ELECTRONIC ASSEMBLY HAVING A POWER SEMICONDUCTOR COMPONENT BETWEEN TWO CIRCUIT CARRIERS, AND METHOD FOR PRODUCING SAME

Abstract

An electronic assembly having a power semiconductor component and a circuit carrier. The power semiconductor component has a contact region on opposite sides; the contact region facing the circuit carrier is in electrical contact with a connection region of the circuit carrier; the power semiconductor component is in electrical contact on the side facing away from the circuit carrier, in the region of the contact region, with a further circuit carrier; an additively generated connecting layer is arranged on the contact region and/or the connection region of the circuit carriers; and the connecting layer is connected to the connection region and/or the contact region using a solder connection. The connecting layer has a lower modulus of elasticity in a direction or plane extending perpendicularly to the surface of the power semiconductor component than in a direction or plane extending in parallel with the surface of the power semiconductor component.

Claims

1-10. (canceled)

11. An electronic assembly, comprising: a power semiconductor component and a circuit carrier, the power semiconductor component having at least one contact region on each of opposite sides of the power semiconductor component, and at least of the contact regions facing the circuit carrier being in electrical contact with a connection region of the circuit carrier; wherein the power semiconductor component is in electrical contact on a side facing away from the circuit carrier, in a region of at least one of the contact regions of the power semiconductor component, with a further circuit carrier, an additively generated connecting layer is arranged on the at least one contact region and/or the connection region of the circuit carriers, and the at least one connecting layer is connected to the connection region and/or the contact region by a solder connection.

12. The electronic assembly according to claim 11, wherein the connecting layer has a lower modulus of elasticity in a direction extending perpendicularly to a surface of the power semiconductor component than in a direction extending in parallel with the surface of the power semiconductor component.

13. The electronic assembly according to claim 11, wherein the connecting layer is formed from a plurality of sub-layers of a metal starting material, and at least some of the sub-layers have gaps or free spaces in a plane extending in parallel with a surface of the power semiconductor component.

14. The electronic assembly according to claim 11, wherein the connecting layer has a lower modulus of elasticity in a plane extending perpendicularly to a surface of the power semiconductor component than in a plane extending in parallel with a plane of the power semiconductor component, by forming the connecting layer with a herringbone pattern.

15. The electronic assembly according to claim 13, wherein at least a first sub-layer of the connecting layer formed on the contact region or the connection region is a full-surface sub-layer.

16. The electronic assembly according to claim 13, wherein at least one of the sub-layers of the connecting layer arranged on the side facing the connection region has gaps or free spaces.

17. The electronic assembly according to claim 11, wherein the circuit carrier and the further circuit carrier are in electrical contact with one another in a region outside the power semiconductor component, and at least one of the additively generated connecting layers is arranged in a region of the contacting.

18. The electronic assembly according to claim 11, wherein the circuit carrier and the further circuit carrier are in electrical contact with one another in a region outside the power semiconductor component, with an interposition of a contact element, and at least one of the additively generated connecting layers is arranged in a region of the contacting

19. The electronic assembly according to claim 11, wherein the power semiconductor component is a transistor and the circuit carrier and the further circuit carrier are each a substrate.

20. A method for forming an electronic assembly, the method comprising the following steps: constructing a connecting layer on and/or in a region of a contact region of a power semiconductor component and/or on a connection region of a circuit carrier and/or of a further circuit carrier in an additive manufacturing process; contacting the circuit carrier and the further circuit carrier with interposition of the power semiconductor component; and forming a solder connection between the connecting layer and: (i) the connection region, or (ii) the contact region.

21. The method according to claim 20, wherein a solder is applied on the connecting layer by dispensing.

Description

BRIEF DESCRIPTION OF THE DRAWING

[0016] FIG. 1 shows, in a simplified longitudinal section, an electronic assembly between a power semiconductor component designed as a transistor and circuit carriers, each in the form of a substrate, arranged on opposite sides of the power semiconductor component, according to an example embodiment of the present invention.

DETAILED DESCRIPTION OF EXAMPLE EMBODIMENTS

[0017] An electronic assembly 100 is shown in FIG. 1, which assembly comprises a power semiconductor component 10 in the form of a transistor 12, a circuit carrier 14 in the form of a substrate 16 and a further circuit carrier 18, also in the form of a substrate 20, the power semiconductor component 10 being in electrical contact with the two circuit carriers 14 and 18. Furthermore, the planes of the power semiconductor component 10 and of the two circuit carriers 14 and 18 extend in parallel with one another.

[0018] On the side facing the circuit carrier 14, the power semiconductor component 10 has two contact regions 22, 24 arranged separately from one another and formed by metallizations, and on the side facing the further circuit carrier 18, a single contact region 26 likewise formed by a metallization. Furthermore, connection regions 28, 30, 32 in the form of conductor trace sections 34 are provided on the two circuit carriers 14 and 18, associated with the relevant contact region 22, 24 and 26.

[0019] Additively produced connecting layers 36, 38 and 40 are arranged between the connection regions 28, 30 and 32 and the contact regions 22, 24 and 26. The connecting layers 36, 38 and 40, which are preferably produced by layer-by-layer construction of a metal starting material (metal powder) and subsequent selective melting of the starting material by means of an electron beam (laser beam), are generated, in particular, on the connection regions 28, 30 or 32, alternatively or additionally on the contact regions 22, 24 and 26 of the power semiconductor component 10.

[0020] Furthermore, the connection between the connecting layers 36, 38 and 40 and the circuit carriers 14 and 18 and the power semiconductor component 10 takes place via solder connections (not shown in FIG. 1). The solder connections are always formed on the side or the element on which no construction of the connecting layer 36, 38, 40 takes place.

[0021] As can be seen from FIG. 1, gaps 42 or free spaces are formed in the connecting layers 36, 38 and 40 in a plane extending perpendicularly to the plane of the power semiconductor component 10 and the circuit carriers 14 and 18 or in parallel with the drawing plane of FIG. 1. In particular, the connecting layers 36, 38 and 40 each form herringbone patterns 44, in such a way that, according to the double arrow 45 in a direction perpendicular to the plane of the power semiconductor component 10 and the circuit carriers 14 and 18, the connecting layers 36, 38 and 40 have a lower rigidity or a lower modulus of elasticity than in the direction of the plane of the power semiconductor component 10 or of the circuit carriers 14 and 18. As a result, thermomechanical stresses extending in the direction of the double arrow 45 are at least partially absorbed or equalized by the connecting layer 36, 38, 40 in the sense of a spring element, and a forwarding of corresponding stresses to the power semiconductor component 10 or the circuit carriers 14, 18 is reduced.

[0022] In addition, it can be provided that the two circuit carriers 14 and 18 are in electrical contact with one another in a region outside the power semiconductor component 10. In the embodiment shown, a contact element 46 in the form of a solder connector 48 is additionally provided between the two circuit carriers 14 and 18. Connecting layers 54 and 56 formed in an additive manufacturing process, which are arranged between the conductor trace sections 48 and 50 and the contact element 46, are also formed between the contact element 46 and conductor trace sections 50, 52 of the two circuit carriers 14 and 18.

[0023] The electronic assembly 100 described thus far can be modified in many ways without deviating from the idea of the present invention.