OPTICAL ELEMENT, AND ASSEMBLY AND OPTICAL SYSTEM THEREWITH
20250068089 ยท 2025-02-27
Inventors
- Sonja Schneider (Oberkochen, DE)
- Norbert Wabra (Werneck, DE)
- Lukas Salfelder (Mutlangen, DE)
- Peter Graf (Koenigsbronn, DE)
Cpc classification
G02B27/58
PHYSICS
G03F7/70941
PHYSICS
G03F7/70316
PHYSICS
G02B3/04
PHYSICS
G02B27/0043
PHYSICS
International classification
G03F7/00
PHYSICS
G02B27/00
PHYSICS
Abstract
An optical element for incorporation into a holding device for forming an assembly for constructing an optical system comprises a body transparent to light from a used wavelength range, on which a first light passage surface and an opposing second light passage surface are formed. Each light passage surface has an optical used region for arrangement in a used beam path of the optical system and an edge region outside the optical used region and designated as an engagement region for holding elements of the holding device. Each light passage surface is of optical quality in the optical used region and has a surface shape designed in accordance with a used region specification specified by the function of the optical element in the used beam path. Light deflection structures with a geometrically defined surface design are in the edge region of at least one of the light passage surfaces.
Claims
1. An optical element configured to be used in a holding device of an assembly of an optical system of a microlithographic projection exposure apparatus, the optical element comprising: a body which is transparent to used light in a used wavelength range; wherein: the body comprises a first light passage surface and an opposing second light passage surface; each of the first and second light passage surfaces comprises an optical used region and an edge region outside the optical used region; the optical used region of each of the first and second light passage surfaces is configured to be disposed in a beam path of the used light in the optical system; the edge region of each of the first and second light passage surfaces is configured to engage a holding element of the holding device; the optical used region of each of the first and second light passage surfaces is of optical quality; the optical used region of each of the first and second light passage surfaces comprises a surface shape configured in accordance with a used region specification specified by a function of the optical element in the beam path of the used light in the optical system; the edge region of the first light passage surfaces comprises light deflection structures comprising a geometrically defined surface in accordance with an edge region specification which deviates from the used region specification, the geometrically defined surface being configured to deflect portions of light deflected by the light deflection structures into a target region outside of the beam path of the used light in the optical system; and a plurality of contact zones are distributed over a circumference of the edge region of the second light passage surface; the light deflection structures to deflect portions of light into a target region outside of the contact zones; and at least one of the following conditions applies to the light deflection structures: (i) for the first deflection surface, the edge region specification and the used region specification of are configured so that the surface shape of the used region in a transition region located outside of the used region in the edge region transitions smoothly into the surface shape of the edge region; (ii) the first light passage surface has a continuously curved aspheric surface shape in the edge region in accordance with the edge region specification and a spherical surface shape or an aspherical surface shape in the optical used region in accordance with the used region specification; (iii) the light deflection structures have, in an entire edge region of the first light passage surface, a continuously curved surface shape with a negative radius of curvature in at least one region; and (iv) within the edge region of the first light passage surface, there is an inflection point region with a transition from a positive radius of curvature on a side of the optical used region to a negative radius of curvature at a distance from the optical used region.
2. The optical element of claim 1, wherein the light deflection structures comprise refractive deflection structures.
3. The optical element of claim 2, wherein the light deflection structures comprise diffractive light deflection structures.
4. The optical element of claim 3, wherein the light deflection structures comprise reflective light deflection structures.
5. The optical element of claim 1, wherein the light deflection structures comprise diffractive light deflection structures.
6. The optical element of claim 5, wherein the light deflection structures comprise reflective light deflection structures.
7. The optical element of claim 1, wherein the light deflection structures comprise reflective light deflection structures.
8. The optical element of claim 1, wherein at least one of the following holds: the light deflection structures comprise Fresnel lens rings; the light deflection structures comprise a diffractive grating with a diffractive effect for the light of the used wavelength; and the light deflection structures comprise a blazed grating with a diffractive effect for the light of the used wavelength.
9. The optical element of claim 1, wherein the optical element has an optical axis, the surface shape of the optical used region is rotationally symmetric with respect to the optical axis, and the surface shape of the edge region is not rotationally symmetric with respect to the optical axis.
10. The optical element of claim 9, wherein the surface shape in the edge region comprises n-fold rotational symmetry with respect to the optical axis, where n is two, three, four or six.
11. The optical element of claim 1, wherein: the light deflection structures are integral components of the optical element; and the light deflection structures are separate from the transparent body of the optical element and attached to the edge region.
12. The optical element of claim 1, wherein light deflection structures are configured based on calculations regarding a spatial distribution of a stray light intensity in the optical system for specified combinations of mask structures and illumination settings so that a thermally activated manipulator is configured to counteract and at least partly compensate disadvantageous effects of lens heating in the region of the used beam path.
13. An optical system, comprising: an assembly, wherein the assembly comprises the optical element of claim 1.
14. The optical system of claim 13, wherein the optical system is a dioptric microlithographic imaging system or a catadioptric microlithographic imaging system.
15. An assembly, comprising: an optical element; and a holding device configured to hold the optical element, wherein: the optical element comprises a body which is transparent to used light in a used wavelength range; the optical element comprises a first light passage surface and an opposing second light passage surface; each of the first and second light passage surfaces comprises an optical used region in a beam path of the used light and an edge region outside the optical used region; in the optical used region of each of the first and second light passage surfaces, the light passage surface is of optical quality in accordance with a specification surface shape specified by a function of the optical element in the beam path of the used light; the holding device comprises holding elements engaging contact zones in the edge region of the second light passage surface; the edge region of the first light passage surface comprises light deflection structures comprising a geometrically defined surface design; and the light deflection surfaces are configured to deflect portions of light into a target region outside of the contact zones.
16. The assembly of claim 15, wherein a surface shape of the light deflection structures is irregularly structured in the azimuthal direction so that a greatest density of light deflection structures are in a vicinity of an optically used footprint where the beam path of the used light intersects the first light passage surface.
17. The assembly of claim 16, wherein the target region comprises a material that has an absorptivity for the used light that is greater than an absorptivity of the transparent material of the optical element for the used light.
18. The assembly of claim 15, wherein the target region comprises a material that has an absorptivity for the used light that is greater than an absorptivity of the transparent material of the optical element for the used light.
19. An optical system, comprising: the assembly of claim 15.
20. The optical system of claim 18, wherein the optical system is a dioptric microlithographic imaging system or a catadioptric microlithographic imaging system.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0031]
[0032]
[0033]
[0034]
[0035]
[0036]
[0037]
[0038]
[0039]
DETAILED DESCRIPTION OF THE EXEMPLARY EMBODIMENTS
[0040]
[0041] At its exit surface ES, an illumination system ILL disposed downstream of the light source LS generates a large, sharply delimited and substantially homogeneously illuminated illumination field, which is adapted to the desired telecentricity of the projection lens PO arranged downstream thereof in the light path. The illumination system ILL has devices for setting different illumination modes (illumination settings) and, for example, can be switched between conventional on-axis illumination with different degrees of coherence and off-axis illumination. By way of example, the off-axis illumination modes comprise annular illumination or dipole illumination or quadrupole illumination or any other multi-polar illumination. The design of suitable illumination systems is known per se and therefore not explained in any more detail here. The patent application US 2007/0165202 A1 (corresponding to WO 2005/026843 A2) shows examples of illumination systems which can be used within the scope of various embodiments.
[0042] Those optical components which receive the light from the laser LS and form illumination radiation from the light, which illumination radiation is directed to the reticle M, are part of the illumination system ILL of the projection exposure apparatus.
[0043] Arranged downstream of the illumination system is a device RS for holding and manipulating the mask M (reticle) in such a way that the pattern arranged at the reticle lies in the object plane OS of the projection lens PO, which coincides with the exit plane ES of the illumination system and which is also referred to here as reticle plane OS. For the purposes of a scanning operation, the mask is movable in this plane in a scanning direction (y-direction) perpendicular to the optical axis OA (z-direction) with the aid of a scanner drive.
[0044] Following downstream of the reticle plane OS is the projection lens PO, which acts as a reduction lens and images an image of the pattern arranged at the mask M with a reduced scale, for example with the scale of 1:4 (||=0.25) or 1:5 (||=0.20), onto a substrate W coated with a photoresist layer, the light-sensitive substrate surface SS of which lies in the region of the image plane IS of the projection lens PO.
[0045] The substrate to be exposed, which is a semiconductor wafer W in the exemplary case, is held by a device WS which comprises a scanner drive in order to move the wafer synchronously with the reticle M perpendicular to the optical axis OA in a scanning direction (y-direction). The device WS, which is also referred to as wafer stage, and the device RS, which is also referred to as reticle stage, are constituent parts of a scanner device which is controlled by way of a scan control device which, in the embodiment, is integrated in the central control device CU of the projection exposure apparatus.
[0046] The illumination field generated by the illumination system ILL defines the effective object field OF used during the projection exposure. In the exemplary case, the latter is rectangular, it has a height A* measured parallel to the scanning direction (y-direction) and it has a width B*>A* measured perpendicular thereto (in the x-direction). In general, the aspect ratio AR=B*/A* lies between 2 and 10, such as between 3 and 8. The effective object field lies at a distance next to the optical axis in the y-direction (off-axis field). The effective image field IF in the image surface IS, which is optically conjugate to the effective object field, has the same form and the same aspect ratio between the height B and width A as the effective object field, but the absolute field dimension is reduced by the imaging scale of the projection lens, which is to say A=||A* and B=||B*.
[0047] If the projection lens is designed and operated as an immersion lens, then radiation is transmitted through a thin layer of an immersion liquid during the operation of the projection lens, which thin layer is situated between the exit surface of the projection lens and the image plane IS. Image-side numerical apertures NA>1 are possible during the immersion operation. A configuration as a dry lens is also possible; in this case, the image-side numerical aperture is restricted to values NA<1.
[0048]
[0049] Pupil surfaces or pupil planes P1, P2, P3 of the imaging system lie between the object plane and the first intermediate image, between the first and the second intermediate image, and between the second intermediate image and the image plane, respectively, where the chief ray CR of the optical imaging intersects the optical axis OA. The aperture stop AS of the system can be attached in the region of the pupil surface P3 of the third lens part OP3. The pupil surface P2 within the catadioptric second lens part OP2 lies in immediate proximity to a concave mirror CM.
[0050] The catadioptric second lens part OP2 contains the sole concave mirror CM of the projection lens. A negative group NG having two negative lens elements is situated directly upstream of the concave mirror. In this arrangement, which is occasionally referred to as a Schupmann achromate, the Petzval correction, which is to say the correction of the image field curvature, is achieved as a result of the curvature of the concave mirror and the negative lens elements in the vicinity thereof, the chromatic correction as a result of the refractive power of the negative lens elements upstream of the concave mirror and also the stop position with respect to the concave mirror.
[0051] A reflective deflection device serves to separate the beam passing from the object plane OS to the concave mirror CM or the corresponding partial beam path from that beam or partial beam path which, after reflection at the concave mirror, passes between the latter and the image plane IS. For this purpose, the deflection device has a plane first deflection mirror FM1 having a first mirror surface MS1 for reflecting the radiation coming from the object plane to the concave mirror CM and a plane second deflection mirror FM2 aligned at right angles to the first deflection mirror FM1 and having a second mirror surface MS2, wherein the second deflection mirror deflects the radiation reflected from the concave mirror in the direction of the image plane IS. Since the optical axis is folded at the deflection mirrors, in this application the deflection mirrors are also referred to as folding mirrors. The deflection mirrors are tilted relative to the optical axis OA of the projection lens about tilt axes extending perpendicularly to the optical axis and parallel to a first direction (x-direction), for example by 45. When configuring the projection lens for the scanning operation, the first direction (x-direction) is perpendicular to the scanning direction (y-direction) and thus perpendicular to the movement direction of the mask (reticle) and substrate (wafer). For this purpose, the deflection device is realized by a prism whose externally reflectively coated cathetus surfaces aligned perpendicularly to one another serve as deflection mirrors.
[0052] The intermediate images IMI1, IMI2 each lie in optical proximity to the folding mirrors FM1 and FM2, respectively, closest to them, but can be at a minimum optical distance from them, such that possible defects on the mirror surfaces are not sharply imaged into the image plane, and the plane deflection mirrors (plane mirrors) FM1, FM2 lie in the region of moderate radiation energy density.
[0053] The positions of the (paraxial) intermediate images define field planes of the system which are optically conjugate to the object plane and to the image plane, respectively. The deflection mirrors thus lie in optical proximity to field planes of the system, which is also referred to as near field in the context of this application. In this case, the first deflection mirror is arranged in optical proximity to a first field plane, belonging to the first intermediate image IMI1, and the second deflection mirror is arranged in optical proximity to a second field plane, optically conjugate to the first field plane and belonging to the second intermediate image IMI2.
[0054] The optical proximity or the optical distance of an optical surface with respect to a reference plane (for example, a field plane or a pupil plane) is described by the so-called subaperture ratio SAR in this application. For the purposes of this application, the subaperture ratio SAR of an optical surface is defined as follows:
SAR=sign h(|r|/(|h|+|r|))
where r denotes the marginal ray height, h denotes the chief ray height and the signum function sign x denotes the sign of x, with sign 0=1 according to convention. The chief ray height is understood to mean the ray height of the chief ray of a field point of the object field with a maximum field height in terms of magnitude. The ray height should be understood to be signed. The marginal ray height is understood to mean the ray height of a ray with a maximum aperture proceeding from the point of intersection between the optical axis and the object plane. This field point need not contribute to transferring the pattern arranged in the object planefor example in the case of off-axis image fields.
[0055] The subaperture ratio is a signed variable which is a measure of the field or pupil proximity to a plane in the beam path. By definition, the subaperture ratio is normalized to values between 1 and +1, wherein the subaperture ratio is zero in each field plane and wherein the subaperture ratio jumps from 1 to +1, or vice versa, in a pupil plane. Therefore, a subaperture ratio with an absolute value of 1 determines a pupil plane.
[0056] An optical surface or a plane is then designated as (optically) near an optical reference surface if the subaperture ratios of these two surfaces are comparable in terms of numerical value.
[0057] For example, an optical surface or a plane is designated (optically) near field if it has a subaperture ratio that is close to 0. An optical surface or a plane is designated as (optically) near pupil if it has a subaperture ratio that is close to 1 in terms of absolute value.
[0058] The used beam path of the projection lens, which is also referred to as the imaging beam path or projection beam path, runs from the effective object field OF to the effective image field IF. The used beam path is a volume in three-dimensional space (subset of R.sup.3) which is defined in that each point in the space has running through it at least one continuous ray from the object field OF within the object-side use aperture to the image field IF within the image-side use aperture. Shape and position of the imaging beam path during a process generally depend on the current field size and the orders of diffraction.
[0059] The region of an optical surface illuminated by the rays of the projection beam path coming from the effective object field OF is also referred to as footprint in this application. Here, the footprint of the projection radiation on an optical surface represents the size and shape of the intersection between the projection beam and the surface illuminated by the projection beam. Next to the lens element section,
[0060] During operation, there usually are rays that are not part of the used beam path. These include, inter alia, what are known as superaperture rays. In this context, these are understood to mean those rays which are diffracted by the structure-giving mask and emitted at an angle greater than the object-side aperture angle used for the imaging, the object-side aperture angle being determined by the current diameter of the aperture stop bounding the projection beam path. This object-side aperture angle defines the object-side use aperture. A corresponding statement applies to the image side, which is to say the side of the image optically conjugate to the object.
[0061] For the further explanation of some of the issues are considered in this application and the solution thereof,
[0062] The lens element L1-1 has a body K (e.g., made of synthetic fused silica) transparent to ultraviolet light and is formed as a relatively thick biconvex lens element with a first light passage surface LF1 facing the object plane (light entrance surface LF1) and an opposite second light passage surface (LF2) (light exit surface LF2).
[0063] The lens element fulfils its assigned optical function in the beam path to the best possible extent under all use conditions. Therefore, each of the light passage surfaces LF1, LF2 has an optical used region NB1, NB2, which includes the region of the optical axis and which extends radially outward therefrom to such an extent that all rays of the projection beam path pass through the optical used region on both the entrance side and the exit side under all operating conditions. A ray ST1 propagating at the edge of the projection beam is depicted. Each of the lens element surfaces has radially outside of the optical used region an edge region RB1, RB2 which encloses the respective optical used region in ring-shaped fashion.
[0064] In the incorporated state, the optical element or the lens element L1-1 is carried by a holding device or a mount comprising a few holding elements HE which are distributed over the circumference of the lens element and on which the lens element rests in the case of a perpendicularly oriented projection lens. Together with the lens element mounted or held therein, the mount or holding device forms an assembly BG which, together with further assemblies containing other optical elements, forms the projection lens.
[0065] The contact zones KZO between the holding element and the exit-side light passage surface LF2 are located in azimuthally distributed fashion in the edge region of the lens element and are each in contact with the lens element in the region of a contact zone KZO. It is evident from the magnified detail of the region of the contact zone KZO in
[0066] Each of the light passage surfaces is prepared to optical quality in the optical used region NB1, NB2 and has a surface shape designed in accordance with a used region specification. The used region specification in turn is specified by the function of the optical element in the used beam path. It is defined within the scope of calculating the optical design. In the exemplary case, both lens element surfaces LF1, LF2 are spherically curved in the used region.
[0067] By contrast, the intention is for the edge regions RB1, RB2 not to contribute to the imaging. Although the surface shape in the edge region still corresponds to the mathematical continuation of the surface shape in the used region in the case of conventional lens elements, the optical surface is however substantially rougher, at least in a region at a radial distance from the transition between used region and edge region (dashed lines), and of optically poorer quality in this respect since these surface portions are not required for the imaging.
[0068] A peculiarity of this optical element L1-1 relates to the effect thereof on rays running outside of the projection beam path and striking the edge region radially outside of the optical used region.
[0069] The solid line in
[0070] The radiant energy is absorbed by the adhesive protection layer KSS, which can lead to heating of the adjacent lens element and adjacent holding element, and optionally to heating of the adjacent region of the mount. Unwanted lens heating effects may arise due to this locally arising heat.
[0071] In the illustrated embodiment, this issue is avoided by virtue of the edge region of the entrance-side light passage surface LF1 not being a simple extrapolation of the surface shape of the light entrance side in the used region but instead being imparted with a geometrically defined surface design during the manufacturing, the edge region being designed according to an edge region specification that deviates from the used region specification. In the exemplary case, the specified shaping of the light entrance surface in the edge region RB1 at the light entrance side is chosen so that the entrance-side edge region RB1 is provided with a rotationally symmetric aspherical surface shape. The latter emerges smoothly or continuously, which is to say without edges or jumps, from the surface shape of the used region in the transition region between used region and edge region but deviates significantly in the edge region from the mathematical continuation of the used region, which is depicted by the dashed lines.
[0072] In the exemplary case, the entrance-side light passage surface LF1 is convexly spherically curved in the optical used region, and, as the distance from the optical axis increases, the convex curvature turns into a narrow region with concave curvature in the edge region following a point of inflection, before a convex curvature is present again even further out. This creates a refractive light deflection structure LUS1 which ensures that the superaperture light UAP deflected by diffraction reaches a target region ZB outside of the used beam path, the target region being specifiable by the edge region specification. In the present case, the target region is defined such that it is located (radially) outside of the contact zones KZO. In other words: The contact zones are protected from superaperture rays by the refractive light deflection structure LUS1 by virtue of the superaperture rays being deflected past the contact zones on the outside and into non-critical regions outside of the contact zone, which is illustrated by the broken superaperture ray UAP drawn using dashed lines.
[0073] The target region ZB where the deflected superaperture light is incident having circumvented the contact zone should be quite massive or have quite a lot of mass in order to be subject to only small temperature changes in the case of radiation being incident. Moreover, the region should have a good thermal connection to the outside so that the heat does not flow back into the lens element via the holding elements.
[0074] The targeted deflection of superaperture light via an asphere in the edge region of a lens element on the light-entrance side thereof can be realized relatively easily from a manufacturing point of view since the rotationally symmetric asphere (the light deflection structure LUS1) can be manufactured in one work step together with the rotationally symmetric design in the optical used region.
[0075] In the example of
[0076] An alternative option for designing a refractive light deflection structure for the purpose of deflecting superaperture light can be achieved by virtue of the light deflection structure having Fresnel lens rings in the edge region. The asphere in the edge region can thus be embodied as a ring-shaped Fresnel lens element, as a result of which installation space can be saved in comparison with the more massive asphere in
[0077] In the exemplary embodiments explained hereinafter, the same reference signs as in
[0078]
[0079] The creation of light deflection structures which are rotationally symmetric with respect to the optical axis of the optical element may be advantageous for manufacturing reasons, but this is unnecessary or may be undesirable for functional reasons in many cases. Hence, there are exemplary embodiments in which the optically effective surface shape of the edge region is not rotationally symmetric with respect to the optical axis. For example, the surface shape may have an n-fold rotational symmetry in relation to the optical axis in the edge region, where n may be 2, 3, 4, 6 or 8, for example. A few examples are explained hereinafter.
[0080]
[0081] The diffractive structures with a sawtooth-like cross section may be formed in one piece with the material of the lens element body and may be jointly manufactured with the latter. However a different procedure has been chosen in the exemplary case by virtue of the light deflection structures LUS3 being formed on separate optical light deflection elements LUE, which are manufactured separately from the transparent body of the optical element and are only fastened to the designated regions within the entrance-side edge region RB1 at the body of the optical element following its completion. Here, each of the light deflection elements LUE has a contact face on the side opposite to the light deflection structures, the design of the contact face being matched to the surface shape of the lens element body in the edge region such that reliable fastening is possible, for example directly by way of optical contact bonding without an auxiliary mechanism or with the aid of a thin adhesive layer or optical cement. In this way, even relatively complex distributions of light-deflecting properties in the edge region can be realized within the scope of relatively well-controllable manufacturing processes. Optionally, plane faces may also be worked into the edge region at the positions provided for the light deflection elements as these are particularly suitable for auxiliary mechanism-free contacting with plane faces at light deflection elements by way of optical contact bonding.
[0082] A variant for deflecting superaperture light with the aid of refractive light deflection structures in the forms of prisms PR in the edge region of a lens element is explained on the basis of
[0083]
[0084] Light deflection in the circumferential direction can also be achieved with the aid of diffractive structures. By way of example, the light deflection elements in
[0085] In the previous examples, the light deflection structures are predominantly designed in the view of preventing superaperture light and other stray light from being incident on the light exit surface within certain regions, specifically, for example, wherever holding elements are provided and optionally wherever absorbing layers are present in the region of the contact zones. As a result, it is possible to protect the connection points between the holding elements and the lens elements from stray light-induced heating effects.
[0086] However, it is also possible to improve the performance of the projection lens by way of a targeted deflection of stray light into defined target regions, by virtue of certain components of the stray light intensity or the entire stray light intensity being deflected into a target region or into a plurality of target regions in order to heat a component part placed there in targeted fashion and hence to independently achieve a desired and predictable thermally induced manipulation within the optical system.
[0087] An example of a thermal manipulation with the aid of stray light deflected in a targeted fashion is explained on the basis of
[0088] On account of the near-field arrangement of the illustrated light entrance surface (first light passage surface LF1), the light propagating along the projection beam path produces an illuminated footprint FP on the lens element surfaces, the footprint having substantially the rectangular shape of the effective object field, with at least the corners being slightly rounded-off on account of the distance from the field plane. In the case of this illumination, which is asymmetric in relation to the optical axis OA, the passing projection light produces a non-rotationally symmetric, asymmetric temperature distribution within the optical element OA. If the temperature distribution in the edge region RB is considered, relatively warm zones WZ will be found wherever the corners of the illuminated field are closer to the edge of the optical element.
[0089] The stray light propagating outside of the imaging beam path is incident on the lens element in more or less the same way over the entire edge region. The contact zones of the holding elements HE1 and HE3 to HE7 are unprotected so that superaperture light is able to slightly heat the contact zones located there. In contrast thereto, the contact zones of the holding elements HE2 (at two o'clock) and HE8 (at ten o'clock) are protected from incident stray light via a light deflecting structure LUS6 formed on the light entrance side, with the result that the contact zones remain relatively colder in comparison with the contact zones of the other holding elements which are exposed to the stray light. The asymmetric heat distribution arising in the region of the footprint FP can be at least partly compensated for as a result of this non-uniform heat distribution in the circumferential direction of the heat arising due to stray light, and so the temperature distribution within the optical element OE is more uniform or better homogenized than in the case of the absence of the light deflection structures LUS5.
[0090] Diffractive light deflection structures LUS6 which deflect the stray light radially outwardly are used in the example. Similar effects can also be achieved using refractive light deflection structures and/or using light deflection structures which deflect the light in the circumferential direction.
[0091]
[0092] The concept of the disclosure is not restricted to the use of refractive and/or diffractive light deflection structures. The provision of light deflection structures operating on reflective principles is also possible and advantageous in some cases.
[0093] A single layer or multi-layer reflection coating (mirror coating) REF has been applied to the entire surface within the edge region RB1. If superaperture light UAP is incident on the reflective edge region, it is reflected backwards radially outwardly counter to the normal light propagation direction into a target region ZB which, as seen along the optical axis, is located upstream of the lens element, which is to say between the latter and the object plane. An absorber or any other light capturing structure is provided in this target region. In this way, the contact zone in the region of the holding element can also be protected against irradiation by way of superaperture light. In this variant, too, the concrete specification of the surface shape in the edge region via the edge region specification ensures that it is possible to precisely calculate how the surface design of the mirror surface is designed in order to deflect superaperture light from a known angle of incidence range exactly into a desired target region ZB.
[0094] Aspects of the disclosure were described above using the example of an optical imaging system in the form of a microlithographic projection lens. The disclosure is also usable in other optical systems, for example in an illumination system for constructing a microlithographic projection exposure apparatus. Issues on account of superaperture light may also arise in the illumination system, for example damage to an adhesive on account of the radiation load in combination with a lack of adhesive protection.