Semi-transparent reflectors
10067265 ยท 2018-09-04
Assignee
Inventors
- Benjamin Alan Grayson (Ann Arbor, MI, US)
- Debasish Banerjee (Ann Arbor, MI)
- Masahiko Ishii (Okazaki, JP)
Cpc classification
G02B1/10
PHYSICS
G02B5/0825
PHYSICS
International classification
G02B1/00
PHYSICS
Abstract
In one embodiment, a semi-transparent reflector may include a multilayered photonic structure. The multilayered photonic structure includes a plurality of coating layers of high index dielectric material and a plurality of coating layers of low index dielectric material. The plurality of coating layers of high index dielectric material and the plurality of coating layers of low index dielectric material of the multilayered photonic structure are arranged in an [LH . . . (LH).sup.N . . . L] structure. L is one of the plurality of coating layers of low index dielectric material. H is one of the plurality of coating layers of high index dielectric material. N is a positive integer. The multilayered photonic structure has substantially constant reflectance values for wavelengths of electromagnetic radiation in a visible spectrum over a range of angles of incidence of the electromagnetic radiation.
Claims
1. A semi-transparent reflector comprising a multilayered photonic structure, the multilayered photonic structure comprising a plurality of coating layers of high index dielectric material and a plurality of coating layers of low index dielectric material, wherein: the plurality of coating layers of high index dielectric material and the plurality of coating layers of low index dielectric material of the multilayered photonic structure are arranged in an [LH . . . (LH).sup.N . . . L] structure having a total number of layers x, wherein: L is one of the plurality of coating layers of low index dielectric material; H is one of the plurality of coating layers of high index dielectric material; N is a positive integer; the total number of layers x is from about 5 to about 99; intermediate layers (LH) are repeated N times to achieve the total number of layers x such that N=(x3)/2; and the multilayered photonic structure has substantially constant reflectance values for wavelengths of electromagnetic radiation in a visible spectrum over a range of angles of incidence of the electromagnetic radiation as measured by having a standard deviation of the substantially constant reflectance values of less than about 7% reflectance over a range of angles of incidence from about 0 to about 45 over a range of wavelengths of electromagnetic radiation from about 400 nm to about 900 nm.
2. The semi-transparent reflector of claim 1, wherein an average of the substantially constant reflectance values is greater than a target reflectance value minus two standard deviations of the substantially constant reflectance values and the average of the substantially constant reflectance values is less than the target reflectance value plus the two standard deviations of the substantially constant reflectance values.
3. The semi-transparent reflector of claim 2, wherein the target reflectance value is from about 51% to about 95%.
4. The semi-transparent reflector of claim 1, wherein the plurality of coating layers of low index dielectric material comprise a low refractive index from about 1.4 to about 1.6.
5. The semi-transparent reflector of claim 1, wherein the plurality of coating layers of high index dielectric material comprise a high refractive index from about 1.9 to about 2.3.
6. The semi-transparent reflector of claim 1, wherein: the plurality of coating layers of high index dielectric material consists of 8 to 12 coating layers of high index dielectric material; and the plurality of coating layers of low index dielectric material consists of 9 to 13 coating layers of low index dielectric material.
7. The semi-transparent reflector of claim 1, wherein each of the plurality of coating layers of high index dielectric material and each of the plurality of coating layers of low index dielectric material have a layer thickness from about 0.05 nm to about 500 nm.
8. The semi-transparent reflector of claim 1, wherein the multilayered photonic structure is coupled to a surface of an electronic display, a window or a vehicle.
9. A non-metallic vehicle component comprising a multilayered photonic structure comprising a plurality of coating layers of high index dielectric material and a plurality of coating layers of low index dielectric material alternately arranged, wherein: the multilayered photonic structure has substantially constant reflectance values for wavelengths of electromagnetic radiation in a visible spectrum over a range of angles of incidence of the electromagnetic radiation as measured by having a standard deviation of the substantially constant reflectance values of less than about 7% reflectance over a range of angles of incidence of the electromagnetic radiation from about 0 to about 45 over a range of wavelengths of electromagnetic radiation from about 400 nm to about 900 nm; an average of the substantially constant reflectance values is greater than a target reflectance value minus two standard deviations of the substantially constant reflectance values; the average of the substantially constant reflectance values is less than the target reflectance value plus the two standard deviations of the substantially constant reflectance values; the target reflectance value is from about 51% to about 95%; and a total number of coating layers is from about 5 to about 99.
10. The non-metallic vehicle component of claim 9, wherein: the plurality of coating layers of high index dielectric material and the plurality of coating layers of low index dielectric material of the multilayered photonic structure are arranged in an [LH . . . (LH).sup.N . . . L] structure having a total number of layers x; L is one of the plurality of coating layers of low index dielectric material; H is one of the plurality of coating layers of high index dielectric material; N is a positive integer; and intermediate layers (LH) are repeated N times to achieve the total number of layers x such that N=(x3)/2.
11. The non-metallic vehicle component of claim 9, wherein: the plurality of coating layers of high index dielectric material and the plurality of coating layers of low index dielectric material of the multilayered photonic structure are arranged in an [HL . . . (HL).sup.N . . . H] structure having a total number of layers x; L is one of the plurality of coating layers of low index dielectric material; H is one of the plurality of coating layers of high index dielectric material; N is a positive integer; and intermediate layers (HL) are repeated N times to achieve the total number of layers x such that N=(x3)/2.
12. A vehicle comprising: a communication system coupled to the vehicle that receives or transmits a transmission signal, wherein the communication system utilizes the transmission signal to exchange information between the vehicle and a compatible communication device outside of the vehicle; and a non-metallic vehicle component coupled to the vehicle and disposed within a transmission path of the communication system, the non-metallic vehicle component comprising a multilayered photonic structure, the multilayered photonic structure comprising a plurality of coating layers of high index dielectric material and a plurality of coating layers of low index dielectric material, wherein: the plurality of coating layers of high index dielectric material and the plurality of coating layers of low index dielectric material of the multilayered photonic structure are arranged in an [LH . . . (LH).sup.N . . . L] structure having a total number layers x, wherein: L is one of the plurality of coating layers of low index dielectric material; H is one of the plurality of coating layers of high index dielectric material; N is a positive integer; intermediate layers (LH) are repeated N times to achieve the total number of layers x such that N=(x3)/2; the multilayered photonic structure has substantially constant reflectance values for wavelengths of electromagnetic radiation in a visible spectrum over a range of angles of incidence of the electromagnetic radiation as measured by having a standard deviation of the substantially constant reflectance values of less than about 7% reflectance over a range of angles of incidence from about 0 to about 45 over a range of wavelengths of electromagnetic radiation from about 400 nm to about 900 nm; and the multilayered photonic structure is substantially transparent to the transmission signal, and wherein a total number of layers x is from about 5 to about 99.
13. The vehicle of claim 12, wherein: an average of the substantially constant reflectance values is greater than a target reflectance value minus two standard deviations of the substantially constant reflectance values; the average of the substantially constant reflectance values is less than the target reflectance value plus the two standard deviations of the substantially constant reflectance values; and the target reflectance value is from about 51% to about 95%.
14. The vehicle of claim 12, wherein the non-metallic vehicle component is a trim piece, a vehicle emblem, a grille, a hood ornament, a wheel cover, a bumper, a bezel, a taillight, a reflector, a video monitor coating, or a mirror.
15. The vehicle of claim 12, wherein the transmission signal is a K-band transmission, a Ka-band transmission or a V-band transmission.
16. The vehicle of claim 12, wherein the non-metallic vehicle component is coupled to an exterior surface of the vehicle.
17. The vehicle of claim 12, wherein: the plurality of coating layers of high index dielectric material consists of 8 to 12 coating layers of high index dielectric material; and the plurality of coating layers of low index dielectric material consists of 9 to 13 coating layers of low index dielectric material.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) The embodiments set forth in the drawings are illustrative and exemplary in nature and not intended to limit the subject matter defined by the claims. The following detailed description of the illustrative embodiments can be understood when read in conjunction with the following drawings, where like structure is indicated with like reference numerals and in which:
(2)
(3)
(4)
(5)
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(9)
DETAILED DESCRIPTION
(10)
(11) The term light as used herein refers to various wavelengths of the electromagnetic spectrum, particularly wavelengths in the ultraviolet (UV), infrared (IR), and visible portions of the electromagnetic spectrum.
(12) The term transparent means a material that transmits substantially all of the electromagnetic radiation incident upon the material.
(13) Referring now to
(14) In one embodiment, the vehicle 10 generally comprises a communication system 12 that receives or transmits a transmission signal. Specifically, the communication system 12 may be coupled to the vehicle such that the non-metallic vehicle component 14 is along a transmission path 16 of the transmission signal. The transmission signals may be transmitted at a variety of frequencies (e.g., 24 GHz electromagnetic radiation or 77 GHz electromagnetic radiation). The communication system utilizes the transmission signal to exchange information between the vehicle 10 and a compatible communication device outside of the vehicle 10 such as, for example, another vehicle, a satellite, a communication tower, and the like. The communication system 12 may be a millimeter-wave radar system that transmits and/or receives transmission signals of radio frequency electromagnetic radiation such as, for example, K-band, K.sub.a-band, V-band and combinations thereof. While the communication system 12 is depicted in
(15) Still referring to
(16) Referring collectively to
(17) As schematically depicted in
(18) Referring collectively to
(19) In another embodiment, as depicted in
(20) Referring again to
(21) Referring now to
(22) Referring again to
(23) Specifically, the multilayer photonic structure 100, 200 may be tuned by adjusting the thickness t.sub.1, t.sub.2, . . . , t.sub.k, t.sub.k+1, . . . , t.sub.x of each of the layers and or the total number of layers x. The thickness may be any value such as, for example, from about 0.05 nm to about 500 nm. In one embodiment, a transfer matrix method is employed to solve a system of equations that model the substantially constant reflectance values of a multilayer photonic structure 100, 200. The substantially constant reflectance values are dependent upon: the angle of light incident on the structure (e.g., the angle of incidence), the degree of light polarization, the wavelength(s) of interest, the thicknesses t.sub.j of each layer of the multilayer photonic structure 100, 200 and the indices of refraction of the high and low index dielectric materials, the transmission medium, and the incidence medium. The transfer matrix method may be implemented with a computer comprising software programmed to receive various inputs from a user related to the properties of a particular multilayer photonic structure 100, 200 and determine the substantially constant reflectance values. Such software may be referred to herein as a photonics calculator.
(24) The thickness t.sub.1, t.sub.2, . . . , t.sub.k, t.sub.k+1, . . . , t.sub.x of each of the layers may be determined by comparing the substantially constant reflectance values calculated by the photonics calculator with the target reflectance value. Specifically, an optimization or curve fitting process may operate in conjunction with the photonics calculator. In one embodiment, the sum of the squared difference between each of the substantially constant reflectance values calculated by the photonics calculator and the target reflectance value are minimized. The least squares fitting may be performed by an optimizer implemented with computer software executed on a computer system. While particular methods of modeling and optimizing a multilayer photonic structure 100, 200 are described herein, it should be understood that the embodiments described herein may be modeled and optimized by any method capable of tuning a multilayer photonic structure 100, 200 to produce a target reflectance value.
(25) The multilayer photonic structure 100, 200 may also be tuned by selecting the appropriate high index dielectric material H and low index dielectric material L. In one embodiment, the values for the low refractive index and the high refractive index are selected such that the values are the same as commonly available materials. For example, the low refractive index may be selected to be 1.46 while the high refractive index may be selected to be 2.29 such that the values for the low refractive index and the high refractive index approximate the indices of refraction for silica (SiO.sub.2, index of refraction 1.46) and titania (TiO.sub.2, index of refraction 2.36), respectively. Accordingly, a multilayer photonic structure design which utilizes 1.46 and 2.29 for the low refractive index and the high refractive index, respectively, may be constructed from silica and titania or other materials having the same or similar indices of refraction. It should be understood that other values for the low refractive index and the high refractive index may be selected which correspond to the indices of refraction of other materials. Materials such as, for example, Al.sub.2O.sub.3 and XF.sub.y (where X may be any of Ba, Ca, La, Ce, Mg, and Al and y can be any integer from 1 through 3) may be utilized as high index dielectric material. Materials such as, for example, ZnS, ZnO, ZrO.sub.2, CeO.sub.2, Nb.sub.2O.sub.5, Ta.sub.2O.sub.5, HfO.sub.2, and Nd.sub.2O.sub.3 may be utilized as low index dielectric material. Table 1, shown below, contains a non-exclusive list of further possible materials and their corresponding indices of refraction which may be utilized in the multilayer photonic structures described herein.
(26) TABLE-US-00001 TABLE 1 Index of Refraction Material (visible spectrum) Germanium (Ge) 4.0-5.0 Tellurium (Te) 4.6 Gallium Antimonite (GaSb) 4.5-5.0 Indium Arsenide (InAs) 4.0 Silicon (Si) 3.7 Indium Phosphate (InP) 3.5 Gallium Arsenate (GaAs) 3.53 Gallium Phosphate (GaP) 3.31 Vanadium (V) 3 Arsenic Selenide (As.sub.2Se.sub.3) 2.8 CuAlSe.sub.2 2.75 Zinc Selenide (ZnSe) 2.5-2.6 Titanium Dioxide (TiO.sub.2) - solgel 2.36 Alumina Oxide (A12O3) 1.75 Yttrium Oxide (Y2O3) 1.75 Polystyrene 1.6 Magnesium Fluoride (MgF2) 1.37 Lead Fluoride (PbF2) 1.6 Potassium Fluoride (KF) 1.5 Polyethylene (PE) 1.5 Barium Fluoride (BaF2) 1.5 Silica (SiO2) 1.5 PMMA 1.5 Aluminum Arsenate (AlAs) 1.56 Solgel Silica (SiO2) 1.47 N,N'bis(1naphthyl)-4,4'Diamine (NPB) 1.7 Polyamide-imide (PEI) 1.6 Fluorcarbon (FEP) 1.34 Chlorotrifiuoro-Ethylene (CTFE) 1.42 Cellulose Acetate Butyrate 1.46-1.49 Methylpentene Polymer 1.485 Acetal Homopolymer 1.48 Cellulose Nitrate 1.49-1.51 Polyallomer 1.492 Ionomers 1.51 Nylons (PA) Type II 1.52 Polyethylene (Medium Density) 1.52 PVC (Rigid) 1.52-1.55 Urea Formaldehyde 1.54-1.58 Styrene Acrylonitrile Copolymer 1.56-1.57 Polycarbornate (Unfilled) 1.586 Polysulfone 1.633 Chromium (Cr) 3.0 Tin Sulfide (SnS) 2.6 Low Porous Si 2.56 Chalcogenide glass 2.6 Cerium Oxide (CeO.sub.2) 2.53 Tungsten (W) 2.5 Gallium Nitride (GaN) 2.5 Manganese (Mn) 2.5 Niobium Oxie (Nb.sub.2O.sub.3) 2.4 Zinc Telluride (ZnTe) 3.0 Chalcogenide glass + Ag 3.0 Zinc Sulfate (ZnSe) 2.5-3.0 Titanium Dioxide (TiO.sub.2) - vacuum deposited 2.43 Sodium Aluminum Fluoride (Na3AlF6) 1.6 Polyether Sulfone (PES) 1.55 High Porous Si 1.5 Indium Tin Oxide nanorods (ITO) 1.46 Lithium Fluoride (LiF4) 1.45 Calcium Fluoride 1.43 Strontium Fluoride (SrF2) 1.43 Lithium Fluoride (LiF) 1.39 PKFE 1.6 Sodium Fluoride (NaF) 1.3 Nano-porous Silica (SiO2) 1.23 Sputtered Silica (SiO2) 1.47 Vacuum Deposited Silica (SiO2) 1.46 Hafnium Oxide 1.9-2.0 Polytetrafluro-Ethylene (TFE) 1.35 Cellulose Propionate 1.46 Cellulose Acetate 1.46-1.50 Ethyl Cellulose 1.47 Acrylics 1.49 Polypropylene (Unmodified) 1.49 Polybutylene 1.50 Polyethylene (Low Density) 1.51 Acrylics Multipolymer 1.52 Styrene Butadiene Thermoplastic 1.52-1.55 Nylons (Polyamide) Type 6/6 1.53 Polyethylene (High Density) 1.54 Polystyrene (Heat & Chemical) 1.57-1.60 Polystyrene (General Purpose) 1.59
(27) According to the embodiments described herein, the substantially constant reflectance values are about equal to the target reflectance value when the average of the substantially constant reflectance values is within a few standard deviations of the target reflectance value. The average of the substantially constant reflectance values is given by
(28)
where N is the number of substantially constant reflectance values and r is an individual substantially constant reflectance value. The standard deviation of the substantially constant reflectance values is given by
(29)
where N is the number of substantially constant reflectance values, r is an individual substantially constant reflectance value, and is the average of the substantially constant reflectance values. The substantially constant reflectance values are about equal to the target reflectance value when
t(h)t+(h)(3),
where t is the target reflectance value, h is equal to any value from about 0 to about 3, is the standard deviation of the substantially constant reflectance values and is the average of the substantially constant reflectance values.
(30) In order to provide further clarity without limiting the scope of the embodiments described herein, the following experimental results are provided.
(31) Analytical simulations were conducted with the photonics calculator. The following conditions were set in each of the simulations: an angle of incidence was set to 0 or 45, the degree of light polarization was set to natural light (i.e., about 0.5 where 0 represents TE light and 1 represents TM light), the transmission medium was set to air (index of refraction of 1.0), the wavelengths of interest were set to 400 nm to 800 nm, and the target reflectance value was set to about 90%. Referring to
(32) Tables 2 and 3 summarize the results of the photonics calculator, where the total number of layers x and the shorthand notation of the structure are indicated in the leftmost column. Table 2, shown below, contains a summary of the averages of the substantially constant reflectance values determined analytically by the photonics calculator. Table 3, shown below, contains a summary of the standard deviations of the substantially constant reflectance values determined analytically from the photonics calculator.
(33) TABLE-US-00002 TABLE 2 Average (0) Average (45) Average (0) Average (45) (400-900 nm) (400-900 nm) (400-800 nm) (400-800 nm) 11 total layers 71.3 67.9 71.1 68.7 [HL . . . (HL).sup.N . . . H] 13 total layers 78.3 73.4 78.2 75.9 [HL . . . (HL).sup.N . . . H] 15 total layers 81.4 77.3 82.2 78.7 [HL . . . (HL).sup.N . . . H] 17 total layers 79.2 75.4 79.8 76.8 [HL . . . (HL).sup.N . . . H] 19 total layers 87.2 76.7 87.6 84.3 [HL . . . (HL).sup.N . . . H] 21 total layers 85.9 81.4 86.1 82.4 [HL . . . (HL).sup.N . . . H] 23 total layers 86.9 82.9 87.6 83.6 [HL . . . (HL).sup.N . . . H] 25 total layers 88.8 85.0 88.2 86.2 [HL . . . (HL).sup.N . . . H] 19 total layers 87.2 76.7 87.6 84.3 [HL . . . (HL).sup.N . . . H] 21 total layers 89.2 78.4 89.3 86.1 [HL . . . (HL).sup.N . . . H] 23 total layers 86.6 79.2 86.7 83.1 [HL . . . (HL).sup.N . . . H] 21 total layers 88.0 82.1 88.3 85.0 [LH . . . (LH).sup.N . . . L]
(34) TABLE-US-00003 TABLE 3 Std Dev (0) Std Dev (45) Std Dev (0) Std Dev (45) (400-900 nm) (400-900 nm) (400-800 nm) (400-800 nm) 11 total layers 11.9 10.5 13.1 11.1 [HL . . . (HL).sup.N . . . H] 13 total layers 6.1 7.0 6.6 4.8 [HL . . . (HL).sup.N . . . H] 15 total layers 6.7 7.1 7.0 5.8 [HL . . . (HL).sup.N . . . H] 17 total layers 7.8 7.4 8.5 7.7 [HL . . . (HL).sup.N . . . H] 19 total layers 5.4 19.2 5.9 5.4 [HL . . . (HL).sup.N . . . H] 21 total layers 5.0 5.2 5.5 4.4 [HL . . . (HL).sup.N . . . H] 23 total layers 5.4 5.0 5.8 5.2 [HL . . . (HL).sup.N . . . H] 25 total layers 7.5 8.2 6.9 7.1 [HL . . . (HL).sup.N . . . H] 19 total layers 5.4 19.2 5.9 5.4 [HL . . . (HL).sup.N . . . H] 21 total layers 2.9 18.6 2.8 2.8 [HL . . . (HL).sup.N . . . H] 23 total layers 4.3 10.8 4.7 4.5 [HL . . . (HL).sup.N . . . H] 21 total layers 3.3 8.3 3.6 3.2 [LH . . . (LH).sup.N . . . L]
(35) According to Table 2, the average of the substantially constant reflectance values ranged from about 67.9 to about 89.3 for all angles of incidence and both wavelength bandwidths. The average of the substantially constant reflectance values ranged from about 71.3 to about 89.2 for an angle of incidence of 0 and for wavelengths from about 400 nm to about 900 nm. The average of the substantially constant reflectance values ranged from about 67.9 to about 85.0 for an angle of incidence of 45 and for wavelengths from about 400 nm to about 900 nm. The average of the substantially constant reflectance values ranged from about 71.1 to about 89.3 for an angle of incidence of 0 and for wavelengths from about 400 nm to about 800 nm. The average of the substantially constant reflectance values ranged from about 68.7 to about 86.2 for an angle of incidence of 45 and for wavelengths from about 400 nm to about 800 nm.
(36) According to Table 3, the standard deviation of the substantially constant reflectance values ranged from about 2.8 to about 19.2 for all angles of incidence and both wavelength bandwidths. Overall, most of the standard deviations of the substantially constant reflectance values were less than about 7% reflectance (e.g., less than about 6% reflectance, less than about 5% reflectance, less than about 4% reflectance, or less than about 3% reflectance). The standard deviation of the substantially constant reflectance values ranged from about 2.9 to about 11.9 for an angle of incidence of 0 and for wavelengths from about 400 nm to about 900 nm. The standard deviation of the substantially constant reflectance values ranged from about 5.0 to about 19.2 for an angle of incidence of 45 and for wavelengths from about 400 nm to about 900 nm. The standard deviation of the substantially constant reflectance values ranged from about 2.8 to about 13.1 for an angle of incidence of 0 and for wavelengths from about 400 nm to about 800 nm. The standard deviation of the substantially constant reflectance values ranged from about 2.8 to about 11.1 for an angle of incidence of 45 and for wavelengths from about 400 nm to about 800 nm.
(37) Referring collectively to Tables 2 and 3, the average of the substantially constant reflectance values were generally within three standard deviations (i.e., h3, according to equation 3) of the target reflectance value of 90%. Most of the simulations resulted in an average of the substantially constant reflectance values within two standard deviations (i.e., h2). Some of the simulations resulted in an average of the substantially constant reflectance within fewer than two standard deviations (e.g., h1.5, h1, or h0.5).
(38) Referring now to
(39) The substantially constant reflectance values of the twenty-one layer [LH . . . (LH).sup.N . . . L] photonic structure of
(40) Referring now to
(41) The substantially constant reflectance values of the twenty-one layer photonic structure of
(42) It should now be understood that the multilayered photonic structures described herein may be utilized as semi-transparent components and/or coatings that are commonly made of conductive materials. For example, one embodiment of the multilayered photonic structure may be applied to a glass substrate, such as a window or a mirror. When applied to a window, the multilayered photonic structure may reflect light according to a target reflectance value that can be set to any desired value. Thus, a window comprising a multilayered photonic structure, as is described herein, may provide increased levels of privacy through increased target reflectance values. Additionally, since embodiments of the multilayered photonic structure are transparent to radio frequency electromagnetic radiation, such windows may provide an increased level of privacy without interfering with transmission signals.
(43) It is noted that the terms substantially and about may be utilized herein to represent the inherent degree of uncertainty that may be attributed to any quantitative comparison, value, measurement, or other representation. These terms are also utilized herein to represent the degree by which a quantitative representation may vary from a stated reference without resulting in a change in the basic function of the subject matter at issue.
(44) While particular embodiments have been illustrated and described herein, it should be understood that various other changes and modifications may be made without departing from the spirit and scope of the claimed subject matter. Moreover, although various aspects of the claimed subject matter have been described herein, such aspects need not be utilized in combination. It is therefore intended that the appended claims cover all such changes and modifications that are within the scope of the claimed subject matter.