ABSOLUTE MEASUREMENT METHOD FOR THE PHASE OF THE COMPLEX COHERENCE COEFFICIENT
20240401927 ยท 2024-12-05
Inventors
Cpc classification
G01B9/02043
PHYSICS
G01B9/02067
PHYSICS
G01B9/02057
PHYSICS
G01B9/02091
PHYSICS
International classification
G01B9/02091
PHYSICS
Abstract
A method for absolute phase measurement for complex coherence coefficient of an object comprises: firstly, processing fringe data measured by interferometry on any aperture pairs of an equivalent pupil plane of an optical imaging system to obtain an interference term and envelope and extreme values thereof; secondly, selecting extreme value A of light intensity from an interval of relatively stable extreme values change on one side of a curve envelope with zero optical path difference, and selecting two extreme values B and C of light intensity closest to extreme value A on other side of the curve envelope with zero optical path difference, where B>AC or C>AB; thirdly, counting number of fringe periods between A and C or A and B; and fourthly, according to the number of fringe periods, selecting a formula to calculate absolute phase of complex coherence coefficient of the object.
Claims
1. A method for an absolute measurement of a phase of a complex coherence coefficient, comprising providing an optical system comprising an equivalent pupil plane with a plurality of baselines, wherein each of the baselines comprises a pair of apertures at two end points P.sub.1 and P.sub.2 on the equivalent pupil plane, providing a light source that emits optical signals through optical paths to the equivalent pupil plane of the optical system, obtaining interference fringes through interference coupling for the optical signals received through the pair of apertures of the two end points P.sub.1 and P.sub.2 of the baseline on the equivalent pupil plane of the optical system, controlling an optical fiber retarder to sweep through a position of a zero optical path difference of two optical paths through a computer, performing DC removal and denoising on an interference curve of the interference fringes to obtain an interference term and envelope and extreme values thereof, and obtaining the absolute phase of the complex coherence coefficient based on selection and comparison of the extreme values on the interference curve, wherein the absolute phase is the absolute phase of the complex coherence coefficient of any of the baselines on the equivalent pupil plane of the optical system.
2. The method of claim 1, wherein the selection and comparison of the extreme values on the interference curve are based on maximum values, and the method further comprises selecting a relative maximum value A of a light intensity from an interval of relatively stable relative maximum values change in a main lobe on one side of the zero optical path of the interference curve, selecting two extreme values B and C of light intensity that are closest to the relative maximum value A from an interval of relatively stable extreme value change in the main lobe on the other side of the zero optical path, where B>AC, and counting a number of fringe periods between A and C, and when the number of fringe periods is an even number, calculating and obtaining the absolute phase
3. The method of claim 1, wherein the selection and comparison of the extreme values on the interference curve are based on minimum values, and the method further comprises selecting a relative minimum value A of light intensity from an interval of relatively stable relative minimum values change in the main lobe on one side of the zero optical path of the interference curve, selecting two extreme values B and C of light intensity that are closest to the relative minimum value A from an interval of relatively stable extreme value change in the main lobe on the other side of the zero optical path, where C>AB, and counting the number of fringe periods between A and C, and when the number of fringe periods is an odd number, calculating and obtaining the absolute phase
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0034]
[0035]
[0036]
[0037]
[0038]
[0039]
[0040]
DETAILED DESCRIPTION OF THE INVENTION AND EMBODIMENTS
[0041] The following example shows a phase of a target to be measured in a sub-aperture interference test in the present invention.
[0042] An optical path layout diagram of simulated measurement is shown in
[0043] Assuming that the optical path is not affected by dispersion, an intensity curve of the interference term DC-removed and normalized in a simulation test is shown in
[0044] Assuming that the optical path is affected by dispersion, a spectral response function is added in the simulation test. The resulting intensity curve of the interference term, DC-removed and normalized, is depicted in
[0045] The foregoing is merely a preferred embodiment of the present disclosure and is not intended to limit the patent scope of the present disclosure. Any equivalent method or process transformation derived from the description of the present disclosure and the contents of the accompanying drawings, or directly or indirectly used in other related technical fields are similarly encompassed within the scope of patent protection of the present disclosure.
[0046] The method is simple in principle and is not affected by an external environment of an instrument and is widely applied.