Power grid conductor placement within an integrated circuit
09653413 ยท 2017-05-16
Assignee
Inventors
Cpc classification
H01L2924/0002
ELECTRICITY
H01L2924/0002
ELECTRICITY
H01L2924/00
ELECTRICITY
H01L23/58
ELECTRICITY
International classification
Abstract
An integrated circuit 2 is formed with standard-cell power conductors 14 which are overlaid by power grid conductors 20. The power grid conductors are offset in a direction transverse to the longitudinal axis of the power grid conductors relative to their underlying standard-cell power conductor. This has the effect of increasing the conductor spacing possible to one side of the power grid conductor. Accordingly, a wider than minimum width power grid conductor may be provided which blocks only one of its adjacent track positions from being used by a routing conductor 22.
Claims
1. An integrated circuit comprising: a plurality of standard cells having a plurality of standard-cell conductors in a standard-cell conductor layer, said plurality of standard-cell conductors disposed substantially parallel to each other; and a plurality of further conductors in a further layer separate from said standard-cell conductor layer, said plurality of further conductors disposed substantially parallel with said plurality of standard-cell power conductors, wherein at least one of said further conductors is disposed at an offset position relative to a sequence of conductors starting at a boundary of a standard cell and with longitudinal axis spaced by a uniform pitch from each other.
2. An integrated circuit as claims in claim 1, wherein said plurality of standard cell conductors include standard cell signal routing conductors within said plurality of standard cells and said plurality of further conductors include further layer signal routing conductors within said further layer.
3. An integrated circuit comprising: a plurality of standard cells having a plurality of standard-cell conductors in a standard-cell conductor layer, said plurality of standard-cell conductors disposed substantially parallel to each other; and a plurality of further conductors in a further layer separate from said standard-cell conductor layer, said plurality of further conductors disposed substantially parallel with said plurality of standard-cell power conductors, wherein at least one of said further conductors is disposed at an offset position relative to a sequence of conductors starting at a boundary of a standard cell and with longitudinal axis spaced by a uniform pitch from each other, wherein: said plurality of standard cell conductors include a plurality of standard cell power conductors and said plurality of standard cells are connected to draw power from said plurality of standard-cell power conductors; and said plurality of further conductors include a plurality power grid conductors in a further layer separate from said standard-cell conductor layer, said plurality of power grid conductor disposed substantially parallel with and overlapping corresponding ones of said plurality of standard-cell power conductors, wherein at least one of said power grid conductors is disposed overlapping a corresponding one of said plurality of standard-cell power conductors and has a grid-conductor median longitudinal axis offset by an offset distance in a direction within said further layer, and transverse to said grid-conductor longitudinal median axis, from a perpendicular projection into said further layer of a standard-cell power-conductor median longitudinal axis of said corresponding one of said plurality of standard-cell power conductors.
4. An integrated circuit as claimed in claim 3, comprising a plurality of routing conductors in said further layer, said plurality of routing conductors disposed substantially parallel with said plurality of power grid conductors.
5. An integrated circuit as claimed claim 4, wherein said plurality of power grid conductors and said plurality of routing conductors and are disposed at distances from each other meeting a minimum conductor spacing requirement.
6. An integrated circuit as claimed in claim 4, wherein at least some of said plurality of routing conductors have a routing-conductor width and are disposed at relative to one another such that a distance between adjacent ones of said plurality of routing conductors is substantially equal to a minimum distance that meets said minimum conductor spacing requirement.
7. An integrated circuit as claimed in claim 4, wherein at least some said plurality of routing conductors are spaced from each other by a substantially constant conductor pitch value.
8. An integrated circuit as claimed in claim 7, wherein a position for a routing conductor disposed following said substantially constant pitch value that would violate said minimum conductor spacing requirement is left vacant.
9. An integrated circuit as claimed in claim 4, wherein said at least one of said power grid conductors is neighboured by a first neighbouring routing conductor and a second neighbouring routing conductor and said offset is such that such that said at least one of said power grid conductors is closer to said first neighbouring routing conductor than to said second neighbouring routing conductor.
10. An integrated circuit as claimed in claim 4, wherein said plurality of power grid conductors have a greater width in said further layer than said plurality of routing conductors.
11. An integrated circuit as claimed in claim 3, wherein said standard-cell power conductors are connected to said power grid power conductors with power connection vias.
12. An integrated circuit as claimed in claim 3, wherein said plurality of standard-cell power conductors and said plurality of power grid conductors are disposed along opposite parallel edges of said standard cells.
13. An integrated circuit as claimed in claim 3, wherein at least some said plurality of routing conductors are spaced from each other by a substantially constant conductor pitch value P and said plurality of standard cells have a dimension perpendicular to said plurality of routing conductors and parallel to said standard-cell layer that is N*P, where N is a positive integer value greater than 3, and adjacent power grid conductors within said plurality of power grid conductor are offset.
14. An integrated circuit as claimed in claim 3, wherein at least some said plurality of routing conductors are spaced from each other by a substantially constant conductor pitch value P and said plurality of standard cells have a dimension perpendicular to said plurality of routing conductors and parallel to said standard-cell layer that is N*(P/2), where N is a positive integer value greater than 6, and alternating ones of said plurality of power grid conductor are offset.
15. An integrated circuit as claimed in claim 3, wherein said standard-cell conductor layer is a metal one layer of said integrated circuit.
16. An integrated circuit as claimed in claim 15, wherein said further layer is a metal two layer of said integrated circuit.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1)
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DESCRIPTION OF EXAMPLE EMBODIMENTS
(15)
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(19) As illustrated in
(20)
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(23)
(24) The embodiment of
(25) The example illustrates in
(26) As the power grid conductor 20 becomes wider, as illustrated in
(27) In the examples illustrated herein the standard-cell power conductors are formed in the metal one layer and the power grid conductors and routing conductors are formed in the metal two layer. Other arrangements are also possible.
(28) Power connection vias are provided between the power grid conductors and the standard-cell power conductors. Electrical power is routed into the standard cells via the power grid conductors, the power connection vias and the standard-cell power conductors.
(29) All the example Figures included herein show the track lines as horizontal lines, but it will be appreciated that these lines may be vertical or some other orientation. The tracks which define the longitudinal directions of the conductors are substantially parallel to one another and the conductors are accordingly all substantially parallel to one another.
(30) At least some example embodiments slide or dither the wires and vias so that they are off track and positioned to give improved wiring density (first priority) and wire attributes (second priority) either wire thickness (smaller resistance, improved EM/IR) or wire spacing (reduced line-to-line capacitance, coupling to adjacent wires).
(31) This technique allows dithering using existing place and route tools to enhance their productivity with smaller geometry technology that does not support simple multiples of wire widths.
(32)
(33) Column C shows an example where the power conductors in the M2 layer are two tracks wide and the standard cells are seven and one half pitches tall. If the routing conductors in the M2 layer are shifted by half a pitch then six routing conductor are available compared to five without the shift.
(34)
(35) A further example of this technique is described below.
(36) Aligning Routine Tracks to Pins in EDI/ICC
(37) When the floor plan is created EDI System creates first track at an offset from the placement grid set by the OFFSET value for the layer in the LEF file. The track spacing is the PITCH value for the layer defined in LEF. EDI will try to make the upper layer routing tracks align to the lower layers. IC Compiler uses the PITCH specified to generate wire tracks in the unit tile and OFFSET is defined while creating the milky way Typically, we can re-create the tracks by DEF file can be read in the floor plan and Design will reflect the routing tracks defined in the DEF. Tracks can be deleted and recreated manually as per the requirement of architecture. A script is available to re-generate the tracks in EDI/ICC in such a way that required offset value can be assigned to all the rows.
Pin Pre-Processing For FRAM and LEF While creating the FRAM view of library Techfile with M2 pitch of 64 nm has to be replaced by techfile with M2 pitch of 48 nm (cell height multiple) for wire track generation All other steps for FRAM generation carried out with the techfile with M2 pitch of 64 nm Results in via regions in the FRAM view not aligning to the M2 tracks Routing still works, but ARM is concerned about runtime for real designs Working with Synopsys to determine best course of action Pre-processing of the LEF view by the router just before P&R EDI now pre-processes the LEF view to predetermined pin density in the cells and preferred V1 landing sites Not possible to work around the fact the preferred V1 sites are wrong Routing runs fine, but one of the reasons for the pre-processing is improved TAT in the router (as well as improved placement).
(38)
(39) LUG, lowest upper grid
(40) FVP, fundamental vertical pitch
(41) FHP, fundamental horizontal pitch
(42) A dynamic strap provides a power supply that may be switched off, e.g. gated VDD.
(43) A static strap provides a power supply that is always on, or always enabled, e.g. normal VDD.
(44) A Totem is a via stack combination which extends between multiple layers of metal, for example a totem may extend from M6 to M2, that only has vias, and metal layers covering vias. In this case, the M3, M4 and M5 layers are provided to cover the via. The wire (metal layer) in a Totem is provided to form part of the via stack.
(45) Although illustrative embodiments of the invention have been described in detail herein with reference to the accompanying drawings, it is to be understood that the invention is not limited to those precise embodiments, and that various changes and modifications can be effected therein by one skilled in the art without departing from the scope and spirit of the invention as defined by the appended claims.