Electrochemical gas sensors
11486851 · 2022-11-01
Assignee
Inventors
Cpc classification
International classification
Abstract
A gas sensor comprises an electrochemical film, a plurality of electrodes coupled with the electrochemical film and a semiconductor wafer coupled with the plurality of electrodes. A passivation layer is formed between the electrochemical firm and the semiconductor wafer and a dielectric layer is coupled between the electrochemical film and the semiconductor wafer.
Claims
1. A gas sensor comprising: an electrochemical film; a first plurality of electrodes and a second plurality of electrodes coupled with the electrochemical film, wherein the first plurality of electrodes are located on a first surface of the electrochemical film, and wherein the second plurality of electrodes are located on a second surface of the electrochemical film, and wherein the first surface of the electrochemical film and the second surface of the electrochemical film are opposite surfaces; a semiconductor wafer coupled with the first plurality of electrodes and the second plurality of electrodes, wherein the semiconductor wafer is an application specific integrated circuit complementary metal oxide semiconductor (ASIC CMOS) wafer; and a dielectric layer coupled between the electrochemical film and the semiconductor wafer, and wherein the dielectric layer comprises an etched cavity portion such that the etched cavity portion extends underneath at least some of either the first plurality of electrodes or the second plurality of electrodes and separates the at least some of the first plurality of electrodes or the second plurality of electrodes from the ASIC CMOS wafer, and wherein the dielectric layer is monolithically integrated on to the ASIC CMOS wafer; wherein the gas sensor is configured such that a gas to be sensed passes through the electrochemical film in a transverse direction from the first surface to the second surface.
2. The gas sensor of claim 1, wherein the ASIC CMOS wafer comprises laterally spaced structures having holes between them.
3. The gas sensor of claim 1, further comprising a passivation layer between the electrochemical film and the semiconductor wafer.
4. The gas sensor of claim 1, wherein the gas sensor is configured to be an alcohol sensor.
5. The gas sensor of claim 1, wherein the electrochemical film is a solid electrolyte.
6. The gas sensor of claim 1, wherein the electrochemical film and the first plurality of electrodes and the second plurality of electrodes form an electrochemical fuel cell.
7. The gas sensor of claim 1, wherein the first plurality of electrodes and the second plurality of electrodes comprise a porous material such that a gas to be sensed and/or reactants are able to pass through the first plurality of electrodes and the second plurality of electrodes.
8. The gas sensor of claim 1, wherein the first plurality of electrodes and the second plurality of electrodes form a comb or meander structure.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) Some preferred embodiments of the disclosure will now be disclosed by way of example only and with reference to the accompanying drawings, in which:
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
(10)
(11)
(12)
(13)
(14)
DETAILED DESCRIPTION
(15)
(16) This is provided by the form factors shown in
(17)
(18) In this embodiment with a cavity 140, the analyte (ethanol) penetrates through the proton carrying film (Nafion) 115. The electrochemical film 115, used to support the electrochemical reaction of alcohol in the sensor is Nafion. Nafion has improved thermal and mechanical stability. As a film, Nafion™ perfluorosulfonic acid (PFSA) membranes are non-reinforced films based on chemically stabilized PFSA/polytetrafluoroethylene (PTFE) copolymer in the acid (H+) form. As it is close to Teflon (backbone), it is seen as compatible with semiconductor processing.
(19) Other alternatives to Nafion may be used. These include hydrocarbon backbones, composite membranes (including grafted membranes, organic and inorganic nanocomposites, and Nafion based composites) and blended membranes. For example, other solid electrolytes that could be used include yttria-stabilized zirconia, beta-alumina, fluoride ion conductors such as lanthanum trifluoride, iodides such as silver iodide, silver sulfide, lead(II) chloride, perovskite ceramics such as strontium titanate and strontium stannate, polyacrylamides and agar, among others.
(20) The sensor is monolithically integrated on top of an ASIC 105. This brings shortest lead/connection lines to the sensor and therefore gives lowest noise-levels and lowest parasitic capacitance and resistances, resulting in best sensor speed performance. Integration on top of ASIC also gives lowest cost, power, and form factor.
(21) The device has via connections or through passivation via-connections 130 formed through the inter-metal dielectric of the backend layers 110. These connect the electrodes 120, 125 to the ASIC wafer 105. A passivation layer 135 is formed over the sensor leaving the Nafion film 115 exposed to the outside environment, preferably where the electrodes are.
(22)
(23)
(24) The Nafion film is preferably spin-coated and patterned in a Nafion cavity, to provide a sufficiently smooth surface for the top metal electrode. The Nafion film can be dry etched with help of resist. The top metal electrode should also be patterned similarly as in CMOS standard manufacturing methods.
(25) Both electrodes 120, 125 generally withstand ambient atmosphere during lifetime and are preferably made of platinum. However, use of other metals such as gold, tungsten, alloys, or conductive polymers may be suitable as well. Alternatively thin, conductive, corrosion protective layers can also be used between the electrode and the Nafion film.
(26) Alternatively, also porous electrodes can be used through which the analyze gas and reactants are able to penetrate.
(27) In a final process integration step the sensor top electrodes are passivated and bond pads are opened as well as the sensing spot above the cavity, leaving the Nafion film (with its top-electrodes), a sensing area, exposed to the outside environment.
(28) A film-assisted molding process may be used to package the chip and leave only the sensor area exposed to the outside environment.
(29) The manufacturing steps above (of
(30) In step 1 (S1): Oxide is deposited. This is partly a sacrificial oxide layer supporting the build-up of the layered structure.
(31) In step 2 (S2): Contacts are formed to the electrical contacts below on the ASIC wafer.
(32) In step 3 (S3): Bottom electrodes (on the underneath side of the electrochemical film) are deposited
(33) In step 4 (S4): The bottom electrodes are patterned and cleaned
(34) In step 5 (S5): Oxide gapfill and planarize. Outside the Nafion film sensing area, the inter-metal dielectric spacing for the via-connections to the top electrodes is formed. This oxide insulates the via-connections. This step also prevents the bottom electrodes sinking into the Nafion film
(35) In step 6 (S6): Further oxide is deposited and contact formation. The cavity is formed by etching.
(36) In step 7 (S7): The electrochemical (e.g., Nafion) film is deposited. The Nafion film is preferably spin-coated and patterned in a Nafion cavity, to provide a sufficiently smooth surface for the top metal electrode. The Nafion film can be dry etched with help of resist.
(37) In step 8 (S8): The top electrodes are deposited. These electrodes are on an opposite surface of the electrochemical film to the bottom electrodes.
(38) In step 9 (S9): The top electrodes are patterned.
(39) In step 10 (S10): Cleaning steps including etching the cavity: This includes patterning of a hole, hole etching, and vapor HF release of the cavity underneath the bottom electrode. To enable the etch selectivity of the vapor HF step, several etch stop layers may be integrated in the manufacturing process. The etch stop layers define the cavity.
(40) In step 11 (S11): A passivation layer is formed on the structure with an opening to sensor. This leaves the Nafion film exposed to the outside environment.
(41) In step 12 (S12): Bondpad opening. The bondpads of the ASIC are reached through using separate bondpad etching.
(42)
(43)
(44)
(45) The electrodes 120, 125 are formed in a comb and/or meander structure, such that the air flows over the surface of the electrochemical film 115.
(46) A comb (meander) electrode structure 120, 125 is patterned on top of the planarized passivation layer 945 of a carrier wafer 105 (i.e. an ASIC wafer). As a final step the Nafion film 115 is spin-coated, cured, and patterned as a last step. In this way the alcohol sensor film is minimally affected, leaving its properties best preserved. In this embodiment without a cavity, the analyte enters on one side, it is converted, and the reaction products leave at the same side of the Nafion film 115. This embodiment does not require the gas to be measured going through the Nafion film 115 (e.g., electrolyte). This geometry makes the total semiconductor processing of the fuel cell easier. In this embodiment this is the smallest distance between the sensor and the ASIC. This improves speed, performance, and accuracy of the sensor. As there is no cavity in this embodiment, the integration of this sensor is easier. This allows a more cost-effective sensor.
(47)
(48)
(49)
(50)
(51) Although the description above refers to the use of Nafion as the electrochemical film, it will be understood that other types of suitable electrochemical (fuel cell) films can be used in the present disclosure, for example, hydrocarbon backbones, composite membranes (including grafted membranes, organic and inorganic nanocomposites, and Nafion based composites) and blended membranes. For example, other solid electrolytes that could be used include yttria-stabilized zirconia, beta-alumina, fluoride ion conductors such as lanthanum trifluoride, iodides such as silver iodide, silver sulfide, lead(II) chloride, perovskite ceramics such as strontium titanate and strontium stannate, polyacrylamides and agar, among others.
(52) The skilled person will understand that in the preceding description and appended claims, positional terms such as ‘top’, ‘bottom’, ‘above’, ‘overlap’, ‘under’, ‘lateral’, etc. are made with reference to conceptual illustrations of an apparatus, such as those showing standard cross-sectional perspectives and those shown in the appended drawings. These terms are used for ease of reference but are not intended to be of limiting nature. These terms are therefore to be understood as referring to a device when in an orientation as shown in the accompanying drawings.
(53) Although the disclosure has been described in terms of preferred embodiments as set forth above, it should be understood that these embodiments are illustrative only and that the claims are not limited to those embodiments. Those skilled in the art will be able to make modifications and alternatives in view of the disclosure which are contemplated as falling within the scope of the appended claims. Each feature disclosed or illustrated in the present specification may be incorporated in the disclosure, whether alone or in any appropriate combination with any other feature disclosed or illustrated herein.