Ink-jet recording head, recording element substrate, method for manufacturing ink-jet recording head, and method for manufacturing recording element substrate
10029466 ยท 2018-07-24
Assignee
Inventors
Cpc classification
Y10T29/49401
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
B41J2/162
PERFORMING OPERATIONS; TRANSPORTING
Y10T29/42
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
B41J2/1607
PERFORMING OPERATIONS; TRANSPORTING
B41J2/1635
PERFORMING OPERATIONS; TRANSPORTING
International classification
Abstract
An ink-jet recording head includes a plurality of recording element substrates each having an ejection pressure generating element configured to generate pressure for ejecting ink from an ink discharge port. The plurality of recording element substrates each include a first surface on which the corresponding ejection pressure generating element is disposed and a second surface, serving as an end surface intersecting with the first surface, being at least partially formed by etching.
Claims
1. A method for dividing a silicon wafer, the method comprising: providing a silicon wafer to which a first group of ejection pressure generating elements and a second group of ejection pressure generating elements are arranged along each other, each of the first group and the second group including a plurality of ejection pressure generating elements for ejecting a liquid; and forming in the silicon wafer, by dry etching, a first supply port for supplying a liquid to the first group of ejection pressure generating elements, and a second supply port for supplying a liquid to the second group of ejection pressure generating elements; and dividing the silicon wafer into a first recording element substrate including the first group of ejection pressure generating elements and a second recording element substrate including the second group of ejection pressure generating elements by performing dry etching on an area, of the silicon wafer, between the first group of ejection pressure generating elements and the second group of ejection pressure generating elements.
2. The method for dividing the silicon wafer according to claim 1, wherein after the dry etching is performed, dicing is performed on the silicon wafer thereby divide the silicon wafer into the first recording element substrate and the second recoding element substrate.
3. The method for dividing the silicon wafer according to claim 1, wherein after the silicon wafer is provided, a resist film is formed on the silicon wafer as a mask for when the dry etching is performed.
4. The method for dividing the silicon wafer according to claim 1, wherein the provided silicon wafer includes a discharge port for discharging a liquid.
5. The method for dividing the silicon wafer according to claim 4, wherein the discharge port is formed on a flow channel forming member arranged on the provided silicon wafer.
6. The method for dividing the silicon wafer according to claim 1, wherein the forming of the first supply port and the second supply port is performed together with dividing the silicon wafer.
7. A method for dividing a silicon wafer, the method comprising: providing a silicon wafer to which a first group of ejection pressure generating elements and a second group of ejection pressure generating elements are arranged, each of the first group and the second group including a plurality of ejection pressure generating elements for ejecting a liquid; forming in the silicon wafer, by dry etching, a first supply port for supplying a liquid to the first group of ejection pressure generating elements, and a second supply port for supplying a liquid to the second group of ejection pressure generating elements; and performing dry etching on an area, of the silicon wafer, between the first group of ejection pressure generating elements and the second group of ejection pressure generating elements in order that the silicon wafer is divided into a first recording element substrate including the first group of ejection pressure generating elements and a second recording element substrate including the second group of ejection pressure generating elements.
8. The method for dividing the silicon wafer according to claim 7, wherein the provided silicon wafer includes a discharge port for discharging a liquid.
9. The method for dividing the silicon wafer according to claim 8, wherein the discharge port is formed on a flow channel forming member arranged on the provided silicon wafer.
10. The method for dividing the silicon wafer according to claim 7, wherein the forming of the first supply port and the second supply port is performed together with dividing the silicon wafer.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DESCRIPTION OF THE EMBODIMENTS
(10) Exemplary embodiments of the present invention will now be described with reference to the drawings.
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(12) Next, the structure of the recording element substrates 3 will be described with reference to
(13) The recording element substrate 3 is manufactured as shown in
(14) Next, as shown in
(15) Next, as shown in
(16) Finally, as shown in
(17) The ink-jet recording head 1 using the recording element substrates 3 manufactured as above is manufactured with the following method.
(18) First, a recording element substrate 3 is disposed on a positioning jig 43 shown in
(19) Next, as shown in
(20) As another positioning method, a plurality of recording element substrates 3 can be disposed at predetermined positions on the supporting member 5 by bringing the etched surfaces 15 of the recording element substrates 3 into contact with positioning references disposed on the supporting member 5.
(21) According to the ink-jet recording head 1 manufactured as above, the second surfaces 15, intersecting with the first surface 13 having the ink discharge ports 7 and forming the side surfaces of the recording element substrate 3, are at least partially subjected to etching. Since the second surfaces 15 subjected to etching are corrosion-resistant, the surface accuracy of the second surfaces 15 can be ensured. Therefore, the accuracy of the relative positions of a plurality of recording element substrates 3 when they are bonded can be ensured by bringing the recording element substrates 3 into contact with each other at the second surfaces 15 whose surface accuracy is ensured. As a result, the accuracy of the distances between the ink discharge ports arranged in the recording element substrates can also be ensured, and the ink-jet recording head can support the accuracy required for bonding the recording element substrates with densely arranged discharge ports. Thus, variations in accuracy of the positions of the recording element substrates when they are fixed can be markedly improved compared with those in known ink-jet recording heads. Moreover, the ink-jet recording head can be easily manufactured since the accuracy of positions of the recording element substrates 3 when they are bonded can be satisfied without using image processing systems. Furthermore, since the etching openings 33 are formed between the etched surfaces 15 of two adjacent recording element substrates 3 as shown in
(22) The following modification is possible for fixing the recording element substrates 3 according to the above-described exemplary embodiment on the supporting member 5. That is, positioning portions can be formed on the supporting member 5, and the recording element substrate 3 can be disposed such that the second surfaces 15 thereof are brought into contact with the positioning portions. With this, the plurality of recording element substrates can be positioned with respect to the supporting member, and the positions of the recording element substrates on the supporting member when they are fixed can be ensured without bringing the recording element substrates into contact with each other. Although a full-line recording head having a plurality of recording element substrates was described in the above-described exemplary embodiment, the present invention is not limited to this. For example, the present invention is applicable to a recording head in which a single recording element substrate is positioned by being brought into contact with a positioning portion on a supporting member.
(23) In addition, the recording element substrates 3 can be accurately positioned as follows. That is, as shown in
(24) While the present invention has been described with reference to exemplary embodiments, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all modifications and equivalent structures and functions.