Device For The Determination Of Temperature Parameters With Adjustable Sample Holder

Abstract

A device for determining the temperature conductivity, the heat capacity and/or the thermal conductivity of a material sample. The device has a light emitter for exposing a front side of the sample to a light energy beam and a radiation detector for determining the temperature rise at a rear side of the sample facing away from the front side by detecting the radiation emitted there as a function of temperature, and a sample holder for holding the sample in a defined position.

Claims

1. A device for determining the temperature conductivity, the heat capacity and/or the thermal conductivity of a material sample, having a light emitter for exposing a front side of the sample to a light energy beam and a radiation detector for determining the temperature rise at a rear side of the sample facing away from the front side by detecting the radiation emitted there as a function of temperature, and a sample holder for holding the sample in a defined position, wherein a first adjustable aperture is arranged on the front side in front of the sample holder, which aperture the light energy beam passes before it strikes the front side of the sample, and in that a second adjustable aperture is arranged on the rear side behind the sample holder.

2. The device according to claim 1, wherein the adjustable apertures are irises with blades which can be rotated together inwards or outwards by means of a mechanism and thus form a smaller or larger aperture opening between them.

3. The device according to claim 1, wherein the sample holder comprises several and preferably three supports or pins which are displaceable in the radial direction.

4. The device according to claim 3, wherein the specimen holder comprises a specimen holder ring forming radial guides for the pins and a seat for each of the adjustable apertures.

5. The device according to claim 4, wherein at least one of the adjustable apertures can be removed from the specimen holder ring without tools for the purpose of specimen installation.

6. A device for determining a thermal index of a material sample, comprising a light emitter for exposing a front side of the sample to a light energy beam and a radiation detector for determining the temperature rise at a rear side of the sample facing away from the front side by detecting the radiation emitted there as a function of temperature, and a sample holder for holding the sample in a defined position, wherein a first adjustable aperture is arranged on the front side in front of the sample holder, which aperture the light energy beam passes before it strikes the front side of the sample, and in that a second adjustable aperture is arranged on the rear side behind the sample holder.

7. The device of claim 6 wherein the thermal index is temperature conductivity.

8. The device of claim 6 wherein the thermal index is heat capacity.

9. The device of claim 6 wherein the thermal index is thermal conductivity.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0031] FIG. 1 illustrates the basic construction of the generic measuring instruments.

[0032] FIG. 2 shows a measuring device according to the invention in longitudinal section.

[0033] FIG. 3 shows the details of the invention in the area of the specimen holder.

[0034] FIG. 4 shows an axial section through a specimen holder unit according to the invention with two adjustable apertures which receive the specimen between them.

DETAILED DESCRIPTION

[0035] FIG. 2 shows the entire structure of a preferred measuring device according to the invention.

[0036] In the lowest area you can see the light source 1, which radiates upwards to the front side 3 of the sample 2. The sample 2 is here placed in the oven 7 together with the sample holder 8. On the back of the sample, above it, is the detector 5.

[0037] The details can be seen clearly in FIG. 3. The actual sample holder 8 here consists of a sample holder ring 9, the pins 10 for holding the sample and the first adjustable aperture 11, as well as the second adjustable aperture 12. They can form a pre-assembled unit.

[0038] It is clearly visible that the two adjustable apertures are designed here as irises, with the classic, in the broadest sense, crescent-shaped, swivelling slats 13, as is typical for iris diaphragms.

[0039] As you can see, the pins 10 are specially designed.

[0040] They have a small projection 15 at their radially inner ends for gripping underneath the sample 2.

[0041] The pins 10 are guided in the radial bores 14 of the specimen holder ring 9 so that they can be moved and at the same time fixed. The guide is usually designed in such a way that the pins are held in a defined rotational position in the specimen holder ring 9 so that their small projections 15 are always at the bottom, at the lowest point.

[0042] The pins 10 can therefore be very easily adjusted radially so that only their small extensions 15 reach under the sample 2. The areas of the pins 10 that lie next to the specimen and protrude far into the specimen space can easily be blanked out by adjusting the apertures 11 and 12 accordingly.

[0043] It should be noted that the first adjustable aperture 11 or, more exactly, the device forming it, can be screwed, pressed or glued to the sample holder ring 9, as it does not have to be removed for loading a sample, cf. also FIG. 4.

[0044] The second adjustable aperture 12, on the other hand, is simply placed on top of the sample holder ring, where it is centred in and held by the sample holder ring 9 by a seating surface associated with it. In this way, the second adjustable aperture 12 can be easily removed by hand and without tools when loading the device from above in order to place the sample 2 on the pins 10. The latter are positioned “sandwiched”, as it were, between the adjustable apertures 11 and 12.

[0045] As FIG. 4 clearly shows, it can be very advantageous for the two adjustable apertures 11 and 12 or, more exactly, the devices forming it, to be positioned very close to each other or one above the other. In the solution shown in FIG. 4, the two adjustable opertures are directly adjacent to the supports or pins holding the sample on one side and the other. Here you can see the advantages of the projections 15 on the pins 10 or supports—the sample does not rest on the space consuming solid or “fat” area of the pins 10, so that the sample thickness and the pin thickness or the full pin diameter do not add up in direction of irradiation. Instead, viewed in the direction of irradiation, the sample lies essentially or at least predominantly between the pins or supports. In general, it can be said that the distance between the two adjustable apertures is at most 4 times, better at most 2.5 times the sample thickness in the direction of irradiation.

[0046] Miscellaneous

[0047] A final remark of general nature has to be made:

[0048] When the time has come protection will also be sought for a device 17 for determining the temperature conductivity, the heat capacity and/or the thermal conductivity of a material sample, having a light emitter 1 for exposing a front side 3 of the sample 2 to a light energy beam and a radiation detector 5 for determining the temperature rise at a rear side 4 of the sample 2 facing away from the front side 3 by detecting the radiation emitted there as a function of temperature, and a sample holder 8 for holding the sample 2 in a defined position, characterized in that at least one adjustable aperture, designed in an iris-like manner by movable blades defining a smaller or bigger aperture between then, depending from their actual swivel position, is provided for shading a portion of the sample.

[0049] Preferably the said the device forming the iris-like aperture is positioned directly adjacent to the sample holder.