INSTANTANEOUS TIME DOMAIN OPTICAL COHERENCE TOMOGRAPHY

Abstract

A method and system for instantaneous time domain optical coherence tomography (iTD-OCT) provides instantaneous optical depth profiles in an axial direction to a sample having scattering properties or that is at least partially reflective. An iTD-OCT instrument includes a spectroscopic detector having an internal optical axis and an array of detector pixels. A reference beam having a fixed optical path length is superpositioned along the optical axis with a measurement beam that includes back-scattered photons from the sample. The detector pixels capture a time domain interference pattern arising within the spectroscopic detector due to optical path length differences between photons from the reference beam and photons from the measurement beam. The iTD-OCT instrument may be implemented as a robust solid-state device with no moving parts.

Claims

1. A method for performing time domain optical coherence tomography, comprising: generating a sample beam and a reference beam sharing an optical start point; propagating the reference beam along a fixed optical path to an optical axis of a standing waveguide spectrometer; propagating the sample beam to a sample, wherein a portion of the sample beam is back-scattered by the sample resulting in a measurement beam; propagating the measurement beam to the optical axis of the standing waveguide spectrometer; and receiving an interference signal from the standing waveguide spectrometer, wherein the interference signal is indicative of optical interference within the standing waveguide spectrometer between the reference beam and the measurement beam.

2. The method of claim 1, wherein: the optical interference occurs over a first width within the standing waveguide spectrometer, the first width linearly corresponding to a penetration depth of the sample beam within the sample; and the measurement beam includes photons back-scattered by the sample within the penetration depth.

3. The method of claim 1, wherein a zero point for an optical path length difference with respect to the optical start point between photons of the reference beam and photons of the measurement beam is within the standing waveguide spectrometer.

4. The method of claim 1, wherein the interference signal is simultaneously generated by a plurality of detector pixels within the standing waveguide spectrometer, wherein the detector pixels are sensitive to the optical interference.

5. The method of claim 1, further comprising: processing the interference signal to generate an optical depth profile of the sample.

6. The method of claim 5, further comprising: scanning the sample to generate image data indicative of the sample, wherein the sample beam is directed to different lateral positions at the sample, and wherein an optical depth profile is generated at each lateral position.

7. A measurement instrument for performing time domain optical coherence tomography, comprising: a beam splitter to split light from a light source into a sample beam and a reference beam; and a detector comprising a standing waveguide spectrometer having an optical axis, wherein: the reference beam propagates from the beam splitter to the optical axis of the standing waveguide spectrometer; the sample beam propagates to a sample and a portion of the sample beam is back-scattered by the sample resulting in a measurement beam, the measurement beam propagating from the sample to the optical axis of the standing waveguide spectrometer; and the standing waveguide spectrometer generates an interference signal indicative of optical interference, the optical interference occurring within the standing waveguide spectrometer between the reference beam and the measurement beam.

8. The measurement instrument of claim 7, wherein: the optical interference occurs over a first width within the standing waveguide spectrometer, the first width linearly corresponding to a penetration depth of the sample beam within the sample; the measurement beam includes photons back-scattered by the sample within the penetration depth; and the interference signal is simultaneously generated by a plurality of detector pixels within the standing waveguide spectrometer, wherein the detector pixels are sensitive to the optical interference.

9. The measurement instrument of claim 7, further comprising: a signal processing module to process the interference signal to generate an optical depth profile of the sample, wherein an optical path length of the reference beam remains fixed when the interference signal is processed.

10. The measurement instrument of claim 9, further comprising: a scanning element to direct the sample beam to different lateral positions at the sample, wherein an optical depth profile is generated at each lateral position.

11. The measurement instrument of claim 10, wherein the signal processing module and the scanning element are to: generate a two dimensional image corresponding to a plurality of optical depth profiles generated over a scanned line of the sample; and generate a three dimensional image corresponding to a plurality of optical depth profiles generated over a plurality of the scanned lines.

12. The measurement instrument of claim 7, wherein the standing waveguide spectrometer is sensitive to evanescent waves associated with the optical interference.

13. The measurement instrument of claim 7, wherein the reference beam and the measurement beam propagate in opposite directions along the optical axis.

14. The measurement instrument of claim 7, wherein the reference beam and the measurement beam propagate in the same direction along the optical axis.

15. A measurement instrument for performing time domain optical coherence tomography, comprising: a light source to generate low coherence light; a beam splitter to split the low coherence light from the light source into a sample beam and a reference beam; and a detector comprising a standing waveguide spectrometer having an optical axis, wherein: the reference beam propagates from the beam splitter to the optical axis of the standing waveguide spectrometer; the sample beam propagates to a sample and a portion of the sample beam is back-scattered by the sample resulting in a measurement beam, the measurement beam propagating from the sample to the optical axis of the standing waveguide spectrometer; the standing waveguide spectrometer generates an interference signal indicative of optical interference, the optical interference occurring within the standing waveguide spectrometer between the reference beam and the measurement beam; an optical path length of the reference beam remains fixed when the interference signal is generated; the optical interference occurs over a first width within the standing waveguide spectrometer, the first width linearly corresponding to a penetration depth of the sample beam within the sample, wherein the measurement beam includes photons back-scattered by the sample within the penetration depth; and the interference signal is simultaneously generated by a plurality of detector pixels within the standing waveguide spectrometer, wherein the detector pixels are sensitive to evanescent waves associated with the optical interference.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0016] For a more complete understanding of the present invention and its features and advantages, reference is now made to the following description, taken in conjunction with the accompanying drawings, in which:

[0017] FIG. 1 is a prior art block diagram of a TD-OCT instrument;

[0018] FIG. 2 is a block diagram of selected elements of an embodiment of an iTD-OCT instrument;

[0019] FIG. 3 is a block diagram of selected elements of an embodiment of an iTD-OCT detector; and

[0020] FIG. 4 is a flow chart of selected elements of a method for performing iTD-OCT.

DESCRIPTION OF PARTICULAR EMBODIMENT(S)

[0021] In the following description, details are set forth by way of example to facilitate discussion of the disclosed subject matter. It should be apparent to a person of ordinary skill in the field, however, that the disclosed embodiments are exemplary and not exhaustive of all possible embodiments.

[0022] As used herein, a hyphenated form of a reference numeral refers to a specific instance of an element and the un-hyphenated form of the reference numeral refers to the collective element. Thus, for example, device 12-1 refers to an instance of a device class, which may be referred to collectively as devices 12 and any one of which may be referred to generically as a device 12.

[0023] Referring now to the drawings, prior art FIG. 1 is a block diagram showing a time domain optical coherence tomography (TD-OCT) instrument 100. TD-OCT instrument 100 is not drawn to scale but is a schematic representation. As shown, TD-OCT 100 is used to analyze sample 112, which may represent a human eye, and in particular, a cornea of a human eye. Also, in TD-OCT 100, coordinate system 120 defines an axial direction in Z and lateral directions in X and Y, which are relative to sample 112 such that sample beam 130 propagates towards sample 112 in the axial direction Z.

[0024] As shown, TD-OCT 100 includes light source 102, from which a low coherence source beam 123 is generated and introduced along source optical path 122. Source beam 123 propagates along source optical path 122 towards beam splitter 104. Beam splitter 104 creates reference beam 134 that propagates along reference optical path 124 and sample beam 130 that propagates along sample optical path 128. Reference beam 134 propagates along optical path 124 from beam splitter 104 toward reference mirror 106 and then back to beam splitter 104. Sample beam 130 propagates along sample optical path 128 towards sample 112 via scanning mirror 108. Measurement beam 132 propagates along sample optical path 128 back from sample 112 also via scanning mirror 108.

[0025] From beam splitter 104, sample beam 130 propagates along sample optical path 128 and reflects off scanning mirror 108 towards sample 112. Scanning mirror 108 is tilted mechanically to enable scanning in lateral directions X and Y for 2D or 3D scanning operations on sample 112. Measurement beam 132 includes photons that are back-scattered by sample 112 and travel back along sample optical path 128 towards beam splitter 104 after reflecting off scanning mirror 108.

[0026] At beam splitter 104, reference beam 134 is superpositioned with measurement beam 132 and the superpositioned beams propagate along detection optical path 126. Detection optical path 126 propagates superpositioned reference beam 134 and measurement beam 132 towards photodetector 110. An optical path length for reference beam 134 (the total optical path length extending from beam splitter 104 to reference mirror 106 to beam splitter 104 to photodetector 110) may be modulated by mechanical displacement of reference mirror 106. This modulation corresponds to scanning sample 112 in the axial direction Z to obtain an optical depth profile (i.e., an A-scan).

[0027] Due to optical path length differences, superimposed reference beam 134 and measurement beam 132 optically interfere along detection optical path 126 propagating towards photodetector 110. Photodetector 110 may comprise a photodiode or similar device that generates an electrical signal indicative of incident light intensity at photodetector 110. As shown, photodetector 110 outputs the electrical signal to signal processing module 114, which may include corresponding circuitry for signal conditioning, demodulation, digitization, and digital signal processing. Signal processing module 114 generates image data 116, which may represent 1D, 2D, or 3D image data acquired using TD-OCT 100.

[0028] In operation, an optical path length difference between the optical path lengths for reference beam 134 and for the sum of sample beam 130 and measurement beam 132 is precisely modulated by reference mirror 106, such that an interference pattern results along detection optical path 126 and, particularly, at detector 110. Because measurement beam 132 results from back-scattering elements within sample 112, the interference pattern intensity arriving at, and sensed by, photodetector 110 for a given position of reference mirror 106 precisely corresponds to a particular analysis depth at sample 112. However, mechanical displacement of reference mirror 106 is a limiting factor in various aspects of the operation of TD-OCT 100, including limiting the overall scanning speed that is attainable by TD-OCT 100, especially for 2D and 3D imaging applications.

[0029] Referring now to FIG. 2, a block diagram of selected elements of an embodiment of an instantaneous time domain optical coherence tomography (iTD-OCT) instrument 200 is depicted.

[0030] As shown in FIG. 2, iTD-OCT instrument 200 is used to analyze sample 212, which may represent a human eye, and in particular, a cornea or a lens of a human eye. In iTD-OCT instrument 200, coordinate system 220 defines an axial direction in Z and lateral directions in X and Y, which are relative to sample 212 such that sample beam 226 propagates towards sample 212 in the axial direction Z. It is noted that in different embodiments, different orientations for lateral directions X and Y may be used.

[0031] In FIG. 2, iTD-OCT instrument 200 represents a type of TD-OCT instrument that enables very high speed signal acquisition of optical depth profiles (A-scans) that is not limited by mechanical modulation of a reference mirror, in contrast to TD-OCT instrument 100 discussed previously with respect to prior art FIG. 1. As shown, iTD-OCT instrument 200 enables substantially simultaneous capture and measurement of an entire A-scan using a fixed reference optical path 222 for reference beam 230, which eliminates mechanical movement of the reference mirror. The capture and acquisition of the A-scan is enabled by a spectroscopic detector that instantaneously captures interference signals for all back-scattering elements in sample 212 over the entire optical depth profile in the axial (Z) direction. As shown in FIG. 2, iTD-OCT instrument 200 includes standing waveguide spectrometer 210 for the spectroscopic detector. In other embodiments, other types of spectroscopic detectors may be used. For example, instead of standing waveguide spectrometer 210, iTD-OCT instrument 200 may be used with a scanning near-field optical microscope (SNOM) sensor array. In the SNOM sensor array, an evanescent field associated with an interference pattern may be coupled to respective ends of a series of optical fibers having a very small diameter and is sensed using an array of photodetectors.

[0032] Thus, iTD-OCT instrument 200 may represent a mechanically stabile and robust OCT instrument that remains internally calibrated and optically adjusted, similar to an SD-OCT instrument having a spectrometer. Furthermore, since iTD-OCT instrument 200 operates on the basis of time domain interference, as will be described in further detail below, post-processing with a Fourier transformation of spectral information may be omitted, which can substantially accelerate signal processing module 214 as compared to comparable signal processing modules for SD-OCT, which also simultaneously acquire an entire A-scan. Additionally, linearization of the raw sensor signal into the wavenumber (k) space, as is performed with FD-OCT, may be omitted with iTD-OCT. Still further advantages of iTD-OCT instrument 200 may be realized with miniaturization and integration of various components into a single compact solid state unit, which may further decrease costs and improve functionality as compared to other types of OCT instruments.

[0033] As shown, iTD-OCT instrument 200 in FIG. 2 includes light source 202, which is a low coherence light source. Light source 202 represents a singular light source for sample beam 226 and reference beam 230. Accordingly, optical path lengths for both sample beam 226 and reference beam 230 begin at beam splitter 204 for interference purposes. In other words, beam splitter 204 is an optical start point shared by sample beam 226 and reference beam 230.

[0034] In FIG. 2, sample beam 226 propagates along sample optical path 224-1 and 224-2 from beam splitter 204 to sample 212. Measurement beam 228 propagates along sample optical path 224-1, 224-2 and 224-3 from sample 212 to standing waveguide spectrometer 210. Sample beam 226 is redirected at scanning mirror 218 to enable scanning of sample 212 in lateral directions X and Y. This scanning does not substantially change the respective optical path lengths of photons in sample beam 226 and measurement beam 228. Thus, sample optical path 224 is a fixed path. In the exemplary arrangement depicted in FIG. 2, measurement beam 228 includes photons from sample beam 226 that are back-scattered by sample 212 and travel back along optical path 224-2 towards partial mirror 205. Measurement beam 228 propagates from partial mirror 205 to a first end 211 of standing waveguide spectrometer 210 along optical path 224-3.

[0035] As depicted in the example embodiment of FIG. 2, reference beam 230 propagates along reference optical path 222 towards a second end 213 of standing waveguide spectrometer 210. Reference optical path 222 is a fixed optical path and comprises optical paths 222-1, 222-2, and 222-3. Fixed mirror 206-1 diverts reference beam 230 from optical path 222-1 to optical path 222-2. Fixed mirror 206-2 diverts reference beam 230 from optical path 222-2 to optical path 222-3. It is noted that in other embodiments, different arrangements for reference optical path 222 may be used.

[0036] Thus, measurement beam 228 is incident at first end 211 of standing waveguide spectrometer 210 and reference beam 230 is incident at second end 213 of standing waveguide spectrometer 210. Within standing waveguide spectrometer 210, reference beam 230 and measurement beam 228 are superimposed while propagating in opposing directions in the exemplary arrangement shown in FIG. 2. In other arrangements, different propagation directions for reference beam 230 or measurement beam 228 may be used.

[0037] For the superimposed beams within standing waveguide spectrometer 210, the optical path length equality given by Equation 1 defines the condition when an optical path length difference between the beams is zero.

L.sub.Samp=L.sub.Ref Equation (1)

In Equation 1, L.sub.Samp is the total optical path length over sample optical path 224, given by the sum of the optical path lengths for sample beam 226 and measurement beam 228. L.sub.Ref is the total optical path length over reference optical path 222, given by the optical path length of reference beam 230. Equation 1 may be stated in terms of the optical path lengths shown in FIG. 2, as given by Equation 2.

L1+2*L2+L3=L4+L5+L6 Equation (2)

In Equation 2, L1 is the optical path length of sample beam 226 propagating along optical path 224-1. L2 is the optical path length of sample beam 226 propagating along optical path 224-2. L3 is the optical path length of measurement beam 228 propagating along optical path 224-3. L4 is the optical path length of reference beam 230 propagating along optical path 222-1. L5 is the optical path length of reference beam 230 propagating along optical path 222-2. L6 is the optical path length of reference beam 230 propagating along optical path 222-3.

[0038] As shown, optical paths 224-3 and 222-3 are measured to a common termination point within standing waveguide spectrometer 210. When the common termination point is the zero point for the optical path length difference, optical interference (e.g., in the form of an interference pattern) may develop adjacent to the zero point within standing waveguide spectrometer 210. The optical path length differences causing the optical interference arise due to variations in the optical path length L3 for photons in measurement beam 228, which result from reflective features within sample 212 that are at different positions. Thus, the optical interference within standing waveguide spectrometer 210 includes distance and intensity information for the reflective features of sample 212 and is used to obtain an optical depth profile of sample 212.

[0039] Standing waveguide spectrometer 210 is internally sensitive to the optical interference, as explained in further detail with respect to FIG. 3, and can generate an interference signal indicative of the optical interference between reference beam 230 and measurement beam 228. The interference signal is received by signal processing module 214, which processes the interference signal to generate image data 216. The processing by signal processing module 214 may include signal conditioning (e.g., amplification, filtering, windowing, etc.), demodulation, digitization, and digital signal processing. When lateral scanning in X and Y is performed with iTD-OCT instrument 200 using a scanning element, such as scanning mirror 218, a plurality of optical depth profiles may be acquired to generate a 2D image, for example, over a scanned line of sample 212. When lateral scanning is performed over a plurality of the scanned lines, iTD-OCT instrument 200 may generate a 3D image. Thus image data 216 of sample 212 may be 1D, 2D, or 3D.

[0040] As shown in FIG. 2, when signal processing module 214 includes data processing functionality, signal processing module 214 may include a processor and memory media, which store instructions (i.e., executable code) that are executable by the processor having access to the memory media. The processor may execute instructions that cause iTD-OCT instrument 200, or portions thereof, to perform the functions and operations described herein. For the purposes of this disclosure, the memory media may include non-transitory computer-readable media that stores data and instructions for at least a period of time. The memory media may comprise persistent and volatile media, fixed and removable media, and magnetic and semiconductor media. The memory media may include, without limitation, storage media such as a direct access storage device (e.g., a hard disk drive or floppy disk), a sequential access storage device (e.g., a tape disk drive), compact disk (CD), random access memory (RAM), read-only memory (ROM), CD-ROM, digital versatile disc (DVD), electrically erasable programmable read-only memory (EEPROM), flash memory, non-transitory media, and various combinations of the foregoing.

[0041] In FIG. 2, iTD-OCT instrument 200 is not drawn to scale but is a schematic representation. Modifications, additions, or omissions may be made to iTD-OCT instrument 200 without departing from the scope of the disclosure. The components and elements of iTD-OCT instrument 200, as described herein, may be integrated or separated according to particular applications. Moreover, the operations of iTD-OCT instrument 200 may be performed by more, fewer, or other components.

[0042] It is noted that, in various embodiments or arrangements of iTD-OCT instrument 200, different implementations, layouts and diversions of beams may be used. For example, certain portions of optical paths 222 and 224 may include optical fibers. In some embodiments, certain portions of optical paths 222 and 224 may include optical waveguides. Certain portions of optical paths 222 and 224 may represent optical paths within a medium, such as vacuum, free space, a gaseous environment, or the atmosphere. In given embodiments, reference beam 230 and measurement beam 228 may be coincident in the same direction at standing waveguide spectrometer 210. In another arrangement, scanning mirror 218 may be omitted and another scanning element may be used. Scanning elements that replace scanning mirror 218 may include (piezo-) deformable mirrors, micro-electro-mechanical systems (MEMS), digital micro-mirror devices (DMD), liquid-crystal device (LCD) actuation elements, optical objectives, or various combinations thereof. In particular embodiments, at least a portion of the optical components included with iTD-OCT instrument 200 may be miniaturized and combined into a compact unit having relatively small mass and external dimensions, such that the entire compact unit is held by an external scanning element and moved with respect to sample 212. For example, certain portions of iTD-OCT instrument 200 may be implemented using semiconductor manufacturing technology as an integrated circuit. In some embodiments, the integrated circuit may include the scanning element. Also, different orientations of coordinate system 220 may be used in certain embodiments of iTD-OCT instrument 200.

[0043] Referring now to FIG. 3, a block diagram of selected elements of an embodiment of an iTD-OCT detector 300 is depicted. As shown in FIG. 3, iTD-OCT detector 300 includes standing waveguide spectrometer 210, as described with respect to FIG. 2. In certain embodiments, standing waveguide spectrometer 210 is an instance of a stationary wave integrated Fourier transform spectrometer. As shown, standing waveguide spectrometer 210 includes optical axis 312, which represents an optical path of an internal waveguide, along which external beams are introduced at first end 211 or second end 213. As a light beam (or superposition of beams) passes along optical axis 312, nanoelements, placed at regular intervals within standing waveguide spectrometer 210, interact with an evanescent (i.e., near field) wave associated with the light beam. The localized interaction of the nanoelements with the evanescent wave is detected by certain ones of detector pixels 310, shown in FIG.3 as a linear array of pixels along optical axis 312. In this manner, detector pixels 310 are sensitive to evanescent waves generated within standing waveguide spectrometer 210. The nanoelements may be nanoparticles, such as nanodots. The detector pixels 310 register and capture minute localized optical intensity variations, including variations that arise from optical interference patterns. In various embodiments, standing waveguide spectrometer 210 may have an overall length of up to about 30 mm and may have a spacing of detector pixels 310 of less than about 1 m apart from each other.

[0044] In FIG. 3, a slightly different arrangement of iTD-OCT is depicted as compared to iTD-OCT instrument 200 in FIG. 2. For descriptive clarity in FIG. 3, the scanning mirror has been removed and optical path 224-2 does not divert a sample beam for scanning, while sample 212 is arranged normal to optical path 224-2. It is noted that the arrangement depicted in FIG. 3 may represent an embodiment of iTD-OCT instrument 200 used with an external scanning element. In iTD-OCT detector 300, reference beam 230 propagates along optical path 222-3 and is incident at second end 213 along optical axis 312. Measurement beam 228 (shown without sample beam 226 in FIG. 3 for descriptive clarity) includes back-scattered photons from sample 212 and is propagated along optical path 224-2 and optical path 224-3. At first end 211, measurement beam 228 is coincident with optical axis 312 and propagates in an opposing direction to reference beam 230.

[0045] In FIG. 3, additional details with respect to sample 212 are shown. In particular, exemplary boundary layers A, B, and C are shown, representing potential sources of back-scattering from sample 212, where photons are introduced into measurement beam 228. As shown, boundary layers A and B may schematically represent top and bottom edges of the cornea (e.g., epithelium A and endothelium B), while boundary layer C may schematically represent an anterior surface of the lens capsule. Although relatively coarse biostructure resolution is depicted in FIG. 3 for descriptive clarity, it will be understood that iTD-OCT detector 300 is suitable for resolution of fine biostructures within the human eye. For example, iTD-OCT detector 300 may be used to resolve different corneal layers, such as the tear film, the epithelium, Bowman's membrane, the stroma, Descement's membrane, and the endothelium. In various embodiments, iTD-OCT detector 300 may be used to characterize or analyze intra-corneal layer biostructures, such as fibrils or microfibrils in human corneal stroma.

[0046] In FIG. 3, because measurement beam 228 is comprised of back-scattered (i.e., reflected) photons from the incident sample beam (see FIG. 2), time delays in the reflection of photons from boundary layers B and C occur with respect to boundary layer A, Specifically, reflection from boundary layer B is delayed by 2*t.sub.A-B with respect to boundary layer A, while reflection from boundary layer C is delayed by 2*t.sub.A-B+2*t.sub.B-C with respect to boundary layer A, where t.sub.A-B corresponds to a time delay for light from boundary layer A to B, and where t.sub.B-C corresponds to a time delay for light from boundary layer B to C. Accordingly, measurement beam 228, to the extent that boundary layers A, B, and C back-scatter the sample beam, will include reflected photons at the respective time delays described for boundary layers B and C with respect to boundary layer A.

[0047] In FIG. 3, due to superposition of reference beam 230 with measurement beam 228, optical interference due to the optical path length differences between the reference beam photons and the measurement beam photons will occur. The optical interference will occur at precise locations along optical axis 312 that correspond to the time delays resulting from boundary layers A, B, and C. Furthermore, the optical interference will appear as interference pattern 314 that is subject to a point-spread function (PSF) that detector pixels 310 may detect. As shown, interference pattern 314-A is associated with boundary layer A, interference pattern 314-B is associated with boundary layer B, and interference pattern 314-C is associated with boundary layer C. As shown, interference patterns 314-A and 314-B are separated by distance z.sub.A-B along optical axis 312, while interference patterns 314-B and 314-C are separated by distance z.sub.B-C along optical axis 312. Since interference patterns 314 arise due to time domain interference, z.sub.A-B may linearly correspond to t.sub.A-B, while z.sub.B-C may linearly correspond to t.sub.B-C. The respective PSFs are registered by certain ones of detector pixels 310 as intensity values I.sub.A, I.sub.B, and I.sub.C, respectively for interference patterns 314-A, 314-B, and 314-C. Due to the fixed position of detector pixels 310 along optical axis 312, interference patterns 314-A, 314-B, and 314-C enable measurement of z.sub.A-B and z.sub.B-C by identifying particular ones of detector pixels 310 that detect the PSF. In this manner, intensity values I.sub.A, I.sub.B, and I.sub.C along with z.sub.A-B and z.sub.B-C are measured and are used to generate an optical depth profile for sample 212.

[0048] In operation of iTD-OCT detector 300, as shown in FIG. 3, a zero point of axis Z along optical axis 312, which linearly represents axis Z within sample 212, may be adjusted as desired. Although reference beam 230 remains fixed during scanning of iTD-OCT instrument 200, reference beam 230 or sample beam 226 may be calibrated to any desired zero point, for example, to enable different analysis depths. Thus, a desired zero point for axis Z where the optical path lengths of the interfering beams are equivalent may be calibrated to be within standing waveguide spectrometer 210 or may be calibrated to be external to standing waveguide spectrometer 210. It is noted that a direction 320 of axis Z may be reversed by reversing a propagation direction of one of reference beam 230 and measurement beam 228, with respect to standing waveguide spectrometer 210. The zero point of axis Z may be selected based on certain dimensions of standing waveguide spectrometer 210, as desired for a particular application of iTD-OCT. Furthermore, because the temporal or spatial calibration of axis Z is determined by a physical position of each of detector pixels 310, the calibration is inherently stable and remains constant over time.

[0049] It is noted that iTD-OCT detector 300 is not drawn to scale but is a schematic representation. Modifications, additions, or omissions may be made to iTD-OCT detector 300 without departing from the scope of the disclosure. The components and elements of iTD-OCT detector 300, as described herein, may be integrated or separated according to particular applications. Moreover, the operations of iTD-OCT detector 300 may be performed by more, fewer, or other components. For example, in particular embodiments, a plurality of standing waveguide spectrometers 210 may be used in parallel to simultaneously generate a plurality of A-scans (i.e., a line scan), thereby accelerating measurement of a 2D or 3D image.

[0050] Referring now to FIG. 4, a block diagram of selected elements of an embodiment of a method 400 for performing iTD-OCT, as described herein, is depicted in flowchart form. Method 400 may be implemented by iTD-OCT instrument 200 (see FIG. 2). It is noted that certain operations described in method 400 may be optional or may be rearranged in different embodiments.

[0051] Method 400 begins at step 402 by generating a sample beam and a reference beam from a light source. The reference beam is propagated at step 404 along a fixed optical path to an optical axis of a standing waveguide spectrometer. The sample beam is propagated at step 406 to a sample, such that a portion of the sample beam is back-scattered by the sample, resulting in a measurement beam. An interference signal is received at step 408 from the standing waveguide spectrometer, wherein the interference signal is indicative of optical interference within the standing waveguide spectrometer between the reference beam and the measurement beam. The interference signal is processed at step 410 to generate an optical depth profile of the sample. The sample is scanned at step 412 to generate image data indicative of the sample, such that the sample beam is directed to different lateral positions at the sample and an optical depth profile is generated at each lateral position.

[0052] As disclosed herein, a method and system for instantaneous time domain optical coherence tomography (iTD-OCT) provides instantaneous optical depth profiles in an axial direction to a sample having scattering properties or that is at least partially reflective. An iTD-OCT instrument includes a spectroscopic detector having an internal optical axis and an array of detector pixels. A reference beam having a fixed optical path length is superpositioned along the optical axis with a measurement beam that includes back-scattered photons from the sample. The detector pixels capture a time domain interference pattern arising within the spectroscopic detector due to optical path length differences between photons from the reference beam and photons from the measurement beam. The iTD-OCT instrument may be implemented as a robust solid-state device with no moving parts.

[0053] The above disclosed subject matter is to be considered illustrative, and not restrictive, and the appended claims are intended to cover all such modifications, enhancements, and other embodiments which fall within the true spirit and scope of the present disclosure. Thus, to the maximum extent allowed by law, the scope of the present disclosure is to be determined by the broadest permissible interpretation of the following claims and their equivalents, and shall not be restricted or limited by the foregoing detailed description.