Illumination optical unit for EUV projection lithography
10018917 ยท 2018-07-10
Assignee
Inventors
- Stig Bieling (Aalen, DE)
- Martin Endres (Koenigsbronn, DE)
- Markus Deguenther (Aalen, DE)
- Michael Patra (Oberkochen, DE)
- Johannes Wangler (Koenigsbronn, DE)
Cpc classification
G03F7/70116
PHYSICS
G03F7/702
PHYSICS
G03F7/70075
PHYSICS
G03F7/70233
PHYSICS
International classification
Abstract
An illumination optical unit for EUV projection lithography illuminates an object field, in which an object to be imaged is arrangeable. A first facet mirror of the illumination optical generates secondary light sources as images of an upstream light source. The first facet mirror includes mirrors which include a mirror surface smaller than 2 mm2 mm. The first facet mirror is a distance |g| from the light source. The illumination optical unit includes a second facet mirror. The two facet mirrors are a distance b from each other. The individual mirrors of the first facet mirror have a focal length f in a plane of incidence of the illumination light on the individual mirrors such that [0.1 bg/(gb)]<f<[10 bg/(gb)].
Claims
1. An illumination optical unit configured to illuminate an object field with illumination light, the illumination optical unit comprising: a first facet mirror; and a second facet mirror, wherein: the illumination optical unit is an EUV lithography illumination optical unit; the first facet mirror is configured to generate imaging secondary light sources as images of an upstream light source; the first facet mirror comprises a multiplicity of individual mirrors; each individual mirror of the first facet mirror comprises a mirror surface that is less than 2 mm2 mm; the first facet mirror is a distance |g| from the light source; the two facet mirrors are a distance b from one another; the individual mirrors of the first facet mirror have a focal length f in a plane of incidence of the illumination light on the individual mirrors of the first facet mirror;
[0.1 bg/(gb)]<f<[10 bg/(gb)]; at least some of the individual mirrors have different radii of curvature in the plane of incidence and/or a folding plane; the at least some of the individual mirrors have different radii of curvature perpendicular to the folding plane; and the following applies to the radius of curvature r.sub.1 in the folding plane: 20 bg/((gb) cos (/2))<r.sub.1<0.2 bg/((gb) cos (/2)), where is a folding angle of the illumination light upon reflection at the respective individual mirror of the first facet mirror.
2. The illumination optical unit of claim 1, wherein: the upstream light source has a typical diameter G; for each individual mirror of the first facet mirror, the mirror surface has a typical diameter F; and the focal length f deviates from an ideal focal length f.sub.opt=bg/(gb) by at most a factor of 0.3 bG/((bg) F).
3. The illumination optical unit of claim 1, wherein: the upstream light source has a typical diameter G; for each individual mirror of the first facet mirror, the mirror surface has a typical diameter F; and the focal length f deviates from an ideal focal length f.sub.opt=bg/(gb) by at most the factor of 750 m [g/((gb).Math.F)].
4. The illumination optical unit of claim 1, wherein the radius of curvature r.sub.1 deviates from an ideal radius of curvature
5. The illumination optical unit of claim 1, wherein the following applies to the radius of curvature r.sub.2 perpendicular to the folding plane: 20 bg cos (/2)/(gb) <r.sub.2<0.2 bg cos (/2)/(gb).
6. The illumination optical unit of claim 5, wherein the radius of curvature r.sub.2 deviates from an ideal radius of curvature r.sub.2opt=2 bg cos (/2)/(gb) by at most the factor of 750 m [g/((gb).Math.F)].
7. The illumination optical unit of claim 6, wherein: the upstream light source has a typical diameter G; for each individual mirror of the first facet mirror, the mirror surface has a typical diameter F; the focal length f deviates from an ideal focal length f.sub.opt=bg/(gb) by at most a factor of 0.3 bG/((bg)F); and the focal length f deviates from the ideal focal length f.sub.opt=bg/(gb) by at most the factor of 750 m [g/((gb).Math.F)].
8. The illumination optical unit of claim 5, wherein: the upstream light source has a typical diameter G; for each individual mirror of the first facet mirror, the mirror surface has a typical diameter F; the focal length f deviates from an ideal focal length f.sub.opt=bg/(gb) by at most a factor of 0.3 bG/((bg)F); and the focal length f deviates from the ideal focal length f.sub.opt=bg/(gb) by at most the factor of 750 m [g/((gb).Math.F)].
9. The illumination optical unit of claim 4, wherein: the upstream light source has a typical diameter G; for each individual mirror of the first facet mirror, the mirror surface has a typical diameter F; the focal length f deviates from an ideal focal length f.sub.opt=bg/(gb) by at most a factor of 0.3 bG/((bg)F); and the focal length f deviates from the ideal focal length f.sub.opt=bg/(gb) by at most the factor of 750 m [g/((gb).Math.F)].
10. The illumination optical unit of claim 1, wherein: the upstream light source has a typical diameter G; for each individual mirror of the first facet mirror, the mirror surface has a typical diameter F; the focal length f deviates from an ideal focal length f.sub.opt=bg/(gb) by at most a factor of 0.3 bG/((bg)F); and the focal length f deviates from the ideal focal length f.sub.opt=bg/(gb) by at most the factor of 750 m [g/((gb).Math.F)].
11. An illumination system, comprising: an EUV light source; and an illumination optical unit according to claim 1.
12. An optical system, comprising: an illumination optical unit according to claim 1; and a projection optical unit configured to image the object field into an image field.
13. An apparatus, comprising: an EUV light source; an illumination optical unit according to claim 1; and a projection optical unit configured to image the object field into an image field, wherein the apparatus is a lithography projection exposure apparatus.
14. A method of using a lithography projection exposure apparatus comprising an illumination system and a projection optical unit, the method comprising: using the illumination system to illuminate at least a portion of a reticle; using the projection optical unit to project at least a portion of the illuminated reticle onto a light sensitive material, wherein the illumination system comprises an illumination optical unit according to claim 1.
15. An illumination optical unit configured to illuminate an object field with illumination light, the illumination optical unit comprising: a first facet mirror; and a second facet mirror comprising a plurality of facets configured to image portions of the first facet mirror into a facet image in a region of the object field, wherein: the two facet mirrors are a distance |g| from each other; the second facet mirror is a distance b from the object field; the facets of the second facet mirror have a focal length f in a plane of incidence of the illumination light on the individual mirrors of the second facet mirror;
[0.1 bg/(gb)]<f<[10 bg/(gb)]; at least some of the individual mirrors have different radii of curvature in the plane of incidence and/or a folding plane; the at least some of the individual mirrors have different radii of curvature perpendicular to the folding plane; and the following applies to the radius of curvature r.sub.1 in the folding plane: 20 bg/((gb) cos (/2))<r.sub.1<0.2 bg/((gb) cos (/2)), where is a folding angle of the illumination light upon reflection at the respective individual mirror of the first facet mirror.
16. An illumination system, comprising: an EUV light source; and an illumination optical unit according to claim 15.
17. An optical system, comprising: an illumination optical unit according to claim 15; and a projection optical unit configured to image the object field into an image field.
18. An apparatus, comprising: an EUV light source; an illumination optical unit according to claim 15; and a projection optical unit configured to image the object field into an image field, wherein the apparatus is a lithography projection exposure apparatus.
19. A method of using a lithography projection exposure apparatus comprising an illumination system and a projection optical unit, the method comprising: using the illumination system to illuminate at least a portion of a reticle; using the projection optical unit to project at least a portion of the illuminated reticle onto a light sensitive material, wherein the illumination system comprises an illumination optical unit according to claim 15.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) Exemplary embodiments of the disclosure are explained in greater detail below with reference to the drawing. In the figures:
(2)
(3)
(4)
(5)
(6)
(7)
(8)
DETAILED DESCRIPTION
(9) A microlithographic projection exposure apparatus 1, depicted very schematically and in a meridional section in
(10) A transfer optical unit 4 serves to guide the illumination light 3 emanating from the light source 2. The transfer optical unit includes a collector 5, merely depicted in
(11) A Cartesian xyz-coordinate system is used below to facilitate the illustration of positional relationships. The x-direction extends perpendicular to the plane of the drawing in
(12) The projection optical unit 10 is merely indicated in part and very schematically in
(13) The projection optical unit 10 images the object field 12 into an image field 17 in an image plane 18 on a wafer 19 which, like the reticle 8 as well, is carried by a holder not depicted in any more detail.
(14) The first facet mirror 6 includes a multiplicity of individual mirrors (cf.
(15) Thus, imaging secondary light sources are generated as images of an upstream light source, namely of the intermediate focus 5a, via the first facet mirror 6. Here, the individual mirrors 21 image the intermediate focus 5a into a real image plane 24. This real image plane 24 may coincide with a pupil plane of the illumination optical unit 11; however, this is not mandatory. An illumination intensity distribution in the pupil plane corresponds to an illumination angle distribution of an object illumination by way of the illumination optical unit 11. Depending on the embodiment of the illumination optical unit 11, the second facet mirror 7 is arranged either at a distance from this pupil plane or in the region of this pupil plane.
(16)
(17) Within the edge, the individual mirrors 21 are arranged in a grid-like manner in lines and columns by way of the carrier plate 25. What is described in WO 2009/100 856 A1 applies in relation to the arrangement and actuation by actuators of the individual mirrors 21 of the second facet mirror 7. The individual mirrors 21 of the second facet mirror 7 likewise include actuators and the actuation by way of the control device 22.
(18) The individual mirrors 21 of the second facet mirror 7 may also be combined to form individual mirror groups 26. These individual mirror groups 26 of the second facet mirror 7 guide the illumination light 3 which was reflected by assigned individual mirror groups 23 of the first facet mirror 6 to the object field 12.
(19) By appropriately predetermining the tilt angles of the individual mirrors 21 of the two facet mirrors 6, 7 and by predetermining the group assignment, it is possible to predetermine various illumination settings, i.e. various illumination angle distributions and illumination intensity distributions over the object field 21. By way of example, this predetermination of the illumination setting is described in WO 2010/099 807 A1.
(20) In an exemplary manner,
(21) Each individual mirror group 26 of the second facet mirror 7 is illuminated by exactly one individual mirror group, i.e., for example, by the individual mirror groups 23 (cf.
(22) In the illumination example according to
(23)
(24) The individual mirrors 21 of the first facet mirror 6 are not planar but have an imaging effect. The latter may be characterized by a focal length of the individual mirrors 21 of the first facet mirror 6 or by a radius of curvature of the reflection surfaces of the respective individual mirrors 21.
(25)
(26) The intermediate focus 5a has a typical diameter G. This typical diameter G is the diameter of a circle, the area of which equals the source area, i.e. the focus area in the case of the intermediate focus 5a.
(27) F denotes the typical diameter of the individual mirror 21 of the first facet mirror 6. The typical diameter F is the diameter of a circle, the area of which equals the area of the individual mirror 21. In fact, the individual mirrors 21 are rectangular, in particular square, trapezoidal or hexagonal; i.e., they have an edge contour which allows the facet mirror to be occupied with a filling factor which is as high as possible.
(28) g denotes an object distance when imaging the intermediate focus 5a into the secondary light source 27. Here, the following applies: g<0. Then, is the distance between the first facet mirror 6 with the individual mirror groups 21 and the intermediate focus 5a.
(29) B denotes the typical diameter of the secondary light source 27.
(30) b denotes the image distance of this image. Here, the following applies: b0.
(31) To the extent that an individual mirror group 26 of the second facet mirror 7 is arranged at a distance from the real image plane 24 in an arrangement plane 28 at a distance b from the imaging individual mirror 21 of the first facet mirror 6, the following applies for a diameter B of an illumination of this individual mirror group 26:
(32)
(33) Here, the assumption is made that the secondary light source 27 lies downstream of the individual mirror group 26 of the second facet mirror 7 in the beam path of the illumination light 3.
(34) The arrangement plane 28 may be a pupil plane. Then, the individual mirror groups 26 of the second facet mirror are pupil facets.
(35) A minimum diameter B emerges in the case of a focal length f.sub.opt of the individual mirror 21 of the first facet mirror 6:
(36)
(37) Then, the minimum illumination diameter B.sub.opt on the individual mirror group 26 emerges as:
B.sub.opt=bG/g
(38) An actual focal length f of the respective individual mirror 21 of the first facet mirror 6 should deviate from the ideal focal length f.sub.opt in accordance with equation (2) above by no more than an image magnification tolerance value a
(39)
(40) for which the following applies:
(41)
(42) Here, may assume values in the range between 0.1 and 0.3.
(43) The image magnification tolerance value a is a measure for the size of a point image at the image location, i.e. a measure for the diameter of an image of an object field point at the image location. The focal length f of the respective individual mirror 21 should lie in the following range which is dependent on the image magnification tolerance value a:
f.sub.opt/(1+a)<f<f.sub.opt/(1a)
(44) from formula (4) above is a measure for the size or the diameter of the point image relative to the size or the diameter of the second facet 26. The point image may be significantly smaller than the diameter of the respective second facet 26. The point image may have a diameter which is less than 50% of the diameter of the second facet 26, less than 40%, less than 30% or else less than 20%.
(45) If typical values for G (10 mm), b (1000 mm), g (1000 mm) and F (1 mm) are inserted, a value range of between 0.5 and 1.5 emerges for the relative deviation a ( between 0.1 and 0.3). Overall, the focal length f of the individual mirror 21 of the first facet mirror 6 should lie within the following range limits:
[0.1 bg/(gb)]<f<[10 bg/(gb)](5)
(46) Alternatively, a deviation may also be parameterized by way of a magnification tolerance value a
(47)
(48)
(49) Here, lies in the range between 100 m and 750 m.
(50) In practice, the illumination light 3 is folded with a folding angle when it is reflected at the respective individual mirror 21 of the first facet mirror 6 in a plane of incidence yz, affecting the image of the intermediate focus 5a. Then, /2 is the angle of incidence of the illumination light 3 at the respective individual mirror 21. A folding plane is predetermined by the respectively incident and leaving beam at a point of reflection on the individual mirror 21. In
(51) Ideal imaging of the intermediate focus 5a into the secondary light source 27 emerges if the reflection surface of the individual mirror 21 of the first facet mirror 6 is formed as an ellipsoid, with this applying to exactly one switching position of the individual mirror 21. Such an ellipsoid may be described approximately by two radii of curvature in the plane of incidence yz of the illumination light 3 onto the individual mirror 21 or the folding plane and perpendicular to the folding plane. The ellipsoid may be approximated by a toric surface which, to second order, contacts the ellipsoid. The curvature property of the surface, e.g. at the center of the mirror, is desirable.
(52) If use is made of spherical mirrors, the point image is decisively determined by astigmatism in the case of the small aperture present here.
(53) Blurring r of the point image may be described well for folding angles <20 by
(54)
(55) Here, r describes a typical radial extent of the blurred point image.
(56)
(57)
(58) Once again, the deviation factors and , which were already discussed above, emerge for the deviations of tolerable radii of curvature from these ideal radii of curvature. Corresponding deviations apply for the focal lengths, with the following applying:
f.sub.1,2=r.sub.1,2/2.
(59) Corresponding observations, as were made above for the focal lengths and radii of curvature of the individual mirrors 21 of the first facet mirror 6, may also be made in the same way for the second facets or the individual mirror groups 26 of the second facet mirror 7. One of the first facets or individual mirror groups 23, as an object, is imaged into the object field 12 by way of these second facets 26.
(60) The imaging conditions for estimating the focal lengths or radii of curvature for the second facets 26 emerge from the schematic illustration according to
(61) Here, G denotes a typical dimension of one of the individual mirror groups 23 of the first facet mirror 6. This individual mirror group 23 represents a portion of the first facet mirror 6, which is imaged in each case into a facet image 23a in a facet image plane 23b in the region of the object plane 9 by a second facet 26 of the second facet mirror 7. The portion of the first facet mirror 6 to be imaged may be a monolithic field facet or else a virtual field facet embodied as an individual mirror group. The image of such an individual mirror group 23 of the first facet mirror 6 may cover the entire object field 12 or part thereof. As already explained above, the imaging second facets 26 may in turn be formed by individual mirror groups.
(62) The optical variables playing a role when imaging respectively one of the individual mirror groups 23 of the first facet mirror 6 into the facet image 23a are denoted in the same way in
(63) The typical dimension G of the individual mirror group 23 denotes the diameter of a circle, the area of which corresponds to the area of the respective individual mirror group 23.
(64) F denotes the typical diameter of one of the second facets 26 of the assigned individual mirror group.
(65) B denotes a typical extent of the object field 12; i.e., it may once again be considered a diameter of a circle, the area of which corresponds to the area of the object field 12. B denotes the typical diameter of the facet image 23a.
(66) g denotes the object distance of the image of the individual mirror group 23 of the first facet mirror 6 through the individual mirror group 26 of the second facet mirror 7.b denotes the distance between the individual mirror group 26 of the second facet mirror 7 and the object field 12. b denotes the distance of the individual mirror group 26 of the second facet mirror 7 from the facet image 23a.
(67) Then, what was explained above in conjunction with the focal lengths and the radii of curvature of the individual mirrors 21 of the first facet mirror 6 applies accordingly for estimating the focal lengths and radii of curvature of the second facets 26 or the assigned individual mirror groups of the second facet mirror 7.
(68) A point image between the plane of the individual mirror group 23 of the first facet mirror 6 and the object plane 9 in the y-dimension may be very sharp (a in the region of 0) when using a projection exposure apparatus which scans in the y-direction, i.e. in the plane of incidence of the illumination light 3 on the object in the object field 12. In the x-dimension, a0 should apply so that gaps between the individual mirrors 21 of the individual mirror group 23 are not imaged sharply into the object field 12. A lower limit for the point image on the object field 12 in the x-dimension, i.e. perpendicular to the scanning direction, is a typical dimension of the gaps between individual mirrors 21, adjacent in the x-direction, of the respective individual mirror group 23 of the first facet mirror 6.
(69) The boundary conditions a0 in the scanning direction y and a0 in the direction x perpendicular to the scanning direction y may regularly be realized using one and the same radius of curvature of the second facets 26 or of the assigned individual mirror groups of the second facet mirror 7 since an astigmatism emerges on account of the non-perpendicular incidence on the second facet mirror 7, i.e. the refractive power of a spherical mirror not hit perpendicularly therefore having a different value in the x-dimension than in the y-dimension.
(70) Typical absolute range limits for the variables defined above are the following:
(71) 2 mm<=G<=10 mm
(72) 0.4 mm<=F<=2 mm
(73) 2 mm<=B<=12 mm
(74) 0<=alpha/2<=20
(75) On the first facet mirror 6, the following applies to the focal lengths f.sub.1 (tangential) and f.sub.2 (sagittal), the back focal lengths and the radii of curvature (all concave):
(76) 2000 mm<=g<=1000 mm
(77) 1000 mm<=b<=2000 mm
(78) 300 mm<=f.sub.1<=1300 mm
(79) 2600 mm<=r.sub.1<=600 mm
(80) 350 mm<=f.sub.2<=1400 mm
(81) 2800 mm<=r.sub.2<=700 mm
(82) On the second facet mirror 7, the following applies to the focal lengths f.sub.1 (tangential) and f.sub.2 (sagittal), the back focal lengths and the radii of curvature (all concave):
(83) 2000 mm<=g<=1000 mm
(84) 1000 mm<=b<=3000 mm
(85) 300 mm<=f.sub.1<=1600 mm
(86) 3200 mm<=r.sub.1<=600 mm
(87) 350 mm<=f.sub.2<=1700 mm
(88) 3400 mm<=r.sub.2<=700 mm
(89) The reticle 8 and the wafer 19 are initially provided for producing a microstructured component, in particular a highly integrated semiconductor component, for example a memory chip, with the aid of the projection exposure apparatus 1. Subsequently, a structure on the reticle 8 is projected onto a light-sensitive layer on the wafer 19 with the projection optical unit of the projection exposure apparatus 1. By developing the light-sensitive layer, a microstructure is then generated on the wafer 19 and the microstructured or nanostructured component is generated therefrom.