SYSTEMS AND METHODS FOR POSITION SAMPLE CORRELATION
20180052438 ยท 2018-02-22
Assignee
Inventors
Cpc classification
G05B2219/1185
PHYSICS
International classification
Abstract
Systems and methods for position sample correlation, wherein a data sample is preferably processed by one or more independent programmable logic controllers (PLCs) and correlated to a servo position from a motion control processor with very high accuracy.
Claims
1. A method for optimizing performance of a machine comprising: acquiring a first data series at a first rate; acquiring a second data series at a second rate; synchronizing said first and second data series; calculating a third data series as a combination of said first and said second series comprising said first data series and an interpolation of said second data series; adjusting a machine component in response to said third data series.
2. A method according to claim 1, wherein said third data series adjusts an operation on a disposable product manufacturing line.
3. A method according to claim 2 wherein said operation is a bonding unit.
4. A method according to claim 3, wherein said operation is adjusting a gap spacing between an anvil of said bonding unit and a horn of said bonding unit.
5. A method according to claim 1, said first data series comprising a plurality of force measurements.
6. A method according to claim 1, said second data series comprising a plurality of position measurements of a first component of said machine.
7. A method according to claim 6, said position measurements comprising axial position measurements.
8. A machine for producing disposable product, the machine comprising: an operating unit for processing a web of material coupled, said operating unit communicatively coupled to a programmable logic controller system; a sensor for measuring a parameter while said operating unit is at a position of interest, said sensor communicating data from said sensor to said programmable logic controller system; said programmable logic controller system receiving position data from said operating unit; said programmable logic controller system adjusting operation of said operating unit in response to measured parameters from said sensor.
9. A method for optimizing performance of a machine comprising: acquiring a first data series at a first rate; acquiring a second data series at said first rate; synchronizing said first and second data series; calculating a third data series as a combination of said first and said second series comprising said first data series and said second data series; adjusting a machine component in response to said third data series.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0022]
[0023]
[0024]
[0025]
[0026]
[0027]
[0028]
[0029]
DESCRIPTION OF THE PREFERRED EMBODIMENT
[0030] Although the disclosure hereof is detailed and exact to enable those skilled in the art to practice the invention, the physical embodiments herein disclosed merely exemplify the invention which may be embodied in other specific structures. While the preferred embodiment has been described, the details may be changed without departing from the invention.
[0031] There are two blocks that are employed according to the present invention. J_PositionTimeSample block (
[0032] In a parent PLC (not shown) that has the axis data from the J_PositionTimeSample block (
[0033] Concurrently, in the sample PLC data is input into the plc via analog signal or other analog value. That value upon receiving is time stamped if it is not already. Then that data is presented to the correlation block. It is expected that many samples will be taken and stored in a first in first out buffer array.
[0034] When at least two positions and times are received from the parent PLC, preferably all the samples in between the received times are interpolated to have new positions that would correspond to the time in which the sample was taken. Then the block will output the samples with a position of the axis when the sample was received.
[0035] Preferably, the J_PositionTimeSample block (
[0036] Referring now to
[0037] Referring now to
[0038] It is possible that a plurality of data samples could be received and buffered while waiting for axis position and time data from PLC-A. That data can be output with position while buffering incoming data samples. Both operations happen synchronously. Additionally, in a preferred embodiment, both PLC-A and PLC-B are connected in such a way that their clocks are synchronized. In an alternative embodiment to that shown in
[0039] The correlation logic then stores or buffers the data sample and interpolates the axis position when that data sample was taken based on the axis position and time from PLC-A. The output is then Interpolated Axis position and the corresponding Data sample. With this output, an optimization step can be performed, such as a machine adjustment towards a target.
[0040] For instance, an axis position and time stamp retrieved from PLC-A could be considered a radial position of a first actor on a machine. A data sample from a remote or local I/O could be measured data, such as force, of a second actor on the machine that impacts performance. If the machine senses that it could adjust to optimize performance, such as increasing or decreasing bond strength, PLC-B can generate and adjust a machine parameter to alter measured data towards the machine achieving its targeted bond strength.
[0041] Referring now
[0042] Feedback data from the bonding system is acquired and optimization control decisions based on the data are performed. In a general sense, data such as a radial position of a first machine actor can be interpolated based on a measured data of a second machine actor, with the second machine actor action impacting optimized performance. Optimized performance (such as a targeted bond strength), or optimized value (such as a force measurement indicative of an optimized value) can be achieved by adjusting a machine parameter. For instance, if the data indicates the bond is within acceptable specifications or trending towards a fault, optimization control decisions can be generated and transmitted to adjust machine operation parameters to alter measured data towards a target.
[0043] The foregoing is considered as illustrative only of the principles of the invention. Furthermore, since numerous modifications and changes will readily occur to those skilled in the art, it is not desired to limit the invention to the exact construction and operation shown and described. While the preferred embodiment has been described, the details may be changed without departing from the invention, which is defined by the claims.