FORCE BIASED SPRING PROBE PIN ASSEMBLY

Abstract

A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one rectangular cavity formed in the plunger member with a movable cylindrical bearing in the cavity that applies a slight transverse force to the plunger member ensuring good electrical contact between the plunger and the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. A spring member is positioned in the internal cavity between the first plunger member and the second plunger member. At least one rectangular cavity formed in the first plunger member with a first movable cylindrical bearing in the cavity that applies a slight transverse force to the first plunger member ensuring good electrical contact between the first plunger member and the wall of the barrel member and at least one rectangular cavity formed in the second plunger member with a second movable cylindrical bearing in the cavity that applies a slight transverse force to the second plunger member ensuring good electrical contact between the second plunger member and the wall of the barrel member

Claims

1. A force-biased spring probe pin assembly comprising: a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end; a first plunger member reciprocally mounted in said internal cavity proximate said lower end of said internal cavity; a spring member positioned in said internal cavity between said first plunger member and said second end of said internal cavity; at least a first rectangular cavity formed within said first plunger; and a first movable cylindrical bearing in said first rectangular cavity wherein said first movable cylindrical bearing applies a slight transverse force to said first plunger member ensuring good electrical contact between said first plunger member and said barrel member.

2. The assembly of claim 1, wherein the spring probe pin assembly is a Pogo assembly.

3. The assembly of claim 1, further comprising: a second plunger member reciprocally mounted in said internal cavity proximate said second end; said spring member positioned in said internal cavity between said first plunger member and said second plunger member; at least one second rectangular cavity formed within said second plunger member; and a second movable cylindrical bearing in said second rectangular cavity wherein said second movable cylindrical bearing forms good electrical contact between said second plunger member and said barrel member.

4. The assembly of claim 3, said cylindrical cavity having a first opening at said first end and a second opening at said second end, said first plunger member comprising a first probe pin extending through said first opening and said second probe member comprising a second probe pin extending through said second opening.

5. The assembly of claim 1, further including an insert formed of non conductive material and wherein said insert is positioned between said spring member and said first plunger member.

6. The assembly of claim 1, further including: at least a second rectangular cavity formed within said first plunger; and a second movable cylindrical bearing in said second rectangular cavity wherein said first and second movable cylindrical bearings apply a slight transverse force to said first and second plungers ensuring good electrical contact between said first and second plunger members and said barrel member.

7. The assembly of claim 1, wherein said movable cylindrical bearing is comprised of a conductive material.

8. The assembly of claim 1, wherein said movable cylindrical bearing is comprised of a non conductive material.

9. The assembly of claim 1, further including a deformable material within said first rectangular cavity wherein said deformable material is positioned between an inside wall of said first rectangular cavity and said first movable cylindrical bearing and wherein said deformable material applies a slight outward force to said first movable cylindrical conductive bearing and said first plunger providing improved electrical contact between said first plunger and said barrel member.

10. The assembly of claim 1, further including a spring within said first rectangular cavity wherein said spring is positioned between an inside wall of said first rectangular cavity and said first movable cylindrical bearing and wherein said spring applies a slight outward force to said first movable cylindrical bearing and said first plunger providing improved electrical contact between said first plunger and said barrel member.

11. A force-biased spring probe pin assembly comprising: a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end; a first plunger member reciprocally mounted in said internal cavity proximate said lower end of said internal cavity; a second plunger member reciprocally mounted in said internal cavity proximate said upper end of said internal cavity; a spring member positioned in said internal cavity between said first plunger member and said second plunger member; at least one first rectangular cavity formed within said first plunger with a first movable cylindrical bearing in said first rectangular cavity wherein said first movable cylindrical bearing applies slight transverse force to said first plunger member insuring good electrical contact between said first plunger member and said barrel member; and at least one second rectangular cavity formed within said second plunger with a second movable cylindrical bearing in said second rectangular cavity wherein said second movable cylindrical bearing applies slight transverse force to said second plunger member insuring good electrical contact between said second plunger member and said barrel member.

12. The assembly of claim 11, wherein the spring probe pin assembly is a Pogo assembly.

13. The assembly of claim 11, further comprising: at least a second rectangular cavity in said first plunger member with a movable cylindrical bearing within each cavity wherein said movable conductive bearings apply a slight outward force to said first plunger ensuring continuous electrical contact between said first plunger member and said barrel member; and at least a second rectangular cavity in said second plunger member with a cylindrical conductive bearing within each rectangular cavity wherein the cylindrical conductive bearings are in continuous electrical contact with said second plunger member and in continuous electrical contact with said barrel member.

14. The assembly of claim 11, said cylindrical barrel member having a first opening at said first end and a second opening at said second end, said first plunger member comprising a first probe pin extending through said first opening and said second probe member comprising a second probe pin extending through said second opening.

15. The assembly of claim 11 further including an insert between said first plunger and said spring member wherein said insert is composed of a non conductive material.

16. The assembly of claim 11, further comprising: a deformable material within said first rectangular cavity wherein said deformable material is positioned between an inside wall of said first rectangular cavity and said first movable cylindrical bearing and wherein said deformable material applies a slight outward force to said first movable cylindrical bearing and said first plunger providing improved electrical contact between said first plunger and said barrel member; and a deformable material within said second rectangular cavity wherein said deformable material is positioned between an inside wall of said second rectangular cavity and said second movable cylindrical bearing and wherein said deformable material applies a slight outward force to said second movable cylindrical bearing and to said second plunger providing improved electrical contact between said second plunger and said barrel member.

17. The assembly of claim 11, further comprising: a first spring within said first cavity wherein said first spring is positioned between an inside wall of said first rectangular cavity and said first movable cylindrical bearing and wherein said first spring applies a slight outward force to said first movable cylindrical bearing and said first plunger providing improved electrical contact between said first plunger and said barrel member; and a second spring within said second rectangular cavity wherein said second spring is positioned between an inside wall of said second rectangular cavity and said second movable cylindrical bearing and wherein said second spring applies a slight outward force to said second movable bearing and said second plunger providing improved electrical contact between said second plunger and said barrel member.

18. The assembly of claim 11, wherein said first and said second movable cylindrical bearings are comprised of a conductive material.

19. The assembly of claim 11, wherein said first and said second movable cylindrical bearing are comprised of a non conductive material.

Description

DESCRIPTION OF THE VIEWS OF THE DRAWINGS

[0012] FIG. 1 (Prior art) is a partially transparent view of a prior art single ended spring probe pin assembly.

[0013] FIG. 2 (Prior art) is a partially transparent view of a prior art dual ended spring probe pin assembly.

[0014] FIG. 3 (Prior art) is a partially transparent view of a failed prior art single ended spring probe pin assembly.

[0015] FIG. 4A is a partially transparent view of an example embodiment force-biased single ended spring probe pin assembly with a cylindrical bearing in a rectangular plunger cavity.

[0016] FIG. 4B is a partially transparent view of an example embodiment portion of the plunger with a cylindrical bearing in a plunger cavity.

[0017] FIG. 5 is a partially transparent view of an example embodiment force-biased dual ended spring probe pin assembly with cylindrical bearings in rectangular plunger cavities.

[0018] FIG. 6 is a partially transparent view of an example embodiment of a spring-biased probe pin assembly with cylindrical bearings in rectangular plunger cavities and an insert between the plunger and the spring.

DETAILED DESCRIPTION OF EXAMPLE EMBODIMENTS

[0019] Embodiments of the invention are described with reference to the attached figures. The figures are not drawn to scale and they are provided merely to illustrate the invention. Several aspects of the embodiments are described below with reference to example applications for illustration. It should be understood that numerous specific details, relationships, and methods are set forth to provide an understanding of the invention. One skilled in the relevant art, however, will readily recognize that the invention can be practiced without one or more of the specific details or with other methods. In other instances, well-known structures or operations are not shown in detail to avoid obscuring the invention. The embodiments are not limited by the illustrated ordering of acts or events, as some acts may occur in different orders and/or concurrently with other acts or events. Furthermore, not all illustrated acts or events are required to implement a methodology in accordance with the present invention.

[0020] As used herein force-biased spring probe pin assembly refers to a spring probe pin assembly that has been modified to apply a slight force that ensures good electrical contact between the plunger and the cylindrical barrel to avoid significant current from flowing through and damaging the spring.

[0021] Embodiment force-biased spring probe pin assemblies are illustrated in FIG. 4A and FIG. 5. FIG. 4A is a force-biased single ended spring probe pin 402 assembly 400. FIG. 5 is a force-biased dual ended, 402 and 502, spring probe pin assembly 500.

[0022] As is illustrated in FIG. 4A, a rectangular cavity is formed within the plunger 404. A movable cylindrical bearing 420, which may be conductive or may be non conductive, within this rectangular cavity applies a slight transverse force to the plunger 404 ensuring good electrical contact between the plunger 404 and the cylindrical barrel 406.

[0023] As is illustrated in FIG. 4A, a deformable material 405 such as plastic or rubber may be positioned between the inner wall of the rectangular cavity and the movable cylindrical bearing 420 to apply a slight outward force to the cylindrical bearing 420 to ensure good electrical contact between the plunger 404 and the cylindrical barrel member 406.

[0024] Alternatively as shown in FIG. 4B, a metallic spring 407 or springs between the inner wall of the plunger 404 cavity and the movable cylindrical bearing 420 may provide a slight outward force to the plunger 404 to ensure good electrical contact between the plunger 404, and the cylindrical barrel member 406.

[0025] One movable cylindrical bearing 420 is shown in FIG. 4A. More movable cylindrical bearings 420 may be used if desired. The movable cylindrical bearings 420 in the embodiment force-biased spring probe pin assembly 400 are found to significantly increase the number of times the force-biased spring probe pin assembly 400 may be used prior to failure.

[0026] As is illustrated in FIG. 6, an insert 616 of a non conductive material may be positioned between the spring 408 and the plunger 404 to prevent current from flowing through the spring 408 and damaging it.

[0027] While various embodiments of the present invention have been described above, it should be understood that they have been presented by way of example only and not limitation. Numerous changes to the disclosed embodiments can be made in accordance with the disclosure herein without departing from the spirit or scope of the invention. Thus, the breadth and scope of the present invention should not be limited by any of the above described embodiments. Rather, the scope of the invention should be defined in accordance with the following claims and their equivalents.