Optical detector for measuring respective phases of multiple beams apparatus and method

Abstract

A system includes a source of laser beams forming an array, a source of a reference laser beam, and an optical detector for measuring respective phase differences between the array laser beams and the reference laser beam. The system includes a mask, having apertures with a shape, size and position identical to a shape, size and position of the array laser beams, and positioned in the reference laser beam to form respective beams of the reference laser beam corresponding to the beams from the array laser beams. A phase modulator phase modulates respective beams of one of (a) the array laser beams and (b) the beams of the reference laser from the mask. A photodetector receives the respective array laser beams and the corresponding reference laser beams from the mask to generate a composite signal. Processing circuitry is responsive to the composite signal for generating respective signals representing the phase differences of the individual laser beams from the reference laser beam.

Claims

1. In a system comprising a source of laser beams forming an array, a source of a reference laser beam, and an optical detector for measuring respective phase differences between the array of laser beams and the reference laser beam, comprising: a mask defining apertures therein, wherein the mask is positioned in a path of the reference laser beam to form beams emanating through the mask from the reference laser beam; a modulator for modulating the beams of one of (a) the beams of the source of laser beams and (b) the beams of the reference laser beam emanating through the mask; a photodetector for receiving the beams from the source of laser beams and the beams of the reference laser beam emanating through the mask to generate a composite signal; and processing circuitry responsive to the composite signal for generating respective signals representing the phase differences of the individual laser beams from the reference laser beams emanating through the mask.

2. The system of claim 1 wherein: the laser beams forming an array are coherent; and the reference laser beam is coherent with the laser beams forming the array.

3. The system of claim 1, wherein the modulator is a phase modulator.

4. The system of claim 3 further comprising optics for combining the respective beams from the array with corresponding reference beams emanating from the mask, comprising: a first lens arranged in the laser array beams to direct the laser array beams to form respective images on the photodetector; and a second lens arranged in the reference beams emanating through the mask to direct the reference beams to form respective images on the photodetector, and for overlapping the images of the laser array beams with the images of reference beams.

5. The system of claim 4 wherein the optics generate images from the respective beams of the laser array and the corresponding reference beams which images are similar in size and divergence.

6. The system of claim 4, wherein: the beams from the laser array are coherent, and the reference beam is coherent with the beams from the laser array; the optics overlap respective beams from the laser array with the corresponding reference beams transmitted through the mask to produce an interference pattern; and the respective reference beams have an intensity and divergence corresponding to those of the beams from the laser array.

7. The system of claim 4 wherein the optics comprise: a beamsplitter for directing the beams from the laser array and the first lens to form images on the photodetector; the beamsplitter further aligning the reference beams emanating from the mask and the second lens with beams from the laser array.

8. The system of claim 4 wherein the optics comprise: a beam sampler for directing the beams from the laser array to the first lens; and a beam splitter for aligning the respective beams from the mask and the second lens with respective beams from the laser array.

9. The system of claim 3 wherein the processing circuitry comprises: circuitry responsive to the composite signal from the photodetector for extracting signal components, each component representing a single interference image from a beam from the laser array and a beam from the reference laser on the photodetector; and circuitry for analyzing each component signal and generating a corresponding signal representing the phase difference between the beam from the laser array and the corresponding reference laser beam.

10. The system of claim 9 wherein: the phase modulator comprises phase modulators coupled to N beams emanating from one of (a) the laser array and (b) the mask, for phase modulating an i.sup.th beam thereof with a predetermined known frequency .sub.i and a modulating factor .sub.i<; the composite signal responsive circuitry identifying which beam in the laser array corresponds to the component signals by detecting the frequency .sub.i of the phase modulation of that signal; and the analyzing circuitry generating the phase difference representative signal, the phase difference representative signal corresponding to the i.sup.th beam.

11. The system of claim 3 wherein: the phase modulator comprises phase modulators coupled to N beams emanating from one of (a) the laser array and (b) the mask, for phase modulating an i.sup.th beam thereof with a predetermined known frequency .sub.i and a modulating factor .sub.i<; the processing circuitry (1) extracting the signal components using a Fourier transform, and (2) generating the phase difference representative signals in response to the signal components from the Fourier transform.

12. The system of claim 11 wherein the processing circuitry detects the amplitudes of the first A(.sub.i) and second A(2.sub.i) modulation harmonics of each modulated component signal from the Fourier transform and calculates the corresponding phase difference as: ${}_i={\tan }^{-1}\left[\frac{A\left({}_i\right)}{A\left(2{}_i\right)}\frac{J_2\left({}_i\right)}{J_1\left({}_i\right)}\right]$ where .sub.i is the phase difference between the i.sup.th reference beam and the i.sup.th beam in the laser array, A(.sub.i) is the amplitude of the first harmonic of the modulation on the i.sup.th beam in the laser array, A(2.sub.i) is the amplitude of the second harmonic of the modulation on the i.sup.th beam in the laser array, J.sub.1 is the Bessel function of the first kind and order 1, .sub.i is the i.sup.th modulation factor, J.sub.2 is the Bessel function of the first kind and order 2.

13. The system of claim 1, wherein the apertures have shapes, sizes, and positions corresponding to shapes, sizes, and positions of the array laser beams.

14. A method for measuring phases of beams from a laser/laser amplifier array relative to a reference beam, comprising: illuminating a mask defining apertures therein with the reference beam to create reference beams as the reference beam passes through the mask; modulating one of (a) beams from the array and (b) the reference beams; combining the beams from the array with the reference beams on a photodetector to generate a signal; measuring the signal from the photodetector; calculating the respective beam phases for beams in the array relative to the reference beam in response to the measured signal from the photodetector.

15. The method of claim 14 wherein the calculating step comprises calculating the respective beam phases through Fourier analysis of the measured signal from the photodetector.

16. The method of claim 14, wherein the combining step comprises using part of the power of the respective beams in the array.

17. The method of claim 14, further comprising: developing the mask defining apertures therein before illuminating the mask defining apertures therein.

18. The method of claim 14 wherein: the beams from the array are coherent and the reference beam is coherent with the beams from the array; and the combining step comprises developing combined interference images of the array beams and corresponding reference beams.

19. The method of claim 14, wherein the combining step comprises using different magnifications for the respective beams in the array than corresponding reference beams from the mask.

20. The method of claim 14, wherein the combining step comprises overlapping the respective beams from the array with corresponding reference beams to provide less than one interference fringe for every interfering spot on the photodetector.

21. The method of claim 14 wherein developing the mask defining apertures therein further comprises: developing the mask defining apertures therein with shapes, sizes, and positions corresponding to the shapes, sizes, and positions of the beams in the laser array.

22. The method of claim 14 wherein the modulating is sinusoidal phase modulating.

23. The method of claim 14, wherein combining the array beams with the reference beams on the photodetector further comprises developing combined images.

24. In a system comprising a source of coherent laser beams forming an array, a source of a reference laser beam coherent with the array laser beams, and an optical detector for measuring respective phase differences between the array laser beams and the reference laser beam, comprising: a mask defining apertures therein and positioned in the reference laser beam to create reference laser beams as the reference beam passes through the mask; a photodetector receiving the beams from the laser array and the beams from the mask to generate a composite signal; and processing circuitry responsive to the composite signal from the photodetector for generating respective signals representing the phase differences of the individual laser beams from the reference laser beam.

25. The system of claim 24 further comprising: a phase modulator for phase modulating beams of one of (a) the beams from the source of the coherent laser beams forming an array and (b) the reference laser beams from the mask.

26. The system of claim 25 wherein the phase modulator is configured for modulating beams of the source of coherent laser beams forming an array; the processing circuitry: being responsive to the composite signal from the photodetector, and being configured for extracting signal components representing corresponding interference images from beams from the laser array and the reference laser beams emanating through the mask on the photodetector; and the processing circuitry further configured for analyzing each component signal and generating respective signals representing the phase difference between the beams from the laser array and the reference laser beam.

27. The system of claim 26 wherein: the phase modulator comprises phase modulators coupled to N lasers in the laser array for phase modulating an i.sup.th beam in the array with a predetermined known frequency .sub.i and a modulating factor .sub.i<; the processing circuitry identifying which beam in the laser array corresponds to the component signals by detecting the frequency .sub.i of the phase modulation of that signal; the processing circuitry generating a phase difference representative signal corresponding to the i.sup.th beam in the array.

28. The system of claim 25 wherein: the phase modulator is configured for modulating beams of the source of coherent laser beams forming an array; the phase modulator comprising phase modulators for phase modulating N respective beams in the laser array at equally spaced frequencies between .sub.1 and .sub.N with respective modulation factors of .sub.i<, where .sub.i is the modulation factor of an ith beam in the laser array; the processing circuitry separating the composite signal into component signals using a Fourier transform, and generating the respective phase difference representative signals in response to the component signals from the Fourier transform.

29. The system of claim 28 wherein the processing circuitry detects amplitudes A(.sub.i), A(2.sub.i) of the first and second modulation harmonic respectively of each component signal from the Fourier transform and calculates the phase difference as: ${}_i={\tan }^{-1}\left[\frac{A\left({}_i\right)}{A\left(2{}_i\right)}\frac{J_2\left({}_i\right)}{J_1\left({}_i\right)}\right]$ where .sub.i is the phase difference between the i.sup.th reference beam and the i.sup.th beam in the laser array, A(.sub.i) is the amplitude of the first modulation harmonic of the i.sup.th beam in the laser array, A(2.sub.i) is the amplitude of the second modulation harmonic of the i.sup.th beam in the laser array, J.sub.1 is the Bessel function of the first kind, and order 1, .sub.i is the i.sup.th modulation factor, and J.sub.2 is the Bessel function of the first kind, and order 2.

30. The system of claim 24, further comprising optics for forming images on the photodetector, wherein the optics form images of beams from the laser array and the reference laser beams.

31. The system of claim 30 wherein the optics comprise: a first lens arranged in the laser array beams to direct the beams from the laser array to form images on the photodetector; and a second lens arranged in the reference beams to direct the beams to form images on the photodetector, thereby overlapping the images of the laser array beams with the images of the reference beams.

32. The system of claim 31, wherein the optics overlap beams from the laser array with the reference beams from the mask to produce interference patterns.

33. The system of claim 31 wherein the optics comprise: a beamsplitter for directing the beams from the laser array and the first lens to form images on the photodetector, the beamsplitter further for directing the reference beams from the second lens to the photodetector.

34. The system of claim 31 wherein the optics comprise: a beam sampler for directing a portion of the beams from the laser array to the first lens; and a beamsplitter for overlapping the reference beams from the second lens with the beams from the laser array.

35. A method for measuring phases of beams from a coherent laser/laser amplifier array relative to a reference beam, comprising: illuminating a mask defining apertures therein with the reference beam to produce reference beams emanating through the apertures in the mask; modulating one of (a) the beams in the array of laser beams and (b) the reference laser beams emanating through the apertures in the mask; combining the array beams with the reference beams on a photodetector to develop a signal; measuring the signal from the photodetector; calculating the beam phases for beams in the array relative to the reference beams in response to the measured total signal from the photodetector.

36. The method of claim 35 wherein the calculating step comprises calculating the beam phases through Fourier analysis of the measured total signal from the photodetector.

37. The method of claim 35, wherein the combining step comprises using a part of the power of the beams in the array.

38. The method of claim 35, wherein combining the array of beams with the reference beams on the photodetector further comprises developing interference images.

39. The method of claim 38, wherein the combining step further comprises: developing 0-fringe interference images.

40. The method of claim 35, wherein the modulating step further comprises modulating with sinusoidal phase modulation.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1 is a diagram illustrating the formation of an interference pattern useful in understanding the operation of the present invention;

(2) FIG. 2A through FIG. 2F are diagrams of six interference patterns useful in understanding the operation of the present invention;

(3) FIG. 3A is a block diagram of one embodiment of a system according to principles of the present invention and FIG. 3B is an illustration of an image on a photodetector resulting from use of a mask on the reference signal;

(4) FIG. 3C is the same as FIG. 3A, except FIG. 3C includes a phase modulator;

(5) FIG. 3D is the same as FIG. 3B.

(6) FIG. 3E is the same as FIG. 3A, except includes a phase modulator;

(7) FIG. 3F is the same as FIG. 3B.

(8) FIG. 4 is a block diagram of a second embodiment of the optics portion only of a system according to principles of the present invention;

(9) FIG. 5 is an illustration of the image on the photodetector in the absence of a mask;

(10) FIG. 6 is a waveform diagram of a simulated composite signal from the photodetector used in simulating the present invention;

(11) FIG. 7A and FIG. 7B are diagrams illustrating Fourier analyses of the first and second harmonics, respectively, of the simulated composite input signal from a photodetector illustrated in FIG. 6; and

(12) FIG. 8 is a diagram illustrating correspondences of preset phases for an array of laser beams used to fabricate a simulated composite signal to calculated phases for the array of laser beams calculated in response to processing of the simulated composite signal illustrated in FIG. 6 according to principles of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

(13) A multidithering technique is described in pending U.S. patent application Ser. No. 14/596,960 filed on Jan. 14, 2015, and entitled a System for Maintaining the Locking Range of an Injection Locked Laser Array Within Range of the Frequency of a Master Laser by Efimov et al. the contents of which are incorporated herein by reference.

(14) FIG. 1 is a diagram illustrating the formation of an interference pattern useful in understanding the operation of the present invention. There is a difference between 0-phase interference patterns and 0-fringe interference patterns. A 0-phase interference pattern means that the length difference in the optical paths of both beams is equal to 0 and the beams experience a constructive interference with the brightest fringe. Usually this occurs only for some specific direction. However, the same brightness will be observed for any directions where m (i.e. m=L/, where L is the difference between the optical paths of the two beams, and is the wavelength of the coherent light of the two beams) is equal to an integer number. Referring to FIG. 1, L1 is the optical path for a first beam, L2 is the optical path for a second beam, L is the difference in the lengths of the optical paths of beams and is the wavelength. Here L1, L2, and L are measured along the optical axis shown by dashed line in FIG. 1.

(15) FIG. 2 is a diagram of six interference patterns useful in understanding the operation of the present invention. These patterns are the result of the interference of two light beams having 1 m wavelength produced as shown in FIG. 1. The sizes of the patterns, i.e. the length and width of the patterns illustrated in FIG. 2, are 2 mm2 mm. The length L1 is 50 mm. The differences in the optical paths of the beams along the optical axis and the phase differences are described in the caption beneath the figure.

(16) In FIG. 2, the interference patterns shown in FIG. 2A and FIG. 2B are for m=20000 m/1 m=20000. FIG. 2A has the same highest available intensity as for m=0 (not illustrated). If the phase difference is shifted by , then the pattern has the lowest intensity. This situation is shown in FIG. 2B, also with m>>0. If the optical path difference is reduced from 20 mm to 6 mm, as shown in FIG. 2C, the number of fringes over the same area (i.e. 2 mm2 mm), or the spatial frequency of fringes, is reduced. If the optical path difference is further reduced to 2 mm, the spatial frequency of fringes or the number of visible fringes is further reduced as illustrated in FIG. 2D.

(17) If the optical path difference is reduced to zero everywhere on the screen of the photodetector, the same intensity pattern is produced independent of the position of observation on the screen, that is, the spatial frequency of fringes is equal to 0. This is termed the 0-fringe pattern in the remainder of this application. Such patterns are shown in FIG. 2E for =/2 and in FIG. 2F for = phase differences between the beams, respectively. In these figures, the optical path difference L=0 which means that m=0 also. One skilled in the art further understands that a 0-fringe pattern can be implemented with different optics systems for any value of m-number.

(18) FIG. 3A is a block diagram of one embodiment of the present invention and FIG. 3B is an illustration of an image on a photodetector resulting from use of a mask 2 on the reference signal. In FIG. 3A, an array 1 of lasers or laser amplifiers directs beams to the photosensitive area of photodetector 7 by a lens 4. A mask 2, having apertures with shapes, sizes, and positions identical to the shapes, sizes, and positions of beam outputs from array 1, is illuminated with a reference beam 3. The reference beam 3 has a planar wavefront to provide the same phase for all the reference beams developed by the mask 2. The mask 2 is positioned at the same distance from the photodetector 7 as the array 1 and is directed to the photodetector 7 with a lens 5 identical to the lens 4.

(19) The beams from the laser array 1 and the reference beam are coherent. The optical signal supplied to the photodetector 7 is the respective patterns formed by the beams from the array 1 interfering with their corresponding reference beams from the mask 2. The electrical output signal from the photodetector 7 is a composite signal derived from the combination of the respective interference patterns.

(20) One skilled in the art understands that phase modulations may be applied to either the beams in the array 1 or to the respective corresponding reference beams developed by the mask 2. In the remainder of this application, unless specifically described differently, modulations will be illustrated as applied to the respective beams in the array 1.

(21) In operation, the composite signal from the photodetector 7 is supplied to a phase detector 9. The phase detector 9 calculates the respective phase differences between the beams from array 1 and the corresponding reference beams in a manner described in detail below. The phase detector 9 produces respective phase difference signals representing these phase differences. More specifically, in FIG. 3A, 11 phase difference signals are produced corresponding to the 11 beams from the array 1 and the 11 reference beams from the mask 2. These signals may be used, for example, by beam steering apparatus (not germane to this invention, and therefore not illustrated) to correct the phases of the beams in the array in order to steer the array accurately.

(22) FIG. 3B is an illustration of an image on the photodetector 7 detecting surface resulting from use of the mask 2 on the reference signal 3 as illustrated in FIG. 3A. The images from array 1 and mask 2 are combined with each other by beamsplitter 6 to get 0-fringe interference images. These images impinge on the detecting surface of photodetector 7 as shown in FIG. 3B. Because the phases of the beams from array 1 are random in FIG. 3A, the images of interfering beams have different intensities as shown by grayscale in FIG. 3B depending on phase difference between the reference beam 3 and the corresponding beam from array 1. For example, if a beam from array 1 is in phase with the reference beam 3, the resultant combined beams will reinforce and produce a relatively bright image on the detecting surface of photodetector 7, as illustrated by image 7A in FIG. 3B. If a beam from array 1 is out of phase with the reference beam 3, the resultant combined beams will cancel and produce a relatively dark image on the detecting surface of photodetector 7, as illustrated by image 7B in FIG. 3B.

(23) FIG. 4 is a block diagram of the optics portion only of a second embodiment of the present invention. In FIG. 4, elements which are the same as those in FIG. 3A are designated by the same reference number and are not described in detail. One skilled in the art understands that it is not necessary to use the total power of array 1 for phase measurements. Instead, a small part of power from the array 1 is sufficient. In FIG. 4, a beam sampler 8 samples a portion of the power of the beams from array 1 for use in detecting phase differences. In FIG. 4, the lens 4 directs this portion of beams from array 1 to the photodetector 7. The remainder of the embodiment illustrated in FIG. 4 operates as described above with reference to FIG. 3A.

(24) FIG. 5 is an illustration of the image on the detecting surface of photodetector 7 in the absence of mask 2. The embodiments shown in FIG. 3A or FIG. 4 can be used without a mask 2. Each beam from the array 1 interferes with the reference beam and forms an image on the photodetector 7. However, in this case the total area of the detecting surface of the photodetector 7 is exposed to the power from the reference beam 3. This exposure of the entire photosensitive area decreases the available dynamic range of photodetector 7 and, thus, the number of beams measurable with photodetector 7.

(25) Lens 5 in FIG. 3A or FIG. 4 is required to provide the proper geometrical divergence of the reference beam 3 for 0-fringe interference. More specifically, the divergences of the reference and signal beams should be set to provide less than one interference fringe for every interfering spot on the detecting surface of the photodetector 7 to make measurements possible. Otherwise, in the case of non-0-fringe interference, the signal from such a spot will have rather intensive continuous and small alternating components reducing the available photodetector dynamic range and the accuracy of measurements. In addition, when the reference and signal beams have a relatively strong difference in their powers, equations (1) or (5), below, show that the relative contribution of the alternating phase modulated component in the total signal is decreased. Therefore, preferably the beams from array 1 and the corresponding reference beams transmitted through the mask 2 should have the intensity and divergence relatively the same.

(26) The lenses 4 and 5 in FIG. 3A or FIG. 4 as well as the dimensions of mask 2 and array 1 are not necessarily identical. Different magnifications may be used in the reference and array arms of interferometer. The only requirement is that the images from the array 1 and mask 2 have close sizes and divergences so they overlap accurately on the detecting surface of the photodetector 7.

(27) Referring back to FIG. 3A, the phase detector 9 processes the composite signal from the photodetector 7 to generate respective signals representing the phase differences between the beams from the array 1 and the corresponding reference beams from mask 2. According to the multidithering technique discussed above, one of (a) the array 1 beams and (b) the corresponding reference beams from the mask 2, must be phase modulated at known frequencies .sub.i which are unique, and with a modulation factor .sub.i<.

(28) For example in one case, a sinusoidal phase modulation is applied to each beam i of the N beams in the array 1 while the N beams from the mask 2 are not modulated (see FIGS. 3E-3F). In a second case, a sinusoidal phase modulation is applied to each separate reference beam i from the mask 2 while the N beams in the array 1 are not modulated (see FIGS. 3C-3D). In both cases each modulated beam i is modulated at a specific unique known frequency .sub.i with a modulation factor .sub.i<.

(29) The composite signal V.sub.PD(t) from photodetector 7, having responsivity .sub.V, is given by:

(30) $\begin{array}{cc}{V}_{\mathrm{PD}}\left(t\right)=\frac{{}_V}{2}\underset{i=1}{\overset{N}{.Math.}}\left[P_i^s+P_i^r+2\sqrt{P_i^s{P}_i^r}\cos \left({}_i+{}_i\sin {}_{i}t\right)\right]& \left(5\right)\end{array}$

(31) where P.sub.i.sup.s and P.sub.i.sup.r are the powers of the i.sup.th array 1 beam and the i.sup.th reference 3 beam respectively, and .sub.i is the phase difference between i.sup.th array beam and reference beam, .sub.i is the frequency of the modulation of the i.sup.th array beam and .sub.i is the modulation factor of the i.sub.th array beam. By using a Bessel function expansion for the cosine-sine term in equation (5), as described above with respect to equation (2), the following expressions can be obtained:

(32) $\begin{array}{cc}{V}_{\mathrm{PD}}\left(t\right)=\frac{{}_V}{2}\underset{i=1}{\overset{N}{.Math.}}\{\begin{array}{c}{P}_i^s+P_i^r+2\sqrt{P_i^s{P}_i^r}\cos {}_i[J_0\left({}_i\right)+2J_2\left({}_i\right)\cos 2{}_{i}t+\mathrm{.Math.}]-\\ 2\sqrt{P_i^s{P}_i^r}\sin {}_i[2J_1\left({}_i\right)\sin {}_{i}t+2J_3\left({}_i\right)\sin 3{}_{i}t+\mathrm{.Math.}]\end{array}\}& \left(6\right)\end{array}$

(33) or

(34) $\begin{array}{cc}{V}_{\mathrm{PD}}\left(t\right)=\frac{{}_V}{2}\underset{i=1}{\overset{N}{.Math.}}\{\begin{array}{c}\begin{array}{c}\left[P_i^s+P_i^r+2\sqrt{P_i^s{P}_i^r}{J}_0\left({}_i\right)\cos {}_i\right]-\\ \left[4\sqrt{P_i^s{P}_i^r}{J}_1\sin {}_i\right]\sin {}_{i}t+\end{array}\\ \begin{array}{c}\left[4\sqrt{P_i^s{P}_i^r}{J}_2\left({}_i\right)\cos {}_i\right]\cos 2{}_{i}t-\\ \left[4\sqrt{P_i^s{P}_i^r}{J}_3\left({}_i\right)\sin {}_i\right]\sin 3{}_{i}t+\mathrm{.Math.}\end{array}\end{array}\}& \left(7\right)\end{array}$
where J.sub.n(.sub.i) are Bessel functions of the first kind of order n with the modulation factor .sub.i as argument. Finally, the amplitudes of the first A(.sub.i) and second A(2.sub.i) harmonics can be identified and extracted:
A(.sub.i)=4{square root over (P.sub.i.sup.sP.sub.i.sup.r)}J.sub.1(.sub.i)sin .sub.i
A(2.sub.i)=4{square root over (P.sub.i.sup.sP.sub.i.sup.r)}J.sub.2(.sub.i)cos .sub.i(8)
and the phase difference .sub.i calculated:

(35) $\begin{array}{cc}{}_i={\tan }^{-1}\left[\frac{A\left({}_i\right)}{A\left(2{}_i\right)}\frac{J_2\left({}_i\right)}{J_1\left({}_i\right)}\right]& \left(9\right)\end{array}$

(36) Thus, by measuring the composite signal of N array 1 beams interfering with corresponding N reference 3 beams and extracting the amplitudes of fundamental and second harmonics for the modulation on the beams, the phases of all the beams from array can be calculated relative to the reference beam.

(37) The total number of beams measurable with a single photodetector depends on the current state of photodetector technology, and parameters of the photodetector. Higher dynamic range means that more optical signals can impinge upon the photodetector without saturating it. Lowering the intensity of the optical images on the photodetector allows for more beams within the dynamic range, but eventually, the intensity is low enough that the photodetector noise becomes a significant factor. A photodetector with a low noise characteristic allows accurate detection and processing of lower intensity optical signals, and therefore more optical signals, to be detected without being overwhelmed by noise.

(38) Further parameters of the photodetector include bandwidth and size. Wider bandwidth allows for higher, and therefore more, modulation frequencies. The more area, the more interference patterns may be simultaneously, and separately, formed on the detecting surface. Currently the number of beams simultaneously measurable on a single photodetector is about 100 per existing broadband detector. As photodetector technology progresses, more beams will become measurable on a single photodetector.

(39) A simulation was performed using a simulated signal from a 64 laser array 1 with outputs at a sampling rate of 3 GHz. The modulation factors .sub.i were set to random values in the range of 0.2510%. The powers of the reference beams from the mask 2 were set to 1.0 and the powers of the array beams were set to random values in the range of 1.00.2. The laser outputs were set to random phases in a 2 interval and modulated at different frequencies. These frequencies were selected to be separable via a digital Fourier transform (DFT). It is well known that to provide an accurate Fourier analysis the minimum spacing between adjacent frequencies must be inversely proportional to the total time of measurement, i.e. the sample time. The simulation was made for 200 ns total time of measurement and modulating frequencies were set to be equally spaced between 5 MHz and 320 MHz. The simulated combined signal produced by photodetector 7 is shown in FIG. 6.

(40) FIG. 7A and FIG. 7B are diagrams illustrating the frequency spectra of a Fourier analyses of the first and second harmonics, respectively, of the composite input signal (FIG. 6) from the photodetector (FIG. 3A: 7). One skilled in the art understands that the lines between the diamonds merely facilitate eye motion and are not part of the DFT output data. The array of phase differences .sub.i are calculated using equations (5) through (9).

(41) FIG. 8 is a diagram illustrating the correspondence of the preset phases for the array of laser beams to calculated phases for the array of laser beams according to principles of the present invention. In FIG. 8, the triangles show the beam phases as preset in the simulation and the circles show the calculated beam phase values. It may be seen that a phase detector according to principles of the present invention provides an accurate reconstruction of phases from the composite signal. The calculated RMS error for all the channels is below 1%. This value of RMS error was calculated for 1 noise in every channel. The RMS error reaches the value of 1% only at 4% noise level in every channel which is high for current photodetectors.

(42) Thus, a phase detector according to principles of the present invention provides very accurate measurements of a large number of individual phases of beams from coherent laser/laser amplifier array with a single photodetector.