Two-channel point-diffraction interferometer

Abstract

The present invention is related with the two-channel point-diffraction interferometer for testing the optical systems or optical elements. The two-channel point-diffraction interferometer comprising a laser source inducing a linearly polarized laser beam which is divided by a beam splitter to a working channel and to a reference channel whereas the one half of light as working channel is directed from the first collimator to the working collimator by a first single-mode optical fibre to keep polarization of light unchanged, and another half of light as reference channel is directed from the second collimator to the reference collimator by a second single-mode optical fibre to keep polarization of light unchanged.

Claims

1. A two-channel point-diffraction interferometer for testing optical system or optical element comprising a frame and a housing where is placed a laser source inducing a linearly polarized laser beam which is passed through a Faraday isolator to prisms directing the linearly polarized laser beam to a beam splitter where one half of light as working channel is directed to a first collimator which is supported by an unit for adjusting two angles .sub.x, .sub.y between the optical axis of the first collimator and directing of on half of light as working channel on said collimator and thereafter directed to a working collimator connected to a plate (/4) transforming a linear polarized light into circular polarized light and focused by a working channel objective to a plate with pinholes; where another half of light as reference channel is directed through an attenuating stop to a first piezo shifter and by a right angle prism to unit for adjusting two angles .sub.x, .sub.y and thereafter directed to a second collimator and to a reference collimator connected to a plate (/4) and the reference laser beam is thereafter focused by an reference channel objective to a plate with pinholes, whereas the one half of light as working channel is directed from the first collimator to the working collimator by a first single-mode optical fibre to keep polarization of light unchanged, and another half of light as reference channel is directed from the second collimator to the reference collimator by a second single-mode optical fibre to keep polarization of light unchanged.

2. The two-channel point-diffraction interferometer according to claim 1 wherein the Faraday isolator is used for preventing laser from retro reflections of the induced linearly polarized laser beam.

3. The two-channel point-diffraction interferometer according to claim 1 wherein the unit for adjusting two angles .sub.x, .sub.y is used for tilting the working and reference channel laser beam to first and second collimator respectively to provide best coupling of light into first and second single-mode fibre respectively.

4. The two-channel point-diffraction interferometer according to claim 1 wherein the working and reference channel objectives for focusing working and reference channel laser beam respectively are placed on linear stages in order to be moved in direction of x, y, z axes.

5. The two-channel point-diffraction interferometer according to claim 1 wherein the first piezo shifter connected to an attenuating stop is moving said attenuating stop in order to partially cut light to change fringe pattern contrast by regulating light energy of reference channel making reference channel brighter or darker.

6. The two-channel point-diffraction interferometer according to claim 1 wherein a second piezo shifter connected to the right angle prism is moving said right angle prism to regulate phase of reference channel by changing its optical path length.

7. The two-channel point-diffraction interferometer according to claim 1 wherein two pinholes on plate with pinholes are placed along Y direction where a first pinhole is for focusing light of working channel and a second pinhole is for focusing light of reference channel.

8. The two-channel point-diffraction interferometer according to claim 1 wherein the first pinhole can be used for reference channel and the second pinhole can be used for working channel respectively.

Description

BRIEF DESCRIPTION OF DRAWINGS

[0009] The present invention is described in details in the following description with references to the enclosed drawings where

[0010] FIG. 1 shows the scheme of the optical instrument (a two-channel point-diffraction interferometer) according to the present invention,

[0011] FIG. 2 and FIG. 3 shows the axis of pinholes which are combined with the optical axis of imaging lens,

[0012] FIG. 4 and FIG. 5 shows a side view and a top view of a two-channel point-diffraction interferometer design realization according to the present invention.

[0013] FIG. 6 shows the alternative scheme of the optical instrument (a two-channel point-diffraction interferometer) according to the present invention.

DESCRIPTION OF EMBODIMENTS

[0014] A two-channel point-diffraction interferometer consists of the following details and elements:

[0015] A frame and housing, a laser source (1), a Faraday isolator (2), a right angle prism (3), a right angle prism (4), a beam splitter (5), an unit for adjusting two angles .sub.x, .sub.y (6), a collimator (7), a single-mode optical fibre keeping polarization of light unchanged (8), a working collimator (9), a plate (/4) (10), an working channel objective (11), an attenuating stop (12), a first piezo shifter (13), a right angle prism (14), a second piezo shifter (15), an unit for adjusting two angles .sub.x, .sub.y (16), a second collimator (17), a single-mode optical fibre keeping polarization of light unchanged (18), a reference collimator (19), a plate (/4) (20), an reference channel objective (21), a plate with pinholes (22), a test part (23), an imaging objective (24), a right angle prism (25), a ZOOM system (26), a CCD camera (27), and a computer (28) (see FIG. 1 and FIG. 4 and FIG. 5).

[0016] The working principle of two-channel point-diffraction interferometer is as follows: linearly polarized light generated by laser (1) passes through Faraday isolator (2), which prevents laser (1) from retro reflections, then light is directed by prisms (3) and (4) to beam splitter (5), after which one half of light which is working channel, passes through a first collimator (7) which can be tilted by unit (6) under two angles .sub.x, .sub.y providing best coupling of light into single-mode fibre (8), then light passes through fibre (8) and through the working collimator (9) and the plate (/4) (10), which transforms linear polarized light into circularly polarized light, and then light is focused by working channel objective (11), which is put on linear stages in order be moved in x, y, z directions, to pinhole (29) on plate with pinholes (22) (see FIG. 2 or FIG. 3); another half of light, which is reference channel, after beam splitter (5) passes through attenuating stop (12), which is moved by first piezo shifter (13) and partially cuts light to change fringe pattern contrast by regulating light energy of reference channel making reference channel brighter or darker, then light is reflected by right angle prism (14), which is moved by second piezo shifter (15) to regulate phase of reference channel by changing its optical path length, then light passes through second collimator (17), which can be tilted by unit (16) under two angles .sub.x, .sub.y providing best coupling of light into single-mode fiber (18), then light passes through reference collimator (19) and plate (/4) (20), which transforms linearly polarized light into circularly polarized light, then light is focused by reference channel objective (21), which is put on linear stages in order be moved in x, y, z directions, to pinhole (30) on plate with pinholes (22) (see FIG. 2 or FIG. 3); after diffraction by pinhole (29) light of working channel in the form of divergent beam with perfectly spherical convex wave front passes to test part (23) and is reflected back to plate with pinholes (22) from which it is reflected to imaging objective (24); after diffraction by pinhole (30) light of reference channel in the form of divergent beam with perfectly spherical convex wave front passes to imaging objective (24); while passing from plate with pinholes (22) to imaging objective (24) light of working channel and light of reference channel interfere and form fringe pattern which by imaging objective (24) and ZOOM system (26) is relayed to CCD camera (27), where fringe pattern is registered and then transmitted to computer (28); computer (28) controls the following parts of two-channel point-diffraction interferometer: first piezo shifter (13) which moves attenuating stop (12) in order to partially cut light to change fringe pattern contrast by regulating light energy of reference channel making reference channel brighter or darker; second piezo shifter (15) which moves prism (14) to regulate phase of reference channel by changing its optical path length; test part (23) mounted in some electro-mechanical stage with possibility to tilt and move test part (23) in order to put it into necessary position thereby providing necessary number of fringes in fringe pattern; imaging lens (24) mounted in some electromechanical stage with possibility to move imaging lens (24) in order to combine the optical axis of imaging lens (24) with the axis of pinhole (30) (see FIG. 2 or FIG. 3); ZOOM system (26) in order to set necessary magnification and best focus of fringe pattern; CCD camera (27) in order to set necessary gain of image, shutter speed, and number of frames to be captured.

[0017] There are two pinholes on plate with pinholes (22) placed along Y direction: pinhole (29) is for focusing light of working channel, pinhole (30) is for focusing light of reference channel (see FIG. 2 or FIG. 3). Otherwise pinhole (29) can be used for reference channel and pinhole (30) can be used for working channel respectively.

[0018] Another implementation of two-channel point-diffraction interferometer:

[0019] Differently from the prior art the working channel consists of an unit for adjusting two angles .sub.x, .sub.y (6), a first collimator (7), a single-mode optical fibre keeping polarization of light unchanged (8), a working collimator (9), a plate (/4) (10), a working channel objective (11), a plate with pinholes (31), a test part (23) (see FIG. 6), which works as follows: light after diffraction by one of pinholes (29) or (30) (see FIG. 2 or FIG. 3) passes through test part (23) to plate with pinholes (22) from which it is reflected to imaging objective (24); such scheme allows testing wave front of light transmitted through test part and thereby measure optical aberrations, uniformity and birefringence of test part material.

[0020] Advantages which the new scheme gives versus the scheme in the previous interferometer design (Patent No. EE 05614 incorporated here by reference) are: [0021] Light of two channelsworking channel (6, 7, 8, 9, 10, and 11) and reference channel (12, 13, 14, 15, 16, 17, 18, 19, 20, and 21)can be absolutely independently focused to pinholes on plate with pinholes (22) due to flexibility of single-mode optical fibres (8) and (18). Independence of focusing light of two channels contributes to stability and low vibration sensitivity of the whole device. [0022] Focusing light of channels is performed strictly along x, y, z directions due to possibility of using linear stages to move working channel objective (11) and reference channel objective (21) in contrary to the patented scheme where focusing only in z direction is strict, but no possibility to keep strictly x, y directions because of using tilting mirrors. In the patented scheme it is principally impossible to attain the same best focus as in the new scheme. This advantage helps attain the highest possible s/n ratio for the fringe pattern especially during testing glass or plastic uncoated mirrors. [0023] Excellent stability of the whole point-diffraction interferometer is achieved easier due to short optical path lengths of two channels and possibility to mount firmly working and reference channel objectives (11) and (21) on one small plate which can be made necessarily thick. This helps use the point-diffraction interferometer in any orientation keeping the light of two channels best focused to corresponding pinholes. [0024] Using pinhole plate with two pinholes (22) helps exclude mutual influence of the diffracted fields of the working and reference channels. Light of each channel is focused to its own pinhole provided that the offset between pinholes exceeds the field of view of the imaging objective (24). In this case the imaging objective (24) is focused to the pinhole to which the light of reference channel is focused and the diffracted light from the pinhole to which the light of working channel is focused passes beyond the field of view of the imaging objective (24). Therefore the image of the fringe pattern can be obtained without the imposition of interference with stray light emerging from the pinhole to which the light of working channel is focused. This is a crucial advantage of this scheme over all existing schemes of point-diffraction interferometers providing achievement of the best possible accuracy.

[0025] There is in addition other advantage as the light of working channel in the new scheme is focused only by movement of working channel objective (11) which is very light versus the more heavy unit containing beam splitter and several parts of phase shifting device together with contrast regulating parts: this advantage provides better stability of light focusing of working channel which is very important during phase shifting measurements with high accuracy.

[0026] In addition the regulation of phase of reference channel in the new scheme is performed by movement of only very light small prism (14) versus moving sufficiently heavy parts of contrast regulation and light coupling device in the provisional application: this advantage allows application of very accurate phase shifter which can carry only small light loads but provides sub-nanometer accuracy of phase shifts.

[0027] Both above mentioned advantages are crucial for achievement of extremely high accuracy of measurements in phase shifting mode which is impossible in the scheme of previous technical solutions.