MICROMECHANICAL INERTIAL SENSOR
20220357357 ยท 2022-11-10
Inventors
- Klaus Petzold (Reutlingen, DE)
- Reinhold Wolpert (Neuenstadt, DE)
- Sebastian Guenther (Tuebingen, DE)
- Zoltan Szkupien (Budapest, HU)
Cpc classification
International classification
Abstract
A micromechanical inertial sensor. The inertial sensor includes a first sensor element for measuring an inertial variable in a first frequency band, and a second sensor element for measuring a periodic acceleration in a second frequency band. The second frequency band is at least partially above the first frequency band.
Claims
1-5. (canceled)
6. A micromechanical inertial sensor, comprising: a first sensor element configured to measure an inertial variable in a first frequency band; and a second sensor element configured to measure a periodic acceleration in a second frequency band, the second frequency band being at least partially above the first frequency band.
7. The micromechanical inertial sensor as recited in claim 6, wherein the first sensor element is configured to measure the inertial variable in a first detection direction, and the second sensor element is configured to measure the periodic acceleration in the first detection direction.
8. The micromechanical inertial sensor as recited in claim 6, wherein the first sensor element is an accelerometer which is configured to measure smaller accelerations than the second sensor element.
9. The micromechanical inertial sensor as recited in claim 6, wherein the first sensor element is a rotation rate meter.
10. The micromechanical inertial sensor as recited in claim 6, further comprising: a signal processing unit configured to process a first measuring signal of the first sensor element and a second measuring signal of the second sensor element, and configured to output a first measuring signal which has been corrected and/or commentated based on the second measuring signal.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0017]
[0018]
DETAILED DESCRIPTION OF EXAMPLE EMBODIMENTS
[0019]
[0020] These sensors typically have bandwidths of 50 Hz to 400 Hz. The bandwidth is reduced by the ASIC to the desired degree to keep the noise of the sensor as low as possible. The typical bandwidth of the MEMS sensor element is 3 kHz to 5 kHz. In a range of 400 Hz to several kHz, it is thus possible to measure accelerations of the sensors which are not desirable for the useful signal (50 Hz to 400 Hz). These signals may result in sensor errors (signal bias) or in mechanical clipping of the sensor element. In the case of the sensor error, a good prediction about the magnitude of the sensor error may be made, having knowledge of the interference acceleration frequency and amplitude. Due to the PT2 behavior, the transfer function of the MEMS element rapidly decreases considerably above the resonance frequency of the MEMS element (f>10 kHz). Here, the MEMS element becomes immune toward interference accelerations. In a frequency range of 400 Hz to 10 kHz, knowledge of the present interference accelerations is very advantageous, first to compensate for the sensor signal in a part-specific manner with respect to sensor errors, and secondly to reliably detect the mechanical overload range of the sensor element.
[0021]
[0022] For this purpose, a second capacitance-to-voltage converter (C/V converter) 215 for generating a voltage corresponding to the present acceleration per channel, which supplies a second measuring signal 225, is integrated on the ASIC. Furthermore, a second signal processor 240 for signal processing is integrated. In signal processor 240 of the high-g signal, it is now possible to analyze the positions of the interference frequencies and their amplitudes, for example with the aid of FFT, high-pass filter, low-pass filter, bandpass filter, . . . ) and to transfer them as pieces of information 305 about the interference spectrum to the DSP of the low-g part, a signal processor including signal correction 235. Here, a compensation of the offset signal may be carried out, or an overload indicator may also be set in the event of an excessive mechanical overload. Signal processor 235 then outputs a low-g acceleration signal 310, corrected or also supplemented by pieces of information regarding overload.
[0023] The detection of high-frequency interference signals (>10 kHz) may also be important, specifically for rotation rate sensors. Since they are oscillators having a high quality G, interference frequencies up to several 100 kHz may play an important role here.
LIST OF REFERENCE NUMERALS
[0024] 1 micromechanical inertial sensor [0025] 10 MEMS chip [0026] 20 ASIC [0027] 110 x channel low-g acceleration sensor element [0028] 115 x channel high-g acceleration sensor element [0029] 120 y channel low-g acceleration sensor element [0030] 125 y channel high-g acceleration sensor element [0031] 130 z channel low-g acceleration sensor element [0032] 135 z channel high-g acceleration sensor element [0033] 210 first capacitance-to-voltage converter (C/V converter) low-g [0034] 215 second capacitance-to-voltage converter (C/V converter) high-g [0035] 220 first measuring signal [0036] 225 second measuring signal [0037] 230 first signal processor (low-g) [0038] 235 signal processor including signal correction [0039] 240 second signal processor [0040] 300 low-g acceleration signal [0041] 305 pieces of information about interference spectrum [0042] 310 low-g acceleration signal, corrected, supplemented by pieces of information regarding overload