LASER DISTANCE MEASURING MODULE WITH INL ERROR COMPENSATION

Abstract

A distance measuring method and an electronic laser distance measuring module, in particular for use in a distance measuring apparatus, especially configured as a laser tracker, tachymeter, laser scanner, or profiler, for fast signal detection with an analog-to-digital converter, wherein conversion errors that arise in the context of a signal digitization, in particular timing, gain and offset errors of the ADC, are compensated for by means of variation of the sampling instants.

Claims

1-16. (canceled)

17. A distance measuring method for determining a distance to a target object, the method comprising: emitting transmission signals as a transmission signal series; receiving at least portions of the transmission signals of the transmission signal series reflected at the target object as reception signals of a reception signal series; digitizing the reception signals of the reception signal series into digital signals of a digital signal series by means of an analog-to-digital converter, referred to hereinafter as ADC, in particular of the interleave ADC or pipeline ADC type, and processing the digital signal series in order to derive the distance to the target object therefrom, wherein the reception signal series is superimposed with a bias signal that varies in a defined manner, wherein the value of the bias signal is varied over time in such a way that reception signals of the reception signal series are superimposed with different offset values within a defined value range.

18. The distance measuring method according to claim 17, wherein the different offset values are taken into account during the processing of the digital signal series in order to compensate for an average integral non-linearity of the ADC as a function of a signal value of an ADC input signal.

19. The distance measuring method according to claim 17, wherein the bias signal is configured as a signal having a low-frequency oscillation component.

20. The distance measuring method according to claim 17, wherein: the bias signal is generated by means of at least one of the following measures: adding different discrete DC values to an ADC input signal of an ADC input signal series generated by the reception signal series at different instants of the ADC input signal series referred to hereinafter as DAC, periodically shifting the offset levels of the common-mode voltage of the ADC, and a noise generator for generating a variable additional signal to the ADC input signal series.

21. The distance measuring method according to claim 17, wherein the value range of the bias signal is set on the basis of: a defined measurement accuracy for the determination of the distance, or a measured signal value of a reception signal.

22. The distance measuring method for determining a distance to a target object in the context of a measurement campaign comprising: emitting a transmission signal, receiving at least portions of the transmission signal reflected at the target object as a reception signal, and processing the reception signal into a digital signal by means of an analog-to-digital converter, referred to hereinafter as ADC in order to derive the distance to the target object therefrom, wherein in the context of the measurement campaign: determining parameters of an integral nonlinearity of the ADC as a function of a signal value of an ADC input signal is carried out, referred to hereinafter as INL parameters, and the INL parameters are used in the context of processing the reception signal, wherein in the context of determining the INL parameters at least one stability criterion for the INL parameters is taken into account as a function of a measurement instant of the measurement campaign.

23. A distance measuring method according to claim 22, wherein determining the INL parameters is carried out by digitizing a calibration series of calibration signals having a known signal characteristic, in particular a known signal waveform, by means of the ADC, wherein a deviation of the digitized calibration series from an expected ideal calibration series is determined on the basis of the known signal characteristic of the calibration signals.

24. A distance measuring method according to claim 22, wherein the transmission signals are emitted toward a target object with constant distance to the distance measuring apparatus, wherein determining the INL parameters is carried out by means of at least one of the following measures: that the signal values of the emitted transmission signals are varied, in particular continuously varied, and that the signal values of emitted transmission signals are stabilized over a defined calibration period and the stabilized transmission signals are sampled with a multiplicity of different sampling instants.

25. An electronic laser distance measuring module for determining a distance to a target object comprising: a transmission channel having a transmitting unit for generating transmission signals of a transmission signal series; a reception channel having a receiving unit for receiving at least portions of the transmission signals of the transmission signal series reflected at the target object as reception signals of a reception signal series; a reception circuit for digitizing the reception signals of the reception signal series into digital signals of a digital signal series with an analog-to-digital converter, referred to as ADC hereinafter, in particular of the interleave ADC or pipeline ADC type; and a supervisory and control unit for determining the distance to the target object on the basis of a processing of the digital signal series, in particular summing or averaging the digital signals over the digital signal series, in particular wherein the determination of the distance is based on the pulse time-of-flight method, wherein the laser distance measuring module is configured in such a way that: a bias signal that varies in a defined manner is generated, and the reception signal series is superimposed with the bias signal, wherein the value of the bias signal is varied over time in such a way that reception signals of the reception signal series are superimposed with different offset values within a defined value range.

26. The laser distance measuring module according to claim 25, wherein the different offset values are taken into account during the processing of the digital signal series by the supervisory and control unit in order to compensate for an average integral nonlinearity of the ADC as a function of a signal value of an ADC input signal.

27. The laser distance measuring module according to claim 25, wherein the bias signal is configured as a signal having a low-frequency oscillation component.

28. The laser distance measuring module according to claim 25, wherein the bias signal is generated by means of at least one of the following measures: adding different discrete DC values to an ADC input signal of an ADC input signal series generated by the reception signal series at different instants of the ADC input signal series, referred to hereinafter as DAC, periodically shifting the offset levels of the common-mode voltage of the ADC, and a noise generator for generating a variable additional signal to the ADC input signal series.

29. The laser distance measuring module according to claim 25, wherein the value range of the bias signal is set on the basis of: a defined measurement accuracy for the determination of the distance, or a measured signal value of a reception signal.

30. An electronic laser distance measuring module for use in a distance measuring apparatus, the electronic laser distance measuring module comprising: a transmission channel having a transmitting unit for generating a transmission signal; a reception channel having a receiving unit for receiving at least one portion of the transmission signal reflected at the target object as a reception signal; a reception circuit for processing the reception signal into a digital signal with an analog-to-digital converter (ADC); and a supervisory and control unit for deriving the distance to the target object on the basis of the digital signal, wherein: the laser distance measuring module is configured in such a way that: in the context of the measurement campaign a calibration process is provided for determining parameters of an integral non-linearity of the ADC as a function of a signal value of an ADC input signal, referred to hereinafter as INL parameters, and the INL parameters are used in the context of processing the reception signal, in the context of the calibration process at least one stability criterion for the INL parameters is taken into account as a function of a measurement instant of the measurement campaign.

31. The laser distance measuring module according to claim 30, wherein the laser distance measuring module is configured in such a way that: determining the INL parameters is carried out by digitizing a calibration series of calibration signals having a known signal characteristic, in particular a known signal waveform, by means of the ADC, wherein a deviation of the digitized calibration series from an expected ideal calibration series is determined on the basis of the known signal characteristic of the calibration signals.

32. The laser distance measuring module according to claim 30, wherein: the laser distance measuring module is configured in such a way that the ADC generates an ADC sampling pattern by means of at least two ADC conversion stages, the ADC sampling pattern defines with respect to a reception signal an initial signal sampling pattern with at least one initial sampling point of the reception signal, and the reception signals of the reception signal series are temporally shifted relative to the ADC sampling pattern by means of a first temporal shift, such that the at least one initial sampling point is detected at least once by a first ADC conversion stage and at least once by a second ADC conversion stage.

Description

[0066] The distance measuring method according to the invention and the laser distance measuring module according to the invention are described in greater detail purely by way of example below on the basis of exemplary embodiments that are illustrated schematically in the drawings. In the figures, identical elements are identified by identical reference signs. The embodiments described are generally not illustrated as true to scale, nor should they be understood as a restriction.

[0067] Specifically,

[0068] FIGS. 1a, b: show a schematic illustration of the pulse time-of-flight method in an electro-optical distance measuring apparatus according to the prior art;

[0069] FIGS. 2a, b: show a basic illustration of a digitization by an analog-to-digital converter (ADC) with a linear relationship between the ADC input signal and the digitized output values (a) and with a differential nonlinearity (b);

[0070] FIG. 3: shows a typical error curve for a differential nonlinearity of an ADC;

[0071] FIG. 4: shows a typical error curve for an integral nonlinearity of a fast ADC;

[0072] FIG. 5: shows an illustration of a compensation of the INL error by means of a superimposition of the measurement signal generated by the detected reception signals with a varying bias signal;

[0073] FIG. 6: shows an illustration of an averaging over a plurality of reception signals which were superimposed with a varying bias signal according to the invention for the generation of the ADC input signal;

[0074] FIG. 7: shows an exemplary embodiment of a reception channel of a laser distance measuring module according to the invention.

[0075] FIGS. 1a and 1b illustrate the pulse time-of-flight principle such as is used in typical electro-optical distance measuring apparatuses according to the prior art.

[0076] FIG. 1a shows a basic illustration of an electro-optical distance measuring device 1 from the prior art according to the pulse time-of-flight principle. A transmitter 2 and a receiver 3 are arranged in the distance measuring device 1. The transmitter 2 emits a light pulse 4, which, after reflection or backscattering at a target, e.g. a cooperative target object such as a retroflector 5 or an uncooperative target object such as a natural surface, is detected again as a backscattered light pulse 4 by the receiver 3. A continuously modulated transmission signal is often also used instead of the light pulses.

[0077] As elucidated schematically in FIG. 1b, the distance is ascertained from the time of flight T.sub.f as a temporal difference between the start instant of the emission of a light pulse 4 and the reception instant of the backscattered light pulse 4. In this case, the reception instant is ascertained by the evaluation of a feature of the signal pulse s(t), e.g. by a signal threshold being exceeded oras in the present inventionby the sampling of the signal pulse, wherein after identification of the coding of the associated transmission signal of a received signal, a pulse time of flight is determined very accurately from a defined profile point of the sampled and digitized signal, for example the points of inflection, the curve maxima, or integrally by means of an optimum filter known from the time interpolation. A further method for determining a defined profile point e.g. also comprises converting the reception signal into a bipolar signal and subsequently determining the zero crossing.

[0078] In the approach of temporally precise sampling of the backscattered pulse, the electrical signal generated by the detector is converted into a digital signal sequence by means of an analog-to-digital converter (ADC), said digital signal sequence then usually being processed further in real time. By using a multiplicity of sample sequences and/or summation of the reception signal synchronously with the emission rate, it is possible to identify a useful signal even under unfavorable circumstances, such that it is possible to cope with even relatively large distances or background scenarios that are noisy or beset by disturbances.

[0079] In fast analog-to-digital converters (ADC), the high sampling rate in conjunction with a high resolution of the signal value is achieved for example by temporally interleaving (interleave) a plurality of slow ADCs and/or by quantizing in stages (pipeline). In this case, architecture-typical errors arise despite careful internal corrections, which errors vary over time and for example temperature.

[0080] Particularly in the case of pipeline ADCs, the typical errors are usually manifested as differential nonlinearity DNL and integral nonlinearity INL. DNL and INL are errors during the conversion of the analog signal value into digital (integral) values, for example brought about by the quantization in stages in a pipeline ADC with steps becoming finer and finer/resolution becoming higher and higher.

[0081] FIGS. 2a and 2b illustrate the effect of a differential nonlinearity DNL during a digitization by an analog-to-digital converter (ADC). The figures in each case show a plot for the generated digital signal DS as a function of the voltage V of an analog ADC input signal.

[0082] FIG. 2a illustrates the ideal case, wherein the digitization is effected in such a way that the difference between the threshold voltage and the next digital value is constant, that is to say that a linear digitization with a digitization step function 6a is generated, the step width V.sub.LSB of which is constant. In each case two neighboring digital values, e.g. the digital values 001 and 010, thus correspond to two converted analog input voltages with a separation between them of exactly one setpoint voltage V.sub.LSB (Least Significant Bit).

[0083] In contrast thereto, FIG. 2b shows the effect of a differential nonlinearity DNL, wherein now in each case neighboring digital values, for example the digital values 001 and 010, correspond to analog input voltages which have a voltage difference that is less or greater than the setpoint voltage V.sub.LSB. This produces a nonlinear digitization with a digitization step function 6b having a varying step width.

[0084] The INL error is essentially the sum of all the DNL errors cumulated up to the voltage value V of the input signal and can attain a plurality of LSBs. Therefore, even in the case of moderate fluctuations of the signal value, the INL error, in particular, has serious effects on the digitized signal waveform accuracy and as a result of the INL error over distance a singly periodic distance error in the distance of the sampling pattern arises during the distance measurement, for example.

[0085] FIG. 3 shows a typical error curve 7 for a differential nonlinearity DNL, for example of an individual ADC of an interleave ADC architecture or of a quantization stage of a pipeline ADC. The DNL error curve 7 shows the deviation of neighboring digitized values from the ideal setpoint value of a respective LSB stage (Least Significant Bit) as a function of the input voltage V.

[0086] FIG. 4 shows a typical error curve 8 for an integral nonlinearity INL, for example of a fast interleave ADC architecture or of a pipeline ADC. The INL error curve 8 shows the deviation of the digitized value from the ideal setpoint value expressed in LSB units as a function of the ADC input voltage V.

[0087] The global profile of the INL error curve 8 (typically an S-shape) is represented here by a zigzag line 9 having three different gradients, for the sake of simplicity. If the sampled voltage values of a reception signal remain within an INL range having a substantially linear gradient value, then this generates an amplitude-dependent signal gain, which leads to a distortion of the pulse shape and reduces the distance measurement accuracy. If the sampled signal waveform comprises relatively great deviations from an average, linear gradient range of the INL curve (the signal waveform comprises e.g. a kink of the zigzag line 9), then further distortions arise on the signal waveform and the accuracy of a distance measurement exhibits cyclic errors with respect to the sampling pattern. The same considerations are also applicable to the start pulse. The minimum excursion of the varying bias signal should therefore be chosen to be sufficiently large, such that for example the samples assigned to the start and stop pulses on average sweep over a respective linear gradient range of the INL curve.

[0088] A local curvature of the INL error curve 8 (the local excursions/deviations of the INL error curve 8 from the global profile 9) generates a distance measurement error which for example is at least singly periodic with respect to the sampling pattern. Said local excursions of the INL curve considerably influence the distance measurement accuracy. The local curvature of the INL error curve and the distance measurement error that arises as a result are corrected by the features of the present invention.

[0089] FIG. 5 illustrates the correction of the INL error (of the local curvature of the INL error curve 8, see FIG. 4) by means of a superimposition of the measurement signal generated by the detected reception signals with a varying bias signal 10.

[0090] The figure shows an ADC input signal series 11 (reception signal series) generated according to the invention as a function of time t, consisting of a superimposition of the actual measurement signal generated by a plurality of (pulsed) reception signals 12 (single shots) of a reception signal series with the varying bias signal 10, here for example a low-frequency sinusoidal signal, wherein here the superimposed bias signal 10 is average-value-free over the time period dT occupied by the ADC input signal series.

[0091] The bias signal 10 can be in particular a low-frequency oscillation signal, for example a sinusoidal, sawtooth, stepped, triangular or trapezoidal signal, wherein the bias signal 10 can be generated for example by adding discrete DC values to the measurement signal actually generated, e.g. set by a digital-to-analog converter (DAC).

[0092] FIG. 6 illustrates an averaging over a plurality of reception signals 12 (single shots) of a reception signal series which was superimposed with a varying bias signal 10 (see FIG. 5) according to the invention for the generation of the ADC input signal series 11 (see FIG. 5).

[0093] As a result of the superimposition with the bias signal 10, the actual measurement signal of a reception signal 13 during the averaging, in one specific embodiment in an average-value-free manner, is shifted over a wide value range, as a result of which various error zones of the INL error curve 8 (see FIG. 4) are swept over. Averaging over a plurality of reception signals thus gives rise to an averaging over different INL error contributions, as a result of which the INL error influence is significantly reduced, in particular without any deterioration in the signal-to-noise ratio (SNR). A particularly efficient elimination of the INL influence on the signal waveform and thus on the distance measurement is achieved if the shot sequence frequency is effected asynchronously with respect to the sampling pattern and asynchronously with respect to the bias signal.

[0094] FIG. 7 shows one exemplary embodiment of a reception channel 14 of a laser distance measuring module according to the invention comprising a receiving optical system and a receiving unit 15 for receiving transmission signals reflected at a target object as reception signals, installation electronics 16 for conditioning the reception signals into an analog electrical measurement signal, and also a (fast) analog-to-digital converter (ADC) 17, for example having an interleave architecture or a pipeline architecture.

[0095] The bias signal 10 (see FIG. 5) is superimposed 18 on the ADC input signal series, for example by adding discrete DC values to the measurement signal actually generated, e.g. set by a digital-to-analog converter (DAC) 19.

[0096] By virtue of the temporal variation of the INL error, for example in a temperature-dictated manner, by virtue of different requirements in respect of the measurement accuracy and by virtue of different reception strengths, if appropriate the amplitude of the varying bias signal 10 can be varied, e.g. by means of an FPGA or microprocessor 20 that records and processes the ADC signal.

[0097] It goes without saying that said figures illustrated only schematically illustrate possible exemplary embodiments. The various approaches can likewise be combined with one another and also with methods from the prior art.