CONTACT DEVICE AND A METHOD OF TESTING A SINGULATED ELECTRONIC COMPONENT USING A CONTACT DEVICE

Abstract

A contact device (200, 200) and a method for testing a singulated electronic component (101). The contact device (200, 200) comprises a plunger unit (202) comprising a chamber lid (220) and a nest (230) which is adapted to carry the singulated electronic component (101), and a socket unit (201) comprising a socket (132) and a chamber (210) having an open front side and surrounding the socket (132). The chamber (210) is adapted in that closing of the chamber (210) at its open front side (219) by the chamber lid (220) comprises automatically contacting the singulated electronic component (101) to the socket (132).

Claims

1. A contact device for testing a singulated electronic component comprises: a plunger unit comprising a chamber lid and a nest which is adapted to carry the singulated electronic component, and a socket unit comprising a socket and a chamber having an open front side and surrounding the socket, wherein the chamber is adapted in that closing of the chamber at its open front side by the chamber lid comprises automatically contacting the singulated electronic component to the socket.

2. The contact device according to claim 1, wherein the plunger unit further comprises at least one plunger rod which exerts a closing force that moves the chamber lid in a direction to the open front side of the chamber and which moving force exceeds a contact force for contacting to the singulated electronic component.

3. The contact device according to claim 1, wherein the nest comprises a supporting piece being suspended with an elastic suspension on the chamber lid so that a force exerted by the elastic suspension on the supporting piece is sufficient to contact the singulated electronic component to the socket.

4. The contact device according to claim 1, wherein the nest protrudes from the chamber lid in the direction towards the open front side of the chamber.

5. The contact device according to claim 1, wherein the chamber comprises an outlet for applying low pressure to the chamber, the low pressure being in particular at least as low so that an electrical discharge during a high voltage test of the singulated electronic component is avoided.

6. The contact device according to claim 1, wherein the chamber comprises an inlet for applying a high pressure to the chamber for performing a high-pressure test of the singulated electronic component.

7. The contact device according to claim 1, wherein the nest comprises a rear element and a web which are adapted to clamp the singulated electronic component.

8. A method of testing a singulated electronic component using a contact device comprises: providing a plunger unit comprising a chamber lid and a nest which is adapted to carry the singulated electronic component, and providing a socket unit comprising a socket and a chamber having an open front side and surrounding the socket, wherein closing of the chamber at its open front side by the chamber lid comprises automatically contacting the singulated electronic component to the socket.

9. The method according to claim 8, wherein the plunger unit comprises at least one plunger rod, wherein the method further comprises exerting a closing force with the plunger rod, and moving the chamber lid in a direction to the open front side of the chamber, wherein the closing force exceeds a contact force for contacting the singulated electronic component to the socket.

10. The method according to claim 8, wherein the nest comprises a supporting piece being suspended with an elastic suspension on the chamber lid, wherein the method further comprises exerting a force by the elastic suspension on the supporting piece, which force is sufficient to enable contacting of the singulated electronic component to the socket.

11. The method according to claim 8, wherein the nest protrudes from the chamber lid in the direction towards the open front side of the chamber.

12. The method according to claim 8, further comprising applying a low pressure to the chamber via an outlet, the low pressure being at least as low so that a flashover during a high voltage test of the singulated electronic component is avoided.

13. The method according to claim 8, further comprising applying a high pressure to the chamber via an inlet and performing a high-pressure test of the singulated electronic component.

14. The method according to claim 8, further comprising clamping the singulated electronic component with a rear element and a web of the nest.

Description

BRIEF DESCRIPTION OF THE DRAWING

[0046] FIG. 1 shows a schematic view of known automated test equipment

[0047] FIG. 2 shows a perspective view of a contact device

[0048] FIG. 3 shows a cross-sectional view of the contact device

[0049] FIG. 4 shows the contact device with a contacted electronic component 101

[0050] FIG. 5a shows a cross-sectional view of a further contact device

[0051] FIG. 5b shows the further contact device with a contacted electronic component

[0052] FIG. 6 shows the contact device with an adapter board

DETAILED DESCRIPTION OF THE DRAWING

[0053] FIG. 1 shows a schematic view of automated test equipment 100 as already known. Automated test equipment 100 comprises at least a handler 110 for handling and sorting electronic components 101a, 101b and a tester 120 for testing the electronic components 101, 101b. A test head 130 may be docked to the handler 110 and may be coupled to the tester 120 by a cable 125 so that an electric contact to the tester 120 may be enabled. Between the test head 130 and the handler 110 a DUT board 135 may be arranged on which a plurality of sockets 132a, 132b may be mounted. The handler 110 may provide for each of the sockets 132a, 132b a plunger 112a, 112b comprising a nest 114a, 114b. Each nest 114a, 114b may carry one electronic component 101a, 101b, respectively, and by a forward and backward movement 119 of the plungers 112a, 112b the electronic components 101a, 101b may be contacted to the sockets 132a, 132b or moved away from the sockets 132a, 132b, respectively. The arrangement of a plunger 112a, 112b and a socket 132a, 132b may be called a contact device 200. As can be seen in FIG. 1 the electronic component 101b may be contacted to the socket 132b by a forward movement of the plunger 112b so that an electric conduct may be established between the electronic component 101b and the tester 120 via the socket 132b, the DUT board 135, and the cable 125. The backward movement of the plunger 112a as can be seen in FIG. 1 illustrates that the respective electronic component 101a may not be contacted and may be sorted after a test carried out by the tester 120.

[0054] FIG. 2 shows a perspective view of a contact device 200 comprising a plunger unit 202 and a socket unit 201. The plunger unit 202 comprises a first plunger rod 113 and a second plunger rod 114. The first plunger rod 113 and the second plunger rod 114 may allow for a forward and backward movement 119 (see FIG. 1) of the nest 230. The plunger unit 202 may comprise the nest 230 for carrying a singulated electronic component (not shown). The nest 230 may comprise a base 236 on which a rear element 238 of the nest may be fixedly mounted. On the rear element 238 of the nest 230 there may be movably mounted a web 232. The rear element 238 and the web 232 may form a slot 235 through which the electronic component may be fed.

[0055] Between the web 232 and the rear element 238 the electronic component may be clamped since the web 232 may be automatically forced towards the rear element 238 by a spring force. In order to clamp an electronic component to the nest 230 the web 232 may first be slightly separated from the rear element 238 against the spring force and then released again. The plunger unit 202 may further comprise a chamber lid 220 on which the base 236 of the nest 230 may be mounted. The nest 230 may extend from the chamber lid 220 into the same direction where a forward movement takes place.

[0056] The contact device 200 may further comprise a socket unit 201. The socket unit 201 comprises a chamber 210 which may be concave and may have an open front side 219. The chamber lid 220 may fit to the open front side 219 of the chamber 210. By moving the plunger unit 202 forward the chamber lid 220 may close the chamber 210 so that an inner space may be formed in which the nest 230 may be located. The inner space may be airtight and the nest 230 as well as a socket (see also FIG. 3) may be arranged inside of the chamber 210 closed by the chamber lid 220.

[0057] The chamber 210 may be a rectangular cuboid having a first side wall 211 and an opposite third side wall 213, as well as rectangular arranged to them a second side wall 212 and an opposite fourth side wall 214. The chamber may have a back-side wall 215 which may be opposite to an open front side 219. The first, second, third and fourth side walls 211, 212, 213, and 214 may form with the back-side wall 215 a hollow airtight body. The back-side wall 215 may be penetrated by tester sided contacts 133. One of the side walls 211, 212 213, 214 or the back-side wall 215,here the first side wall 211may comprise an inlet 241 and an outlet 242. By the inlet 241 and the outlet 242 low pressure and high pressure may be applied to the chamber 210 when being closed by the chamber lid 220.

[0058] Summarizing, the contact device 200 may comprise a socket unit 201 and a plunger unit 202. The socket unit 201 may comprise a hollow chamber 210 surrounding the socket 132 (see FIG. 3). The plunger unit 202 may comprise plunger rods 113, 114, and a nest 230 extending from the lid 220 and extending into the chamber 210 if the chamber may be closed by the lid 220.

[0059] FIG. 3 shows a cross-sectional view of the contact device 200 in a non-contacted state. The socket unit 201 may comprise the two opposite side walls 212, 214 which may form the hollow body together with the airtight back side wall 215 (and with the other two side walls 211, 213 which, cannot be seen in this cross-sectional view). The chamber 210 may comprise the open front side 219. Inside the chamber 210 a socket 132 may be arranged which provides DUT sided contacts 333a, 333b, 333c which may be adapted to mate with contact terminals 102 of the electronic component 101. The DUT sided contacts 333a, b, c may extend through the socket 132 and through the back-side wall 215 so that an electric conduct path may be established. The socket 132 may be a sandwiched type of construction 332 so that the back-side wall 215 may be penetrated by tester sided contacts 133a, 133b, 133c and the whole chamber construction may be airtight.

[0060] An abutting surface of the side walls 211, 212, 213, 214 may comprise a sealing ring 216 which may allow for a complete airtight space inside the chamber 210 when being closed with chamber lid 220 of the plunger unit 202.

[0061] The plunger unit 202 may comprise the nest 230, an elastic suspension 339, the two plunger rods 113, 114 and the chamber lid 220. The two plunger rods 113, 114 may extend through the chamber lid 220 in an airtight way. The elastic suspension 339 for the nest 230 may comprise a first spring 337 and a second spring 338. Both springs 337, 338 may be mounted to the chamber lid 220 and to a base 236 of the nest 230, so that the nest 230 and the electronic component 101 held by the nest 230 may be elastically held. The nest 230 may further comprise a rear element 238 which may support the back side of the electronic component 101. The rear element 238 may be fixed to the base 236 so that the rear element 238 may be suspended by the elastic suspension 339, as well. In particular, the base 236 and the rear element 238 may be made from one piece. The electronic component 101 may be clamped between the rear element 238 and a web 232 which is flexibly mounted relative to the rear element 238, so that the electronic component 101 can be removed from the nest 230 when the web 232 is separated from the rear element 238. The web 232 may comprise an opening 342 in a middle area so that the electronic component 101 may be accessible by a DUT sided ground contact 333a of the contact socket 132. Lead backers 234, 234 may extend from the base 236. The lead backers 234, 234 may support the terminals 102 of the DUT 101 during the contacting of the DUT 101.

[0062] FIG. 4 shows the contact device 200 when an electronic component 101 may be contacted to the socket 132. The side walls 212, 214 (211, 213 see FIG. 2) and the back-side wall 215 of the socket unit 201 and the chamber lid 220 of the plunger unit 202 may form the airtight chamber 210. The force by which the plunger unit 202 may be moved (forwards and) towards the socket unit 201 allows for an appropriate electrical contact of the DUT sided contacts 333a, b, c with the respective terminals 102 of the electronic component 101. The base 236 of the nest 230 may comprise the lead backers 234, 234 which may support the terminals 102 of the singulated electronic component 101 against an elastic restoring force being exerted by the DUT sided contacts 333a, b, c when the electronic component 101 is contacted to the socket 132. So, the force pressing the plunger unit 202 should be higher than the elastic restoring force of the DUT sided contacts 333a, b, c since the chamber 210 has also to be air-tightly closed. If there is a high pressure applied to the inner space of the chamber for a pressure test of the electronic component 101 by the inlet 241 (see FIG. 2) then the force of the plunger unit 202 should exceed this additional high pressure force. The elastic suspension 339 of the nest 230 may prevent the DUT sided contacts 333a, b, c and the terminals 102 of the electronic component 101 from being damaged since a hard stop may be avoided. Additionally, the elastic suspension 339 may help to overcome fabrication tolerances of the construction which may otherwise cause bad contacting. When the electronic component 101 may be contacted to the DUT sided contacts 333a, b, c then an electric conduct may be established between the DUT and the tester sided contacts 133a, 133b, 133c which may be electrically coupled to the tester 120 (compare FIG. 1). The web 232 may also be suspended with the elastic suspension 339. Therefore, during the contact procedure the DUT 101 may be clamped between the web 232 and the rear element 238. Further, the terminals 102 of the DUT 101 may be supported by the lead backers 234, 234. A slightly different form of suspension 339 is shown and discussed in FIG. 5a and FIG. 5b.

[0063] FIG. 5a and FIG. 5b show an exemplary embodiment of the further contact device 200 being very similar to the contact device 200 shown in FIG. 3 and FIG. 4. Primarily the suspension 339 of the nest 230 differs, so that only the differences are emphasized. FIG. 5a shows the non-contacted state in which the DUT 101 may be clamped by the web 232 and the rear element 238. The lead backers 234, 234 may support the terminals 102 of the DUT 101. The lead backers 234, 234 may extend from the base 236 of the nest 236. The base 236 may comprise the rear element 238 and may comprise an abutting face 520 adapted to abut on an abutting surface 510 of the socket 132. However, the web 232 may be rigidly coupled to the lid 220 and so the suspension 339 may press the rear element 238 against the web 232 so that the DUT 101 may be clamped between the rear element 238 and the web 232.

[0064] FIG. 5b shows the contact device 200 during a contacted state. The abutting face 520 of the base 236 and the abutting surface 510 of the socket 132 may abut on each other. Since the web 232 may be fixed to the chamber lid 220 and does not interact with the socket 132, the web 232 may lift off the DUT 101 which is then not being clamped in the nest 230. However, the back side of the DUT 101 may be supported by the rear element 238 and the terminals 102 may be supported by the lead backers 234, 234. The terminals 102 being supported by the lead backers 234, 234 may be contacted to the DUT sided contacts 333a, b, c of the socket 132. The slightly different contact device 200 may comprise less movable suspended parts since the web 232 is fixedly coupled with the chamber lid 220.

[0065] FIG. 6 shows a cross-sectional view of the socket unit 201 using an adapter board 610. A regular socket 132 may be used since the air tightness of the chamber 210 may be realized by the adapter board 610. The tester sided contacts 133a, b, c of the adapter board 610 may be electrically coupled to the tester sided contacts 633a, b, c of the socket 132. An electric conduct may be established from the DUT sided contacts 333a, b, c to the tester 120, via the adapter board 610. The use of the adapter board 610 may allow for using a regular socket 132 which sandwiched type of construction 332 then does not have to be airtight.