METHOD OF MAKING LARGE SURFACE AREA FILAMENTS FOR THE PRODUCTION OF POLYSILICON IN A CVD REACTOR
20170253960 ยท 2017-09-07
Inventors
- Yuepeng Wan (Nashua, NH)
- Santhana Raghavan Parthasarathy (Nashua, NH, US)
- Carl Chartier (Manchester, NH, US)
- Adriano Servini (Chesterfield, MO, US)
- Chandra P. Khattak (Nashua, NH, US)
Cpc classification
Y10T117/1024
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10T117/104
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10T117/1032
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
C01B33/035
CHEMISTRY; METALLURGY
Y10T117/10
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10T117/102
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
C23C16/458
CHEMISTRY; METALLURGY
International classification
C23C16/458
CHEMISTRY; METALLURGY
C01B33/035
CHEMISTRY; METALLURGY
Abstract
The bulk polysilicon deposition rate of a Siemens method CVD reactor system having a power supply configured for deposition on a solid rod silicon filament of a specified diameter and length is increased by installing a high surface area silicon filament in the CVD reactor in lieu of the specified solid rod filament, the high surface area filament being dimensionally configured such that it can be used in place of the solid rod filament without reconfiguring or replacing the reactor power supply. The high surface area filament can be tubular, flat, or shaped with radial fins. Existing reactors thereby require only adaptation or replacement of filament supports to be adapted for use of the high surface area filament. The high surface area filament can be grown from silicon melt using the EFG method, so as to maintain a cross-sectional shape within a tolerance of +/10%.
Claims
1. A CVD reactor for bulk production of polysilicon comprising: a base plate system configured with filament supports; an enclosure attachable to said base plate system so as to form a deposition chamber; a power supply adjusted and configured for use with a solid rod silicon filament having a specified solid rod diameter, a specified solid rod length, and a specified solid rod surface area; at least one high surface area silicon filament disposed within said chamber on said filament supports, said high surface area silicon filament having a length substantially equal to the solid rod length and a surface area greater than the solid rod surface area, while also being usable in the CVD reactor without reconfiguring or replacing the power supply of the CVD reactor; electrical feedthroughs in said base plate system, said electrical feedthroughs being adapted for connection of the power supply to both ends of said high surface area silicon filament; a gas inlet in said base plate system connectable to a source of silicon-containing gas; and a gas outlet in said base plate system whereby gas may be released from said chamber.
2. The CVD reactor of claim 1, wherein the cross sectional shape of the high surface area silicon filament includes outwardly projecting fins.
3. The CVD reactor of claim 1, wherein the high surface area silicon filament is tubular.
4. The CVD reactor of claim 1, wherein the high surface area silicon filament comprises two vertical filament segments electrically connected by a bridge segment.
5. The CVD reactor of claim 4, wherein the bridge segment is tubular.
6. The CVD reactor of claim 1, wherein the high surface area silicon filament includes an annular tube section having an outer diameter of at least 20 mm and a ratio of tube wall thickness to outer diameter of not greater than 1:4.
7. The method of claim 1, wherein a wall thickness of the high surface area silicon filament is constant along the length of the high surface area silicon filament to within a tolerance of 10%.
8. A CVD reaction system for bulk production of polysilicon comprising: a CVD reactor having: a base plate system configured with filament supports; an enclosure attachable to said base plate system so as to form a deposition chamber; a power supply adjusted and configured for use with the solid rod silicon filament; electrical feedthroughs in said base plate system, said electrical feedthroughs being adapted for connection of the power supply to said solid rod silicon filament; a gas inlet in said base plate system connectable to a source of silicon-containing gas; and a gas outlet in said base plate system whereby gas may be released from said chamber; a solid rod silicon filament having a solid rod surface area; and a high surface area silicon filament having a surface area greater than the solid rod surface area, said solid rod silicon filament and said high surface area filament being usable interchangeably in the CVD reactor without reconfiguration or replacement of the power supply of the CVD reactor.
9. The CVD reaction system of claim 8, wherein the cross sectional shape of the high surface area silicon filament includes outwardly projecting fins.
10. The CVD reaction system of claim 8, wherein the high surface area silicon filament is tubular.
11. The CVD reaction system of claim 8, wherein the high surface area silicon filament comprises two vertical filament segments electrically connected by a bridge segment.
12. The CVD reaction system of claim 11, wherein the bridge segment is tubular.
13. The CVD reaction system of claim 8, wherein the high surface area silicon filament includes an annular tube section having an outer diameter of at least 20 mm and a ratio of tube wall thickness to outer diameter of not greater than .
14. The CVD reaction system of claim 8, wherein a wall thickness of the high surface area silicon filament is constant along the length of the high surface area silicon filament to within a tolerance of 10%.
15. A method of modifying a CVD reactor system so as to increase its rate of bulk polysilicon production, the CVD reactor system including a reactor having: a base plate system configured with filament supports; an enclosure attachable to said base plate system so as to form a deposition chamber; a power supply adjusted and configured for use with a solid rod silicon filament having a specified solid rod diameter, a specified solid rod length, and a specified solid rod surface area; electrical feedthroughs in said base plate system, said electrical feedthroughs being adapted for connection of the power supply to both ends of said solid rod silicon filament; a gas inlet in said base plate system connectable to a source of silicon-containing gas; and a gas outlet in said base plate system whereby gas may be released from said chamber, the method comprising: providing a high surface area silicon filament having a length substantially equal to the solid rod length and a surface area greater than the solid rod surface area, said high surface area filament having dimensions that cause the high surface area filament to be usable in the CVD reactor without reconfiguring or replacing the power supply of the CVD reactor; installing the high surface area filament in the CVD reactor; introducing a silicon-containing gas into the deposition chamber through the gas inlet; and causing the power supply of the CVD reactor to apply electrical energy to the high surface area filament without adjusting, reconfiguring, or replacing the power supply, thereby initiating heating of the high surface area filament and causing silicon to be deposited from the silicon-containing gas onto the high surface area filament.
16. The method of claim 15, wherein: the method further comprises, before installing the high surface area filament in the CVD reactor: installing a solid rod silicon filament in the CVD reactor, said solid rod silicon filament having a length substantially equal to said specified solid rod length, a diameter substantially equal to the specified solid rod diameter, and a surface area substantially equal to the solid rod surface area; attaching said enclosure to said base plate system so as to form said deposition chamber; introducing a silicon-containing gas into the deposition chamber through the gas inlet; and causing the power supply of the CVD reactor to apply electrical energy to the solid rod silicon filament without adjusting, reconfiguring, or replacing the power supply, thereby initiating heating of the solid rod silicon filament and causing silicon to be deposited from the silicon-containing gas onto the solid rod silicon filament; and wherein installing the high surface area filament in the CVD reactor includes removing the solid rod silicon filament from the CVD reactor and installing the high surface area filament in its place without reconfiguring or replacing the power supply of the CVD reactor.
17. The method of claim 15, wherein the cross sectional shape of the high surface area silicon filament includes outwardly projecting fins.
18. The method of claim 15, wherein the high surface area silicon filament is tubular.
19. The method of claim 15, wherein the high surface area silicon filament comprises two vertical filament segments electrically connected by a bridge segment.
20. The method of claim 19, wherein the bridge segment is tubular.
21. The method of claim 15, wherein the high surface area silicon filament includes an annular tube section having an outer diameter of at least 20 mm and a ratio of tube wall thickness to outer diameter of not greater than 1:4.
22. The method of claim 15, wherein a wall thickness of the high surface area silicon filament is constant along the length of the high surface area silicon filament to within a tolerance of 10%.
Description
BRIEF DESCRIPTION OF THE FIGURES
[0022]
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DETAILED DESCRIPTION OF THE INVENTION
[0029] The invention is susceptible of many variations in form and practice. Accordingly, the figures and following description of embodiments of the invention are to be regarded as illustrative in nature, and not as restrictive.
[0030] According to one embodiment of the invention, shaped silicon filaments are used to replace the conventional slim rods in a CVD reactor for making polysilicon. Referring to
[0031] By selecting an appropriate wall thickness and cross section area of the silicon filament sections, the electrical resistance characteristics can by design approximate those of a slim rod filament. This allows the power supply that was designed and used for heating the silicon slim rods of the reactor of
[0032] Using tubular silicon filaments as an example, assuming the same total length of the filaments in one current loop of a power supply as in a conventional Siemens reactor, the power needed to heat up the filament, thus the maximum voltage required at the launching stage, will be determined by the cross-section area and the circumferential or surface area of the new filaments based on the energy balance. Those skilled in the art will appreciate the mathematics required to design an alternative large surface area filament profile such as a tubular filament to have similar electrical properties as a solid rod filament. In the case of tubular filaments, in order to utilize the same power supply as used for launching and heating the slim rod filaments, the thickness and the outer diameter (OD) of the tubular silicon filaments must satisfy the relationship:
4(d.sub.o)d.sub.od.sub.slim(1)
where,
[0033] d.sub.o is the OD (outer diameter) of the tubular filament,
[0034] is the thickness of the tube, and
[0035] d.sub.slim is the diameter of the conventional slim rods.
[0036] Therefore, depending on the diameter of the starting tubular silicon filament, the wall thickness , reference W of the silicon tube 31 of
[0037] While a 50 mm diameter tubular filament of about 2 mm wall thickness is described, larger and smaller diameters and larger and smaller wall thicknesses are within the scope of the invention. For example, a useful range of wall thicknesses for filaments according to the invention is from about 1 mm to 6 mm, or more usefully, from about 1.75 to 3.5 mm, as indicated by
[0038] For using large surface area, shaped silicon filaments with electrical properties similar to a conventional slim rod filament, in a reactor otherwise suitable for using conventional slim rods, only the electrode studs, generally consisting of graphite, need to be modified or replaced, to provide a configuration suitable for holding the new filaments with the required electrical contact. In one embodiment, the silicon filament sections, such as illustrated sections 31, 32, 33, are connected mechanically at their intersecting points to form an inverted U-shaped hair pin, with the horizontal bridge section 32 sitting in a groove or a key slot at the top of the each vertical section 31, 33. Another way to connect the shaped silicon bodies to form a inverse U-shaped is to use components made of silicon or pure graphite to interconnect the different sections. Other means of making a suitable mechanical and electrical connection between vertical and bridging sections of a filament of the invention are within the scope of the invention. This inverted U-shaped filament structure is mounted to the electrode studs and connected so as to provide a current path between a pair of electrical feedthroughs 19. During the CVD process, existing power supplies are used in the conventional manner to heat the filaments; polysilicon deposit 41 accumulates uniformly on the exposed surface of the silicon filament; the deposit layer being shown here partially removed to expose the silicon filament structure.
[0039] The silicon filament shapes can be uniform or non uniform in cross section and shape over its length, and may include but not be limited to silicon tubes, silicon ribbons, or elongate silicon bodies with other cross-sections, such as illustrated in the profiles or different cross sections in
[0040] Referring again to
[0041] Referring again to
[0042] It is useful to compare the results using a conventional CVD reactor with 18 U-shaped slim rods and an average deposition rate of 13.6 microns per minute with trichlorosilane and hydrogen mixture, to the production levels afforded by the invention. The graph of
[0043] Data of the type illustrated in
[0044] In a conventional CVD reactor higher growth rates can result in gas entrapment in the deposited silicon which leads to problems in the subsequent step of crystal growth by the Czochralski process for microelectronic applications. If the initial surface area of the filament is larger as taught herein, higher deposition rates can be initiated and increased without gas entrapment. For photovoltaic applications after polysilicon production, the subsequent step is usually multi-crystalline ingot growth by a heat exchanger method (HEM) or directional solidification system (DSS) for which minor gas entrapment in silicon is not a problem, enabling yet faster deposition rates. Faster polysilicon deposition rates and greater overall production yields will result in significantly lower costs of production which is very important for the photovoltaic industry.
[0045] For the microelectronic applications the purity of polysilicon produced has to be very high, less than 1 part per billion total metallic impurities. In contrast, a silicon wafer for solar cells has a more relaxed requirement of less than 1 part per million total metallic impurities, three orders of magnitude more impurities. In fact, most of the silicon for solar cell applications is intentionally doped with boron (B) to about 0.5 parts per million atomic prior to fabricating solar cells. Therefore, polysilicon production for photovoltaic applications is able to utilize filaments of the invention similarly doped with boron or other suitable dopants; and the resultant low resistivity aids the direct resistive heating of the filaments during initial stages of the polysilicon deposition. This eliminates the requirement of a complex array of subsystems and two power sources; one power supply that can provide very high voltage and low current, and a second power supply that can sustain a very high current at relatively lower voltage plus the associated switching circuit. The two power supplies and related switching circuitry can be replaced with a simple system of current supply and temperature controls. This change in design will result in lower capital equipment costs for new reactors of similar design, and for retrofit of existing reactors when required. This change and type of operation avoids cumbersome and time consuming start up procedures, lowers down time and increases productivity, for applications where the resulting purity level is acceptable.
[0046] The present invention is not restricted to CVD reactors using polysilicon deposition involving reaction of trichlorosilane but can be used for reactions involving silane, dicholosilane, or other derivatives or combinations of gases; by replacing solid slim rods with large surface area geometries and similar electrical resistivity properties in accordance with the invention.
[0047] While tubular filaments are preferred over other variations of large surface area filaments, the invention is not limited to tubular filament shapes. Referring to
[0048] In another aspect of the invention, producing the
[0049] One example of the invention is a CVD reactor for bulk production of polysilicon consisting of a base plate system that might for example be one plate or a pair of opposing plates, configured with filament supports, and an enclosure attachable to the base plate system so as to form a deposition chamber. There is at least one silicon filament disposed within the chamber on the filament supports, and an electrical current source connectable to both ends of the filament via electrical feedthroughs in the base plate system, for heating the filament. There is at least one gas inlet in the base plate system connectable to a source of silicon-containing gas, and a gas outlet in the base plate system whereby gas may be released from the chamber.
[0050] The filament has a tubular cross section with an outer diameter of at least 20 mm and a ratio of wall thickness to diameter of not greater than . The starting diameter may be other or greater than 20 mm, for example it may be in the range of 20-100 mm, and the wall thickness may range according. Alternatively, a tubular filament may have a starting outer diameter in the range of 40-80 mm, and a wall thickness in the range of 1.75-6 mm. One tubular embodiment may have a starting diameter of about 50 mm and a starting wall thickness of about 2 mm. The filament may be doped with at least one element from one of groups 3 and 5 of the Periodic Table, whereby its impedance at room temperature is reduced to less than in the order of 10.sup.3 ohm.Math.cm.
[0051] Another example of the invention is a method for making and using large surface area filaments in a CVD reactor for the production of polysilicon, consisting of heating silicon in a silicon melt pool to a molten state, and growing with the silicon in a molten state by an EFG method with a die, a silicon structure consisting of a cross section with an outer circumference of greater than 60 mm and an impedance to the flow of electrical current ranging from in the order of 10.sup.6 ohm.Math.cm at room temperature to 0.01 ohm.Math.cm at 1200 deg C.; then disposing at least one section of the silicon structure between two electrodes within a CVD reactor so that it can function as a filament. Then heating the filament with electrical current and conducting a CVD process with a silicon-containing gas so that the filament receives a deposit of silicon. The die may be a multi-cavity die. There may be doping of the silicon structure so as to reduce the impedance at room temperature to less than in the order of 10.sup.3 ohm.Math.cm.
[0052] Yet another example of the invention is a method for producing polysilicon consisting of using a silicon-containing gas and a CVD reactor, disposing in the CVD reactor a tubular silicon filament having an outer diameter in the range of 40 to 60 mm and a wall thickness in the range of 1.75 to 6 mm, and conducting a CVD process with the silicon-containing gas wherein the tubular silicon filament is heated by electrical current so that it receives a growing deposit of silicon until the CVD process is terminated.
[0053] Other and various examples and embodiments of the invention will be readily apparent to those skilled in the art from the description, figures, and claims that follow.