Photodetector utilizing quantum dots and perovskite hybrids as light harvesters
10038156 ยท 2018-07-31
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Inventors
Cpc classification
B82Y20/00
PERFORMING OPERATIONS; TRANSPORTING
Y02P70/50
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
B82Y40/00
PERFORMING OPERATIONS; TRANSPORTING
H10K30/211
ELECTRICITY
Y10S977/892
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H10K30/82
ELECTRICITY
Y10S977/813
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H10K30/00
ELECTRICITY
H10K85/1135
ELECTRICITY
Y10S977/954
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H10K85/50
ELECTRICITY
H10K30/10
ELECTRICITY
Y02E10/549
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10S977/774
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
International classification
Abstract
A broad-band photodetector utilizes perovskite hybrid material and quantum dots as light harvesters. In particular, the photodetector is configured so that the structural defects on the surface of a quantum dot layer are passivated with perovskite hybrid material. As a result, the trap states on the surface of the quantum dot material is reduced, allowing leakage currents in the quantum dot material to be significantly reduced. As such, the photodetector is able to achieve broad-band operation, with enhanced photoresponsitivity and detectivity.
Claims
1. A photodetector comprising: an at least partially light transparent first electrode; a quantum dot layer positioned adjacent to said first electrode, said quantum dot layer having at least one defect site; a perovskite hybrid layer positioned directly adjacent to said quantum dot layer and configured to fill said at least one defect site; and a second electrode positioned adjacent to said perovskite hybrid layer.
2. The photodetector of claim 1, wherein said first electrode comprises indium-tin-oxide (ITO).
3. The photodetector of claim 1, wherein said quantum dot layer comprises lead sulfide (PbS) quantum dots.
4. The photodetector of claim 1, wherein said perovskite hybrid layer comprises CH.sub.3NH.sub.3PbI.sub.3.
5. The photodetector of claim 1, wherein said second electrode comprises a low work-function metal.
6. The photodetector of claim 5, wherein said low work-function metal is comprises Al or Ca.
7. The photodetector of claim 1, further comprising a first buffer layer positioned between said first electrode and said quantum dot layer.
8. The photodetector of claim 7, wherein said first buffer layer comprises PEDOT:PSS.
9. The photodetector of claim 1, further comprising a second buffer layer positioned between said second electrode and said perovskite layer.
10. The photodetector of claim 9, wherein said second buffer layer comprises PC.sub.61 BM.
11. The photodetector of claim 9, wherein said second buffer layer comprises n-type organic semiconductor material.
12. The photodetector of claim 1, wherein said first electrode, said quantum dot layer, said perovskite hybrid layer, and said second electrode are arranged along a vertical axis.
13. The photodetector of claim 1, wherein said perovskite hybrid layer is solution processed.
14. The photodetector of claim 1, wherein said quantum dot layer comprises a plurality of layers of quantum dots.
15. The photodetector of claim 1, wherein said quantum dot layer is annealed.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) These and other features and advantages of the present invention will become better understood with regard to the following description, appended claims, and accompanying drawings wherein:
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DETAILED DESCRIPTION
(20) A photodetector is generally referred to by numeral 10, as shown in
(21) As such, perovskite hybrid material, such as organolead halide perovskite or CH.sub.3NH.sub.3PbI.sub.3, is used to passivate the surface defects in the PbS QDs layer 40 of the photodetector 10. This is due to the fact that the perovskite hybrid material, such as CH.sub.3NH.sub.3PbI.sub.3, has an octahedron polycrystalline structure, which is on a scale of about 1 nm, which is small enough to reach the hard-to-access surface defect sites of the PbS QDs. As a result, the trap states of the PbS QDs are minimized by filling the surface defects with the CH.sub.3NH.sub.3PbI.sub.3 material. In addition, the CH.sub.3NH.sub.3PbI.sub.3 itself operates as an effective light harvester, which has been progressively developed for efficient photovoltaic operation. Thus, the photodetector 10 operates as an is uncooled, ultrasensitive, and solution-processed device, while providing broad-band operation using a vertical device structure, where both the CH.sub.3NH.sub.3PbI.sub.3 and the PbS QDs each individually act as light harvesters. Responsitivities (R) over 300 mA/W and 130 mA/W with D* exceeding 10.sup.13 Jones and 5?10.sup.12 Jones have been achieved in the visible and near IR (NIR) regions, respectively using the photodetector 10. Furthermore, the photodetector 10 provides high performance, broad-band operation at room-temperatures.
(22) A TEM (transmission electron microscope) image of the PbS quantum dots of the quantum dot layer 40 used in one or more embodiments of the photodetector 10 is shown in
(23) The photodetector 10 operating as a photovoltaic cell was also evaluated to assess the effect of the thin film thickness of the PbS QDs on photovoltaic performance. As such, the photodetector 10 was constructed in one embodiment to have the structure ITO/PEDOT:PS/PbS QDs/PC.sub.61BM/Al. The current densities versus voltage (J-V) characteristics of such device is shown in
(24) The architecture of the photodetector 10 and the cross-sectional scanning electron microscope (SEM) images of each layer in the ITO/PEDOT:PS/PbS QDs/PC.sub.61BM/Al structure are shown in
(25) The photoresponse of the photodetector 10 with the device structure of ITO/PEDOT:PSS/PbS QDs/CH.sub.3NH.sub.3PbI.sub.3/PC.sub.61BM/Al (identified as PbS QDs/CH.sub.3NH.sub.3PbI.sub.3 based PDs) was also evaluated, whereby its external quantum efficiency (EQE) spectrum (spectral response) is shown in
(26) In order to understand the physical changes that occur with the enhancement of the broad-band spectral response, particularly, the NIR spectral response, from the PbS QDs/CH.sub.3NH.sub.3PbI.sub.3 based photodetector 10, Mott-Schottky analysis was used. In particular, this analysis was first employed to evaluate how the doping density (N.sub.d) and the width of the depletion region (W.sub.p) in the PbS QDs changed by the incorporation of the CH.sub.3NH.sub.3PbI.sub.3 perovskite hybrid layer 50. As such, two-terminal devices with structures of ITO/P EDOT:PSS/PbS QDs/PC.sub.61BM/Al and ITO/PE DOT:PSS/PbS QDs/CH.sub.3NH.sub.3PbI.sub.3/Ca/Al were fabricated and characterized to estimate N.sub.d and W.sub.p in the PbS QDs/PC.sub.61BM and the PbS QDs/CH.sub.3NH.sub.3PbI.sub.3 thin films. From the band alignment shown in
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of the PbS QDs/PC.sub.61BM photodetector and the PbS QDs/CH.sub.3NH.sub.3PbI.sub.3 based photodetector 10 are shown in
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where C is the depletion region capacitance; ? is the static permittivity, which is 18 for PbS QDs; ?.sub.0 is the permittivity of free space; N.sub.d is the doping density of the donor; A is the active area and V is the applied voltage, respectively. The slopes of the linear regions in
(29) The depletion width is described by the following equation as:
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where N.sub.a and N.sub.d are the doping densities of PbS QDs and PC.sub.61BM (or CH.sub.3NH.sub.3PbI.sub.3), respectively. Doping densities of PC.sub.61BM and CH.sub.3NH.sub.3PbI.sub.3 are about 1.0?10.sup.16 cm.sup.?3 and 2.1?10.sup.17 cm.sup.?3, respectively. According to Eq. 2, the depletion width is estimated to be about 75 nm at the PbS QDs/PC.sub.61BM interface, which significantly increased to about 120 nm at the PbS QDs/CH.sub.3NH.sub.3PbI.sub.3 interface. Considering that the thickness of the PbS QDs thin film is about 100 nm, which exceeds the depletion width of the PbS QDs thin films in the PbS QDs/PC.sub.61BM interface, electron-hole pair recombination takes place in PbS QDs thin films for PbS QDs/PC.sub.61BM based photodetectors. While for PbS QDs/CH.sub.3NH.sub.3PbI.sub.3 based photodetector 10, the whole PbS QDs thin film is depleted, and the charge carrier recombination is largely suppressed, resulting in enhanced EQE spectral response in both visible and NIR regions, as shown in
(31) The density of states (DOS) extracted from the C-V curves was used to further investigate the trap states of the PbS QDs. The charge carrier concentrations, n, can be estimated by integrating the C-V curves over the voltages. As such, n is described as
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where A is the device area, e is the electron charge and d is the thin film thickness. It should be noted that n is the amount of excess charge carriers that are needed to separate the quasi-Fermi levels to the corresponding voltages, or n may be the number of mid-gap states that need to be filled. Thus, the spectrum of the DOS can be obtained by differentiating the carrier density with the voltages.
(33) In order to further confirm the above conclusion, the bi-molecular recombination kinetic was investigated. The bi-molecular recombination kinetic is illustrated by the variation of J.sub.SC as a function of light intensities.
(34) The PbS QDs/CH.sub.3NH.sub.3PBI.sub.3 based photodetector 10 and PbS QDs based photodetector 10 were further analyzed by J-V characteristics in dark conditions and under illumination by monochromatic light at a wavelength (?) of about 500 and 900 nm, measured at room temperature. The J-V characteristics of the two different photodetectors above are shown in
(35) According to
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where J.sub.ph is the photocurrent and L.sub.light is the incident light intensity, the responsitivity (R) from two different photodetectors is calculated. The detectivities (D*) are estimated based on the equation D*=R/(2qJ.sub.a).sup.1/2, where q is the absolute value of the electron charge (1.6?10.sup.?19 Coulombs), and J.sub.d is the dark current density (A/cm.sup.2). The R and D* from these two PDs are summarized in Table 1, shown in
(37) In addition, D* versus different wavelengths were estimated based on the EQE spectra of the photodetectors, the results of which are shown in
(38) The photocurrent densities versus the incident light intensity for the photodetectors are also measured and the results are shown in
(39) Thus, the embodiments of the photodetector 10 provide a facile approach to improving the performance of PbS QDs based broad-band photodetectors. Passivating the surface structural defects of PbS QDs with small molecular-scaled CH.sub.3NH.sub.3PbI.sub.3 organolead halide perovskite hybrid material not only significantly removes the trap states in the bandgap of PbS QDs, but also tremendously suppresses the dark current of the PbS QDs/CH.sub.3NH.sub.3PbI.sub.3 based photodetector 10, which effectively brings down the recombination losses and consequently raises the photoresponse of the photodetectors. In addition, CH.sub.3NH.sub.3PbI.sub.3 perovskite hybrid material 50 itself is a light-absorber, which contributes large photocurrents in the visible region. As a result, photodetector 10 exhibits broad spectral response from 375 nm to 1100 nm, with a high responsitivity over 300 mA/W and 130 mA/W, a high detectivity larger than 10.sup.13 Jones and 5?10.sup.12 Jones in the visible and NIR regions. The embodiments of the photodetector 10 also possess a linear dynamic range of about 100 dB. Furthermore, the performance of the photodetector 10 is comparable to those of inorganic photodetectors and indicate that the photodetector 10 of the embodiments of the present invention provide a facile and promising route for advancing the performance of broad-band photodetectors.
(40) Experimental Results:
(41) Materials:
(42) P-type PbS QDs, PBI.sub.2, PC.sub.61BM were purchased from Evident Technology, Inc., Alfa Aesar and Nano C Inc., respectively, and were used as received without further purification to form the photodetector 10. Methylammonium iodide (CH.sub.3NH.sub.3I, MAI) was synthesized in a lab. The perovskite precursor solution was prepared, whereby PbI.sub.2 and MAI were dissolved in dimethylformamide (DMF) and ethanol with the concentrations of 400 mg/mL for PbI.sub.2, and 35 mg/mL for MAI, respectively. All of the solutions were heated at about 100? C. for around 10 minutes to ensure that both the MAI and PbI.sub.2 were fully dissolved.
(43) Thin Film Preparation and Characterization:
(44) Ultra-violet visible (UV-vis) light absorption spectra of PbS QDs, CH.sub.3NH.sub.3PbI.sub.3 and PbS QDs/CH.sub.3NH.sub.3PbI.sub.3 thin films were measured using an HP 8453 spectrophotometer. Cross-sectional scanning electron microscope (SEM) images were measured by Model JEOL-7401 Japan electron optics laboratory (JEOL). The top-view transmission electron microscope (TEM) images were measured by Model JEOL JSM-1230. Photoluminescence (PL) spectra was obtained with a 532 nm pulsed laser as an excitation source at a frequency of about 9.743 MHz. The thickness of the PbS QDs and CH.sub.3NH.sub.3PbI.sub.3 thin films were obtained by atomic force microscope (AFM) measurement.
(45) Device Fabrication:
(46) PEDOT:PSS was spin-cast onto the top of pre-cleaned ITO substrates, followed by depositing multiple layers of PbS QDs followed with ligand exchange. The fabrication procedure utilized is as follows: the first layer of PbS QDs was spin-coated on the top of the PEDOT:PSS from 10mg/mL toluene solvent at about 1000 RPM for approximately 20 seconds, followed by rinsing the thin film in 1,2-ethanedithiol (EDT)/methanol solution (10 vol %) for about 30 seconds and then spin-cast for about 10 seconds to dry the film. The film was subsequently rinsed in methanol solvent to remove the excess EDT and then spin-cast for approximately 10 seconds to dry the film. Multiple layers of PbS QDs were fabricated by repeating the above procedures to obtain the desired thickness, and then annealed in air at about 90? C. for approximately 3 hours to complete the treatment. The CH.sub.3NH.sub.3PbI.sub.3 perovskite hybrid thin films were then processed by a 2-step fabrication method, whereby a PbI.sub.2 layer was spin-coated from 400 mg/mL DMF solution at about 3000 RPM for about 35 seconds on the top of the PbS QDs layer, then the thin film was dried at about 70? C. for approximately 5 minutes. After the film was cooled to room temperature, the MAI layer was the spin-coated on the top of the PbI.sub.2 layer from 35 mg/mL ethanol solution at about 3000 RPM for about 35 seconds, followed by transferring to the hot plate (100? C.) immediately. After thermal annealing at about 100? C. for approximately 2 hours, the PC.sub.61BM layer was deposited from 20 mg/mL chlorobenzene solution at about 1000 RPM for about 55 seconds. Lastly, the pero-HSCs where finished by thermal evaporation of the aluminum (Al) (100 nm). The resulting device area was defined to be about 0.16 cm.sup.2.
(47) Device Characterization:
(48) The electrical current densities versus the voltage (J-V) characteristics of the various photodetectors were measured using a Keithley 2400 source-power unit. The photodetectors were characterized using a solar simulator at a wavelength of about 500 nm with an irradiation intensity of about 0.80 mW/cm.sup.2 and 900 nm with an irradiation intensity of about 0.70 mW/cm.sup.2. The external quantum efficiency (EQE) of the photodetectors was measured with a commercial photomodulation spectroscopic setup (DSR 100UV-B) including a xenon lamp, an optical chopper, a monochromator, a lock-in amplifier operated by a PC computer, and a calibrated Si photodiode. The capacitance versus the voltage (C-V) characteristics were measured by a Keithley model 82-WIN Simultaneous CV System.
(49) Thus, it can be seen that the objects of the embodiments of the present invention have been satisfied by the structure and its method for use presented above. While in accordance with the Patent Statutes, only the best mode and preferred embodiments have been presented and described in detail, with it being understood that the embodiments of the present invention are not limited thereto or thereby. Accordingly, for an appreciation of the true scope and breadth of the invention, reference should be made to the following claims.