Heat-activated pump with integrated evaporator for electronic chip heat removal
12133363 ยท 2024-10-29
Assignee
Inventors
Cpc classification
H05K7/20827
ELECTRICITY
H05K7/20818
ELECTRICITY
F04F1/04
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
H05K7/20327
ELECTRICITY
F28D15/0266
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
International classification
H05K7/20
ELECTRICITY
F04B19/24
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
F04F1/04
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
F28D15/02
MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
Abstract
A heat-activated pump removes waste heat from an electronic chip. An evaporator integrated into the chip packaging receives heat from the chip, converting a working fluid into vapor. Piping from the evaporator to a heat exchanger and back form a fluid circulation system. A pressure-control valve set for a specified electronic operating temperature allows vaporized working fluid to vent into a liquid-piston chamber, where it expands adiabatically, displacing pumped liquid in a pumping stage and expelling it from the chamber through a unidirectional valve to the shared heat exchanger(s). The heat exchanger(s) has a heatsink transferring heat away to a flow of cooler fluid. The pumped liquid returns in a suction cycle to the chamber through another unidirectional valve. An injector valve returns jets of condensed working fluid to the evaporator in successive brief spurts responsive to periodic pressure pulses in the chamber.
Claims
1. A heat-activated pump for removal of waste heat from an electronic chip, comprising: the electronic chip generating the waste heat; an evaporator containing a working fluid, the evaporator built into and integrated with a packaging of the electronic chip to receive the waste heat from the electronic chip to convert a liquid phase of the working fluid into a vapor of the working fluid; a pressure-control safety valve coupled to an exit port of the evaporator and maintaining the working fluid in the evaporator at a set target pressure and allowing the vaporized working fluid to escape through the exit port whenever the set target pressure is exceeded; a liquid-piston chamber coupled to the pressure-control valve to receive the vaporized working fluid from the evaporator at the set target pressure, the vaporized working fluid expanding adiabatically and displacing a liquid within the liquid-piston chamber, the liquid comprising the liquid phase of the working fluid, expelling the liquid from the liquid-piston chamber in a pumping stage of a thermodynamic cycle; a unidirectional pump-exit check valve coupled to a first exit port of the liquid-piston chamber to allow the working fluid and/or the displaced liquid to exit the liquid-piston chamber; a unidirectional liquid suction-entry check valve coupled to a return port of the liquid-piston chamber to allow the displaced liquid to enter the liquid-piston chamber; a heat exchanger with a heatsink, the heat exchanger coupled to the unidirectional pump-exit check valve to receive the displaced liquid into the heat exchanger, and the unidirectional liquid suction-entry check valve to allow the displaced liquid to return to the liquid-piston chamber in a suction stage of the thermodynamic cycle, the heatsink radiating the waste heat away to a flow of cooler fluid; and a unidirectional injector return check valve coupled to both a second exit port of the liquid-piston chamber and an input port of the evaporator, wherein periodic pressure pulses of the liquid phase of the working fluid from the liquid-piston chamber that temporarily exceed the set target pressure in the evaporator facilitate jets of the liquid phase of the working fluid to replenish the evaporator in successive brief spurts.
2. The heat-activated pump as in claim 1, wherein the evaporator is in the form of microchannels built into the packaging of the electronic chip.
3. The heat-activated pump as in claim 1, wherein the evaporator is a thermally insulative plate with edges bonded to a face of the electronic chip and with a hole for vapor egress and another hole for liquid ingress.
4. The heat-activated pump as in claim 3, wherein the pressure-control safety valve is in the form of a load disc applying deadweight upon the hole for the vapor egress to permit the vapor egress only when the specified target pressure that corresponds to the deadweight is reached.
5. The heat-activated pump as in claim 3, wherein the pressure-control safety valve is in the form of a flexible diaphragm covering the hole for the vapor egress and with a specified thickness and stiffness that flexes open to permit the vapor egress only when the specified target pressure is reached.
6. The heat-activated pump as in claim 1, wherein the liquid-piston chamber and the heat exchanger are in a form of at least one fluid channel accommodated in a single plate housing.
7. The heat-activated pump as in claim 6, wherein the unidirectional pump-exit check valve, the unidirectional liquid suction-entry check valve, and the unidirectional injector return check valve are in a form of balls confined within the at least one fluid channel, the at least one fluid channel having narrow backstops to limit a positional range of the balls.
8. The heat-activated pump as in claim 7, wherein the narrow backstops include O-ring gaskets to seal the at least one fluid channel whenever engaged by a respective one of the balls against a corresponding one of the O-ring gaskets.
9. The heat-activated pump as in claim 6, wherein the at least one fluid channel defining the liquid-piston chamber has a length that accommodates a specified volume of the vaporized working fluid and the displaced liquid.
10. The heat-activated pump as in claim 9, wherein at least one fluid channel defining the liquid-piston chamber has a serpentine arrangement within the single plate housing.
11. The heat-activated pump as in claim 6, wherein the single plate housing with the at least one fluid channel therein has a heat spreader cover in thermal transfer relation to an ambient environment having the flow of the cooler fluid.
12. The heat-activated pump as in claim 11, wherein the heat spreader cover further includes the heatsink attached thereto.
13. The heat-activated pump as in claim 1, further comprising a permanent magnetic material within the displaced liquid in the liquid-piston chamber, and an induction electrical generator surrounding the liquid-piston chamber for generating electrical current.
14. The heat-activated pump as in claim 13, wherein the permanent magnetic material is confined between backstops embedded in a groove defining the liquid-piston chamber, and the induction electrical generator comprises copper windings adjacent to the groove.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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DETAILED DESCRIPTION
(10) Nomenclature
(11) Working Fluid: The fluid whose change in phase is utilized to performing the pumping operation. The working fluid could be selected from a variety of fluid options: water, as well as commonly used or new refrigerants (e.g., R-130, R-245fa, R-407c, R-410a, R-454b, R-1234yf, etc.). In addition to performance and desired temperature range, safety (flammability and exposure limits) will be factors in the choice of working fluid.
(12) Pumped Fluid: The fluid which needs to be pumped from one location to another. This could be the same as the working fluid or it could be a different fluid material altogether. If the pumped fluid is different, it would need to be immiscible with the working fluid. In that case, a separator 113 may be provided (as seen in
(13) Ambient Temperature: The temperature in the general environment around the region or device in focus.
(14) The Heat-Activated Multiphase Fluid-Operated Pump
(15) The HAMFOP pump utilizes heat to pump a fluid. The heat is used to convert a working fluid from liquid to vapor. The vapor is then used to displace the fluid that needs to be pumped.
(16) The principle of operation is as follows, as referenced by the numbered elements in
(17) In the case where the pumped fluid 114 (and 106) is composed of a different material from the working fluid 102 (and 110), and not merely a different liquid-vapor phase of the same material, a difference in density between the working and pumped fluids can be leveraged to separate them. The elements of such an embodiment are largely identical to structure and operation to those in
(18) Heat Activated Pump for Cooling of Large Systems such as racks of PCBAs, Datacenters and other such large electronic systems A heat activated pump system can be used to move fluid around a datacenter as illustrated in
(19) Heat activated pumps on devices attached to PCBAs in a rack pump the cooling fluid around in piping running throughout the data center. The datacenter-level heat activated pump system uses this hot pumped fluid from each individual heat activated pump to pump the fluid to the heat exchanger and return the fluid back to the PCBA level devices at a cool temperature to close the circuit as shown in
(20) Heat Activated Pump for Cooling of Electronic Devices Mounted on PCBAs
(21) As seen especially in
(22) TABLE-US-00001 Material Element Options Description Printed Circuit Standard The board on which Board 200 Industry different electrical Materials devices are mounted Chip 201 Standard Generic designator for the Industry device that needs to be Materials cooled. It could be a logic chip, memory, optical device etc. It could be a single monolith or a heterogeneous multichip device. Thermal Standard A thin material used to Interface Industry contact two heat Material Materials transferring surfaces. The (TIM) 202 fluid-operated heat activated pump could be bonded directly to the chip or contacted via the TIM material Evaporator High Thermal The outer body of the Enclosure 203 Conductivity: evaporator. This could be Copper, standalone if a metal foam Aluminum, is inserted into the High Temp enclosure. It could be Ceramic etc. integrated with the core Evaporator High Thermal The core is where the Core 204 Conductivity: working vapor is created. Copper, It is designed to have the Aluminum, highest surface area High Temp possible for max heat Ceramic, transfer. Core examples: Metal Foam metal foam, serpentine etc. grooved trenches, or bonded fins Evaporator Top High Thermal Plate to allow vapor to Cover 205 Conductivity: exit the evaporator and Copper, return to it. Comprised Aluminum, of holes strategically High Temp located to allow vapor Ceramic etc. exit and liquid return Could be bolted, soldered, or welded to evaporator and pump Pump 206 Insulating Vapor from evaporator material: enters the pump, flows PTFE, Nylon, through the channel Plastic, or displacing existing fluid. other Vapor condenses in the material channel while displacing coated with the fluid and evacuating insulation the channel, thus creating a low-pressure cavity for fresh fluid to be sucked in. Contains three valves integrated into it: pump fluid out, return some fluid back to evaporator and suck fresh fluid in Valve Balls 207 Plastic, Balls (could also be thin Metal (Steel, discs) designed to allow Tungsten only unidirectional flow etc.), as desired. O-rings Rubber, could also be used with Ceramic the balls to ensure tight seals Pressure Valve High Temp, Thin, flexible gasket Gasket 208 Fluid Vapor designed to seal the Resistant vapor entry into pump (e.g., Silicone) Pressure Valve Copper, Shaft designed to apply Seat 209 Aluminum, solid pressure on valve High Temp gasket, so the vapor does Ceramic, or not enter the pump high temp chamber until the plastic etc. pressure exceeds target load value. Diaphragm 210 Silicone, Diaphragm designed to Rubber, or flex to allow vapor to other escape into second chamber flexible when pressure exceeds material that target load. Diaphragm can can withstand be replaced with O-rings working vapor or metal bellows in other pressure, embodiments as needed chemical and temperature conditions Heat High Thermal Pumped hot liquid flows exchanger 211 Conductivity: from the pump to the heat Copper, exchanger. Heat exchanger Aluminum, has serpentine channels to High Temp move fluid and exchange Ceramic etc. heat with heatsink Could be attached on top of it. bolted, Condensed fluid then soldered, or returns to the pump welded to chamber through the pump suction valve. Heat exchanger could also send fluid to another secondary heat exchanger for more cooling Heatsink 211 High Thermal Heat from the heat (combined with Conductivity: exchanger is transferred heat exchanger) Copper, to the heatsink by Aluminum, conduction. Fins on the High Temp heatsink accelerate heat Ceramic etc. transfer to flowing air. In another embodiment, the heatsink could be more tightly integrated into the heat exchanger like a conventional radiator. Different heatsink fins could be used: wavy, elliptical, slotted etc. The heatsink can be mechanically clamped/bolted down to the PCB to ensure it remains firmly in place over the chip. A backing plate underneath the PCB ensures the board remains supported and the chip is not excessively loaded in-situ or during assembly. Whenever needed, the entire assembly can simply be removed and replaced Load Seat 212 Metal or The seat applies a plastic- mechanical advantage by high rigidity balancing the force of the load on top of it with the vapor counter-pressure from the valve seat. Grooves on the top surface keep the load centered on the load seat. Load 213 High density The target weight that the material: vapor needs to overcome Tungsten, to open the valve. The load Liquid could be a dead weight or Gallium etc. a compression spring that could be deflected to impart the same target load resistance. Load Rigid sheet Designed to hold the load Cover 214 metal or in place and prevent it plastic, from falling off. Also preferably designed to provide a heat back-stop to ensure that insulating. the load does not displace Could be excessively due to vapor bolted, pressure in case the welded, or diaphragm fails. soldered on to the heatsink body
(23) This specific embodiment is for a chip and board horizontally oriented with the heat activated pump mounted on top of the chip. This design can easily be modified to operate with a chip and board vertically oriented as well. In situations where multiple chips are mounted close together (as in chiplets on a single substrate) and some of the chips have lower operating temperature requirements as compared to others (as in memories and logic devices); then their heat paths can be completely separated into two distinct pumps operating independently. The vapor pressure of each pump can be tuned to match the target operating temperature of each chip to be cooled. This way, cross heating is mitigated, and each chip operates close to its own target temperature.
(24) Evaporator
(25) The details of the evaporator are outlined in
Pressure Control Valve
(26) The details of the pressure control valve are outlined in
Piston Chamber
(27) The details of the piston are outlined in
Valves
(28) The details of the valves 207a-207c are outlined in
(29) Heat Exchanger
(30) The details of the heat exchanger and heatsink 211 are outlined in
(31) Multiple Chips on PCBA Implementation
(32) The aforementioned implementations are for cooling only one individual electronics device on a PCBA 200. When multiple devices 217 are mounted on a PCBA 200, an example arrangement is shown in
(33) The fluid-operated heat activated pumps 218 of multiple devices can be joined together to a common heat exchanger 219, as seen in
(34) The heat exchanger 219 can also be placed in front of the target device so the heat exchanger receives the coolest incoming air and the hot air it releases downstream can be directed at the device to ensure it runs hot.
(35) The heat activated pumps on each device interconnected, convert part of the collective heat dissipated by the devices into useful work to pump the cooling fluid around the devices, to maintain them at a constant target temperature.
(36) Heat Activated Pump for Cooling of Low Wattage Electronics (Smartphones, Wearables, Flat Panels, Etc.)
(37) A fluid-operated heat activated pump for space-constrained devices (smartphones, wearables, etc.) is shown in
(38) TABLE-US-00002 Material Element Options Description Chip 201 Standard Generic designator for the Industry device that needs to be Materials cooled. It could be a logic chip, memory, optical device etc. It could be a single monolith or a heterogeneous device complex. The silicon chip could have microchannels fabricated on the back side, using a standard Deep Reactive Ion Etching (DRIE) process, typically 50 microns deep. The purpose of the microchannels is to increase the surface area, to enhance boiling. Conventional silicon microchannels have the challenge of restricting the flow of fluid (due to their small dimensions and thus increased resistance to fluid flow). However, this application of silicon microchannels is different because fluid is not pushed through them. Instead, they serve as fins to enable faster heat transfer for boiling. Evaporator Thermal The side facing the chip has Plate 220 insulator 2 holes: one for vapor egress (combined material: 233f and another for liquid with the chip) plastic, ingress 233e. The edges of the polymer, evaporator plate 220 are ceramic etc. bonded to the chip using any industry standard technique: solder, brazing, non-outgassing adhesive, welding etc. Pressure Thermal The load disc 223 transfers Control insulator pressure from the deadweight Valve-Load material: to the evaporator hole to Disc 223 plastic, prevent vapor from exiting polymer, before the deadweight pressure ceramic etc. is reached. The disc could be used standalone or with a gasket/O-ring to achieve leak free contact. The disc could also be a sphere. Pressure Silicone, Diaphragm 224 is designed to Control Rubber, or flex to allow vapor to escape Valve- other flexible into second chamber when Diaphragm 224 material that pressure exceeds target load. can withstand If there is no space for a working vapor deadweight, the diaphragm pressure, itself can be stiffened to act chemical and as the deadweight by tuning temperature its thickness. The diaphragm conditions. It can be replaced with O-rings could also be or metal bellows in other fabricated embodiments as needed. The from silicon diaphragm material is extended or silicon to cover above the piston area carbide using as well, where it serves as a standard wafer thermal insulator preventing lithography heat from leaving the piston techniques 234 through the top high thermal conductivity metal heat spreader. Pressure Metal or The seat 226 applies a Control plastic-high mechanical advantage by Valve-Load rigidity. balancing the force of the Seat 226 load 223 on top of it with the vapor counter-pressure from the valve seat. Grooves on the top surface keep the load 223 centered on the load seat 226. Pressure High Temp, Thin, flexible gasket 227 is Control Fluid Vapor designed to seal a liquid load Valve- Resistant on top of the load seat 226. Gasket 227 (e.g., Silicone) Single Plate Any insulating This accommodates the piston Housing 232 and rigid chamber 221, heat exchanger material 230 with channels 231, and the valves 233a, c and d, 235 in a single plate with small form factor. Piston NA This is a cavity with input Chamber 221 port 215 and built into the evaporator plate 220, towards the heat spreader side. The groove can be a single channel, or it can be a serpentine channel depending on how much volume needs to be displaced. Backstops 234a-b are embedded in the piston groove 234 (in current generating applications only) to ensure that magnetic material suspended in the liquid does not leave the piston-chamber. Heat NA This is a cavity 230 built Exchanger into the evaporator plate 220. 230 It could be a single channel, or a series of channels 231 connected together in parallel. The heat exchanger could also be completely off- the-chip depending on the amount of heat loss required. Inductive Copper This interacts with magnetic electrical winding and material between the backstops generator 236 ferro-magnetic 234a-b to induce a current in material the windings 236. Valves 233a, c NA These are cavities with and d, 235 specific obstructions built into the chambers to allow fluid to flow uni-directionally. 233a is the injector return check valve with small hole 233f returning; 233c is the pump-exit check valve with a groove 233b forming a first exit port of the liquid-piston chamber; 233d is the suction-entry check valve coupled to a groove 233e forming the return port of the liquid-piston chamber. Piston Cover High Thermal This plate closes the pump and Heat Conductivity and isolates it to protect it. It Spreader 225 Material: also transfers heat from the Copper, heat exchanger 230 to the Aluminum etc. ambient environment. It could be attached with thermal adhesive to the chassis of a smartphone, watch etc. A finned heatsink could also be attached to the top if there is convective air cooling available. Valve Balls Plastic, Metal Balls 222 (could also be thin 222 (Steel, discs) designed to allow only Tungsten etc.), unidirectional flow as Rubber, desired. O-rings could also be Ceramic used with the balls to ensure tight seals Pressure Valve High Temp, Thin, flexible gasket 227 Gasket 227 Fluid Vapor designed to seal the vapor Resistant entry into the pump (e.g., Silicone) Load Rigid sheet Designed to hold the load 223 Cover 228 metal or plastic, (solid or liquid) in place and preferably prevent it from falling off. heat insulating. Also designed to provide a If liquid is back-stop to ensure that the used, could be load does not displace made of rubber excessively due to vapor or other flexible pressure in case the material. Could diaphragm fails. be bolted, welded, or soldered on to the heatsink body Load Cover Metal or This is needed when a liquid Top 229 Plastic, Rigid load is used. The liquid load is poured into the load cover to the desired height and then the top is used to seal the cover to prevent spillage.
(39) In vertical space constrained applications, a deadweight load cannot be used, especially if the operating temperature is high. In such situations, the diaphragm itself could be stiffened to act as the load by selecting the appropriate thickness, material, and diameter. In situations where a diaphragm cannot be used, a spring or a liquid dead weight (like Gallium) can be used. The operating principle is Pascal's law: the pressure in a fluid is always the same and the pressure is a function of the height of the fluid.
(40) Taller columns produce higher counterweight. In some situations, the counterweight load may need to be dynamically changed (increased or decreased) while the unit is operating. For instance: the ambient temperature temporarily increases beyond nominal values. A higher ambient temperature means a higher flowrate is required through the heat exchanger to transfer the same amount of heat. If the duty load on the chip is low, the temperature of the chip can be raised slightly, so the pump does more work and increases the flowrate through the heat exchanger. This increase in chip temperature can be accomplished by raising the deadweight value: by increasing the height of the liquid column. This can be achieved by using a bimetallic strip which contracts in diameter, thus raising the height of the liquid column.
(41) In applications where the ambient temperature is too high (e.g., a smartphone left on a car dashboard or an electronic device in a higher than specified ambient environment), the pump will act as a thermal switch where heat from outside the device will not be conducted back into the device. It accomplishes this because the pump is designed to transfer heat from the evaporator to the heat exchanger. If the heat exchanger temperature exceeds the evaporator temperature, the pump will cease to function until the heat exchanger temperature drops below the evaporator temperature.