FREQUENCY DOUBLER HAVING OPTIMIZED HARMONIC SUPPRESSION CHARACTERISTICS
20170141763 ยท 2017-05-18
Assignee
Inventors
Cpc classification
H03G3/3052
ELECTRICITY
International classification
H03K3/013
ELECTRICITY
H03K5/00
ELECTRICITY
Abstract
Disclosed is a frequency doubler which controls a magnitude of a signal supplied to a virtual ground by adjusting a gain of one-side transistor among transistors receiving differential input signals when outputting a frequency multiplied LO signal through the virtual ground by amplifying the input differential signals by using a differential circuit structure to minimize undesired harmonics characteristics in a frequency doubled signal output by making the magnitudes of two differential signals be the same as each other.
Claims
1. A frequency doubler comprising: a differential circuit amplifying a differential AC signal input through a first input transistor and a second input transistor biased to first DC voltage and outputting a signal frequency-multiplied through a virtual ground; and a gain control circuit controlling an output gain of the frequency-multiplied signal by controlling current which flows on the first and second input transistors, wherein the gain control circuit includes a first control circuit for controlling current of the first input transistor by using one or more transistors and a second control circuit for controlling current of the second input transistor by using one or more other transistors and the first and second control circuits use bias by respective DC voltage.
2. The frequency doubler of claim 1, wherein one of the first and second control circuits uses the first DC voltage and the other one of the first and second control circuits uses second DC voltage having a different voltage value from the first DC voltage.
3. The frequency doubler of claim 1, wherein resistors are connected between respective drain terminals of the first and second input transistors which are NMOS transistors and first power voltage.
4. The frequency doubler of claim 1, wherein inductors are connected between the respective drain terminals of the first and second input transistors which are NMOS transistors and the first power voltage.
5. The frequency doubler of claim 1, wherein the resistors are connected between the respective drain terminals of the first and second input transistors which are PMOS transistors and second power voltage.
6. The frequency doubler of claim 1, wherein the inductors are connected between the respective drain terminals of the first and second input transistors which are the PMOS transistors and the second power voltage.
7. The frequency doubler of claim 1, wherein the first control circuit includes a first transistor connected between the drain terminal of the first input transistor and predetermined voltage, the second control circuit includes a second transistor connected between the drain terminal of the second input transistor and the predetermined voltage, and respective gate terminals of the first and second transistors are biased by the respective DC voltage.
8. The frequency doubler of claim 1, wherein the first control circuit includes first and second transistors connected between the drain terminal of the first input transistor and the predetermined voltage in series and a third transistor connected between a first current source and the predetermined voltage and having the gate terminal and the drain terminal connected with each other, in which the gate terminal of the first transistor is connected with the first DC voltage and the gate terminals of the second and third transistors are connected with each other, and the second control circuit includes fourth and fifth transistors connected between the drain terminal of the second input transistor and the predetermined voltage in series and a sixth transistor connected between a second current source and the predetermined voltage and having the gate terminal and the drain terminal connected with each other, in which the gate terminal of the fourth transistor is connected with the first DC voltage and the gate terminals of the fifth and sixth transistors are connected with each other.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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[0027]
[0028] It should be understood that the appended drawings are not necessarily to scale, presenting a somewhat simplified representation of various features illustrative of the basic principles of the invention. The specific design features of the present invention as disclosed herein, including, for example, specific dimensions, orientations, locations, and shapes will be determined in part by the particular intended application and use environment.
[0029] In the figures, reference numbers refer to the same or equivalent parts of the present invention throughout the several figures of the drawing.
DETAILED DESCRIPTION
[0030] Hereinafter, some exemplary embodiments of the present invention will be described in detail with reference to the exemplary drawings. When reference numerals refer to components of each drawing, it is noted that although the same components are illustrated in different drawings, the same components are designated by the same reference numerals as possible. In describing the exemplary embodiments of the present invention, when it is determined that the detailed description of the known components and functions related to the present invention may obscure understanding of the exemplary embodiments of the present invention, the detailed description thereof will be omitted.
[0031] Terms such as first, second, A, B, (a), (b), and the like may be used in describing the components of the exemplary embodiments of the present invention. The terms are only used to distinguish a component from another component, but nature or an order of the component is not limited by the terms. Further, if not contrarily defined, all terms used herein including technological or scientific terms have the same meanings as those generally understood by a person with ordinary skill in the art. Terms which are defined in a generally used dictionary should be interpreted to have the same meaning as the meaning in the context of the related art, and are not interpreted as an ideal meaning or excessively formal meanings unless clearly defined in the present application.
[0032] First, it will be described as an example that transistors M1, M2, M3, M4, M21, M22, M23, M25, M26, and M27 mentioned below are field effect transistor FETs having a metal-oxide-semiconductor (MOS) structure as illustrated in drawings. However, the present invention is not limited thereto and it will be, in advance, noted that the transistors M1, M2, M3, M4, M21, M22, M23, M25, M26, and M27 may be substituted with transistors having a different structure, which perform a similar function to the MOS-FET bipolar junction transistor (BJT), and the like as necessary. Further, all of the transistors M1, M2, M3, M4, M21, M22, M23, M25, M26, and M27 are preferably implemented to have the same channel width and length, but are not limited thereto and may be designed according to various design rules.
[0033]
[0034] Referring to
[0035] The differential circuit 10 is a circuit having a basic differential amplifier structure which amplifies a differential alternating current (AC) signal inp or inn input through a first input transistor M1 and a second input transistor M2 and outputs a signal (output) frequency-multiplied (e.g., doubled) through a virtual ground. A current source CS is connected between the virtual ground connected with source terminals of the first and second input transistors M1 and M2 and second power voltage (ground) and a frequency multiplied (e.g., doubled) amplification signal may be output through a capacitor C1 connected to the virtual ground. The differential AC signals inp and inn are input gate terminals of the first and second input transistors M1 and M2 through capacitors CA and CB, respectively.
[0036] However, only by the differential circuit 10, an undesired harmonics signal may be included in the frequency multiplied signal due to amplitude mismatch of the different AC signals inp and inn.
[0037] Therefore, in order to optimize the harmonics suppression characteristics according to the present invention, the respective gate terminals of the first and second input transistors M1 and M2 are biased to first direct current (DC) voltage Vg1 through a resistor R11/R12.
[0038] The frequency doubler 100 according to the first exemplary embodiment of the present invention includes auxiliary transistors M11 and M12 for optimizing the harmonics suppression characteristics and the respective transistors M11 and M12 control current which flows on the first and second input transistors M1 and M2 to control an output gain of the frequency multiplied signal output. As a result, a total gain difference of the first and second input transistors M1 and M2 is given to obtain the frequency multiplied signal output in which harmonics is minimized through the virtual ground with respect to the differential AC signals inp and inn having an amplitude difference.
[0039] In the frequency doubler 100 according to the first exemplary embodiment of the present invention in
[0040]
[0041]
[0042] An operation of the frequency doubler 200 according to the second exemplary embodiment of the present invention in
[0043]
[0044] The frequency doubler 300 according to the third exemplary embodiment of the present invention in
[0045] Meanwhile, as an example implemented by substituting the NMOS transistors M1, M2, M11, and M12 with PMOS (P-type MOS) transistors M3, M4, M31, and M32 in the frequency doubler 100 according to the first exemplary embodiment of the present invention, a frequency doubler 400 according to a fourth exemplary embodiment of the present invention in
[0046] The operation of the frequency doubler 400 according to the fourth exemplary embodiment of the present invention in
[0047] As an example implemented by substituting the NMOS transistors M1, M2, M11, and M12 with PMOS (P-type MOS) transistors M3, M4, M31, and M32 in the frequency doubler 200 according to the second exemplary embodiment of the present invention, a frequency doubler 500 according to a fifth exemplary embodiment of the present invention in
[0048] The operation of the frequency doubler 500 according to the fifth exemplary embodiment of the present invention in
[0049] The frequency doublers 100 to 500 according to the exemplary embodiments of the present invention control the current which flows on the first and second input transistors M1 and M2 by a gain control circuit including the auxiliary transistors (e.g., M11, M12, etc.,) to optimize the harmonics suppression characteristics by controlling the output gain of the frequency multiplied signal output.
[0050] That is, in
[0051] A first control circuit includes the transistor M11/M31 connected between the drain terminal of the first input transistor M1/M3 and predetermined voltage (e.g., the ground) and controls current of the first input transistor M1/M3. A second control circuit includes a transistor M12/M32 connected between the drain terminal of the second input transistor M2/M4 and the predetermined voltage (e.g., the ground) and controls current of the second input transistor M2/M4.
[0052] The transistor M11/M31 of the first control circuit and the transistor M12/M32 of the second control circuit receive the bias by respective DC voltage Vg1 and Vg2 through the respective gate terminals. In
[0053] Meanwhile, as illustrated in
[0054] Herein, in the first control circuit, the first transistor M21 and the second transistor M22 are, in series, connected between the drain terminal of the first input transistor M1 and the predetermined voltage (e.g., the ground). A third transistor M23 is connected between a first current source Ib1 and the predetermined voltage (e.g., the ground) and the gate terminal and the drain terminal of the third transistor M23 are connected with each other. The gate terminal of the first transistor M21 is connected with first DC voltage Vg1 and the gate terminals of the second and third transistors M22 and M23 are connected with each other.
[0055] In the second control circuit, a fourth transistor M25 and a fifth transistor M26 are, in series, connected between the drain terminal of the second input transistor M2 and the predetermined voltage (e.g., the ground). A sixth transistor M27 is connected between a second current source Ib2 and the predetermined voltage (e.g., the ground) and the gate terminal and the drain terminal of the sixth transistor M27 are connected with each other. The gate terminal of the fourth transistor M25 is connected with first DC voltage Vg1 and the gate terminals of the fifth and sixth transistors M26 and M27 are connected with each other.
[0056]
[0057]
[0058] As illustrated in
[0059] That is, when the first DC voltage Vg1 biased to the transistor M11/M31 of the first control circuit is 1.2 V, it may be verified that the harmonics suppression characteristics are optimized when the second DC voltage Vg2 biased to the transistor M12/M32 of the second control circuit is 1.03 V as illustrated in
[0060] As described above, the frequency doublers 100 to 500 having optimized harmonics suppression characteristics according to the present invention adopt the differential structure without using a single structure circuit scheme and adopt a method that adjusts a bias of an auxiliary transistor or one-side transistor of a differential amplifier in order to overcome an error of an input signal, which occurs in a differential structure to optimize harmonics suppression characteristics. Further, by overcoming a frequency limit of a CMOS process and optimizing the harmonics suppression characteristics, a frequency multiplied LO signal can be generated in a higher frequency band than an LO signal generated by a voltage control oscillator by two times or more and in addition, since the harmonics suppression characteristics which are a core standard in the frequency doubler can be optimized in a chip, an additional circuit is not required in implementing a module and an LO module in a high frequency band is integrated by the CMOS process by overcoming a limit of the process to be implemented by on-chip.
[0061] The above description just illustrates the technical spirit of the present invention and various changes and modifications can be made by those skilled in the art to which the present invention pertains without departing from an essential characteristic of the present invention.
[0062] Therefore, the exemplary embodiments disclosed in the present invention are used to not limit but describe the technical spirit of the present invention and the scope of the technical spirit of the present invention is not limited by the exemplary embodiments. The scope of the present invention should be interpreted by the appended claims and it should be understood that all technical spirit in the equivalent range thereto is intended to be embraced by the scope of the present invention.