AMPLIFIERS WITH ATTENUATOR IN FEEDBACK AND BYPASS PATHS
20230090460 · 2023-03-23
Inventors
Cpc classification
H03F2200/159
ELECTRICITY
H03G1/0088
ELECTRICITY
H03F2203/7239
ELECTRICITY
H03F2200/51
ELECTRICITY
International classification
H03F1/02
ELECTRICITY
Abstract
Methods and devices to support multiple gain states in amplifiers are described. The methods and devices are based on implementing a feedback element in the amplifier and adjusting the impedance of the feedback element to provide a desired gain while maintaining the overall performance of the amplifier and reducing degradation of the S12 parameter. The feedback element includes an adjustable attenuator and a tunable resistive element. The adjustable attenuator is provided in a path that is common to the feedback path and the bypass path of the amplifier. Exemplary implementations of adjustable attenuators are also presented.
Claims
1. An amplifier comprising: one or more transistors; and a feedback element selectively coupling a drain terminal of a last transistor of the one or more transistors to a gate terminal of a first transistor of the one or more transistors, the feedback element comprising a series connection of a first attenuator, and a resistive element, the first attenuator or the resistive element having an adjustable value; wherein: in a first controllable state, a first path is formed through, the first attenuator and the resistive element of the feedback element, and in a second controllable state, a second path different from the first path is formed through the first attenuator of the feedback element, the second path bypassing the resistive element.
2. The amplifier of claim 1, configured to: operate in one of a first i) high gain mode, ii) low gain mode, and iii) bypass mode, and receive a first input signal at a first input terminal, the first input terminal being coupled to the gate terminal of the first transistor, wherein, in the first high gain mode, the first input signal is routed through the one or more transistors to generate a first amplified output signal at an output terminal of the amplifier, the output terminal being coupled to the drain terminal of the last transistor.
3. The amplifier of claim 2, wherein in the first low gain mode: the first input signal is routed through the one or more transistors to generate a second amplified output signal at the output terminal, and the second amplified output signal is partially fed back to the gate terminal of the first transistor through the feedback path.
4. The amplifier of claim 2, wherein in the first bypass mode: the one or more transistors are bypassed, and the first input signal is routed from the first input terminal to the output terminal through the bypass path.
5. The amplifier of claim 3, wherein in the first low gain mode, a combination of the first attenuator and the resistor of the feedback element is configured to provide one or more gain states.
6. The amplifier of claim 4, wherein in the first bypass mode, the first attenuator is configured to provide one or more gain states.
7. The amplifier of claim 1, wherein the first attenuator comprises three impedance elements arranged in a Pi-network or T-network configuration, each impedance element being controllably switchable to provide one or more gain states of the amplifier in a low gain mode of the amplifier and in a bypass mode of the LNA.
8. The amplifier of claim 1, wherein the feedback element further comprises a first switch connected in series with the resistive element, the amplifier further comprising a second switch configured to couple the first attenuator to an input terminal of the amplifier and to the gate terminal of the first transistor.
9. The amplifier of claim 1, further comprising a second adjustable attenuator between the drain terminal of the last transistor and an output terminal of the amplifier.
10. The amplifier of claim 9, wherein the second adjustable attenuator is in series with an output capacitor.
11. The amplifier of claim 2, further comprising a second input terminal; one or more additional transistors arranged in a cascode configuration, wherein a gate terminal of a first additional transistor of the one or more additional transistors is connected to the second input terminal, a drain terminal of a last additional transistor of the one or more additional transistors is connected to the drain terminal of the second transistor, and the feedback element is configured to be selectively coupled to the gate terminal of the first additional transistor.
12. The amplifier of claim 11 configured to: operate in one of a second i) high gain mode, ii) low gain mode, and iii) bypass mode; and receive a second input signal at the second input terminal, wherein in the second high gain mode, the second input signal is routed through the one or more additional transistors to generate a third amplified output signal at the output terminal of the amplifier.
13. The amplifier of claim 12, wherein in the second low gain mode: the second input signal is routed through the one or more additional transistors to generate a fourth amplified output signal at the output terminal, and the fourth amplified output signal is partially fed back to the gate terminal of the first additional transistor through the feedback path.
14. The amplifier of claim 12, wherein in the second bypass mode: the one or more additional transistors are bypassed, and the second input signal is routed from the second input terminal to the output terminal through the bypass path.
15. The amplifier of claim 13, wherein in the second low gain mode, a combination of the first attenuator, and the resistive element of the feedback element is configured to provide one or more second gain states.
16. A radio frequency (RF) receiver front-end comprising the amplifier of claim 1.
17. An integrated circuit comprising the amplifier of claim 1.
18. A power amplifier comprising the amplifier of claim 1.
19. A low noise amplifier (LNA) comprising the amplifier of claim 1.
20. The amplifier of claim 1, wherein the one or more transistors are two or more transistors arranged in a cascode configuration.
21. The amplifier of claim 11, wherein the one or more additional transistors are two or more additional transistors arranged in a cascode configuration.
22. The amplifier of claim 1, wherein attenuation of the amplifier is shared between the first attenuator and the resistive element, wherein higher attenuation through the first attenuator implies lower attenuation through the resistive element and vice versa.
23. The amplifier of claim 1, wherein the feedback element further comprises a feedback capacitor disposed in series with the attenuator and the resistive element.
24.-25. (canceled)
Description
DESCRIPTION OF THE DRAWINGS
[0010]
[0011]
[0012]
[0013]
[0014]
[0015]
[0016] Like reference numbers and designations in the various drawings indicate like elements.
DETAILED DESCRIPTION
[0017]
[0018] LNA (100A) of
[0019] Continuing with the description of
[0020] As can be noticed, LNA (100A) of
[0021] With continued reference to
[0022]
[0023]
[0024] Turning back to
[0025] Continuing with the simulations described above and with continued reference to
[0026] The teachings of the present disclosure where an adjustable attenuator is shown in series with a feedback resistor in an amplifier such as a power amplifier or an LNA in a common feedback path, provide an improvement over cases where such adjustable attenuator is not present. In particular, according to the present disclosure, the provided attenuation can be shared between the variable resistor (Rf) and the attenuator (A1), thus providing a beneficial trade-off between more attenuation and less feedback, and vice versa. By way of example, the amount of attenuation can be expressed in terms of an attenuation factor going from 0 to 1, where a desired factor (e.g. 0.25) is assigned to the feedback resistor (Rf) and the remaining amount (e.g. 0.75) is assigned to the variable attenuator (A1). In view of such terminology, a case where no attenuator is present would be indicated as an attenuation factor of 1.0 applied to the feedback resistor (Rf).
[0027]
[0028] As seen in such figures, the higher the amount of attenuation, the better (i.e. lower) the value of input and output return loss. Such diagrams also show that independently of trying to obtain lower values of input or output return loss, the presence of the variable attenuator (A1) allows the circuit designer to balance such values with other consideration that may be typical of the specific implementation chosen. As a consequence, the presence of such attenuator provides additional degrees of freedom that enable a more stable return loss across a wide attenuation and feedback range. In particular, once a certain given gain level is desired, the circuit designer can partition the attenuation contribution in a way that also minimizes RL1 and RL2, with a more stable result and without an unneeded sacrifice in the amount of feedback desired.
[0029] Turning back now to
[0030]
[0031] With reference to
[0032] While the embodiment of
[0033] Additionally, while the embodiment of
[0034] Furthermore, as also previously noted throughout the present text, the teachings of the present disclosure can be also applied to other circuits, not necessarily LNAs (e.g. amplifiers, such as power amplifiers), having an attenuator located in a common path shared in two different states (e.g. bypass and feedback states) of such circuits.
[0035] It should be also noted that while elements with a resistive component of the circuits shown in
[0036] The term “MOSFET”, as used in this disclosure, includes any field effect transistor (FET) having an insulated gate whose voltage determines the conductivity of the transistor, and encompasses insulated gates having a metal or metal-like, insulator, and/or semiconductor structure. The terms “metal” or “metal-like” include at least one electrically conductive material (such as aluminum, copper, or other metal, or highly doped polysilicon, graphene, or other electrical conductor), “insulator” includes at least one insulating material (such as silicon oxide or other dielectric material), and “semiconductor” includes at least one semiconductor material.
[0037] As used in this disclosure, the term “radio frequency” (RF) refers to a rate of oscillation in the range of about 3 kHz to about 300 GHz. This term also includes the frequencies used in wireless communication systems. An RF frequency may be the frequency of an electromagnetic wave or of an alternating voltage or current in a circuit.
[0038] With respect to the figures referenced in this disclosure, the dimensions for the various elements are not to scale; some dimensions have been greatly exaggerated vertically and/or horizontally for clarity or emphasis. In addition, references to orientations and directions (e.g., “top”, “bottom”, “above”, “below”, “lateral”, “vertical”, “horizontal”, etc.) are relative to the example drawings, and not necessarily absolute orientations or directions.
[0039] Various embodiments of the invention can be implemented to meet a wide variety of specifications. Unless otherwise noted above, selection of suitable component values is a matter of design choice. Various embodiments of the invention may be implemented in any suitable integrated circuit (IC) technology (including but not limited to MOSFET structures), or in hybrid or discrete circuit forms. Integrated circuit embodiments may be fabricated using any suitable substrates and processes, including but not limited to standard bulk silicon, high-resistivity bulk CMOS, silicon-on-insulator (SOI), and silicon-on-sapphire (SOS). Unless otherwise noted above, embodiments of the invention may be implemented in other transistor technologies such as bipolar, BiCMOS, LDMOS, BCD, GaAs HBT, GaN HEMT, GaAs pHEMT, and MESFET technologies. However, embodiments of the invention are particularly useful when fabricated using an SOI or SOS based process, or when fabricated with processes having similar characteristics. Fabrication in CMOS using SOI or SOS processes enables circuits with low power consumption, the ability to withstand high power signals during operation due to FET stacking, good linearity, and high frequency operation (i.e., radio frequencies up to and exceeding 300 GHz). Monolithic IC implementation is particularly useful since parasitic capacitances generally can be kept low (or at a minimum, kept uniform across all units, permitting them to be compensated) by careful design. Voltage levels may be adjusted, and/or voltage and/or logic signal polarities reversed, depending on a particular specification and/or implementing technology (e.g., NMOS, PMOS, or CMOS, and enhancement mode or depletion mode transistor devices). Component voltage, current, and power handling capabilities may be adapted as needed, for example, by adjusting device sizes, serially “stacking” components (particularly FETs) to withstand greater voltages, and/or using multiple components in parallel to handle greater currents. Additional circuit components may be added to enhance the capabilities of the disclosed circuits and/or to provide additional functionality without significantly altering the functionality of the disclosed circuits.
[0040] Circuits and devices in accordance with the present invention may be used alone or in combination with other components, circuits, and devices. Embodiments of the present invention may be fabricated as integrated circuits (ICs), which may be encased in IC packages and/or in modules for ease of handling, manufacture, and/or improved performance. In particular, IC embodiments of this invention are often used in modules in which one or more of such ICs are combined with other circuit blocks (e.g., filters, amplifiers, passive components, and possibly additional ICs) into one package. The ICs and/or modules are then typically combined with other components, often on a printed circuit board, to form part of an end product such as a cellular telephone, laptop computer, or electronic tablet, or to form a higher-level module which may be used in a wide variety of products, such as vehicles, test equipment, medical devices, etc. Through various configurations of modules and assemblies, such ICs typically enable a mode of communication, often wireless communication.
[0041] A number of embodiments of the invention have been described. It is to be understood that various modifications may be made without departing from the spirit and scope of the invention. For example, some of the steps described above may be order independent, and thus can be performed in an order different from that described. Further, some of the steps described above may be optional. Various activities described with respect to the methods identified above can be executed in repetitive, serial, and/or parallel fashion.
[0042] It is to be understood that the foregoing description is intended to illustrate and not to limit the scope of the invention, which is defined by the scope of the following claims, and that other embodiments are within the scope of the claims. In particular, the scope of the invention includes any and all feasible combinations of one or more of the processes, machines, manufactures, or compositions of matter set forth in the claims below. (Note that the parenthetical labels for claim elements are for ease of referring to such elements, and do not in themselves indicate a particular required ordering or enumeration of elements; further, such labels may be reused in dependent claims as references to additional elements without being regarded as starting a conflicting labeling sequence).