Tape head with narrow skiving edges fitted to transducers
09691414 ยท 2017-06-27
Assignee
Inventors
- Robert G. Biskeborn (Hollister, CA, US)
- Johan B. C. Engelen (Zurich, CH)
- Mark A. Lantz (Thalwil, CH)
- Hugo E. Rothuizen (Oberrieden, CH)
Cpc classification
G11B5/1871
PHYSICS
International classification
G11B5/00
PHYSICS
G11B5/008
PHYSICS
Abstract
A tape head includes a body, which includes a transducer. The transducer may be a read or write element, respectively configured so as for the tape head to read from or write to a tape, in operation. The body exhibits a tape-bearing surface, which is typically configured to face and interact with the tape, in operation. The tape head further includes a closure. The closure is fixed on a leading side or a trailing side of the body and includes a skiving edge vis--vis the transducer. The skiving edge is adjoined by non-skiving edges. Finally, the closure has a top surface that meets the skiving edge; the top surface is level with the tape-bearing surface. Also included are related devices; tape head apparatuses for recording and/or reproducing tapes, comprising such tape heads; and methods of fabrication thereof.
Claims
1. A tape head comprising: a body, said body in turn comprising: a transducer, the transducer being a read or write element, respectively configured so as for the tape head to read from or write to a tape, in operation; and a tape-bearing surface, and a closure fixed on a leading side or a trailing side of the body; wherein said closure comprises a skiving edge vis--vis the transducer, the skiving edge adjoined by non-skiving edges; and wherein said closure has a top surface meeting the skiving edge, wherein the top surface is level with the tape-bearing surface.
2. The tape head according to claim 1, wherein a width of the skiving edge is at least equal to a width of the transducer, as measured along a lateral direction parallel to the tape-bearing surface and perpendicular to a longitudinal direction of circulation of the tape.
3. The tape head according to claim 1, wherein the non-skiving edges are respectively formed by two beveled or rounded portions of the closure, at each end of the skiving edge.
4. The tape head according to claim 1, wherein the non-skiving edges are respectively formed by two recessed portions, at each end of the skiving edge, wherein an external surface of each of the recessed portions faces the tape, in operation, and is recessed with respect to the top surface of the closure.
5. The tape head according to claim 4, wherein the external surface of each of the two recessed portions is beveled or rounded.
6. The tape head according to claim 1, wherein the closure is a monobloc closure.
7. The tape head according to claim 6, wherein the closure comprises aluminum-titanium carbide.
8. The tape head according to claim 1, wherein the tape head comprises two closures, and wherein: a first one of the closures is fixed on the leading side of the body; and a second one of the closures is fixed on the trailing side of the body, wherein each of the closures comprises: a skiving edge; and non-skiving edges, and wherein the skiving edge of each of the closures: is adjoined by non-skiving edges of said each of the closures; and extends vis--vis the transducer; and wherein, each of the closures has a top surface that meets the skiving edge of said each of the closures, the top surface being level with the tape-bearing surface.
9. The tape head according to claim 1, wherein the tape head comprises two or more transducers, and wherein the closure comprises two or more skiving edges vis--vis the two or more transducers, respectively, each of the two or more skiving edges adjoined by non-skiving edges.
10. The tape head according to claim 1, wherein the tape head is a planar tape head, the transducer being an in-plane transducer, whose top poles extend in-plane with the tape-bearing surface.
11. The tape head according to claim 1, wherein the transducer is a servo writer.
12. A tape head apparatus for carrying out at least one of recording and reproducing multi-track tapes, said tape head apparatus comprising a tape head, said tape head in turn comprising: a body, said body in turn comprising: a transducer, the transducer being a read or write element, respectively configured so as for the tape head to read from or write to a tape, in operation; and a tape-bearing surface, and a closure fixed on a leading side or a trailing side of the body; wherein said closure comprises a skiving edge vis--vis the transducer, the skiving edge adjoined by non-skiving edges; and wherein said closure has a top surface meeting the skiving edge, wherein the top surface is level with the tape-bearing surface.
13. A method of fabrication of a tape head, the method comprising: providing a substrate; patterning a hard mask on a first portion of the substrate; depositing a photoresist on a second portion of the substrate, which second portion includes said first portion, so as for a front of the photoresist to substantially meet a front edge of the patterned hard mask, the front edge extending along a lateral direction of the substrate, the lateral direction parallel to the tape-bearing surface and perpendicular to a longitudinal direction of circulation of the tape; transferring a topography of the reflowed photoresist into the substrate to obtain a substrate with a skiving edge extending along said lateral direction, wherein the skiving edge is adjoined by non-skiving edges, the substrate obtained forming a closure having a top surface meeting the skiving edge; and fixing the closure to a body of the tape head, said body in turn comprising: a transducer, the latter being a read or write element, respectively configured so as for the tape head to read from or write to a tape, in operation; and a tape-bearing surface, wherein, at fixing, the closure is fixed on the leading side or the trailing side of the body, so as for the top surface of the closure to be level with the tape-bearing surface; and the skiving edge to be vis--vis the transducer.
14. The method according to claim 13, wherein depositing the photoresist further comprises heating the deposited photoresist to reflow it, so as for the front of the reflowed photoresist to exhibit beveled or rounded portions on opposite sides of the patterned hard mask, such that the skiving edge subsequently obtained is adjoined by two beveled or rounded portions, one at each end of the skiving edge, said beveled or rounded portions forming said non-skiving edges.
15. The method according to claim 13, further comprising, after transferring and prior to fixing, stripping remaining parts of the photoresist and the hard mask.
16. The method according to claim 15, further comprising, after stripping and prior to fixing, dicing the substrate to obtain the closure.
17. The method according to claim 13, wherein a width of the hard mask provided is substantially equal to or greater than the width of the transducer, said widths measured along said lateral direction.
18. The method according to claim 13, wherein transferring the topography of the photoresist is carried out so as for the substrate eventually obtained to have two recessed portions forming said non-skiving edges, one at each end of the skiving edge, wherein an external surface of each of the recessed portions is recessed with respect to the top surface of the closure.
19. The method according to claim 13, wherein the closure formed comprises aluminum-titanium carbide.
20. The method according to claim 13, wherein the hard mask patterned comprises silicon dioxide.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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(9) The accompanying drawings show simplified representations of devices or parts thereof, as involved in embodiments. Technical features depicted in the drawings are not to scale. In particular, the scales assumed for axes x, y and z may differ. For example, in
DETAILED DESCRIPTION OF EMBODIMENTS OF THE INVENTION
(10) As it can be realized, the second technology (pure thin film planar servo writers) evoked in the background section may substantially suffer from friction and wear. Friction is problematic as it results in velocity variations during servo formatting that cause written-in velocity noise and degrade servo performance. Wear of the servo writer is also problematic as it limits the useful lifetime of a servo write head.
(11) The wear robustness of a planar tape head can be significantly improved by mounting a hard ceramic closure on the leading edge (for asymmetrically wrapped heads with a trailing edge wrap angle of <0 degrees) or on both the leading and trailing edges for heads used in combination with a positive wrap angle on both the leading and trailing edges. In order to assure good contact between the tape and planar servo writer, the skiving edge should be sharp and the tape-bearing surfaces of the closure(s) and the planar head should be co-planar. Such closures are already known from their use in flat profile read/write heads in tape drives (see Hard-disk-drive technology flat heads for linear tape recording R. Biskeborn and J. Eaton, IBM Journal of Research and Development, Volume: 47, Issue: 4 pp 385-400, and Flat-profile tape recording head, R. Biskeborn and J. Eaton, IEEE Transactions on Magnetics, Volume: 38, Issue: 5, pp 1919-1921).
(12) Such heads are manufactured by gluing a closure on the edge of a tape head chip and lapping to achieve a flat planar tape-bearing surface. Good alignment (co-planarity) between the tape-bearing surface of the closure and the head chip is required to ensure good tape-head contact (i.e., a low spacing therebetween). For read/write heads, planarity can be achieved by lapping of the head chip and the closure to a flat surface. In addition to making the surfaces flat and planar, the lapping process has the added benefit of creating a sharp skiving edge on the closure.
(13) However, as present Inventors have realized, such heads still suffer from friction. In addition, the above process is not suited for planar heads (because of the in-plane transducers) as the lapping process may damage the transducers. More generally, lapping may cause damages to a tape-bearing surface.
(14) Having realized these potential issues, present inventors have developed methods for (pre)shaping the closure to achieve reduced friction between the tape and the tape-bearing surface. In addition, they have developed methods for mounting a closure onto a tape head, where the closure is profiled such as to make it possible to reach co-planarity with the surface of the tape bearing, without resorting to a lapping process.
(15) The present solutions can notably find applications for planar servo writers (e.g., thin film planar servo writers). However, and the one skilled in the art may appreciate, the present solutions may potentially apply to any type of tape heads and, in particular, to planar tape heads for use in tape drives.
(16) Referring generally to
(17) Basically, the tape head comprises a body 5, 5.sub.a, 5.sub.b. The body 5, 5.sub.a, 5.sub.b exhibits a tape-bearing surface 20, which is the surface meant to contact the magnetic tape and interact therewith, to read from or write to the tape 10 (see
(18) The tape-bearing surface is preferably planar (i.e., flat) and may be defined by a reduced surface portion 20 surrounding the transducer 22 and slightly protruding from a bearing surface 5.sub.s of the body 5, as assumed in
(19) In addition, the body 5, 5.sub.a, 5.sub.b comprises one or more transducers 22. Only one transducer 22 is shown in the accompanying figures except in
(20) Such a transducer is preferably partly buried in the body. The top poles 22.sub.p (see
(21) The tape head further comprises a closure 50-50.sub.c. As illustrated in the accompanying drawings, a closure may be fixed on a leading side 30 (
(22) An edge as understood here refers to the outside (external) limit of an object portion, where two (transverse) surface portions meet. The skiving edges 58.sub.l are sharp and are located at the level of the top surface 58.sub.s (thus at a same level as the tape-bearing surface 20), whereas the non-skiving edges 51.sub.l are either rounded, beveled or otherwise blunt (i.e., less sharp than the skiving edges, as in
(23) A closure 50-50.sub.c otherwise shows a top surface 58.sub.s that meets the skiving edge 58.sub.l. If the adjoining (non-skiving) surface portions 51.sub.s are not recessed with respect to the top surface 58.sub.s, as in
(24) Because (i) the top surface 58s is co-planar with the tape-bearing surface 20 and (ii) the relative fraction of the skiving edge(s) is narrowed due to adjoining non-skiving edges, the present approach makes it possible to further reduce friction between the tape 10 and the tape-bearing surface 20 and, therefore, to reduce wear. Namely, a close contact between the tape and the tape-bearing surface is maintained only where necessary, i.e., at the level of the skiving-edges 58.sub.l (and the respective top surfaces 58s). Yet, the necessary geometry can easily be achieved thanks to the fact that skiving-edges and non-skiving edges are fabricated on a closure 50-50.sub.c that is initially separated from the body 5, 5.sub.a, 5.sub.b and is subsequently mounted onto or fixed to the body 5, 5.sub.a, 5.sub.b.
(25) In addition, and as seen in the accompanying drawings, the tape-bearing surface and adjoining closure(s) have a step-like cross-section, which allows the area of the tape head that comes into contact with the tape 10 to be effectively decreased, as only the area 20 touches the tape 10, in operation. Indeed, and as it can be realized, the total footprint of the head (exposed to the tape) cannot be indefinitely reduced, owing to wiring and other parts needed in the head, be it to electrically connect the transducers 22 to other components of a tape head apparatus (not shown). However, it is possible to trim the top portion of the tape head, e.g., by etching portions surrounding the intended contact surface 20. This way, one obtains a step-like structure (whereby only a residual surface 20 touches the tape 10), which makes it possible to reduce the effective contact area and, hence, to further reduce friction and wear. The minimal surface area 20 that can be achieved (to create a step-like profile) depends on the type and arrangement of transducers 22 utilized.
(26) As illustrated in
(27)
(28) On the contrary, in embodiments such as depicted in
(29) In all cases (
(30) The closure 50-50.sub.c used herein are preferably monobloc, and appropriately structured to confer desired properties, in terms of (reduced) friction. Example of fabrication processes are discussed later. The closure 50-50.sub.c may notably comprises aluminum-titanium carbide, i.e., the closure may be structured from an aluminum-titanium carbide substrate, or AlTiC substrate (e.g., a wafer that essentially comprises Al, Ti and C elements, in an Al2O3-TiC composition). As known per se, photoresist patterns can easily be transferred into an AlTiC substrate, e.g., by reactive ion etching. Such a process results in clean step-like structures, as needed in embodiments.
(31)
(32) Referring back to
(33) At present, dimensions of the structural features of the closures are discussed in detail. The embodiments of
(34) Because of the riser 40, the recessed surface 52.sub.s is recessed from the contact area 20+58.sub.s by a distance h that corresponds to the height of the riser 40, i.e., along x. The riser 40 and, more generally, the step-like structure 58.sub.s-40-52.sub.s can notably be obtained according to methods described later in reference to
(35) However, and as it can further be realized, the surrounding surface portions 52.sub.s cannot be too deeply recessed, else the wirings (needed to connect the transducers 22) and other sensitive parts possibly contained in the head may be affected. Thus, the distance h should ideally be as small as small as possible, to avoid damaging the tape head and to facilitate fabrication.
(36) Still, the distance h cannot be too small either with respect to the width w of the recessed surface 30 (w extends along a direction parallel to the longitudinal direction z of circulation of the tape 10).
(37) A suitable distance h is, in practice, preferably between 1 and 10 microns, to ease the transfer process, at fabrication (step S20,
(38) Possible ranges of for dimensions for the head components follow: The length of the leading edge (i.e., formed by edges 51.sub.l and 58.sub.l, along axis y) preferably corresponds to the whole length of the head (as assumed in
(39) As seen in
(40) Note that the above considerations as to the ratio h/w are formulated with respect to the step-like structure 58.sub.s-40-52.sub.s. However, since a major portion of the leading edge may be formed by the step-like structure 51.sub.s-40-52.sub.s, the same considerations may be used in respect of the ratio h/w, where h this time denotes the (vertical) distance between the surfaces 51s and the recessed surface 52.sub.s. I.e., one may already want to impose a ratio h/w larger than or equal to tan(), to prevent the tape from touching the surface 52.sub.s, in operation. Whether to do so depends also on the actual configuration of the portions 52s, which may be beveled or rounded, a thing that mitigates the risk of touch down.
(41) Present tape heads are advantageously used in tape head apparatuses for recording and/or reproducing multi-track tapes. The present invention can accordingly be embodied as such an apparatus.
(42) Referring now to
(43) Such a method makes use of a substrate 500, onto which a hard mask 100 is patterned (step S1,
(44) Then, a photoresist 110 is deposited and, e.g., patterned S2 on a second portion of the substrate. The second portion includes said first portion, i.e., it is larger than the first portion (corresponding to the hard mask 100), especially on the lateral sides thereof (along axis y). As illustrated in
(45) Next, the topography of the reflowed photoresist 110 is transferred S3, S4 into the substrate 500 Thanks to the hard mask 100, this makes it possible to eventually obtain S4-S5 a substrate 500 with a skiving edge 58.sub.l extending along the lateral direction y, and which is laterally adjoined by non-skiving edges 51.sub.l. The substrate 500 obtained can otherwise be used as a closure, which, as per the fabrication steps described above, has a top surface 58.sub.s that meets the skiving edge 58.sub.l.
(46) Finally, the closure 50.sub.a can be fixed
(47) The same process can be applied to obtain and fix a closure having several skiving edges, arranged laterally along direction y. In this case, a respective number of hard masks 100 are patterned and a single layer of photoresist may be deposited over all the masks 100.
(48) The transfer of the topography is typically performed by way of an etch process such as reactive ion etching. The hard mask material is preferably silicon dioxide, and is preferably deposited on top of an AlTiC substrate. In variants, the hard mask may for instance comprise titanium. More generally, it may comprise a material that is resilient against the reactive ion etching step, but that can be etched using another method such as wet etching so that the mask can be patterned.
(49) The above method can advantageously be used to obtained rounded or beveled lateral portions. Namely, the deposited photoresist 110 may be heated (after or during deposition S2) so as to reflow it. As a result, and because of changes occurring in the surface tension of the material, the front of the reflowed photoresist 110 will exhibit a beveled or rounded front, as seen in step S2. Because of the hard mask, the beveled or rounded front will give rise to beveled/rounded portions 51.sub.s on opposite sides of the patterned hard mask, after the transfer S3, as seen at S4. Thus, the skiving edge 58.sub.l subsequently obtained is adjoined by two beveled or rounded portions 51.sub.s, one at each end of the skiving edge 58.sub.l. The beveled or rounded portions meet respective non-skiving edges on the right-hand side.
(50) In embodiments, remaining parts of the photoresist 110 and the hard mask 100 are stripped, step S4, after the transfer and prior to fixing the closure. A monobloc closure can be obtained by stripping all the remaining parts of the photoresist 110 and the hard mask 100, which likely give rise to a cleaner, better defined closure. Yet, one may, in variants, keep residual portions or the upper materials 100, 110. In other variants, the upper portion of the closure may be lapped.
(51) If necessary, the substrate 500 obtained at the end of step S4 is furthermore diced, step S5, to obtain a narrow closure element, and this, prior to fixing it to the body.
(52) The width of the hard mask 100 provided is preferably substantially equal to, or greater than the width of the transducer 22 (said widths measured along lateral direction y), for reasons discussed earlier.
(53) In embodiments, the transfer of the topography of the photoresist 110 may be carried out so as for the substrate 500 eventually obtained to exhibit laterally recessed portions 51.sub.s, as in
(54) In preferred embodiments, several of the aspects discussed above in reference to
(55) In variants, steps S1-S4 may be integrated in a process such as illustrated in
(56) First, an AlTiC wafer 50.sub.w is provided that is coated with a photoresist 52.sub.p, and lithographically patterned, step S10, to give rise to apertures. Then, S20: the pattern is transferred into the AlTiC wafer by reactive ion etching, creating an edge which will serve as a skiving edge 58.sub.l, in operation. During steps 30-50: sections of the wafer are removed using repeated passes of a wafer saw 80 to cut partially through the depth of the wafer. At step S60: an additional deeper cut is made with the wafer saw to produce a region with a residual thickness of approximately 50 microns. At present, upper surfaces 52.sub.s, 53.sub.s and 54.sub.s (compare with
(57) Steps S1-S4 described in reference to
(58) Next, regarding the closure assembly: a planar tape head body 5 (obtained from a wafer chip) and a closure are placed upside-down (i.e., with the write elements and the skiving edges down) on a flat reference surface, S80. Note that the dimensions of the distal flanks 55 (along x) may be slightly larger than those of the proximal flanks 51 to compensate for the difference of height induced by the intercalated process S1-S4. The two parts are then aligned, and glued S90, under a small applied load. The use of the reference surface ensures the co-planarity of the (planar) tape-bearing surface and the closure's top surfaces (upside-down). Using a glass plate (or any other transparent material) for the reference surface 70, the surfaces of the body and the closure can be viewed using an inverted microscope, to verify the co-planarity of the surfaces and adjust the alignment of the elements, as well as the applied load, if necessary, before gluing. After the glue 60 is cured S100, the free, distal flank 55 of the closure is removed S110 by breaking at the level of the thinned region 52.
(59) If assembly is performed at the row bar level, the row bars can be diced into individual, planar servo-writers in a subsequent step (not shown).
(60)
(61) While the present invention has been described with reference to a limited number of embodiments, variants and the accompanying drawings, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the scope of the present invention. In particular, a feature (device-like or method-like) recited in a given embodiment, variant or shown in a drawing may be combined with or replace another feature in another embodiment, variant or drawing, without departing from the scope of the present invention. Various combinations of the features described in respect of any of the above embodiments or variants may accordingly be contemplated, that remain within the scope of the appended claims. In addition, many minor modifications may be made to adapt a particular situation or material to the teachings of the present invention without departing from its scope. Therefore, it is intended that the present invention not be limited to the particular embodiments disclosed, but that the present invention will include all embodiments falling within the scope of the appended claims. In addition, many other variants than explicitly touched above can be contemplated. For example, other materials than those explicitly mentioned may be used for the substrate 500 or 50.sub.w.