SAMPLE HOLDER FOR SCANNING ELECTRON MICROSCOPY (SEM) AND ATOMIC FORCE MICROSCOPY (AFM)

Abstract

The present invention refers to a two-systems compact specimen holder (SH) easy to use which enables to analyse the same sample by employing either an atomic force microscope (AFM) or a scanning electron microscope (SEM), by preserving the setting reference of the details for both microscopies, so that it satisfies the requirements of size, conductivity, magnetization, tidiness, reference and adaptability.

The capacity of preserving the location reference of the details for both microscopies, in the scope of correlational microscopy, results essential to obtain information and images in both fields of microscopy, which can be correlated in order to acquire valuable combined information.

Claims

1. A specimen holder or sample holder (SH) enabling to analyse the same sample by means of atomic force microscopy (AFM) and by means of scanning electron microscopy (SEM), which includes: A flat platen or sample holder (AFM-SH), which is magnetisable and conductive, with appropriate width and thickness for AFM, which has carved on it three mutually orthogonal graduated reference axes (4). A SH for SEM or SEM-SH (2), that is electron conductive, which has carved on it three mutually orthogonal graduated reference axes (4), specially designed for the platen (1), with a box that includes two slots where the AFM-SH slides in (1); mechanisms for holding and securing the platen (1); and a removable support pin (5), to be used in other different scanning electron microscopes.

2. The specimen holder (SH) from claim 1, where the platen or AFM-SH (1) is circular or has any other shape.

3. The SEM specimen holder (SEM-SH) from claims 1 and 2, where the platen holding and securing mechanisms (1) include either an attachment block (3) secured with bolts and/or a captive screw (6).

4. The specimen holder (SH) from vindications 1 to 3, characterized by the fact that it preserves the sample-features location reference when analysed in both microscopies and by the fact that it satisfies the requirements of size, conductivity, magnetization tidiness, reference and adaptability.

Description

BRIEF DESCRIPTION OF DRAWING(S)

[0018] Note: Numbers in parenthesis ( ), refer to numbers on the figures.

[0019] FIGS. 1 to 9 show sample holders (SH) for scanning electron microscopy existing in the market, which are more closely related to the functionality of the present invention.

[0020] FIG. 10 shows the SH of the present invention with an attachment block (3), where: [0021] (1)=SH for AFM or AFM-SH, magnetizable and conductive to electrons; [0022] (2)=SH for SEM or SEM-SH, conductive to electrons; and [0023] (3)=attachment block.

[0024] FIG. 11 shows the upper view of the present invention SH with attachment block, indicating the measuring scales for referencing in both, AFM-SH and SEM-FH (4).

[0025] FIG. 12 shows the front view of SH of the present invention without attachment block and pin.

[0026] FIG. 13 shows the side view of SH of the present invention with attachment block, highlighting the Phillips-type support pin (5).

[0027] FIG. 14 displays a first example of SH for SEM and AFM of the present invention with vertical flanks and attachment block (3).

[0028] FIG. 15 is a display of SH of the present invention with scale-engraved tilted flanks, and captive screw.

[0029] FIG. 16 shows the upper view of SH of the present invention with captive screw, highlighting the graduated scales for referencing (4).

[0030] FIG. 17 shows the front view of SH of the present invention with captive screw.

[0031] FIG. 18 shows the side view of SH of the present invention highlighting the captive screw (6).

[0032] FIG. 19 shows a demonstration of the holding action with the captive screw inserted (6) in the SH of the present invention, no support pin is used for atomic force microscopes with a large chamber.

DETAILED DESCRIPTION

[0033] The present invention refers to a specimen holder (SH) designed to analyse the same sample in both, an atomic force microscope (AFM) and a scanning electron microscope (SEM), preserving the positioning reference of the sample details in both microscopies, satisfying the requirements of size, conductivity, magnetization, tidiness, referencing and adaptability.

[0034] The specimen holder from the present invention is described in the following paragraphs and presented by means of FIGS. 10 to 19, it includes: [0035] a) A flat sample holder (SH) or AFM-SH(1) also called platen, that is magnetisable and conductive, with width and thickness that are appropriate for AFM, having circular shape or any other shape, where the sample is mounted. This platen (1) has carved on it, three mutually orthogonal graduated reference axes (4) in order to facilitate the location of specific details inside the sample and to insert it inside of a SEM-SH specially designed for this flat sample holder, as described in the following paragraphs. [0036] b) A SH for SEM or SEM-SH(2) that is electron conductive, it has tilted flanks with three mutually orthogonal graduated reference axes carved on them (4), specially designed for the platen (1), with a box that includes two slots where a graduated platen can fit in (1). Once the platen is installed (1) on its correct location, it is fixed with one of the following mechanisms: [0037] An attachment block is inserted (3) and fixed with bolts (FIGS. 10 to 14), and/or [0038] It is fixed with a captive screw (6) that prevents the platen from coming off and from moving (FIGS. 15 to 19). [0039] These holding mechanisms prevent from using double-sided adhesive tape. The SEM-SH from the present invention has carved, on its upper part, three orthogonal axes (4), with mutually orthogonal tracking scales in order to pinpoint the platen axes (1) with respect to those axes.

[0040] In addition, the SEM-SH from the present invention may include a removable support pin (5), which can be employed on several other scanning electron microscopes. Some atomic force microscopes can completely accommodate the platen for AFM and the SH for the SEM without the pin, for this reason the present invention includes the option of removable support pin (5). FIG. 13 shows with clarity a Phillips-type removable support pin (5).

[0041] The design of the inclined planes and the graduated scales on them in the SEM-SH enables the scales from both AFM-SH and SEM-SH (4) converge to the same plane and thus, both scale systems can be focused at the same time, this eliminates the need of focusing the scale axes of both SEM-SH and AFM-SH independently to track features in either microscope and waste of time and effort.

[0042] In this way, the same sample, mounted on the AFM-SH(1) can be analysed on this instrument, with its details being correctly referenced to orthogonal axes, and then can be taken without dismounting the platen (1) to a SEM and be analysed on this new instrument without losing the requirements of conductivity, dimensioning, reference or functionality since it can be inclined, rotated, or translated inside the SEM. This device reduces the fundamental problem of analysing one sample with different techniques included in AFM and SEM by employing the same SH, in such a way that the results from these analyses can now be correlated.