Method for producing thermoelectric layers
09957602 ยท 2018-05-01
Assignee
Inventors
Cpc classification
H10N10/8556
ELECTRICITY
H10N10/855
ELECTRICITY
International classification
Abstract
The invention relates to a method for producing thermoelectric layers by depositing thermoelectric material on a substrate by means of sputter deposition. In order to create a method for producing thermoelectric layers that are better suited for use in thermogenerators, and in particular have higher Seebeck coefficients, the production of a target made of thermoelectric material is proposed by mixing at least two powdered starting materials having a particle size from 0.01 ?m-5000 ?m, while coupling in energy and depositing the thermoelectric material from the target on the substrate by way of magnetron sputter deposition.
Claims
1. A method for producing thermoelectric layers configured for thermoelectric generators by depositing thermoelectric material onto a substrate by sputter deposition, comprising the steps of producing a target of thermoelectric material by mixing together at least two powdered starting materials in a particle size of 0.01-5000.00 ?m under the input of energy by one of mechanical alloying and plasma alloying, wherein the mechanical alloying includes grinding the powdered starting materials, and the input of energy is achieved through loads delivered by impacts and shocks during the grinding, and depositing the thermoelectric material from the target onto the substrate by magnetron sputter deposition, thereby forming the thermoelectric layers configured for thermoelectric generators, where a magnetic field is superimposed on an electric field produced by a target cathode and an anode and only a DC gas discharge between the target cathode and the anode serves as an ion source for the magnetron sputter deposition.
2. The method according to claim 1, the at least two powdered starting materials include at least two different materials from one of the following groups of starting materials mixed together: Bi.sub.2Te.sub.3, Bi.sub.2Se.sub.3, Sb.sub.2Te.sub.3; PbTe; Si, Ge; carbides; perovskites; clathrates; skutterudites; nitrides; Zintl phases; half-Heusler compounds; carbon-based semiconductors; and metal oxides.
3. The method according to claim 2, wherein the step of producing includes producing a p-type target using the starting materials Sb.sub.2Te.sub.3 and Bi.sub.2Te.sub.3 mixed together, and the p-type target comprises 60-90 mol. % of Sb.sub.2Te.sub.3.
4. The method according to claim 2, wherein the step of producing includes producing an n-type target using the starting materials Bi.sub.2Se.sub.3 and Bi.sub.2Te.sub.3 mixed together, and the n-type target comprises 80-95 mol. % of Bi.sub.2Se.sub.3.
5. The method according to claim 2, wherein the step of producing includes producing an n-type target by mixing together the n-type doped starting materials silicon and germanium.
6. The method according to claim 2, wherein the step of producing includes producing a p-type target by mixing together the doped starting materials silicon and germanium.
7. The method according to one of claims 1, wherein the step of producing comprises grinding the at least two powdered starting materials; removing the starting materials, which have been alloyed by the grinding process; and then sintering the alloyed starting materials at temperatures in the range of 200-1,000? C.
8. The method according to claim 7, wherein the at least two powdered starting materials are ground in a grinding-body mill.
9. The method according to claim 1, wherein the step of producing comprises introducing the at least two powdered starting materials into a gas stream; generating a cold atmospheric plasma in a gas jet; and feeding the gas stream into the gas jet.
10. The method according to claim 9, wherein the cold atmospheric plasma comprises a temperature below 1,000? C.
11. The method according to claim 9, wherein the mass flow rate of the starting materials in the gas stream is in the range of 0.01-200 g/sec-cm.sup.2.
12. The method according to one of claim 1, further comprising tempering the layer deposited onto the substrate.
13. The method according to claim 12, wherein the tempering of the layer is performed at a temperature in the range of 200-1,000? C.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) In the following, the inventive method is explained in greater detail on the basis of
(2)
(3)
(4)
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
(5)
(6) Then the starting materials 1, 2 which have been alloyed as shown in
(7) In the left half of
(8)
(9) To produce the cold atmospheric plasma in a gas jet 6 required for this purpose, a hollow cylindrical plasma generator 7 is used, to one end of which a feed line 8 for a working gas is connected. A pin electrode 9 extends into the plasma generator 7 from the center of this feed end. At the opposite end of the plasma generator 7, which tapers down in the manner of a nozzle, there is a ring electrode 10. An ignition voltage is applied between the pin electrode 9 and the ring electrode 10; this voltage leads to a strikeover and to the ignition of a gas discharge between the electrodes 9, 10. The cold atmospheric plasma is generated in the gas jet 6 formed in the working gas flowing through the plasma generator 7 in the direction of the arrows 11.
(10) Transversely to the flow direction 11 of the working gas, an inlet 13 for supplying another gas stream 14 to the plasma generator 7 is also incorporated into the plasma generator 7, near its nozzle-like tapering tip 12. The gas stream 14 contains the two powdered starting materials 1, 2, which have already been introduced into it, and they are mixed together as they are transported in the gas stream. The first and second powdered starting materials 1, 2 are introduced with the gas stream 14 into the gas jet 6. As a result of the input of energy E which occurs in the gas jet 6 of the plasma generator, the layer-like structure of the starting materials 1, 2 is produced, as can be seen in the right half of
(11)
(12) The thermoelectric material from the target 3 is deposited onto a substrate 16 by magnetron sputter deposition. The magnetron sputter deposition system 17 required for this comprises an evacuated work chamber 18, in which a noble gas, especially argon, is used. The target cathode 19, which is preferably designed in the form of a plate, is positioned on one side of the work chamber. The substrate 16 is mounted near the target 3, which itself rests on the target cathode 19, so that the atoms which have been dislodged by bombardment with high-energy noble-gas ions and converted into the gas phase can then condense on the substrate 16, where they are thus able to form the layer 22 of thermoelectric material.
(13) A DC gas discharge between the target cathode 19 and the anode 20 serves as the ion source. Behind the target cathode 19 are magnets to create an additional magnetic field. The magnetic field is superimposed on the electric field produced by the target electrode 19 and the anode 20. This has the effect of generating a greater degree of ionization in the area parallel to the surface 21 of the target 3.
(14) Finally, in the last step as shown in
(15) By optimizing the temperature profile during tempering, the recrystallization can be controlled in such a way that the Seebeck coefficient of the deposited thermoelectric layer 22 is greater than the Seebeck coefficient of the pure crystalline thermoelectric materials.
(16) Thus, while there have shown and described and pointed out fundamental novel features of the invention as applied to a preferred embodiment thereof, it will be understood that various omissions and substitutions and changes in the form and details of the devices illustrated, and in their operation, may be made by those skilled in the art without departing from the spirit of the invention. For example, it is expressly intended that all combinations of those elements and/or method steps which perform substantially the same function in substantially the same way to achieve the same results are within the scope of the invention. Moreover, it should be recognized that structures and/or elements and/or method steps shown and/or described in connection with any disclosed form or embodiment of the invention may be incorporated in any other disclosed or described or suggested form or embodiment as a general matter of design choice. It is the intention, therefore, to be limited only as indicated by the scope of the claims appended hereto.