth 36 of transmission channel 34 when said test contact 100 is brought correctly into contact with positioning unit 18 because base contact surface 20 fully surrounds opening cross section 38 of channel mouth 36. Thus, test contact 100 can be easily mounted on positioning unit 18 by means of a negative pressure. Furthermore, FIG. 2 shows that height h.sub.BA of base contact surface 20 is greater than the sum of height h.sub.AK of stop body 28 and height h.sub.ANL of contact body 40. Furthermore, it can be seen that both stop body 28 and contact body 40 are disposed below upper surface 42 of base contact surface 20, contact body 40 also being disposed below stop body 28. In the present embodiment, total width b.sub.ges of positioning unit 18 results from the width of contact body 40 and width b.sub.BA of base contact surface 20, contact body 40 and stop body 28 having the same width in the present illustrative example.
[0039] FIGS. 3 to 5 show a device 10 according to the invention for handling a test contact 100 having a test contact 100 according to the invention, whereby a manufacturing system 50 is formed. Test contact 100 has a fastening base 102 and two projections 106 disposed on either side of fastening base 102. In the upper area of fastening base 102, a projecting contact arm 104 is disposed, the top edge of contact arm 104 laterally prolonging the top edge of fastening base 102, said top edge forming test contact top edge 112. Fastening base 102 with projections 106 of test contact 100 is formed essentially cross-shaped with a contact arm 104 projecting from test contact top edge 112. A contact tip 108, which can be used for contacting, is disposed on contact arm 104. From a combined view with FIG. 2, it can be seen that fastening base 102 of test contact 100 is brought into contact with base contact surface 20 of positioning unit 18 in FIGS. 3 to 5. Furthermore, projections 106 are brought into full contact with additional contact surfaces 24 of contact body 40. Each projection stop edge 108 of projections 106 is brought into contact with stop edge 26 of stop body 28. For positioning test contact 100 relative to contact head 12 by means of positioning unit 18, test contact top edge 112 is not required to come into contact with a stop because top edges 110 of projections 106 of test contact 100 can be brought into contact with a stop edge 26 of stop body 28. Thus, device 10 and in particular positioning unit 18 can be used flexibly and universally, in particular because the height of test contact 100 to be positioned is not limited. It can be seen, in particular from FIGS. 4 and 5, that stop edge 26 has an edge thickness which is greater than the material thickness of test contact 100 in order to ensure that test contact 100 reliably rests on stop body 28. Furthermore, it can be seen from a combined view of FIGS. 3 to 5 with FIG. 2 that channel mouth 36 of transmission channel 34, which is inserted in contact head 12, is closed by means of test contact 100, if said test contact 100 correctly abuts against positioning unit 18, in such a manner that test contact 100 can be mounted on positioning unit 18 when a negative pressure is applied via transmission channel 34 and, consequently, can be moved to the intended position for contacting test contact 100.
