ELECTRON MICROSCOPE AND METHOD FOR TRANSMISSION ELECTRON MICROSCOPY IMAGING OF SAMPLE ARRAYS
20170207062 ยท 2017-07-20
Inventors
Cpc classification
G01N35/1011
PHYSICS
G01N1/30
PHYSICS
G01N1/2813
PHYSICS
H01J37/26
ELECTRICITY
G01N2001/282
PHYSICS
International classification
H01J37/26
ELECTRICITY
G01N1/28
PHYSICS
Abstract
A method of electron microscopy imaging of samples, using an electron microscope (100) having a microscope column (10) and a transfer device (11) with a grid carriage (12), comprises the steps of preparing multiple samples (1) on a single electron microscopy grid (2), including dispensing the samples (1) with a dispenser device (30) on distinct positions on the grid (2), introducing the grid (1) with the transfer device (11) into the microscope column (10), and electron microscopy imaging of the samples (1), wherein the preparing step includes holding the grid (2) on the grid carriage (12) of the transfer device (11) or on a grid holder device (20) provided at the electron microscope (100) and dispensing the samples (1) on the grid (2) while holding it on the grid carriage (12) or on the grid holder device (20). Furthermore, an electron microscope (100) for electron microscopy imaging of samples is described.
Claims
1. A method of electron microscopy imaging of samples, using an electron microscope having a microscope column and a transfer device with a grid carriage, comprising the steps of preparing multiple samples on a single electron microscopy grid, including dispensing the samples with a dispenser device on distinct positions on the grid, introducing the grid with the transfer device into the microscope column, and electron microscopy imaging of the samples, wherein the preparing step includes holding the grid on the grid carriage of the transfer device or on a grid holder device provided at the electron microscope and dispensing the samples on the grid while holding it on the grid carriage or on the grid holder device.
2. The method according to claim 1, wherein, for dispensing the samples onto the grid on the grid carriage, the grid is provided on the grid carriage being inserted in the transfer device adjacent to an input port of the microscope column, or the grid is provided on the grid carriage being separated from the transfer device.
3. The method according to claim 1, wherein the grid has at least one identification feature, which identifies at least one of the grid itself and positions of the samples on the grid.
4. The method according to claim 3, wherein the identification feature includes at least one of a dot code arranged adjacent to the samples, a characteristic sample pattern formed by the samples, and a characteristic grid pattern formed by a grid label.
5. The method according to claim 4, wherein at least one of the dot code and the characteristic sample pattern is deposited on the grid after arranging the grid on the grid carriage or on the grid holder device.
6. The method according to claim 1, wherein the step of dispensing the samples onto the grid includes varying at least one of buffer solutions of the samples, concentrations of the samples, surfactants added to the samples, and concentrations of the surfactants.
7. The method according to claim 1, wherein the step of preparing the samples on the grid includes at least one of staining the samples with a staining substance, wherein the dispenser device is used for supplying the staining substance to the samples, and removing excess liquid with the dispenser device from the samples.
8. The method according to claim 7, wherein the step of staining the samples on the grid includes varying at least one of the staining substance, surfactants added to the staining substance and concentrations of the staining substance.
9. The method according to claim 1, including a step of optical imaging the grid on the grid carriage or on the grid holder device for collecting at least one optical image of the grid or an identification feature thereof.
10. The method according to claim 9, wherein the preparing step is controlled using the optical image such that the samples are dispensed in at least one of a central portion of the grid and a predetermined orientation of the grid relative to the grid carriage.
11. The method according to claim 7, wherein the preparing step includes determining locations of the samples using the optical image, and removing the excess liquid at the locations of the samples.
12. The method according to claim 1, wherein the samples are dispensed on the grid while holding it on the grid holder device, and the grid is moved to the transfer device by picking the grid from the grid holder device.
13. An electron microscope for electron microscopy imaging of samples, comprising a microscope column having a transfer device with a grid carriage, wherein the transfer device is configured for introducing an electron microscopy grid into the microscope column, and a dispenser device being arranged adjacent to the microscope column, such that the dispenser device is capable of dispensing the samples onto the grid while the grid is held on the grid carriage of the transfer device or on a grid holder device adjacent to the microscope column.
14. The electron microscope according to claim 13, wherein the dispenser device is arranged for dispensing the samples onto the grid on the grid carriage being coupled with the transfer device adjacent to an input port of the microscope column.
15. The electron microscope according to claim 14, wherein the dispenser device is coupled with the microscope column.
16. The electron microscope according to claim 13, wherein the dispenser device is arranged for dispensing the samples onto the grid on the grid carriage being separated from the transfer device.
17. The electron microscope according to claim 13, wherein the dispenser device comprises at least one piezoelectric dispenser.
18. The electron microscope according to claim 13, further comprising a sample plate carrier coupled with the dispenser device.
19. The electron microscope according to claim 13, further comprising an optical imaging device being arranged for collecting at least one optical image of the grid arranged at the transfer device or the grid holder device.
20. The electron microscope according to claim 13, wherein the electron microscope is provided with the grid holder device, and the grid holder device comprises a planar grid holder card being adapted for carrying an array of grids.
21. The electron microscope according to claim 20, wherein the grid holder card has at least one of the features the grid holder card has a size of a microscope slide, the grid holder card has at least one holder card label, and the grid holder card has a self-adhesive surface holding the grids.
Description
[0025] Further details and advantages of the invention are described in the following with reference to the attached drawings, which show in:
[0026]
[0027]
[0028]
[0029]
[0030]
[0031]
[0032] Features of preferred embodiments of the invention are described in the following with particular reference to the provision of a transmission electron microscope with a dispenser device and the preparation of a sample array on a grid just before introducing the grid into the electron microscope. Details of the electron microscope and the dispenser device as such and methods of operating thereof are not described as far as they are known from conventional electron microscopes or dispenser devices. Furthermore, exemplary reference is made to the use of a translation device having a sliding grid carriage for introducing a grid into the microscope column of the electron microscope, wherein the grid carriage is permanently coupled with the transfer device. The implementation of the invention is not restricted to the use of this type of transfer device, but rather possible with other types of transfer devices, e. g. having a removable grid carriage.
[0033]
[0034] The transfer device 11 includes the sliding grid carriage 12 (exemplary plan view shown in
[0035] The dispenser device 30 includes a piezoelectric droplet dispenser 31, a translation stage 32 and a sample plate carrier 33. The translation stage 32 and the sample plate carrier 33 have a fixed position relative to the microscope column 10. These components are connected with a support structure 34 comprising multiple vertical support rods 35 and at least one horizontal support beam 36 for moving the translation stage 32. The support structure 34 is positioned e. g. on the support table 14 as shown with drawn lines in
[0036] The sample plate carrier 33 provides a support e. g. for a microtiter plate 37, wherein samples e. g. with varying buffer solutions or surfactants and optionally washing and/or staining solutions are arranged in the wells of the microtiter plate 37. Preferably, the sample plate carrier 33 is coupled with the support structure 34, e. g. with one of the vertical support rods 35.
[0037] The optical imaging device 40 comprises a CCD camera, which is mechanically connected with the piezoelectric droplet dispenser 31, the translation stage 32 or the support structure 34. The optical imaging device 40 is arranged for collecting an optical image of the sliding carriage 12 including the grid 2.
[0038] The grid holder device 20 comprises a grid holder card 21 (exemplary plan view shown in
[0039]
[0040]
[0041] With a preferred embodiment of the invention, the electron microscopy imaging of the samples on the grid 2 is conducted with the following steps. Firstly, grids 2 are provided in the grid holder device 20 (see
[0042] Subsequently, with the embodiment of
[0043] According to
[0044]
[0045] Subsequently, the dispenser device 30, e. g. another dispenser 31A thereof is used for removing excess liquid from the deposited droplets 6, so that the samples 1 to be imaged remain on the grid surface (
[0046] Finally, the grid 2 with the sample array is moved through the injection port into the microscope column 10. Transmission electron microscopy images of the samples 1 are collected as it is known from conventional transmission electron microscopy. The electron microscopy images are assigned to specific samples using the identification features 3 of the sample grids 2.
[0047] The features of the invention disclosed in the above description, the drawings and the claims can be of importance individually or in combination for the realisation of the invention in its different embodiments.