METHOD OF FABRICATING A CATALYST ON A SUBSTRATE
20240417872 ยท 2024-12-19
Assignee
Inventors
- Siva Krishna KARUTURI (Australian Capital Territory, AU)
- Chennupati JAGADISH (Forestville, New South Wales, AU)
- Hark Hoe Tan (Australian Capital Territory, AU)
- Bikesh GUPTA (Australian Capital Territory, AU)
- Joshua Zheyan SOO (Australian Capital Territory, AU)
Cpc classification
Y02E60/36
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
B01J37/348
PERFORMING OPERATIONS; TRANSPORTING
C25B11/053
CHEMISTRY; METALLURGY
C23C14/16
CHEMISTRY; METALLURGY
C23C28/34
CHEMISTRY; METALLURGY
International classification
C25B11/053
CHEMISTRY; METALLURGY
C23C14/16
CHEMISTRY; METALLURGY
C23C28/00
CHEMISTRY; METALLURGY
Abstract
A method of fabricating a catalyst on a substrate comprising: providing a substrate having a layer of metal thereon; and contacting the layer of metal with a corrosive solution to form the catalyst.
Claims
1-75. (canceled)
76. A method of fabricating a catalyst on a substrate comprising: providing the substrate; applying a seed layer to the substrate; forming a layer of metal on the seed layer, the layer of metal comprising one or more metals selected from Ni, Mo, Co, Fe, Cu, Mn and Zn; and contacting the layer of metal with a corrosive metal halide solution to form the catalyst.
77. The method of claim 76, wherein the seed layer has a minimum thickness of approximately 50 nm.
78. The method of claim 76, wherein the seed layer has a thickness of approximately 100 nm.
79. The method of claim 76, wherein the seed layer comprises Ti and/or Ni.
80. The method of claim 79, wherein the seed layer comprises at least one of a layer of Ti and a layer of Ni.
81. The method of claim 76, wherein applying the seed layer to the substrate comprises depositing the seed layer by electron beam evaporation.
82. The method of claim 76, wherein applying the seed layer to the substrate comprises depositing the seed layer by thermal evaporation.
83. The method of claim 76, wherein applying the seed layer to the substrate comprises depositing the seed layer by sputter deposition.
84. The method of claim 76, wherein forming the layer of metal on the seed layer comprises electroplating the metal on the seed layer.
85. The method of claim 76, wherein the layer of metal has a thickness of 0.5 m to 10 m.
86. The method of claim 76, wherein the layer of metal is applied on the seed layer by electroplating the seed layer with a Ni(II) chloride solution as the electrolyte, to thereby form a layer of Ni on the seed layer.
87. The method claim 76, wherein the layer of metal comprises two or more metals.
88. The method of claim 76, wherein forming the layer of metal on the seed layer comprises applying a metal plate or foil on the seed layer.
89. The method of claim 76, wherein the substrate is an electrode.
90. The method of claim 76, wherein the substrate is a photovoltaic cell.
91. The method of claim 90, wherein substrate is a GaAs photovoltaic cell.
92. The method of claim 76, wherein the catalyst comprises one or more metal hydroxides.
93. The method of claim 76, wherein the corrosive metal halide solution is a transition metal halide solution.
94. The method of claim 93, wherein the corrosive metal halide solution comprises one or more transition metal chlorides.
95. The method of claim 94, wherein the corrosive metal halide solution comprises a mixture of Ni(II) and Fe(III) chlorides.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0080] Embodiments will now be described by way of example only, with reference to the accompanying drawings in which:
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DETAILED DESCRIPTION
[0089] In the following detailed description, reference is made to the accompanying drawings which form a part of the detailed description. The illustrative embodiments described in the detailed description, depicted in the drawings and defined in the claims, are not intended to be limiting. Other embodiments may be utilised and other changes may be made without departing from the spirit or scope of the subject matter presented. It will be readily understood that the aspects of the present disclosure, as generally described herein and illustrated in the drawings can be arranged, substituted, combined, separated and designed in a wide variety of different configurations, all of which are contemplated in this disclosure.
[0090] The present disclosure provides a method of fabricating a catalyst on a variety of substrates and/or support materials. The method comprises the steps of (i) applying a layer of metal on the substrate to form a metalized substrate; and (ii) contacting the layer of metal to a corrosive solution to form a layer of the catalyst.
[0091] The method for fabricating a catalyst on a substrate will now be described by way of example and with reference to the figures.
[0092] According to the embodiment schematically shown in
[0093] In the described embodiment, the seed layer is deposited on one side of the substrate using electron beam evaporation. However, any other suitable deposition technique can be used. For example, in some embodiments the seed layer is applied by chemical bath deposition.
[0094] In the described embodiment, the composition of the seed layer includes Ti and Ni. In particular, the seed layer is composed by a 50 nm layer of Ti and a 50 nm layer of Ni. In the described embodiment, the layer of Ti is deposited on the substrate and the Ni layer is deposited on top of the Ti layer.
[0095] The seed layer improves or provides conductivity to the underlying substrate. Additionally, the Ti layer helps to improve the adhesion of the metal layer (in this case Ni layer) during the subsequent plating process.
[0096] However, the composition and the thickness of the seed layer can be selected as desired and tailored to the specific use of the catalyst in catalytic processes.
[0097] The substrate shown in
[0098] According to the described embodiment, after the deposition of the seed layer, a layer of metal is applied to the substrate by electroplating. It should be noted that the deposition of the seed layer is optional, and, in some embodiments, the layer of metal is applied directly on the substrate.
[0099] In the described embodiment, a layer of Ni is applied by electroplating. In particular, a Ni(II) chloride solution is used as the electrolyte to deposit the layer of Ni on the substrate.
[0100] The electrodeposition is performed at 20 mA/cm.sup.2 using a 0.36 M Ni(II) chloride solution.
[0101] Although not apparent from the schematic shown in
[0102] Referring to
[0103] In the described embodiment, the substrate is dipped for 1 minute into a 15 mM solution mixture of Ni(II) and Fe(III) chloride at 1:1 molar ratio. The chloride ions in the solution initiate the corrosion process of the electroplated Ni layer to form NiFe double hydroxides at the film surface. The substrate is then dried at 70 C. for 1 hour.
EXAMPLE
[0104] Substrates made of different materials, including semiconductors (Si and GaAs), metals (Cu mesh, Cu plate, stainless steel) and a polymer (PET), were coated using the method described in
[0105] The substrates were then electroplated at 20 mA/cm.sup.2 with Ni using 0.36 M Ni(II) chloride solution as the electrolyte.
[0106] After the Ni electroplating, the substrate was dipped for 1 minute into a 15 mM solution mixture of Ni(II) and Fe(III) chloride at 1:1 molar ratio. The chloride ions in the solution initiated the corrosion process of the electroplated Ni film thereby forming NiFe double hydroxides at the film surface.
[0107] The substrates were finally dried at 70 C. for 1 hour.
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[0109] Once the chloride-solution dipping process is completed, it was possible to observe a visible change in the Ni film appearance in all substrates, whereby a brown rust-like appearance was noticed in contrast to the metallic grey appearance commonly seen in untreated Ni films.
[0110] The top-view scanning electron microscope (SEM) images in
[0111] Voltammetric measurements of a Ni-electroplated Si substrate with and without the catalyst were performed to determine the catalytic improvement provided by the NiFe LDH. In particular, the OER performance of the Ni-electroplated Si substrate with and without the catalyst, respectively, were compared by connecting the substrate as a working electrode in a three-electrode cell with Pt plate and Ag/AgCl as counter and reference electrodes, respectively, at 1.0 M KOH solution (pH 13). The linear sweep voltammetry (LSV) curves of electroplated Ni on Si with and without NiFe LDH (
[0112] Additionally, according to the Nyquist plot obtained from the electrochemical impedance spectroscopy (EIS) of the Ni-electroplated Si substrate with and without the catalyst (
[0113] In terms of stability, the NiFe LDH catalyst was able to sustain OER activity at 10 mA cm.sup.2 for 24 hours without any major deviation in overpotential required (
[0114] The OER performance test was extended to all the assessed substrates of
[0115] To demonstrate the reusability of the layer of metal applied to the substrate for multiple catalyst regeneration processes, the NiFe LDH catalyst was removed from the catalyst supporting Si substrate by treating the substrate with an etchant (hydrochloric acid (HCl) 0.1 M) for 10 minutes. The cleaned metal surface was then dipped in the 15 mM solution mixture of Ni(II) and Fe(III) chloride using the same dipping conditions of the first dipping process. The etching-corrosion process is repeated for four times. The overpotential was measured after each cycle to monitor changes in the catalyst performance.
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[0117] The method according to the present disclosure can also be used to stabilize catalysts for III-V semiconductor-based photoelectrode devices. III-V semiconductors exhibit good efficiency in (photovoltaic) PV and water splitting cells, but they can be sensitive to photo-corrosion in harsh electrolyte environments.
[0118] As schematically shown in
[0119] As shown in
[0120] The experimental results discussed above and illustrated in the accompanying Figures demonstrate that the method according to the present disclosure can be used to construct and stabilise semiconductor electrodes for solar water splitting, achieving record levels of photoanode efficiency.
[0121] It is to be understood that, if any prior art publication is referred to herein, such reference does not constitute an admission that the publication forms a part of the common general knowledge in the art, in Australia or any other country.
[0122] In the claims which follow and in the preceding description of the invention, except where the context requires otherwise due to express language or necessary implication, the word comprise or variations such as comprises or comprising is used in an inclusive sense, i.e. to specify the presence of the stated features but not to preclude the presence or addition of further features in various embodiments of the invention.