LIGHT FIELD IMAGE CAPTURING APPARATUS

Abstract

A light field image capturing apparatus includes: a main lens, configured to transmit light of an object environment, and including an optical axis; a beam generation unit, configured to receive the light transmitted by the main lens and generate plurality Bessel-beams, where the beam generation unit includes plurality slits or conical lenses arranged in an array manner and configured to generate the Bessel-beam respectively; a micro-lens unit, configured to receive the Bessel-beam generated by the beam generation unit, and including plurality micro-lens elements corresponding to the beam generation unit, wherein each micro-lens element is configured to determine a focus point generated after the Bessel-beam passes through each micro-lens element, and a focal length of a distance between the focus point and the micro-lens element; and a light sensing unit, including a focal plane, and configured to enable the focus point to be focused on the focal plane.

Claims

1. A light field image capturing apparatus, comprising: a main lens, configured to transmit light of an object environment, and comprising an optical axis; a beam generation unit, configured to receive the light transmitted by the main lens and generate plurality Bessel-beams, wherein the beam generation unit comprises plurality slits or conical lenses arranged in an array manner and configured to generate the Bessel-beams respectively, and the slits or the conical lenses are arranged along a direction perpendicular to the optical axis of the main lens; a micro-lens unit, configured to receive the Bessel-beams generated by the beam generation unit, and comprising plurality micro-lens elements corresponding to the beam generation unit, wherein the micro-lens elements are also arranged along a direction perpendicular to the optical axis of the main lens, and each micro-lens element is configured to determine a focus point generated after the Bessel-beam passes through each micro-lens element, and a focal length of a distance between the focus point and the micro-lens element according to each focus point; and a light sensing unit, comprising a focal plane, and configured to enable the focus point to be focused on the focal plane.

2. The light field image capturing apparatus according to claim 1, wherein: the slits enable a beam to generate, after the beam passes through the slits, corresponding Bessel-beams respectively; and the micro-lens elements are arranged in an array manner and correspond to the slits respectively.

3. The light field image capturing apparatus according to claim 1, wherein: the conical lenses enable a beam to generate, after the beam passes through the conical lenses, corresponding Bessel-beams respectively; and the micro-lens elements are arranged in an array manner and correspond to the conical lenses respectively.

4. The light field image capturing apparatus according to claim 1, wherein the slits are completed by forming a metal film on a transparent substrate and then making the slits on a metal surface of the metal film.

5. The light field image capturing apparatus according to claim 4, wherein the slits are annular slits.

6. The light field image capturing apparatus according to claim 5, wherein an inner diameter width of each of the slits is between 16 m and 50 m, and a slit width of each of the slits is between 150 nm and 300 nm.

7. The light field image capturing apparatus according to claim 1, further comprising: an image capturing and analyzing unit, configured to analyze and calibrate at least one circle of confusion formed on the focal plane.

8. The light field image capturing apparatus according to claim 7, wherein the circles of confusion of different wavelength gains generated, by the Bessel-beams of different wavelengths generated by the slits of different sizes, on the focal plane of the light sensing unit after the Bessel-beams pass through the corresponding micro-lens elements.

9. The light field image capturing apparatus according to claim 1, wherein the light sensing unit is an image sensor.

10. The light field image capturing apparatus according to claim 9, wherein the image sensor is a complementary metal oxide semiconductor (CMOS) photosensitive element or a charge coupled device (CCD).

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0018] FIG. 1 is a schematic diagram of a light field image capturing apparatus according to an embodiment of the present invention;

[0019] FIG. 2 is a schematic diagram of increasing an available focal length by means of controlling a micro-lens element;

[0020] FIG. 3 is a schematic diagram of generating circles of confusion of different wavelength gains by using slits, of which sizes are designed to be different, according to an embodiment of the present invention;

[0021] FIG. 4 is a schematic diagram of calibrating circles of confusion; and

[0022] FIG. 5 is a schematic diagram of a light field image capturing apparatus according to another embodiment of the present invention.

DETAILED DESCRIPTION

[0023] FIG. 1 is a schematic diagram of a light field image capturing apparatus according to an embodiment of the present invention, and FIG. 2 is a schematic diagram of increasing an available focal length by means of controlling a micro-lens element.

[0024] Referring to FIG. 1 and FIG, 2, a light field image capturing apparatus 1 according to an embodiment of the present invention includes a main lens 14, a beam generation unit 11, a micro-lens unit 12, and a light sensing unit 13.

[0025] The main lens 14 is configured to transmit light of an object environment 141 and includes an optical axis 142.

[0026] The beam generation unit 11 is configured to receive the light transmitted by the main lens, and generate plurality Bessel-beams 112 arranged along a direction perpendicular to the optical axis of the main lens. For example, in this embodiment, the beam generation unit 11 includes plurality slits 111 arranged in an array manner, and the slits 111 are arranged along a direction perpendicular to the optical axis 142 of the main lens 14, so that a beam 114 generates Bessel-beams 112 (with high directional electric field distribution) by the slits 111 (similar to far-field interference of plurality point light sources). Using the slits 111 to generate the Bessel-beams 112 is prior art, and is not described herein again. The beam generation unit 11 of this embodiment is formed by coating, by using a sputtering machine, a clear transparent substrate 113 (such as a glass substrate) with a metal film 116 (such as a silver film) less than 250 nm, and then making, by using a focused ion beam (FIB), plurality slits 111 with inner diameter widths W between 16 m and 50 m and slit widths D between 150 nm and 300 nm on a surface of the metal film 116, wherein the slits 111 are annular slits or ring slits.

[0027] The micro-lens unit 12 is configured to receive the Bessel-beams 112 generated by the beam generation unit 11 and includes plurality micro-lens elements 121 arranged in an array manner, wherein the micro-lens elements 121 are also arranged along a direction perpendicular to the optical axis 142 of the main lens 14 and correspond to the slits 111 respectively. In this embodiment, by means of controlling a distance between the micro-lens element 121 and the slit 111, a position of a focus point 122 generated after the Bessel-beam 112 passes through the micro-lens element 121, and a focal length F of a distance between the focus point 122 and the micro-lens element 121 are determined, as shown in FIG. 2.

[0028] The light sensing unit 13 includes a focal plane 131. The light sensing unit 13 can be an image sensor (such as a complementary metal oxide semiconductor (CMOS) light sensing element or a charge coupled device (CCD)). The light sensing unit 13 is usually configured behind the micro-lens unit 12, and is mainly configured to focus the focus point 122 on the focal plane 131, thereby performing multi-angle domain three-dimensional scanning measurement.

[0029] The light field image capturing apparatus 1 according to this embodiment can be applied to the restoring of three-dimensional light field information (for example, being used with a 3D light field camera), wherein a beam passes through the slits 111 to generate Bessel-beam with high directional electric field distribution, thereby resolving the problem that spatial resolution cannot be improved due to a fact that a micro-lens array of the 3D light field camera may be easily subject to inter-pixel interference.

[0030] Further, focal lengths of the Bessel-beams 112 with respect to the slits 111 can be adjusted by using the micro-lens elements 121 of the micro-lens unit 12, so as to extend available focal lengths, that can extend depth of field of focusing work to a millimeter level, and improve assembly permissible precision, thereby effectively improving angular resolution and spatial resolution, obtaining a high quality image with more complete details and more detailed depth map information, and achieving means for mass production and integration of the elements.

[0031] FIG. 3 is a schematic diagram of generating circles of confusion of different wavelength gains by using slits, of which sizes are designed to be different, according to an embodiment of the present invention, and FIG. 4 is a schematic diagram of calibrating circles of confusion.

[0032] Referring to FIG. 3, when slits are made, inner diameter widths and slit widths of the slits are controlled to make slits with different sizes, and the slits with different sizes can match with used light source bands. For example, slits 111a, 111b, and 111c can allow bands of three types of light, that is, red light, blue light, and green light, to pass, so that only the bands of the three types of light, that is, the red light, the blue light, and the green light can pass through the slits 111a, 111b, and 111c, and other bands are filtered. The sizes of the slits described in this embodiment can be controlled according to requirements, so as to enable required bands to pass through the slits, and the sizes of the slits can be designed according to different application fields.

[0033] In addition, the light field image capturing apparatus 1 further includes an image capturing and analyzing unit 15. Referring to FIG. 3 in combination with FIG. 1, in this embodiment, the slits 111a, 111b, and 111c, of which the sizes are designed to be different, are also used, so that a beam can generate, after the beam passes through the slits 111a, 111b, and 111c, and micro-lens elements 121a, 121b, and 121c, circles of confusion of required wavelength gains on the focal plane 131 of the light sensing unit 13. In FIG. 3, illustration is performed by using an example, wherein the slit 111b generates a focus point A, and the slits 111a and 111c generate circles of confusion B1 and B2 respectively. Accordingly, the image capturing and analyzing unit 15 arranged behind the light sensing unit 13 can be used to perform image capturing, analysis, and calibration according to the sizes and positions of the focus point A and the circles of confusion B1 and B2. Referring to FIG. 4 in combination with FIG. 3, when the image capturing, analysis, and calibration is performed, the focus point A is used as a reference point, the beam generation unit 11 or the micro-lens unit 12 is rotated by an angle along a clockwise rotation direction R1 or a counterclockwise rotation direction R2 on a plane on which an X axis intersects with a Y axis, so that the slits 111a, 111b, and 111c of the beam generation unit 11 and the micro-lens elements 121a, 121b, and 121c of the micro-lens unit 12 are aligned with each other, that is, the circles of confusion B1 and B2 are moved, and the circles of confusion B1 and B2 become smaller as focus points A1 and A2. Therefore, the circles of confusion are generated by using the slits, of which sizes are designed as diffraction level, and the circles of confusion are calibrated by using the image capturing and analyzing unit 15, thereby helpfully obtaining relatively fine image.

[0034] In this embodiment, the specific number of slits for calibrating the circles of confusion can be determined according to requirements as long as accurate positioning can be performed.

[0035] In another embodiment, in addition to rotating the beam generation unit or the micro-lens unit on a plane on which the X axis intersects with the Y axis, displacement (not shown in the drawings) in the direction of a Z axis (a direction perpendicular to the intersection of the X axis and the Y axis) also needs to be taken into consideration for calibrating circles of confusion.

[0036] FIG. 5 is a schematic diagram of a light field image capturing apparatus according to another embodiment of the present invention.

[0037] Referring to FIG. 5 in combination with FIG. 1, this embodiment is basically the same as the aforementioned embodiment, and this embodiment differs from the former embodiment mainly in: a beams generation unit 11 of a light field image capturing apparatus 1 includes plurality conical lenses 115 arranged in an array manner and arranged along a direction perpendicular to an optical axis 142 of a main lens 14, so that a beam 114 generates corresponding Bessel-beams after passing through the conical lenses 115.

[0038] Moreover, after the Bessel-beam with high directional electric field distribution are generated, the technology of adjusting focal lengths of the Bessel-beam with respect to the conical lenses according to the light field image capturing apparatus 1 of this embodiment are the same as those of the aforementioned embodiments, and are not described herein again.

[0039] The above descriptions are merely implementation manners or embodiments of technical means adopted by the present invention for resolving problems, but are not intended to limit the implementation scope of the present invention. That is, equivalent variations and modifications consistent with the meanings of the claims of the present invention or made according to the claims of the present invention shall fall within the scope the claims of the present invention.