Method and system for controlling an operation of a thermoelectric device

Abstract

According to some embodiments, a thermoelectric system includes a thermoelectric device having a first surface and a second surface and a power source configured to deliver a voltage across the thermoelectric device to selectively activate or deactivate the thermoelectric device, wherein the first surface is configured to heat and the second surface is configured to cool when the thermoelectric device is activated. The system further includes a processor configured to determine a potential between the first surface and the second surface when the thermoelectric device is deactivated, correlate the potential to a temperature of the first surface and adjust the correlated temperature of the first surface based on an ambient temperature.

Claims

1. A thermoelectric system comprising: a thermoelectric device having a first surface and a second surface; a power source configured to deliver a voltage signal across the thermoelectric device to power the thermoelectric device, wherein the voltage signal is configured to be delivered at a duty cycle that includes a plurality of on and off power pulses, wherein the plurality of on and off power pulses are a plurality of alternating on-time periods and off-time periods, whereby each of the on-time periods is a time during which a power is supplied to the thermoelectric device and each of the off-time periods is a time during which the power is switched off; wherein the first surface is configured to heat and the second surface is configured to cool when the thermoelectric device is being powered; and a processor configured to: adjust an amount of power supplied to the thermoelectric device by varying the duty cycle of the voltage signal supplied to the thermoelectric device and determine a potential difference between the first surface and the second surface during at least one of the off-time periods between consecutive on-time periods within the duty cycle; determine a temperature of the first surface based on the potential difference and on an ambient temperature.

2. The system of claim 1, wherein the processor is further configured to: compare the temperature of the first surface with a desired temperature; and adjust the amount of power supplied to the thermoelectric device by the power source, thereby reducing an amount of error between the temperature of the first surface and the desired temperature.

3. The system of claim 1, further comprising a second thermoelectric device.

4. The system of claim 3, wherein the processor is further configured to: determine a potential difference between a first and a second surface of the second thermoelectric device during at least one of the off-time periods between consecutive on-time periods within the duty cycle; correlate the potential difference between the first and second surfaces of the second thermoelectric device to a temperature of the first surface of the second thermoelectric device; and compare the temperature of the first surface of the second thermoelectric device with the temperature of the first surface of the first thermoelectric device; adjust an output to at least one of the first and second thermoelectric devices based on the comparison.

5. The system of claim 1, wherein the thermoelectric device is located in an automobile seat.

6. The system of claim 1, wherein the thermoelectric device is located in a cup holder or cool bin.

7. The system of claim 1, wherein the thermoelectric device is located in a bed system.

8. The system of claim 1, wherein the thermoelectric device is located in a medical application.

9. The system of claim 1, wherein the thermoelectric device is located in a battery thermal management application or system.

10. The system of claim 1, wherein the system is configured to provide temperature controlled fluid to a vehicle battery.

11. A method of controlling a duty cycle or a power level of a thermoelectric device, the method comprising: adjusting an amount of power supplied to the thermoelectric device by varying a duty cycle of the thermoelectric device, the duty cycle including a plurality of on and off power pulses, wherein the plurality of on and off power pulses are a plurality of alternating on-time periods and off-time periods, whereby each of the on-time periods is a time during which a power is supplied to the thermoelectric device and each of the off-time period is a time during which the power is switched off; determining a potential difference between a first surface of the thermoelectric device and a second surface of the thermoelectric device during at least one of the off-time periods between consecutive on-time periods within the duty cycle; wherein the first surface is configured to heat and the second surface is configured to cool when the thermoelectric device is electrically activated or powered; correlating the potential difference with a temperature of the first surface of the thermoelectric device; and adjusting the duty cycle or the power level of the thermoelectric device based on a comparison of the temperature of the first surface of the thermoelectric device with a desired temperature.

12. A method of measuring a temperature of a side of a thermoelectric device having a first side and a second side, the method comprising: adjusting an amount of power supplied to the thermoelectric device by varying a duty cycle of a power signal supplied to the thermoelectric device, the duty cycle including a plurality of on and off power pulses, wherein the plurality of on and off power pulses are a plurality of alternating on-time periods and off-time periods, whereby each of the on-time periods is a time during which a power is supplied to the thermoelectric device and each of the off-time period is a time during which the power is switched off; measuring a voltage difference between a first and a second side during at least one of the off-time periods between consecutive on-time periods within the duty cycle; and correlating the voltage difference to a temperature of at least one side of the thermoelectric device.

13. The method of claim 12, wherein correlating the voltage difference to the temperature of the at least one side is accomplished using a lookup table.

14. A method of providing temperature control to a system comprising a thermoelectric device including a first surface and a second surface, the method comprising: adjusting an amount of power supplied to the thermoelectric device by varying a duty cycle of a power signal, the duty cycle including a plurality of on and off power pulses, wherein the plurality of on and off power pulses are a plurality of alternating on-time periods and off-time periods, whereby each of the on-time periods is a time during which a power is supplied to the thermoelectric device and each of the off-time period is a time during which the power is switched off; determining a potential difference between the first surface and the second surface during at least one of the off-time periods between consecutive on-time periods within the duty cycle; correlating the potential difference with a temperature of the first surface; comparing the temperature of the first side with a desired temperature value; and adjusting the power received by the thermoelectric device based on the comparison, thereby changing an amount of heat exchanged between a fluid and at least one of the first surface and the second surface, wherein the fluid is provided to the system.

15. The method of claim 14, wherein the system comprises a vehicle seat.

16. The method of claim 14, wherein the system comprises a cup holder or cool bin.

17. The method of claim 14, wherein the system comprises a medical application.

18. The method of claim 14, wherein the system comprises a bed system.

19. The method of claim 14, wherein the system comprises a cooling tower or other cooling device or system.

20. The method of claim 14, wherein the system comprises battery thermal management.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) Various embodiments are depicted in the accompanying drawings for illustrative purposes, and should in no way be interpreted as limiting the scope of the embodiments. In addition, various features of different disclosed embodiments can be combined to form additional embodiments, which are part of this disclosure.

(2) FIG. 1 illustrates an embodiment of a TE system in a powered mode, the system including a temperature sensor associated with a TE device.

(3) FIG. 2A illustrates another embodiment of a TE system in a powered mode, the system not including a temperature sensor associated with a TE device.

(4) FIG. 2B illustrates the TE system of FIG. 2A in a depowered mode.

(5) FIG. 2C illustrates a vehicle seat as an example of use of the TE system of FIG. 2A.

(6) FIG. 3 illustrates a chart of an example of voltage applied to a TE device as a function of time.

(7) FIG. 4 illustrates an embodiment of a method of producing a lookup table of temperatures of a surface of a TE device and corresponding Seebeck potentials.

(8) FIG. 5 illustrates an embodiment of a method of controlling a TE device based on the Seebeck potential of the TE device.

(9) FIG. 6 illustrates an embodiment of a TE system in a fluid conduit, the TE system including a plurality of TE devices in parallel with respect to a flow of fluid through the conduit.

(10) FIG. 7 illustrates an embodiment of a TE system in a fluid conduit, the TE system including a plurality of TE devices in series with respect to a flow of fluid through the conduit.

(11) FIG. 8 illustrates an embodiment of a TE system having a TE device with multiple zones.

(12) FIG. 9 illustrates a schematic view of a TE system according to an embodiment.

(13) FIG. 10 illustrates a schematic view of a TE system according to an embodiment.

(14) FIG. 11 illustrates a schematic view of a TE system according to an embodiment.

DETAILED DESCRIPTION OF SOME EMBODIMENTS

(15) A variety of examples of TE systems and control methods therefore are described below to illustrate various examples that may be employed to achieve the desired improvements. These example embodiments are only illustrative and not intended in any way to restrict the general inventions presented and the various aspects and features of these inventions. For example, although certain embodiments and examples are provided herein in the automotive, medical, food service, aerospace, evaporative cooling, and other fields, the inventions are not confined or in any way limited or restricted to such fields and certain embodiments can be used in other fields. As discussed in greater detail herein, the various temperature detection and/or control schemes or methods discussed herein provide one or more benefits, such as, for example, enabling a system to respond more reliably and quickly, improving the reliability of a system (e.g., less failure modes or incidents) and/or the like. Furthermore, the phraseology and terminology used herein is for the purpose of description and should not be regarded as limiting. No features, structure, or step disclosed herein is essential or indispensible.

(16) As illustrated in FIG. 1, a TE system 100 can include a TE device 102, which in turn comprises a first side 106 and a second side 108. The TE device 102 can be operably coupled with a power source 104. The power source 104 can be configured to apply a voltage to the TE device 102. When the voltage is applied to the TE device 102, one side (e.g., the first side 106) creates heat while the other side (e.g., the second side 108) absorbs heat. Switching polarity of the circuit typically creates the opposite effect. In a typical arrangement, the TE device 102 comprises a closed circuit that includes dissimilar materials. As a DC voltage is applied to the closed circuit, a temperature difference 110 is produced at the junction of the dissimilar materials. Depending on the direction of the electrical current, heat is either emitted or absorbed at a particular junction. In some embodiments, the TE device 102 includes several solid state P and N type semi-conductor elements connected in series. In certain embodiments, the junctions are sandwiched between two electrical isolation members (e.g., ceramic plates), which can form the cold side and the hot side of the TE device 102. The cold side can be thermally coupled to an object to be cooled and the hot side can be thermally coupled to a heat sink which dissipates heat to the environment. In some such embodiments, a fluid in a fluid conduit (e.g., air in a duct) is passed over or near one of the sides 106, 108 in order to adjust the temperature of the fluid, which can then be delivered to a desired location (e.g., a seat, bed, cup holder or climate controlled compartment, cooling tower, battery, or otherwise) to provide temperature control thereof. Further details and examples of some embodiments of thermoelectric devices are provided in U.S. Patent Application Publication No. 2008/0047598, filed Aug. 3, 2007, titled THERMOELECTRIC DEVICE, the entirety of which is incorporated herein by reference.

(17) To facilitate such temperature control, it can be helpful to determine the ambient temperature, the temperature of at least one of the sides 106, 108 and/or a temperature within the TE device 102. Thus, some embodiments of the system 100 include: an ambient temperature sensor 120 and/or a TE device temperature sensor 112 (such as a thermistor). The TE device temperature sensor 112 can be located inside, adjacent to, near, or otherwise in close proximity to the TE device 102. Wires 112a, 112b and/or other electrically conductive connectors (e.g., electrical traces, busses, etc.) can electrically connect the temperature sensor 112 to other electrical components, such as a processor 118.

(18) However, embodiments including one or more TE device temperature sensors 112 can be less desirable due to, for example, the cost of the sensor 112, the additional manufacturing steps and complexity associated with positioning the sensor 112 in the system 100, the possibility of sensor failure, and/or one or more other reasons or considerations. Furthermore, wires 112a, 112b or other electrical connectors can add manufacturing steps, such as connecting the wires to the sensor 112, routing the wires 112a, 112b through the TE device 102, routing the wires 112a, 112b to the processor 118, and connecting the wires 112a, 112b to the processor 118. Moreover, the temperature sensor 112 and the wires 112a, 112b are points of potential failure and thus can reduce the overall reliability of the system 100.

(19) With regard to FIG. 2A, another embodiment of a TE system 200 is illustrated. The system 200 resembles or is identical to the system 100 discussed above in many respects, with some of the differences discussed below. Accordingly, numerals used to identify features of the system 200 are incremented by a factor of one hundred to identify like features of the system 200. This numbering convention generally applies to the remainder of the figures. Any component or step disclosed in any embodiment in this specification can be used in other embodiments.

(20) Like the system 100, the system 200 can include a power source 204 operably coupled with a TE device 202 having first and second sides 206, 208. However, unlike the system 100, the system 200 does not employ a temperature sensor (see 112 in FIG. 1) to determine the temperature of one of the sides 206, 208. Rather, as discussed in greater detail below, the system 200 is configured to determine the temperature of one of the first and second sides 206, 208 (or a temperature differential across the TE device 202) by the potential induced by the Seebeck effect.

(21) As shown in FIG. 2B, in certain embodiments, the power source can be turned off (e.g., supply zero volts to the TE device 202). In such instances, a temperature difference 210 between the first and second sides 206, 208 can induce a potential 214 between the first and second sides 206, 208. The inducement of the potential 214 is known as the Seebeck effect. The potential 214 produced is generally proportional to the temperature difference 210 between the first and second sides 206, 208 and can be expressed by the following equation:
V=(ThTc)=T
Where V is the potential 214 between the first and second sides 206, 208, is the Seebeck coefficient, and (ThTc) or T is the temperature difference 210 between the first and second sides 206, 208. As such, the Seebeck coefficient for a given TE device 202 can be described as the ratio of the potential 214 to the temperature difference 210 between the first and second sides 206, 208.

(22) In some embodiments, the Seebeck coefficient can be determined experimentally. For example, various voltages can be supplied to the TE device 202 (e.g., by the power source 204), and the resultant temperature difference 210 and corresponding potential 214 can be observed. For example, a 9-volt power source 204 can be applied to the TE device 202. Then the power source 204 can be disconnected, and the temperature difference 210 and potential 214 can be measured. A similar procedure can be applied for various other voltages, such as 12-volt, 15-volt, 24-volt, and otherwise. From these empirical readings of temperature difference 210 and potential 214, the Seebeck coefficient can be determined for a given TE system 200.

(23) In certain configurations, for a TE system 200 with a known Seebeck coefficient , the temperature difference 210 between the first and second sides 206, 208 can be determined based on the voltage potential 214. For example, in some cases, the temperature difference 210 (T) is approximately equal to the potential 214 divided by the Seebeck coefficient . Such a configuration can, for example, provide for monitoring of the temperature difference 210 of the TE device 202 without the need for a separate temperature sensor. As noted above, the elimination of such a temperature sensor can facilitate manufacturing (e.g., reduce process steps), decrease manufacturing time, reduce costs, increase device longevity, and/or provide one or more other advantages or benefits. Further, not including of such a sensor can simplify the design of the TE device 202, for example, by eliminating channels through the TE device 202 for the passage of wires for the sensor. Furthermore, not including such a sensor can improve reliability of the system 200 by reducing the total number of components that could fail.

(24) Various embodiments of the system 200 are configured to determine an absolute temperature of at least one of the sides 206, 208 of the TE device 202, as will be discussed further below. In some embodiments, the temperature difference 210 and/or the absolute temperature of at least one of the sides 206, 208 is used in a feedback control scheme, which can, for example, provide for a faster response time and/or reduced thermal lag for temperature feedback compared to systems employing a separate temperature sensor (e.g., the sensor 112 in the system 100). Additional details regarding illustrative embodiments of such a feedback control scheme are provided below. In some embodiments, the temperature difference 210 and/or the absolute temperature of at least one of the sides 206, 208 is used for fault monitoring. For example, the temperature difference 210 and/or the absolute temperature of at least one of the sides 206, 208 can be used to detect overheating of the TE device 202, which could reduce the efficiency of the TE device 202 or otherwise damage the device and/or other components of the TE system 200.

(25) The TE system 200 can be used in most any application in which thermoelectric closed loop control would be advantageous. For example, the TE system 200 can be used in any type of support assembly 205 such as heated and/or cooled beds, hospital beds, bed topper members, vehicle seats, wheelchairs and/or any other seating assemblies as shown schematically in FIG. 9. In other embodiments, the TE system 200 is used in cooling towers or other industrial applications where temperature control is desired. In yet other embodiments, the TE system 200 is used in cup holders or other small or large climate controlled compartments or devices 206 as shown schematically in FIG. 10. For example, the TE system 200 can be used in food and/or beverage containers (e.g., coolers), wine racks, shipping containers, animal crates, and otherwise. In still further embodiments, the TE system 200 is used in battery cooling systems 207 as shown schematically in FIG. 11, such as for electric vehicles, hybrid vehicles, and/or the like. In other embodiments, the TE system 200 is used in an aircraft or a spacecraft, such as a satellite, capsule, orbiting telescope, or otherwise. Of course, the above-listed applications are illustrative only and are not intended to be limiting. Indeed, the TE system 200 is contemplated for use in most any application in which temperature control with a TE device would be beneficial.

(26) As noted above, in some embodiments, the TE system 200 is used in a seat for an automobile or other vehicle. For example, the TE system 200 or portions thereof, can be located in a heated and/or cooled automobile seat system. In certain embodiments, such as in the embodiment shown in FIG. 2C, multiple TE systems 200 can be provided to the seat. For example, a first TE system 200 can provided to a seat cushion and a second TE system 200 can be provided to a seatback. In some arrangements, the TE systems 200, 200 are part of a temperature control system, which can include things such as fans and ducts.

(27) In some embodiments of the TE system 200 in an automobile or other vehicle, the automobile or other vehicle includes an ambient temperature sensor, the data from which is broadcast on a communication bus. In some cases, the processor 218 is in communication with the communication bus and thus able to receive the ambient temperature sensor signal. Thus, in such embodiments, an additional ambient temperature sensor specific to the TE system 200 is not needed.

(28) As shown in FIG. 3, the TE device 202 can be powered (e.g., when the power source 204 is energized and is applying a certain voltage to the TE device 202) for certain periods of time and depowered or deactivated (e.g., when the power source 204 is applying about zero volts to the TE device 202) for certain periods of time. As indicated in FIG. 3, in some embodiments, the potential 214 is generally measured during one or more time periods 303, which can occur when the TE device 202 is in the depowered or deactivated mode.

(29) In certain embodiments, the ratio of the amount of time that the TE device 202 is in the powered mode to the total amount of time under consideration is known as the duty cycle. Duty cycle is generally expressed as a percentage. For example, if the TE device 202 was powered for three seconds within a ten second time period, then the duty cycle would be expressed as 30%. In certain embodiments, such as is shown in FIG. 3, the potential 214 (the Seebeck voltage) can be affected by the duty cycle. For example, in certain arrangements, an increase in the duty cycle results in an increase in the potential 214. This is because, by way of example, an increase in the duty cycle generally results in an increase in the amount of power supplied to the TE device, which in turn can result in a greater Seebeck potential when the power supply is discontinued.

(30) In some embodiments, the TE device 202 is activated and deactivated several times each second. According to some embodiments, for example, the TE system 200 may operate at approximately 200 Hz. In some embodiments, the TE system 200 operates in the range of approximately 60 Hz to approximately 300 Hz. In some embodiments, the TE system 200 operates at approximately 10, 20, 30, 60, 100, 120, and/or 150 Hz. Other embodiments operate at various other frequencies.

(31) In some embodiments, the TE device 202 is powered via pulse-width modulation (PWM). In some implementations, the processor 218 controls the amount of power applied to the TE device 202 by adjusting (e.g., by software) the length of time that the power source 204 supplies power to the TE device 202. For example, as shown in FIG. 3, for a 50% duty cycle, voltage from the power source 204 can be applied to the TE device 202 for about twice as long as for a 25% duty cycle. Likewise, during a 75% duty cycle, voltage can be applied to the TE device 202 about three times longer than during a 25% duty cycle. Using PWM, the energized and de-energized cycles (which together form a square wave) of the TE device 202 can be modulated to achieve a desired analog signal level e.g., a temperature setpoint. In other words, in some embodiments, power is supplied to the TE device 202 by way of a plurality of on and off pulses of the power source 204 (whereby the on time is the time during which the power is supplied, and the off time is the period during which the power is switched off) in order to achieve a desired output. Such a configuration can, for example, reduce the total amount of power supplied to the TE device 202, while not appreciably affecting or interrupting the operation of the TE device 202. For example, in some arrangements, any negative effects or disruptions to the TE device can be reduced or minimized when the switching frequency of the on and off pulses is faster than the response time of the TE device 202 to a change in the power state.

(32) Further, given that the TE device 202 is depowered or deactivated for certain time periods during PWM, the potential 214 of the TE device 202 can be measured during such periods without interrupting the normal operation of the TE device 202. However, in other embodiments, operation of the TE device 202 is temporarily interrupted (e.g., depowered) for a short period of time, such as for a period of a few microseconds. In such embodiments, the interruption is generally so brief as to not inhibit controlling the TE device 202 to maintain a desired output, such as a desired temperature.

(33) In some embodiments, the processor 218 can be in communication with an ambient temperature sensor 220 and can be configured to determine the potential 214. For example, an analog input of the processor 218 can be in communication with a negative temperature coefficient device or other device, from which a signal can be used to determine (e.g., by a calculation) an ambient temperature. Such a configuration can, for example, allow for the determination of an absolute temperature of at least one of the first and second sides 206, 208 of the TE device 202. For example, the absolute temperature can be determined with a calculation or by correlating the potential 214 with a known (e.g., by empirical measurements) absolute temperature for at least one of the first and second sides 206, 208. For instance, the correlation may be performed with a lookup table, as discussed in further detail below. The calculated or correlated absolute temperature can then be adjusted based on the ambient temperature. In some instances, the absolute temperature of one of the first and second sides 206, 208 is determined by adding the temperature difference 210 and the ambient temperature. In certain scenarios, the absolute temperature of one of the first and second sides 206, 208 is used in a closed loop feedback control scheme, which can, in some embodiments, enhance the response time of the control scheme.

(34) In certain embodiments, the determination of the absolute temperature of at least one of the first and second sides 206, 208 includes other factors as well. For example, the voltage of the voltage source 204 (e.g., a battery) and/or the duty cycle that was applied to the TE device 202 that resulted in the temperature difference 210 can be used in determining the absolute temperature of at least one of the first and second sides 206, 208. Generally, such factors are dependent on the characteristics of a particular TE device design and are determined empirically. In some embodiments, the status of other components (e.g., fan speed) is also used in determining the absolute temperature.

(35) In some instances, the relationship between the absolute temperature of at least one of the sides 206, 208 and the potential 214 is determined by a computation, which can be programmed in the processor 218. In other instances, the relationship between the absolute temperature of at least one of the sides 206, 208 and the potential 214 is set forth in a lookup table, which can be programmed in the processor 218 or reside in a data storage element, such as a magnetic disk or other memory element. In certain arrangements, employing a lookup table can, for example, provide a faster response than embodiments employing a computation.

(36) An embodiment of a method 400 of producing such a lookup table or computation is illustrated in FIG. 4. In block 402, at a known ambient temperature, power is applied to a TE device to produce a desired temperature difference (e.g., between the first and second sides) in the TE device. For example, in some embodiments, at an ambient temperature of about 0 C., the TE device can be powered to produce a temperature difference of about 4 C. In other embodiments, power is applied to a TE device to produce a desired absolute temperature on a side of the TE device. For example, at an ambient temperature of about 0 C., sufficient power can be supplied to the TE device such that one side of the TE device has a temperature of about 4 C. During the method 400, the temperature difference and/or absolute temperature of the TE device can be monitored with, e.g., temporary sensors located on, near, or adjacent the first and/or second sides of the TE device.

(37) In block 404, the TE device can be depowered or deactivated. For example, the power source can be disconnected from the TE device. Additionally, in block 404 the potential across the first and second sides can be measured. For example, in some embodiments, at the above-described ambient temperature of 0 C. and/or absolute temperature of about 4 C. on one side of the TE device, a potential of about 0.4 volts may be measured.

(38) In block 406, a decision can be made whether there are additional temperatures (e.g., gradient or absolute) to be analyzed at the present ambient temperature. For example, if the TE device is intended to operate with a temperature of about 0 C. to about 50 C., block 406 asks whether additional data points between about 0 C. and about 50 C., as well as the corresponding potentials, are desired to be measured. If the answer is affirmative, the method 400 moves to block 408, where the TE device temperature is incremented (e.g., by 4 C.). The method then loops back to block 402, in which power is applied to the TE device to produce the incremented temperature in the TE device. In some embodiments, the loop from blocks 402, 404, 406, 408 and back to block 402 occurs at generally the same ambient temperature.

(39) However, if the answer in block 406 is negative, then the method 400 moves to block 410, which queries whether there are additional ambient temperatures to be analyzed. For example, if the TE device is intended to be used in a range of ambient temperatures (e.g., 10 C. to 30 C.), block 410 asks whether the loop of blocks 402-408 should be completed for additional ambient temperatures within that range. If the answer in block 410 is affirmative, then the method 400 moves to block 412, in which the ambient temperature is incremented (e.g., by 5 C.). The method 400 then loops back to block 402, in which power is applied to the TE device to produce the temperature in the TE device at the incremented ambient temperature.

(40) If, on the other hand, the answer to block 410 is negative, the method 400 moves to block 414, in which a computation is generated or a look-up table is created for each of the temperatures in the TE device 102 and at each of the ambient temperatures for which blocks 402-408 were completed. An example of a look-up table for three ambient temperatures (e.g., about 0 C., about 5 C., and about 10 C.) is shown in Table 1 below. The method 400 can then end.

(41) TABLE-US-00001 TABLE 1 Temperature Potential ( C.) (V) Ambient = approx. 0 C. 4.2 0.15 7.9 0.34 10.7 0.5 13.3 0.64 15.9 0.8 18.5 0.96 20.9 1.09 23.4 1.24 25.7 1.37 28 1.5 30.1 1.67 32.2 1.8 34.3 1.92 35.8 2.04 39.1 2.2 40.8 2.33 Ambient = approx. 5 C. 9.2 0.16 12.7 0.35 15.5 0.51 18.1 0.66 20.7 0.82 23.2 0.96 25.6 1.1 28.1 1.25 30.2 1.4 32.5 1.52 34.7 1.67 37.4 1.82 39.4 1.98 41.4 2.1 43.5 2.22 45.3 2.35 Ambient = approx. 10 C. 14.4 0.16 18 0.36 20.7 0.52 23.4 0.67 25.9 0.83 28.3 0.98 30.8 1.12 33.1 1.26 35.3 1.4 37.6 1.55 39.7 1.7 42.1 1.85 44.3 2 46.3 2.12 48.3 2.25 50.2 2.36

(42) With reference to Table 1, at a given ambient temperature, a potential was provided to an embodiment of the TE device 102 to produce a measured temperature difference (e.g., when the TE device 102 was depowered). For example, at an ambient temperature of about 0 C., to produce a measured temperature difference of about 4.2 C., it was found that a supply of about 0.15 V was needed to the TE device 102. As another example, at an ambient temperature of about 0 C., it was determined that about 0.34 V was needed to be supplied to the TE device 102 to produce a measured temperature difference of about 7.9 C. This process continued for various other target temperatures (as shown above) until a target temperature of about 40.8 C. and the corresponding potential of about 2.33V were found.

(43) The ambient temperature was then incremented to a new ambient temperature, such as about 5 C. As shown above, several target temperatures and corresponding potentials (when the TE device 102 was depowered) were then determined. For example, at an incremented ambient temperature of about 5 C. and for a target temperature was then set to about 9.2 C., the potential needed to be supplied to the TE device 102 was found to be about 0.16 V. The process continued through several other target temperatures and corresponding potentials for the 5 C. ambient temperature. The ambient temperature was then incremented to about 10 C. and several target temperatures and corresponding potentials (e.g., when the TE device 102 was depowered) were then determined.

(44) With regard to FIG. 5, an embodiment of a method 500 of controlling a TE device is illustrated. As shown in block 502, the ambient temperature is read or determined, e.g., with an ambient temperature sensor. In some embodiments, block 502 includes communicating with other components in related systems, e.g., over a communication bus in an automobile, in order to read or determine the ambient temperature.

(45) The method 500 then moves to block 504, in which the Seebeck potential of the TE device is measured. For example, in some embodiments, the processor is configured to measure the potential of the TE device. In other embodiments, the processor is configured to communicate with another component that measures the potential of the TE device. Generally, the potential of the TE device is measured when the TE device is depowered.

(46) In some embodiments, the method 500 further includes block 506, in which the absolute temperature of a surface of the TE device is calculated. This can include, for example, determining (e.g., with a computation or lookup table) the absolute temperature based on the Seebeck potential measured in block 504. In certain embodiments, block 506 also includes adjusting the absolute temperature determination with the ambient temperature from block 502. Further, in some arrangements, the absolute temperature determination includes other factors (e.g., duty cycle and battery voltage) as well. In some implementations, the Seebeck potential is measured during a duty cycle period in which the TE device 102 is de-energized.

(47) In some embodiments, the method 500 includes block 508, in which the absolute temperature of a surface of the TE device is compared with a desired value for the TE device, such as a temperature setpoint to determine the amount of error. For example, the desired value can be provided to the processor (e.g., by a person adjusting a dial or other input device) and the processor can conduct the comparison.

(48) In some embodiments, the method includes block 510, in which the signal to the TE device is modified to reduce the error between the absolute temperature of a surface of the TE device and the desired value for the TE device. For example, if the absolute temperature of a surface of the TE device is higher than the desired value for the TE device, future duty cycles for the TE device can be decreased (e.g., from 40% to 20%), thereby decreasing the absolute temperature of a surface of the TE device and reducing the error between the absolute temperature of a surface of the TE device and the desired value for the TE device. In some cases, the error is supplied to, for example, a PID controller.

(49) As shown, block 512 can ask whether the TE device continues to be in operation. For example, for a TE device in an automobile seat cushion, the block 512 can ask whether the automobile key remains in the ignition and/or whether a seat occupancy sensor indicates that the seat is occupied. If the answer to block 512 is in the affirmative, then the method 500 can loop back to block 502 to begin again. If, however, the answer to block 512 is negative, then the method 500 ends.

(50) The method 500 can, for example, increase responsiveness of a system compared to systems having an embedded temperature sensor 112 (see FIG. 1). For example, the method 500 systems can reduce thermal lag (e.g., the time between a temperature charge occurring and that temperature charge being detected) compared to systems employing a TE device temperature sensor. Furthermore, the method 500 eliminates the need for the TE device temperature sensor, thereby reducing components and manufacturing steps, as well as eliminating wiring to the TE device temperature sensor and associated wiring channels in a housing of the TE device.

(51) As illustrated in FIG. 6, in some embodiments, a TE system 600 can include a plurality of TE devices 602a, 602b. Although two TE devices 602a, 602b are shown, some embodiments of the system 600 include three, four, five, six, or more TE devices. The TE devices 602a, 602b can be similar to and similarly controlled as TE devices 202 discussed herein. For example, each of the TE devices 602a, 602b can be powered by a power source (not shown), which can selectively provide electrical power to each of the devices 602a, 602b. In certain embodiments, the TE devices 602a, 602b share a common power source. In other arrangements, the TE devices 602a, 602b each has a dedicated power source.

(52) As discussed in greater detail above, when power is applied to the TE devices 602a, 602b, temperature differences in the TE devices 602a, 602b can result. For example, the TE device 602a can have a temperature difference 610a and the TE device 602b can have a temperature difference 610b. Furthermore, when the TE devices 602a, 602b, are depowered, in some instances, the Seebeck effect can induce potentials in the TE devices 602a, 602b. For example, the TE device 602a can have a potential 614a and the TE device 602b can have a potential 614b.

(53) The TE devices 602a, 602b can be located at least partly in a fluid conduit 622. For example, in the embodiment illustrated, the TE devices 602a, 602b are located partly in a duct, such as an air duct in a temperature control system. Fluid, such as ambient air, can enter the conduit 622 at a first end 624 and can exit the conduit 622 at a second end 626. Between the first and second ends 624, 626, the fluid can pass through, over, and/or near one or more of the TE devices 602a, 602b. Thus, in certain embodiments, due at least partly to the temperature differences 610a, 610b of the TE devices 602a, 602b, heat transfer between the fluid and the TE devices 602a, 602b can occur, thereby changing the temperature of the fluid as it passes through the conduit 622. For example, the duty cycle and/or potentials 614a, 614b and or temperature differences 610a, 610b can be controlled so as to transfer. Sufficient heat to the fluid to maintain a desired fluid temperature downstream of the TE devices 602a, 602b. As shown, in some embodiments, the TE devices 602a, 602b are arranged in parallel with respect to the fluid flowing through the conduit 622.

(54) In certain embodiments, the system 600 is configured to determine an ambient temperature. For example, in some instances, the system 600 includes an ambient temperature sensor 620. In other instances, the system 600 is configured to receive the ambient temperature from another system, such as from a communication bus in an automobile.

(55) As previously discussed, the TE devices 602a, 602b can be controlled based on, for example, the potential 614a, 614b and the ambient temperature. In some embodiments, the same ambient temperature is used to control each of the TE devices 602a, 602b. Such configurations can, for example, reduce the total number of components of the system 600, thus reducing cost, complexity, and potential for failure. For example, a single ambient temperature sensor 620 can be used rather than a dedicated ambient temperature sensor for each of the TE devices.

(56) With regard to FIG. 7, another embodiment of a TE system 700 having a plurality of TE devices, 702a, 702b is illustrated. Such an embodiment may, for example, be used in a climate controlled bed or other seating assembly. For instance, one of the TE devices 702a, 702b could be located at the foot of the bed and the other of the TE devices 702a, 702b could be located at the head of the bed. As shown, the TE devices 702a, 702b can be located in a fluid conduit 722, such as a duct. Fluid, such as ambient air, can enter the conduit 722 from a first end 724 and traverse through the conduit to a second end 726. In certain embodiments, the fluid can pass through, over, and/or near the TE devices 702a, 702b. Furthermore, like in some of the systems discussed above, the system 700 can be configured to determine an ambient temperature, such as via an ambient temperature sensor (not shown).

(57) In accordance with certain other embodiments discussed herein, when power is applied to the TE devices 702a, 702b from a power source (not shown), a temperature differential can results across the TE devices 702a, 702b. For example, the TE device 702a can have a temperature difference 710a between a first side 706a and a second side 708a, and the TE device 702b can have a temperature difference 710b between a first side 706b and a second side 708b. Moreover, when power is discontinued to the TE devices 702a, 702b, in some embodiments, the Seebeck effect induces potentials in the TE devices 702a, 702b. For example, the TE device 702a can have a potential 714a and the TE device 702b can have a potential 714b.

(58) In certain embodiments, such as in the embodiment depicted in FIG. 7, the TE devices 702a, 702b are positioned in series with regard to the fluid flowing through the conduit 722. In some such embodiments, the fluid encounters TE device 702a then TE device 702b.

(59) In certain embodiments, due to, for example, the temperature difference 710a of the TE device 702a, the temperature of the fluid is changed as it passes through, over, and/or near the TE device 702a. In some such instances, the temperature of the fluid downstream of the TE device 702a and upstream of the TE device 702b is approximately the sum of the ambient temperature and the absolute temperature of the first side 706a of the TE device 702a. Thus, in such cases, the temperature of the fluid that encounters the TE device 702b has been changed by the TE device 702a.

(60) In some embodiments, due to, for example, the temperature difference 710b of the TE device 702b, the temperature of the fluid is changed as it passes through, over, and/or near the TE device 702b. In some such instances, the temperature of the fluid downstream of the TE device 702b is the approximately the sum of the temperature of the fluid that is downstream of the TE device 702a and upstream of the TE device 702b plus the absolute temperature of the first side 706b of the TE device 702b. In certain instances, the temperature of the fluid downstream of the TE device 702b is the approximately the sum of the ambient temperature, the absolute temperature of the first side 706a of the TE device 702a, and the absolute temperature of the first side 706b of the TE device 702b.

(61) In certain embodiments, the TE devices 702a, 702b can operate in conjunction to provide a desired temperature of fluid. For example, the TE devices 702a can raise the temperature of the fluid a first amount and the second TE device 702b can raise the temperature of the fluid a second amount. Likewise, the TE devices 702a can lower the temperature of the fluid a first amount and the second TE device 702b can lower the temperature of the fluid a second amount. In further embodiments, for example in instances in which dehumidified and temperature controlled fluid is desired, the TE device 702a can lower the temperature of the fluid an amount (e.g., so as to promote water vapor in the fluid to condense), then TE device 702b can raise the temperature of the fluid to approximately a desired temperature level (e.g., a user-selectable temperature setpoint).

(62) With reference to FIG. 8, another embodiment of a TE system 800 is illustrated. As shown, the TE system 800 includes a TE device 802, which includes a plurality of zones 802a-d. Of course, the TE device 802 can include more or fewer zones than the four zones illustrated, such as two, three, five, six, or otherwise. In some embodiments, the TE device 802 also include one or more electrical connections 850-854, which can be in electrical communication with, for example, a processor 818. The processor 818 can be configured to measure or otherwise determine a potential 814a-d for each of the zones 802a-d based on the connections 850-854. For example, the potential 814a for zone 802a can be determined by measuring the potential between the connections 850 and 851; the potential 814b for zone 802b can be determined by measuring the potential between the connections 851 and 852; and so on. Such a configuration can, for example, facilitate the monitoring and/or comparison of the potentials 814a-d, and thus the respective temperature of, each of the zones 802a-d of the TE device 802. Such monitoring and/or comparison can be used to detect, for example, a malfunction and/or failure in the zones 802a-d of the TE device 802. For instance, if each of the potentials 814a-c are found to be about equal, but the potential 814d is substantially higher or lower than the potentials 814a-c, then there may be a problem with the TE device 802 at zone 802d. Accordingly, in such embodiments, a flag, alarm, or other indicator can be provided regarding the possible problem. For example, in an embodiment in which the TE device 802 is employed in an automotive seat, an error code can be provided to the vehicle's on-board computer regarding a possible problem with the TE device 802.

(63) Although TE systems and control methods therefore have been disclosed in the context of certain embodiments and examples, it will be understood by those skilled in the art that the TE systems and control methods therefore extend beyond the specifically disclosed embodiments to other alternative embodiments and/or uses of the embodiments and certain modifications and equivalents thereof. It should be understood that various features and aspects of the disclosed embodiments can be combined with or substituted for one another in order to form varying modes of the vial adaptor. For example, the temperature of a surface of the TE device can be determined by both a temperature sensor 112 associated with the TE device (see FIG. 1) and by correlating the Seebeck potential of the TE device to an absolute temperature of a side of the TE device. Accordingly, it is intended that the scope of the TE systems and control methods therefore herein-disclosed should not be limited by the particular disclosed embodiments described above, but should be determined only by a fair reading of the claims that follow.