FERRITE THICK FILMS AND CHEMICAL SOLUTION-BASED METHODS OF PREPARATION THEREOF

Abstract

Ferrite films, antennas including ferrite films, and methods of making thereof are provided. The methods can include tape casting of a slurry to produce a green film, wherein the slurry includes a ferrite powder, a dispersant, and a binder in a suitable solvent; and densifying the green film to produce the ferrite film having a thickness of 50 m to 5 mm. The methods can be used to make large area films, for example the films can have a lateral area of about 1000 cm.sup.2 to 3000 cm.sup.2. VHF/UHF antennas are including the ferrite films are also provided.

Claims

1. A method of making a ferrite film, the method comprising tape casting of a slurry to produce a green film, wherein the slurry comprises a ferrite powder, a dispersant, and a binder in a suitable solvent; densifying the green film to produce the ferrite film having a thickness of 50 m to 5 mm.

2. The method of claim 1, wherein the ferrite powder comprises XFe.sub.2O.sub.4, wherein X is selected from the group consisting of Ni, Zn, Co, Fe, Ti, Mn, and a combination thereof.

3. The method of claim 1, wherein the ferrite powder comprises a ferrite selected from the group consisting of Ni.sub.xCo.sub.yFe.sub.zO.sub.4, Ni.sub.xZn.sub.yFe.sub.zO.sub.4, and Co.sub.xZn.sub.yFe.sub.zO.sub.4, wherein xis 0.1 to 0.6, y is 0.1 to 0.6, and z is 1.8 to 2.8, and wherein x+y+z=3.0.

4. The method of claim 1, wherein the ferrite powder is Ni.sub.0.19Zn.sub.0.28Co.sub.0.03Fe.sub.2.5O.sub.4.

5. The method of claim 1, wherein the ferrite powder has an average particle diameter of about 20 nm to 50 nm.

6. The method of claim 1, wherein the dispersant is a fish oil.

7. The method of claim 1, wherein the binder is a polyvinyl butyral.

8. The method of claim 1, wherein the solvent is ethanol.

9. The method of claim 1, wherein the tape casting comprises casting the green film onto a glass or polymer substrate.

10. The method of claim 1, wherein the tape casting comprises heating the green film to burnout the dispersant, the binder, and the solvent.

11. The method of claim 1, wherein the densifying comprises heating the green film to a temperature of about 900 C. to 1400 C. and maintaining the temperature for a period of time of about 1 hour to 150 hours.

12. The method of claim 11, wherein the heating is at a heating rate of about 2 C./min to 20 C./min.

13. The method of claim 1, wherein the densifying comprises applying a pressure of about 40 MPa to 60 MPa to the green film.

14. The method of claim 1, wherein the densifying comprises applying an electric field to the green film.

15. The method of claim 14, wherein the electrical field is pulsed with pulses that are about 500 s to 300 ms.

16. The method of claim 1, wherein the green film has a lateral area of about 1000 cm.sup.2 to 3000 cm.sup.2.

17. A ferrite film made according to the method of claim 1.

18. A VHF/UHF antenna comprising a ferrite film according to claim 17.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Further aspects of the present disclosure will be readily appreciated upon review of the detailed description of its various embodiments, described below, when taken in conjunction with the accompanying drawings.

[0012] FIG. 1 depicts one embodiment of a very high frequency (VHF)/ultra high frequency (UHF) antenna.

[0013] FIG. 2 is a schematic of the inverse spinel ferrite crystal structure depicting the A and B sites.

[0014] FIG. 3 is a graph of the magnetization hysteresis of a green thick film of Ni.sub.0.5Zn.sub.0.5Fe.sub.2O.sub.4 (NZF). The magnetization (emu/g) is depicted along the left axis as a function of the applied magnetic field (kOe).

[0015] FIG. 4 is a graph of the magnetization hysteresis for thick films of Ni.sub.0.5Zn.sub.0.5Fe.sub.2O.sub.4 (NZF) heated at 2 C./min to 1100 C., 1200 C., or 1300 C. for 1 hour or 3 hours. M.sub.s increases with temperature.

[0016] FIG. 5 is a graph of the magnetization hysteresis for thick films of Ni.sub.0.5Zn.sub.0.5Fe.sub.2O.sub.4 (NZF) heated at 2 C./min sintered at either 1300 C. for varying times ranging from 1 hour to 100 hours or at 950 C. for 100 hours.

[0017] FIG. 6 is a graph of the magnetization hysteresis for thick films of Ni.sub.0.5Zn.sub.0.5Fe.sub.2O.sub.4 (NZF) heated at 10 C./min sintered at either 1300 C. for varying times ranging from 1 hour to 100 hours or at 950 C. for 100 hours.

[0018] FIG. 7 is a graph of the x-ray diffraction (XRD) pattern for Ni.sub.0.5Zn.sub.0.5Fe.sub.2O.sub.4 (NZF) tape sintered at 1300 C. for 10 hours with a heating rate of 2 C./min depicting the inverse spinel structure.

[0019] FIG. 8 is a graph of the normalized intensities (%) of Miller planes versus sinter time (hours) for Ni.sub.0.5Zn.sub.0.5Fe.sub.2O.sub.4 (NZF) tapes sintered at 1300 C.

[0020] FIG. 9 is a flow chart depicting one embodiment of a method of making ferrite thick films.

[0021] FIG. 10 is an X-Ray diffraction (XRD) pattern for as-received NZCF powder.

[0022] FIG. 11 is a magnetization hysteresis for as-received NZCF powder.

[0023] FIG. 12 is a graph of the hysteresis curves for NZCF samples processed at different temperatures with a 10 C./min heating rate and 3 hour sintering time.

[0024] FIG. 13 is a graph demonstrating the difference in magnetization saturation between samples with sintering time of 1 and 100 hours.

[0025] FIG. 14 is an X-Ray diffraction (XRD) pattern for a NZCF sample heated to 1400 C. for 1 hour.

[0026] FIG. 15 is a graph of the magnetization curves for NZCF samples heated to 1300 C. with different sintering times.

[0027] FIG. 16 is an X-Ray diffraction (XRD) pattern for a NZCF tapes processed at 1300 C. with a 10 C./min heating rate and 48 hours sintering time.

[0028] FIG. 17 is an X-Ray diffraction (XRD) pattern for a NZCF tapes processed at 1300 C. with a 10 C./min heating rate and 100 hours sintering time.

DETAILED DESCRIPTION

[0029] Before the present disclosure is described in greater detail, it is to be understood that this disclosure is not limited to particular embodiments described, and as such may, of course, vary. It is also to be understood that the terminology used herein is for the purpose of describing particular embodiments only, and is not intended to be limiting. The skilled artisan will recognize many variants and adaptations of the embodiments described herein. These variants and adaptations are intended to be included in the teachings of this disclosure and to be encompassed by the claims herein.

[0030] All publications and patents cited in this specification are herein incorporated by reference as if each individual publication or patent were specifically and individually indicated to be incorporated by reference and are incorporated herein by reference to disclose and describe the methods and/or materials in connection with which the publications are cited. The citation of any publication is for its disclosure prior to the filing date and should not be construed as an admission that the present disclosure is not entitled to antedate such publication by virtue of prior disclosure. Further, the dates of publication provided could be different from the actual publication dates that may need to be independently confirmed.

[0031] Although any methods and materials similar or equivalent to those described herein can also be used in the practice or testing of the present disclosure, the preferred methods and materials are now described. Functions or constructions well-known in the art may not be described in detail for brevity and/or clarity. Embodiments of the present disclosure will employ, unless otherwise indicated, techniques of nanotechnology, organic chemistry, material science and engineering and the like, which are within the skill of the art. Such techniques are explained fully in the literature.

[0032] It should be noted that ratios, concentrations, amounts, and other numerical data can be expressed herein in a range format. It is to be understood that such a range format is used for convenience and brevity, and thus, should be interpreted in a flexible manner to include not only the numerical values explicitly recited as the limits of the range, but also to include all the individual numerical values or sub-ranges encompassed within that range as if each numerical value and sub-range is explicitly recited. To illustrate, a numerical range of about 0.1% to about 5% should be interpreted to include not only the explicitly recited values of about 0.1% to about 5%, but also include individual values (e.g., 1%, 2%, 3%, and 4%) and the sub-ranges (e.g., 0.5%, 1.1%, 2.2%, 3.3%, and 4.4%) within the indicated range. Where the stated range includes one or both of the limits, ranges excluding either or both of those included limits are also included in the disclosure, e.g. the phrase x to y includes the range from x to y as well as the range greater than x and less than y. The range can also be expressed as an upper limit, e.g. about x, y, z, or less and should be interpreted to include the specific ranges of about x, about y, and about z as well as the ranges of less than x, less than y, and less than z. Likewise, the phrase about x, y, z, or greater should be interpreted to include the specific ranges of about x, about y, and about z as well as the ranges of greater than x, greater than y, and greater than z. In some embodiments, the term about can include traditional rounding according to significant figures of the numerical value. In addition, the phrase about x to y, where x and y are numerical values, includes about x to about y.

[0033] Definitions

[0034] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the specification and relevant art and should not be interpreted in an idealized or overly formal sense unless expressly defined herein.

[0035] The articles a and an, as used herein, mean one or more when applied to any feature in embodiments of the present invention described in the specification and claims. The use of a and an does not limit the meaning to a single feature unless such a limit is specifically stated. The article the preceding singular or plural nouns or noun phrases denotes a particular specified feature or particular specified features and may have a singular or plural connotation depending upon the context in which it is used.

[0036] The terms green film and green tape, as interchangeably used herein, refer to a tape in its unfired state which upon being heated to ceramic-forming temperatures, generally in the range of from about 900 to 2000 C., is converted to a unitary ceramic body of polycrystalline or mixed polycrystalline and glassy structure by the volatilization of the support matrix and sintering or fusing together of the ceramic raw material particles.

[0037] The term xerogel, as used herein, refers the solid or semisolid network formed from a sol-gel process which remains after solvents and other swelling agents have been removed, typically by heating.

[0038] Methods of Making Ferrite Thick Films

[0039] Methods of making ferrite films are provided. One exemplary embodiment of the method is depicted in FIG. 9. The methods can include producing a slurry containing a ferrite powder.

[0040] The slurry can be tape cast to form a green film having a variety of thicknesses and lateral surface areas. Densifying the green film can produce the ferrite films, e.g. thick films having a thickness of greater than 50 m, 100 m, or 150 m.

[0041] The ferrite powder can be purchased or can be prepared by sol-gel auto combustion. The methods can include forming a stoichiometric mixture of metal salts and complexing agents, where the metal in the metal salt can be Ni, Zn, Co, Fe, Ti, Mn, or any combination thereof. Suitable complexing agents can include citric acid, urea, glycine, or combinations thereof. The methods can include heating the mixture to form a xerogel. The methods can include igniting the xerogel to produce the ferrite powder.

[0042] A variety of ferrite powders can be used in the slurry. The ferrite powder can include XFe.sub.2O.sub.4, wherein X is Ni, Zn, Co, Fe, Ti, Mn, or any combination thereof. The ferrite powder can be an inverse spinel ferrite. The ferrite powder can include Ni.sub.xCo.sub.yFe.sub.zO.sub.4, Ni.sub.xZn.sub.yFe.sub.zO.sub.4, or Co.sub.xZn.sub.yFe.sub.zO.sub.4. Each occurrence of x can be about 0.05 to 0.75, about 0.1 to 0.6, about 0.2 to 0.6, or about 0.25 to 0.55. Each occurrence of y can be about 0.05 to 0.75, about 0.1 to 0.6, about 0.2 to 0.6, or about 0.25 to 0.55. Each occurrence of z can be about 1.5 to 3.0, about 1.8 to 2.8, about 1.8 to 2.3, or about 2.0. The sum of x, y, and z can be about 3.0. In some embodiments, the ferrite powder has the formula Ni.sub.0.19Zn.sub.0.28Co.sub.0.03Fe.sub.2.5O.sub.4. The ferrite powder can include Co having a stoichiometry ranging from about 0.01 to 0.6, about 0.05 to 0.5, about 0.01 to 0.1, or about 0.3 to 0.6. The ferrite powder can have an average particle diameter of about 10 nm to 200 nm, about 10 nm to 100 nm, about 20 nm to 100 nm, about 20 nm to 50 nm, or about 10 nm to 30 nm.

[0043] The methods can include preparing a slurry containing the ferrite powder in a suitable solvent. The slurry can include about 40 wt % to 80 wt % ferrite powder, about 50 wt % to 80 wt % ferrite powder, about 50 wt % to 70 wt % ferrite powder, or about 55 wt % to 65 wt % ferrite powder based upon the weight of the slurry. The solvent can include ethanol, toluene, acetlyacetone, xylene, or a combination thereof. The solvent can be present in the slurry in an amount from about 20 wt % to 60 wt %, about 20 wt % to 50 wt %, or about 20 wt % to 40 wt % based upon the weight of the slurry. The slurry can include additional components such as dispersants, binders, and plasticizers. The methods can include ball milling a mixture of the ferrite powder to increase the homogeneity. The ball milling can include first ball milling a mixture of the ferrite powder, solvent, and dispersant to homogeneously disperse the ferrite powder. This can be done, for example, for a period of about 12 hours to 48 hours, or about 24 hours. The methods can include adding plasticizer and/or binder, additionally including further ball milling to mix the components of the slurry.

[0044] Suitable dispersants can include, for instance, long chain carboxylic acids including stearic acid, oleic acid, lauric acid; long chain amines; quaternary ammonium salts; acrylic acids including polyacrylic acids; acrylate salts; methacrylic acids including polymethacrylic acids; methacrylate salts including salts of polymethacrylic acid; polycaprolactams; and phosphate esters. In some embodiments the dispersant is fish oil, in particular blown menhaden fish oil. The dispersants can be present in an amount from about 0.1 wt % to 10 wt %, about 0.1 wt % to 5 wt %, about 0.5 wt % to 5 wt %, or about 0.5 wt % to 2.5 wt % based upon the weight of the slurry.

[0045] Suitable binders can include polyvinyl alcohol, acrylic polymers, polyglycols, polyvinyl acetate, polyisobutylene, polycarbonates, polystyrene, polyacrylates, derivatives thereof, copoylmers thereof, and mixtures thereof. In some embodiments the binder is a polyvinyl butyral such as butvar (B98). The binder can be present in an amount from about 2 wt % to 20 wt %, about 2 wt % to 10 wt %, about 2 wt % to 5 wt %, or about 3 wt % to 5 wt % based upon the weight of the slurry.

[0046] Suitable plasticizers can include phthalic acid esters such as dimethyl phthalate, dibutyl phthalate, diethyl phthalate, and butyl benzyl phthalate; sebacic acid esters such as dibutyl sebacate; citric acid esters such as triethyl citrate, tributyl citrate tributyl citrate; benzoic acid esters such as benzyl benzoate; polyethylene glycols; propylene glycol butyl, and/or glycol esters of fatty acids; refined mineral oils; oleic acid; castor oil; corn oil; camphor; and sugar alcohols such as sorbitol. The plasticizer can be present in an amount from about 0.1 wt % to 10 wt %, about 0.1 wt % to 5 wt %, about 0.5 wt % to 5 wt %, or about 0.5 wt % to 2.5 wt % based upon the weight of the slurry.

[0047] The methods can include tape casting of the slurry to produce a green film. The term tape casting, as generally used herein, refers to a process of producing a ceramic tape from a ceramic slurry. The tape casting can include placing the slurry into a chamber or container having a gap. The width of the gap can be adjusted, for example via a doctor blade that can control the thickness of the green film produced. The length of the gap can range from about 5 cm or 10 cm to about 50 cm, 100 cm, or greater. The tape casting can include moving a substrate, such as a glass or a polymer substrate, relative to the gap so that the green film is produced on the substrate and/or moving the gap or doctor blade relative to the substrate so that the green film is produced on the substrate. The green film can be produced having a thickness of greater than 50 m, 100 m, or 150 m. For example the green film can have a thickness of about 50 m to 5 mm, about 100 m to 5 mm, about 150 m to 5 mm, about 150 m to 3 mm, or about 300 m to 3 mm. The tape casting can further include drying the green film and/or heating the green film to burnout the components in the slurry other than the ferrite powder, e.g. the binder, the plasticizer, the dispersant, and/or the solvent. Although the methods can be used to make green films having smaller surface areas, the methods can also produce large-area green films. The green film can have a lateral area of about 1000 cm.sup.2 to 5000 cm.sup.2, about 1000 cm.sup.2 to 3000 cm.sup.2, about 2000 cm.sup.2 to 5000 cm.sup.2, or about 2500 cm.sup.2 to 5000 cm.sup.2. The methods can include densifying the green film to produce the ferrite film. A variety of densifying techniques can be used in various embodiments of the methods. The densifying can include sintering the green film, e.g. by heating the green film to an elevated temperature and maintain the elevated temperature for a period of time. The densifying can include applying pressure to the green film, e.g. a pressure of about 10 MPa to 80 MPa, about 10 MPa to 60 MPa, about 20 MPa to 60 MPa, about 40 MPa to 60 MPa, or about 20 MPa to 50 MPa. The densifying can include applying an electric field or a voltage to the green film. The electric field can be about 100 V/cm to 1000 V/cm, about 100 V/cm to 800 V/cm, about 200 V/cm to 800 V/cm, or about 300 V/cm to 800 V/cm. The electric field or voltage can be pulsed, for example with pulses that are about 500 s to 300 ms, about 500 s to 250 ms, about 1 ms to 250 ms, or about 50 ms to 250 ms.

[0048] The densifying can include sintering the green film, e.g. by heating the green film to an elevated temperature and maintain the elevated temperature for a period of time. The heating can include heating at a rate of about 1 C./min to 20 C./min, about 2 C./min to 20 C./min, or about 2 C./min to 10 C./min. The elevated temperature can be about 500 C. to 2000 C., about 600 C. to 2000 C., about 700 C. to 2000 C., about 900 C. to 2000 C., about 900 C. to 1500 C., about 900 C. to 1400 C., about 950 C., about 1000 C., about 1050 C., about 1100 C., about 1150 C., about 1200 C., about 1250 C., about 1300 C., about 1350 C., about 500 C. to 1350 C., about 500 C. to 1200 C., or about 600 C. to 1200 C. The period of time can be from about 15 minutes to 200 hours, about 15 minutes to 100 hours, about 15 minutes to 20 hours, about 15 minutes to 10 hours, about 30 minutes to 10 hours, about 30 minutes to 5 hours, about 30 minutes to 3 hours, about 1 hour to 200 hours, about 1 hour to 150 hours, about 1 hour to 100 hours, about 10 hours to 100 hours, about 20 hours to 100 hours, about 24 hours to 100 hours, about 24 hours to 72 hours, or about 24 hours to 40 hours.

[0049] Ferrite Thick Films and Uses Thereof

[0050] Ferrite films are provided, in particular ferrite thick films. The ferrite film can have a thickness of greater than 50 m, 100 m, or 150 m. For example the ferrite film can have a thickness of about 50 m to 5 mm, about 100 m to 5 mm, about 150 m to 5 mm, about 150 m to 3 mm, or about 300 m to 3 mm. The ferrite thick films can also have a large area. The lateral area can be about 1000 cm.sup.2 to 5000 cm.sup.2, about 1000 cm.sup.2 to 3000 cm.sup.2, about 2000 cm.sup.2 to 5000 cm.sup.2, or about 2500 cm.sup.2 to 5000 cm.sup.2.

[0051] The ferrite thick film can be an inverse spinel ferrite. Ferrimagnetic materials exhibit spontaneous magnetization at room temperature due to magnetic domains. This magnetization results from a nonzero cancellation of cations of opposite spins located on different lattice sites. Ferrites are ferrimagnetic materials with the general formula MFe2O4 where M is one or more divalent cations. These materials have the crystal spinel structure in which each unit cell contains 8 formula units with oxygen occupying the FCC lattice sites and of the tetrahedral sites and of the octahedral sites occupied by metallic cations. There are two distribution extremes that are observed in spinel ferrites. In normal spinel, the divalent iron ions are located on the octahedral sites while the trivalent M ions are located on the tetrahedral sites. In an inverse spinel structure, shown in FIG. 2, the trivalent ions are located on both the octahedral and tetrahedral sites while the divalent iron ions are positioned on the remaining octahedral sites.

[0052] The ferrite films can have a variety of grain sizes dependent upon the preparation procedure. The ferrite film can have a grain size of about 10 nm to 100 nm, about 10 nm to 50 nm, about 10 nm to 30 nm, about 10 nm, about 15 nm, about 20 nm, about 25 nm, or about 30 nm. In some embodiments, the ferrite films can have very small grain sizes of about 15 nm, about 12 nm, about 10 nm, about 8 nm, about 6 nm, or less. The ferrite film can have larger grain sizes, for example about 100 nm to 30 m, about 300 nm to 30 m, about 300 nm to 25 m , about 300 nm to 25 m , about 1 m to 25 m, or about 5 m to 25 m. The ferrite film can have a high resistivity, e.g. about 8 Ohm-m, about 10 Ohm-m, about 100 Ohm-m, about 500 Ohm-m, or more. The ferrite film can have a permeability of about 10 to 2000, about 10 to 1000, about 10 to 500, about 10 to 100, about 50 to 2000, about 50 to 1000, or about 50 to 500.

[0053] The ferrite film can include XFe.sub.2O.sub.4, wherein X is Ni, Zn, Co, Fe, Ti, Mn, or any combination thereof. The ferrite film can be an inverse spinel ferrite. The ferrite film can include Ni.sub.xCo.sub.yFe.sub.zO.sub.4, Ni.sub.xZn.sub.yFe.sub.zO.sub.4, or Co.sub.xZn.sub.yFe.sub.zO.sub.4. Each occurrence of x can be about 0.05 to 0.75, about 0.1 to 0.6, about 0.2 to 0.6, or about 0.25 to 0.55. Each occurrence of y can be about 0.05 to 0.75, about 0.1 to 0.6, about 0.2 to 0.6, or about 0.25 to 0.55. Each occurrence of z can be about 1.5 to 3.0, about 1.8 to 2.8, about 1.8 to 2.3, or about 2.0. The sum of x, y, and z can be about 3.0. In some embodiments, the ferrite powder has the formula Ni.sub.0.19Zn.sub.0.28Co.sub.0.03Fe.sub.2.5O.sub.4. The ferrite film can include Co having a stoichiometry ranging from about 0.01 to 0.6, about 0.05 to 0.5, about 0.01 to 0.1, or about 0.3 to 0.6.

[0054] Various electronic devices can be developed using the ferrite thick films provided herein. For typical antenna, the total lateral area of the ferrite substrate is on the order of 1600 cm.sup.2. The cavity between the antenna radiator and ground plane can be designed to be between 2.5 mm to 20 mm, depending on the intended frequency range. Given current electromagnetic performance requirements, the ferrite film can fill at least about 50% of this cavity, e.g. about 40% to 100%, about 50% to 100%, or about 50% to 90%. Antenna including the ferrite films can operate in the very high frequency (VHF) and/or the ultra high frequency (UHF) region. For example, the antenna can operate at a frequency of about 0.1 GHz to 5 GHz, about 0.5 GHz to 5 GHz, about 1 GHz to 5 GHz, or about 1 GHz to 3 GHz.

EXAMPLES

[0055] Now having described the embodiments of the present disclosure, in general, the following Examples describe some additional embodiments of the present disclosure. While embodiments of the present disclosure are described in connection with the following examples and the corresponding text and figures, there is no intent to limit embodiments of the present disclosure to this description. On the contrary, the intent is to cover all alternatives, modifications, and equivalents included within the spirit and scope of embodiments of the present disclosure.

[0056] NZF Thick Films

[0057] A tape casting system was used to create large-area films of around 300 m thickness. Cast green thick films were studied to provide a baseline for comparison for microstructure and magnetic behavior. As the green thick films were heated, constituents other than the ferrite powder were burnt-out. Thermogravimetric analysis (TGA) and differential thermal analysis (DTA) were used to study the binder burn-off temperature, which was found to be 350 C. Before and after, scanning electron microscopy (SEM) images revealed that the binder burnout was homogenous. Energy dispersive X-ray (EDS) maps of the NZF film post-burnout, confirmed the homogeneous distribution of elements. Furthermore, x-ray diffraction (XRD) confirmed the inverse spinel structure of nickel zinc ferrite and the absence of other phases. Magnetization hysteresis of a green thick film is shown in FIG. 5; note that the saturation magnetization (M.sub.s) is low, 20 emu/g. Green thick films were then sintered at temperatures varying from 950 C. to 1300 C. in air. Scanning electron microscope (SEM) results at sintering temperatures of 1100 C., 1200 C., and 1300 C. showed that increased sintering temperature yielded larger grain sizes for Ni.sub.0.5Zn.sub.0.5Fe.sub.2O.sub.4 (NZF) tapes processed at a heating rate of 2 C./min in air with a sintering time of 3 hours.

[0058] FIG. 4 plots the magnetic behavior of thick films after sintering at 1100 C., 1200 C. and 1300 C.; M.sub.s is much greater than in the green thick film, and increases with increasing sintering temperature. Subsequent studies were therefore performed at 1300 C.

[0059] The effects of processing conditions on densification were studied by varying sintering time from 1 to 100 hours. Two heating rates, 2 C./min and 10 C./min, were used to study the effect of heating rate on grain size. Densification was quantified via image processing using top-view SEM images to obtain percent porosity for each sample. Final porosity data was averaged over 5 or more images from each sample. In general, increased sintering time resulted in increased grain size. At 100 hours, 100% densification was achieved with grain sizes in some cases exceeding 60 m. Faster heating rates led to smaller grain size, as was confirmed by SEM images of Ni.sub.0.5Zn.sub.0.5Fe.sub.2O.sub.4 (NZF) tapes sintered at 1300 C. under varying sintering conditions. NZF tapes were heated at 2 C./min with sintering for 10 hours; heated at 2 C./min with sintering for 48 hours; heated at 2 C./min with sintering for 100 hours; heated at 10 C./min with sintering for 10 hours; heated at 10 C./min with sintering for 48 hours; or heated at 10 C./min with sintering for 100 hours. Densification increased with sintering time, and faster heating rates yielded smaller grains. Faster heating rates still yielded 100% dense tapes after 100 hours. Cross-sectional image confirmed that densification was through-thickness in the thick films.

[0060] Magnetization behavior was characterized for each set of processing conditions to study connections between processing parameters and magnetic behavior. The resulting magnetization hysteresis is shown in FIGS. 5 and 6. The coercivity (H.sub.c) is independent of sintering conditions. For both heating rates, it was found that a sintering time of 3 hours yielded the highest M.sub.s. Not wishing to be bound by any theory, M.sub.s variations are thought to be connected to changes in grain orientation and texturing.

[0061] X-ray diffraction (XR)D was used to study changes in crystallography. All samples showed the inverse spinel structure, an example of which is shown in FIG. 7, but the normalized intensities of each plane varied significantly with sintering time. FIG. 8 shows the normalized intensities of each plane at different sintering times. As sintering time increases, the (440) planes become more prevalent, whereas for shorter times the (311) planes dominate. These changes in preferential planes could account for the surface features on the SEM images and the changes in saturation magnetization.

[0062] The results demonstrate that the chemical solution deposition approach can be scaled up to large area, thick ferrite films via tape casting. A peak sintering temperature of 1300 C. is challenging for integration with devices.

[0063] NZCF Thick Films

[0064] The as-received NZCF powder was examined initially. X-ray diffraction (XRD) was used to investigate the structure of the as-received NZCF powder. Results illustrated in FIG. 10 confirmed that the stoichiometry is an inverse spinel structure; however, small non-spinel peaks were also found to be present, suggesting the presence of other phases in the material.

[0065] Inductively coupled plasma atomic emission spectroscopy (ICP-ES) was used to investigate possible impurities that may have contributed to these additional phases. Normalizing by cobalt, the stoichiometry of the green powder was found to be Ni.sub.0.18Zn.sub.0.27Co.sub.0.03Fe.sub.2.5O.sub.4, which is significantly lacking in iron content. Small impurities of sodium and carbon were found in the material, but have not been linked to the unidentified phase in the XRD pattern.

[0066] A vibrating superconducting quantum interference device (SQUID) magnetometer was used to characterize the magnetization behavior of the as-received powder NZCF. As shown in FIG. 11, green NZCF powder was found to have a saturation magnetization of 36 emu/g.

[0067] The NZCF was used in a series of tape casting examples. The doctor blade used for these examples had a 6 inch width. The slurry to be placed in the doctor blade was created using a two-step process as illustrated in FIG. 9. 3 ounce batches of slurry were produced for each casting. First, the NZCF powder, ethanol, and blown Z-3 menhaden fish oil were combined and ball milled for 24 hours in 4 ounce bottles using 50 zirconia milling media. Then, butyl benzyl phthalate and B98 polyvinyl butyral were added to the mixture and ball milled for 24 hours. The plasticizer was added before the binder to ensure even mixing. After ball milling was completed, the slurry was immediately cast onto a mylar substrate to make sure that none of the components have time to settle.

[0068] It can be possible to use a shortened ball milling scheme. In this case, the total milling time can be reduced to 24 hours with the first step taking about 8 hours and the second about 16. There was no noticeable difference when casting.

[0069] The thickness of the green tape was set by the height of the doctor blade. The thicker the films, the greater the chance of cracking occurring on the surface of the films due to the surface of the film drying faster than the solvent can evaporate from the bottom of the sample. To find the maximum thickness possible to cast without causing surface cracking, different doctor blade heights were tested. The doctor blade height was monitored by using feeler gauges to measure the gap height. The gap height was adjusted by moving two micrometers that each controls half of the doctor blade. The doctor blade heights used were roughly 150 m, 200 m, 300 m, 450 m, and 600 m. The two smallest heights, 150 m and 200 m, created crack-free green tapes, while the two largest heights created large cracks in the films. 300 m was an intermediary height: cracks would inconsistently appear using this doctor blade height.

[0070] Cracked films removed easily from the silicone coated mylar surface. To remove tape, the mylar was slowly rolled back away from the film and the film easily falls off of the surface. Removing the crack-free films from the mylar casting surface was far more challenging. Thin casts under 200 nm adhered to the surface of the mylar. These films were so thin that any pressure applied to remove them from the mylar resulted in the films crumbling or rolling into thin strips. Contrastingly, the edges of thicker films easily released from the mylar; however, these released pieces would snap away from the rest of the film when trying to peel the center away from the surface. Once the film was removed from the mylar, films were cut down to sizes necessary for each characterization method.

[0071] Different processing conditions for NZCF were examined including sintering temperature and total sintering time. All films were processed using a 10 C./min heating rate and furnace cooled. All samples were placed on an alumina boat or plate. Samples were heated to 1000 C., 1100 C., 1200 C.,1300 C., and 1400 C. At each temperature, samples were created using a 3 hour sintering time. More sintering times were used to create a wider variety of samples at the highest two temperatures. Sintering times used for samples heated to 1300 C. were 1 hour, 3 hours, 10 hours, 24 hours, 48 hours, 72 hours, and 100 hours. Sintering temperatures for samples heated to 1400 C. included 1 minute, 5 minutes, 10 minutes, 1 hour, 3 hours, and 100 hours.

[0072] While heating, samples often gain some degree of curvature. This curvature is more severe at longer sintering times. As this curvature is prohibitive for certain characterization methods, small alumina boats are placed on top of samples to ensure that they remain flat. With sintering times longer than 10 hours, the samples frequently stick to the alumina boat and must be gently pried off using a non-magnetic pair of tweezers. Once cooled, samples were brittle and required gentle handling. Due to this brittleness, samples often broke during the removal process, so it frequently required multiple tries to obtain samples of particular shapes or dimensions.

[0073] While handling both green and fired tapes, only non-magnetic instruments were used, such as stainless steel scissors or carbon-tipped tweezers. Non-magnetic tools are required so as not to alter results by unknowingly inducing magnetization in the samples.

[0074] To create films that are stacked to increase overall thickness, 2-3 samples were placed on top of each other in an alumina boat. Another smaller alumina boat is then placed on top of the samples to apply pressure. Three samples were created using this method. The first consisted of two 1 inch.sup.2 samples stacked and heated to 1300 C. and held at temperature for 3 hours. The second was two 1 cm.sup.2 samples stacked and heated to 1300 C. with a 72 hour sintering time. The third consisted of three 1 cm.sup.2 samples fired at 1300 C. for a 100 hour sintering time. These samples were roughly handled to get a idea of the strength of the bond between layers, but were not further characterized.

[0075] Samples were characterized using various methods. Scanning electron microscopy (SEM) with energy dispersive spectrometry (EDS) was used to examine the homogeneity of elemental distributions of green and fired thick films and to determine changes in grain size and density in samples. Note that as this EDS instrument was not calibrated for NZCF samples in particular, all numerical data obtained from this technique was only used for qualitative analysis. Only un-magnetized samples were examined so as not to damage the instrument. XRD was used for phase and texture analyses. Green and heat-treated films were examined to confirm an inverse spinel structure and determine texture. Samples were leveled by placing a glass slide on top of the sample causing all spots with curvature to flatten. Eliminating curvature ensured that the x-rays hit each spot of the sample with the same angle. The sample is then placed in a low-background sample holder for measurement.

[0076] DC magnetic measurements of green and fired films were made using a SQUID magnetometer. Magnetization hysteresis loops were measured at room temperature. To ensure that the shape effect was removed from the results, each sample was ground into powder using a mortar and pestle. Each batch of powder was then split into 50 mg samples. Each sample's mass was weighed using an analytical balance and then placed into a plastic capsule for measurement. This capsule was placed into a straw and placed into the SQUID. The SQUID measured a standard hysteresis loop over the range 3 to 3 T. The magnetic moment data obtained by the SQUID is then converted to magnetization by normalizing by sample mass. To find a suitable sintering temperature for NZCF that would yield a large magnetization saturation as well as a dense film, all films were cast with a 600 m doctor blade height for the following images. SEM was used to study the changes in density of the films with temperature. As temperature increased, grain size and densification increased. At 1300 C. and above, pores were no longer prevalent in the top-view images of the samples even when scanning across the entire image. This lack of pores suggests that the films were nearing full densification; however, cross-sectional images are required to confirm densification of the full body of the sample.

[0077] Further magnification of top-down SEM images revealed triangular shaped features that began to form in the sample. These features suggested that changes in sintering conditions promotes the growth of preferential planes within the crystal structure.

[0078] EDS was used on these NZCF images as a baseline method to observe any inhomogeneity that may be present in samples. From observing these images, it does not appear that there are any inhomogeneities of the elements in these samples. This suggests that the films are completely homogeneous at least at the resolution of the instrument. Further, note that cobalt is not detected using this method. Cobalt L alpha rays overlap with both nickel and iron L alpha rays. Due to this overlap, the software would not assign any counts to cobalt, making appear as if cobalt is not present in this material. An unassigned peak, suggested the presence of cobalt; however, we were not able to confirm using this technique. Different methods must be used to confirm the stoichiometry of these NZCF samples.

[0079] Magnetization saturation variation with sintering time was studied using SQUID. As shown in FIG. 12, increasing temperature increased the saturation magnetization of the films up to 1300 C. This increase is likely attributed to increased ionic mobility, which places the cations in positions that maximizes the total magnetic moment of the material. At 1400 C., the saturation of the film is drastically decreased. At such high temperatures, it is possible that zinc loss is prevalent enough to alter positions of the cations in the spinel structure such that the iron magnetic moments begin cancelling each other, reducing the total magnetic moment. This magnetization saturation decrease at 1400 C. determined that 1300 C. would be the suitable temperature for processing NZCF.

[0080] The second goal of this project was to study the effect of changing sintering time on the density and structure of NZCF. Variations in sintering time were studied for two sets of samples: one was heated to 1300 C. and the other to 1400 C. Results for the higher temperature films will be discussed first. These films were cast with a doctor blade height of 600 m. Samples were heated with sintering times of 1 minute, 10 minutes, 1 hour, 3 hours, and 100 hours. Times at each extreme were used to fully map out the limitations on grain size and density at this temperature. FIG. 12 shows top-view SEM images of these some of these films. As expected, grain size increased with increasing sintering times. It can be observed that few pores are visible even with a sintering time as short as 1 minute. This suggests that densification began during the heating process at a temperature lower than 1400 C.

[0081] At 100 hours, an interesting microstructure occurred. The sample was divided into large grains containing directional ridge features. Some of these grains spanned the entirety of the sample and were so large that they could not be fully observed at the instrument's lowest magnification. The resolution of the EDS on the instrument was unable to detect any element concentrations on or near these ridges, so driving factors behind these features are not yet understood.

[0082] SQUID was used to determine if sintering time, in particular if the microstructural features of the 100 hours samples, had any effect on the magnetic properties of the material. The hysteresis loops of a 1 hour sintering time sample and a 100 hours sintering time sample are compared in FIG. 13. While it appears that the 1 hour sample has a slightly larger magnetization saturation, the difference between the two samples is within the error of the instrument, so it may be concluded that the microstructural features of the long sintering time sample does not impact the saturation of the material.

[0083] XRD was used on a sample heated to 1400 C. for 1 hour to determine if the inverse spinel structure remained after firing. FIG. 14 shows the XRD pattern. It was found that the inverse spinel structure is maintained after firing; however, the unidentified phase is maintained as well.

[0084] The second set of samples studied for sintering time variation were heated to 1300 C. This set was primarily created to determine whether features similar to those of the 1400 C. 100 hours sintering time sample emerge. Samples were processed with sintering times of 10 hours, 24 hours, 48 hours, 72 hours, and 100 hours.

[0085] It was observed that porosity was introduced at a sintering time of 72 hours and that most grains have ridge-like microstructural features on the surface. In the magnified image, grain boundaries are not as clearly distinguishable as those in the magnified image of the 100 hours films. The longest sintering time sample no longer has visible pores on the surface of the film. Further, at this temperature, the unusual microstructural features of the 1400 C. sample do not appear. SEM images with sintering times in between 72 and 100 hours are required to understand the transition between these microstructural arrangements.

[0086] As with the earlier set of samples, SQUID was used to determine if changes in sintering time translated to changes in saturation magnetization. Slight variations were observed in saturation magnetization at different sintering times, which is illustrated in FIG. 15, but are within the error of the instrument. Thus, as with the 1400 C. samples, sintering time did not have a large affect on the saturation magnetization of the material.

[0087] XRD was used on samples heated at 1300 C. to study how changes in sintering time affected the spinel structure of the films as well as the unidentified additional phases in NZCF. As sintering time increased, it was found that the inverse spinel structure dominated over the unidentified phases. It was observed in the XRD patterns shown in FIGS. 16-17 that at a sintering time of 48 hours, while the intensity peaks are sharp, the signal was noisy. Some of these additional peaks corresponded to the unidentified phase seen in the as-received powder, while others can be attributed to background noise. At a longer sintering time of 100 hours, the XRD pattern contained peaks that correspond only to the inverse spinel structure. Thus, despite having a high saturation and minimal porosity at short sintering times, long sintering times were required to make NZCF primarily have a spinel structure.

[0088] It should be emphasized that the above-described embodiments of the present disclosure are merely possible examples of implementations, and are set forth only for a clear understanding of the principles of the disclosure. Many variations and modifications may be made to the above-described embodiments of the disclosure without departing substantially from the spirit and principles of the disclosure. All such modifications and variations are intended to be included herein within the scope of this disclosure.