CAPACITIVELY COUPLED DEVICES AND OSCILLATORS
20170135190 ยท 2017-05-11
Inventors
Cpc classification
H05H1/30
ELECTRICITY
H01J49/105
ELECTRICITY
H05H1/46
ELECTRICITY
H05H1/2406
ELECTRICITY
International classification
Abstract
Certain embodiments described herein are directed to devices that can be used to sustain a capacitively coupled plasma. In some examples, a capacitive device can be used to sustain a capacitively coupled plasma in a torch in the absence of any substantial inductive coupling. In certain embodiments, a helium gas flow can be used with the capacitive device to sustain a capacitively coupled plasma.
Claims
1-120. (canceled)
121. A method of sustaining a capacitively coupled plasma comprising: introducing a gas flow into a torch body; providing radio frequency energy to the torch body using a capacitive device configured to sustain the capacitively coupled plasma, in which the capacitive device contacts an external surface of the torch body.
122. The method of claim 121, further comprising sustaining the capacitively coupled plasma in the absence of any substantial inductive coupling.
123. The method of claim 121, further comprising configuring the gas flow as a helium gas flow at a flow rate of about 0.5 Liters/minute or less.
124. The method of claim 121, further comprising configuring the capacitive device as a wire coil that surround at least a portion of the torch body.
125. The method of claim 121, further comprising configuring the capacitive device as a plate electrode comprising an aperture to receive at least a portion of the torch body.
126. The method of claim 121, further comprising configuring the torch body as an alumina torch.
127. The method of claim 121, further comprising sustaining the capacitively coupled plasma in the absence of an injector.
128. The method of claim 121, further comprising configuring the capacitive device to be electrically coupled to an oscillator.
129. The method of claim 128, further comprising cooling the oscillator using ambient air.
130. The method of claim 121, further comprising using a portable power source to power the capacitive device.
131. The method of claim 121, further comprising using a battery to power the capacitive device.
132. The method of claim 121, further comprising using a power source of about 500 Watts or less to power the capacitive device.
133. The method of claim 121, further comprising using a 110-120 Volts alternating current source to power the capacitive device.
134. The method of claim 121, further comprising using an additional capacitive device to provide radio frequency energy to the torch.
135. The method of claim 134, further comprising configuring the additional capacitive device as a wire coil.
136. The method of claim 134, further comprising configuring the additional capacitive device as a plate electrode.
137. The method of claim 134, further comprising electrically coupling the capacitive device and the additional capacitive device to the same oscillator.
138. The method of claim 134, further comprising electrically coupling each of the capacitive device and the additional capacitive device to a different oscillator.
139. The method of claim 121, further comprising configuring the torch as an alumina torch, configuring the gas flow as a helium gas flow and configuring the capacitive device as a wire coil.
140. The method of claim 121, further comprising configuring the torch as an alumina torch, configuring the gas flow as a helium gas flow and configuring the capacitive device as a plate electrode.
141-175. (canceled)
Description
BRIEF DESCRIPTION OF THE FIGURES
[0035] Certain embodiments are described with reference to the figures in which:
[0036]
[0037]
[0038]
[0039]
[0040]
[0041]
[0042]
[0043]
[0044]
[0045]
[0046]
[0047]
[0048]
[0049]
[0050]
[0051]
[0052]
[0053]
[0054]
[0055]
[0056]
[0057]
[0058]
[0059]
[0060]
[0061]
[0062]
[0063]
[0064]
[0065]
[0066] It will be recognized by the person of ordinary skill in the art, given the benefit of this disclosure, that certain dimensions or features in the figures may have been enlarged, distorted or shown in an otherwise unconventional or non-proportional manner to provide a more user friendly version of the figures. Where dimensions are specified in the description below, the dimensions are provided for illustrative purposes only.
DETAILED DESCRIPTION
[0067] Certain embodiments of the devices described herein can be constructed and arranged for use in sustaining capacitively coupled plasmas. While some embodiments are described as including one or more features, additional features may also be included in such embodiments without departing from the spirit and scope of the technology described herein. In addition, while certain numbers of windings are shown in the figures, the exact number of windings that may be used in a wire coil capacitive device can vary.
[0068] In certain examples, the devices and systems described herein can be configured to sustain a capacitively coupled plasma (CCP) using a single electrode. For example, a single electrode that physically contacts some portion of an exterior surface of a torch body can be used to sustain a capacitively coupled plasma within the torch. The single electrode can be used to provide radio frequency energy to a torch that receives a gas such as, for example, helium, argon, hydrogen, nitrogen or other gases. The single electrode can be positioned external to a torch or chamber such that it does not interfere with or react with species in the torch or chamber. In some examples, the capacitive coupling can be provided in the absence of any substantial inductive coupling to sustain the capacitively coupled plasma. For example, substantially no inductive coupling can be present while providing the radio frequency energy for capacitive coupling and the device may still sustain a plasma in the torch. In some instances, the CCPs can be sustained at atmospheric pressure, a pressure below atmospheric pressure or a pressure above atmospheric pressure.
[0069] Certain embodiments of a capacitive device are described below with reference to an electrode which can take various forms including a coil of wire that terminates at one end on the torch or on itself, a substantially cylindrical electrode that can surround a portion of the torch, a substantially rectangular or triangular electrode that can surround a portion of the torch or other shapes and configurations that can provide capacitive coupling can also be used, e.g., a thin planar sheet electrode similar to foil or tape can be wrapped around the circumference of the torch. In some instances, a plate electrode that comprises an aperture configured to receive a torch or chamber can be used.
[0070] In certain examples, the size, shape and temperature of the plasma sustained in the torch can vary. For example, the plasma may be about 0.5 mm to about 12 mm in diameter, more particularly about 1 mm to about 8 mm in diameter, e.g., about 2 mm to about 6 mm such as, for example, 4 mm in diameter. For comparison purposes only, a typical inductively coupled plasma may be about 23-25 mm in diameter. In some examples, the cross-sectional shape of the plasma can vary and may be, for example, circular, elliptical, toroid or other cross-sectional shapes. Depending on the exact electrode configuration, the plasma can be substantially perpendicular to a longitudinal axis of the torch, whereas in other examples, the plasma can be tilted at an angle from perpendicular to the longitudinal axis of the torch. In certain instances, the plasma can extend in both longitudinal directions relative to placement of the electrode and may or may not be symmetric about a central radial axis of the electrode. In some examples herein, the CCP may be referred to as a mini-plasma due to its smaller size or as a mini-helium plasma due to its smaller size and that it can be sustained using a helium gas. While certain embodiments are described as using a helium gas, other gases such as argon, nitrogen, ambient air or the like could also be present or used instead of helium.
[0071] In certain embodiments, the exact configuration of the torch can vary and in certain examples the torch can include a dielectric material. In some examples, the torch can include or be made alumina, yttria, titania, quartz, silica nitride or other materials. In other embodiments, the torch can include a material that can withstand the plasma temperatures. In contrast to a typical Fassel torch used to sustain an inductively coupled plasma, the torches used in the devices described herein may be a straight bore torch that is configured as a substantially cylindrical device or tube. In some examples, the straight bore torch can include a single gas inlet at one end and a single gas outlet at an opposite end. The exact length and width of the torch can vary and may be, for example, about 0.1 mm wide to about 50 mm wide, e.g., about 0.5 mm wide to about 10 mm wide, and about 0.5 mm long to about 1 meter long. It will be recognized by the person of ordinary skill in the art, given the benefit of this disclosure, that torches of other widths and lengths can also be used, e.g., the torch may take a form similar to a small quartz, capillary GC column or may be a large cylindrical hollow tube having a length of 1 meter or greater. In addition, the torch can be optically transparent, optically opaque or may transmit a selected amount of light.
[0072] In certain examples, the devices described herein can be operative as an elemental analyzer, a chemical analyzer, a heat source, a torch, e.g., a welding torch, a cutting device, e.g., a plasma cutter, an atomization source, an ionization source, a chemical reactor, a spent fuel processing device, a light source, a portable device or other devices that commonly use a plasma or comparable state of matter. Illustrations of certain devices are provided in more detail below.
[0073] In certain embodiments, the plasma based devices described herein can include a capacitive device. The capacitive device is operative to provide radio frequency energy to the torch to sustain a capacitively coupled plasma in the torch. In some examples, the capacitive device can include an electrode electrically coupled to an oscillator. Referring to
[0074] In certain examples, the electrode can be positioned at various positions along the torch. Referring to
[0075] In certain embodiments, the electrodes of the capacitive device may include a plurality of windings which contact each other and the surface of the torch 120. For example, the windings can be positioned in a suitable manner such that a cylinder of wire is provided with the inner surfaces of the wire cylinder contacting the outer surfaces of the torch 120 with adjacent wire turns also contacting each other. The exact number of windings may vary from about one winding to about fifty windings, more particularly about two windings to about forty windings, e.g., about five windings to about twenty-five windings. As described herein, however, the electrodes can take other forms such as foils, tapes, cylinders or other geometric shapes and constructs.
[0076] In other instances, each of the ends or arms 115, 130 of the torch 110 can be electrically coupled to an oscillator or generator that provides capacitive coupling to the area of the torch body adjacent to the electrode. Illustrative oscillators may be found, for example, in commercially available ICP instruments available from PerkinElmer Health Sciences such as, for example, the Optima 7000 series of instruments. The oscillator can be configured to operate at about 10-50 MHz, for example, about 15-35 MHz, e.g., 20, 25, or 27 MHz. In contrast to oscillators used on existing ICP instruments, which are cooled by a chiller, the oscillators used with the capacitive device can be air cooled using a muffin fan or other suitable air flow device. In addition, the oscillator can be electrically coupled to a power supply of about 500 Watts or less. For example, a power supply designed to operate off of 110-120 Volts alternating current present in most households can be used. In other examples, a 24 Volt battery, 12 Volt battery, a photovoltaic (PV) cell or PV cell array, a fuel cell or other portable power device can be used to provide power to the oscillator. The smaller nature of the oscillator permits the use of portable power sources and can permit the plasma described herein to be used in portable, hand-held devices as described, for example, in more detail below. Also as described in more detail below, one end of the capacitive device can be electrically coupled to a high voltage capacitor of the oscillator and the other end of the capacitive device can be electrically coupled to a transistor of the oscillator.
[0077] In certain examples, the oscillator and other components of the device can be cooled using a fan or other device to provide ambient air to cool the components. The fan can be externally mounted to a housing that includes the capacitive device, the oscillator and the torch or may be mounted in the housing and include one or more air ducts or ports to permit entry and exhaust of air. If desired, cooled air can be introduced into the housing using a compressor and refrigerant or using a chiller or other cooling devices.
[0078] In certain examples, the oscillator may comprise an oscillator circuit 200 that includes a transistor T1 (see
[0079] In certain embodiments, the oscillator circuit may be part of a larger circuit or component that can be used to control the power provided to the plasma in the torch body. For example, the oscillator circuit can be associated with a load that utilizes power from the oscillator. In certain instances, a capacitively coupled plasma generator can be used with a torch and a plasma-forming gas such as argon, helium, nitrogen or other gases. The plasma gas can be excited to a hot plasma that provides a load on the oscillator by drawing power therefrom. The circuit can be electrically coupled to a capacitive device, e.g., a wire coil that contacts surfaces of a torch body, to capacitively couple the oscillator with the plasma-forming gas. In some instances, a controller or computer can be used to control the power provided to the plasma. The exact frequency provided by the oscillators can vary, e.g., may be in the range of 10 to 100 MHz, particularly 20-50 MHz, e.g. 27 or 40 MHz. In a typical configuration, a DC main power supply provides the primary voltage and power to the oscillator by way of a transistor, and a bias power supply can provide a gate bias voltage to the transistor. The power level delivered by the power supply is monitored, for example in the manner taught in the U.S. patent application Ser. No. 08/079,963 filed Jun. 18, 1993, which is incorporated herein by reference. Signals from the main power supply representing a power level can be passed through an analog-digital (A/D) converter to a microprocessor dedicated to controlling the oscillator or a microprocessor that is part of a larger computer system. The microprocessor with its programming can be configured to permit operation of the oscillator circuit in different modes. For example, the microprocessor can be used to determine if the oscillator should be operated in a startup mode and an operating mode. Without wishing to be bound by any particular scientific theory, different impedances may be provided by the plasma during plasma ignition as compared to when the plasma has warmed up or otherwise been sustained for some period. In one configuration, the primary voltage source provides a starting primary voltage for the startup mode, and an operating primary voltage lower than the starting primary voltage for the operating mode. Also, the bias voltage supply can provide a starting bias voltage for the startup mode, and an operating bias voltage lower than the starting bias voltage for the operating mode. If desired, a switch or relay with additional capacitors can be implemented for startup or to otherwise alter the voltage before or after plasma ignition.
[0080] In certain embodiments, the CCPs described herein can be sustained using high voltages, e.g., 5 kV, 10 kV, 15 kV or more. By providing high voltages to sustain the CCP, a plasma is produced that can include high electron temperatures (compared to the electron temperatures sustained using an inductively coupled plasma). In some instances, the electron temperatures of the CCP are at least 10%, 20%, 25%, or 30% higher than an inductively coupled plasma sustained using a helical induction coil.
[0081] In certain examples, the oscillation circuit can include one or more feedback resistors or circuits. For example, a feedback circuit responsive to oscillation frequency and electrically coupled to the transistor to drive the oscillation can be used. In some instances, a capacitive or inductive feedback responsive to the oscillation is connected to the gate terminal of the transistor T1. In some embodiments, the feedback may be capacitive or inductive. A processor or controller can be used to measure feedback and/or provide for control of the oscillator.
[0082] In certain embodiments, the devices and systems described herein may include two or more independent capacitive devices. Referring to
[0083] In certain embodiments, the capacitive devices described herein can sustain a plasma that extends bi-longitudinally from the electrode of the capacitive device. For example and referring again to
[0084] In some instances, it may be desirable to terminate the CCP in the torch so it does not extend beyond a desired point. Referring now to
[0085] In certain embodiments, where the capacitive device takes the form of a coiled wire, the wire can be a copper wire, silver wire, gold wire, aluminum wire, wires formed from refractory materials (e.g., silica nitride, yttria, alumina, ceria or other materials) or wires containing two or more of these materials. The wire can include alloys, oxides or other forms of the metals to provide a desired capacitive coupling effect. The wire can include a fitting at one end to couple to the oscillator and can be terminated at an opposite end wrapping the terminal portion back onto other portions of the coil or by placing the terminal portion against the torch surface. Alternatively, the other end of the wire can be coupled to the oscillator or some component thereof, e.g., a capacitor or transistor of the oscillator. In certain instances, the electrodes of the capacitive devices described herein can be placed at a terminal portion of a torch body to extend the CCP from the torch body. For example, it may be desirable to extend the plasma outside of the torch body to position the plasma closer to a desired site within an instrument or other device. In such instances, the capacitive device can be placed adjacent to an exit terminus of the torch to sustain a CCP that is partially in the torch body and partially extends into space adjacent to the exit terminus of the torch.
[0086] In certain examples, the electrode that provides the radio frequency energy to the torch can be constructed and arranged as devices other than coiled wires. For example, the electrode can take the form of a planar foil or tape, a cylinder, have a rectangular cross-sectional shape, a triangular cross-sectional shape or may have other geometric shape cross-sections. Referring to
[0087] In certain examples, the electrode can take the form of a plate electrode that can sustain the capacitively coupled plasma. Referring to
[0088] In certain embodiments, to generate a plasma in the torch, a gas can be introduced into an inlet of the torch. Radio frequency energy can be provided from an electrode to the torch to provide the capacitive coupling that sustains the plasma. The gas that is introduced can be an inert gas such as, for example, helium, nitrogen, hydrogen, argon or other noble gases. In certain examples, the gas is helium. The use of helium can provide several advantages including low cost (compared to the cost of argon), reduced flow rates, portability and other advantageous features. For example, the helium (or other gas) can be introduced at a flow rate of about 5 Liters/minute or less, for example about less than 4 Liters/minute, 3 Liters/minute, 2 Liters/minute, 1 Liter/minute, 0.75 Liters/minute or even 0.5 Liters/minute or less. Such flow rates can be one-tenth, one-twentieth or even one-thirtieth less than the flow rates commonly used in inductively coupled plasma devices. The device may include conventional sample introduction systems such as Meinhard nebulizers and cyclonic spray chambers. In certain examples, a straight bore torch can replace the injector as no injector is needed for proper operation of the capacitively coupled plasma, though one may be present if desired.
[0089] In certain examples, the torches described herein can include an integral electrode that can be electrically coupled to an oscillator or generator. For example and referring to
[0090] In certain embodiments, the capacitively coupled plasmas described herein can be used in many different settings and in many different devices and systems. For example, the CCP can be used as a light source. In particular, the high intensity light emitted by the CCP can be directed or focused toward a certain direction to provide an intense light source having a focused beam. The light source can be used in portable settings or in a fixed setting such as a home or business. In some examples, the light source can be used to excite one or more other species. For example, the light can be used to excite chemical species that are passing through a window or are in a gas stream.
[0091] In certain examples, the CCP can be used as a chemical reactor. For example, reactants can be introduced into one or more inlets of the CCP torch, and the high temperatures of the CCP can promote a chemical reaction between the two reactants. In some examples, the CCP can be used as a chemical processing device. For example, radioactive species can be introduced into the CCP, and the high temperatures of the CCP can be used to promote conversion of the radioactive species to a more stable form. In other examples, the high temperature of the CCP can be used to study phase changes or can be used to promote atomization and/or ionization of species introduced into the CCP. The person of ordinary skill in the art, given the benefit of this disclosure, will be able to use the CCP devices for these and other chemical uses.
[0092] In some embodiments, the CCP devices can be used in instruments such as those instruments commonly using an inductively coupled plasma. Without wishing to be bound by any particular scientific theory, certain embodiments of the CCP devices described herein more closely mimic those properties of a flame based devices. For example, the CCP can provide good excitation, for example, because of high electron temperatures and lower gas temperatures. Unlike most flame based devices, the CCP device can be portable, is cheap to operate due to low power and low gas flow rate requirements and can provide benefits not achievable with flame based devices. Referring to
[0093] In certain embodiments, the instrument can be configured to detect optical emission of analytes in the CCP or exiting from the CCP. As chemical species are atomized and/or ionized, the outermost electrons may undergo transitions which may emit light (potentially including non-visible light). For example, when an electron of an atom is in an excited state, the electron may emit energy in the form of light as it decays to a lower energy state. Suitable wavelengths for monitoring optical emission from excited atoms and ions will be readily selected by the person of ordinary skill in the art, given the benefit of this disclosure. Exemplary optical emission wavelengths include, but are not limited to, 396.152 nm for aluminum, 193.696 nm for arsenic, 249.772 nm for boron, 313.107 nm for beryllium, 214.440 nm for cadmium, 238.892 nm for cobalt, 267.716 nm for chromium, 224.700 nm for copper, 259.939 nm for iron, 257.610 nm for manganese, 202.031 nm for molybdenum, 231.604 nm for nickel, 220.353 nm for lead, 206.836 nm for antimony, 196.206 nm for selenium, 190.801 nm for tantalum, 309.310 nm for vanadium and 206.200 nm for zinc. The exact wavelength of optical emission may be red-shifted or blue-shifted depending on the state of the species, e.g. atom, ion, etc., and depending on the difference in energy levels of the decaying electron transition, as recognized by the person of ordinary skill in the art.
[0094] In certain embodiments, a schematic of an optical emission spectrometer (OES)-CCP device is shown in
[0095] In certain embodiments, the CCP can be present in an instrument designed for absorption spectroscopy (AS). Atoms and ions may absorb certain wavelengths of light to provide energy for a transition from a lower energy level to a higher energy level. An atom or ion may contain multiple resonance lines resulting from transition from a ground state to a higher energy level. The energy needed to promote such transitions may be supplied using numerous sources, e.g., heat, flames, plasmas, arc, sparks, cathode ray lamps, lasers, etc., as discussed further below. In some examples, the CCP itself can be used to provide the energy or light that is absorbed by the atoms or ions. For example, a device may include a first CCP to atomize and/or ionize a sample and a second CCP to provide suitable energy that can be absorbed by the atoms and ions. Alternatively, suitable optics can be present such that a single CCP can be used for both atomization/ionization and absorption measurements. Suitable other energy sources for providing such energy and suitable wavelengths of light for providing such energy will be readily selected by the person of ordinary skill in the art, given the benefit of this disclosure.
[0096] In certain examples, a single beam AS device is shown in
[0097] In certain embodiments and referring to
[0098] In certain examples, a device for mass spectroscopy (MS) that includes a CCP device is schematically shown in
[0099] In certain embodiments, the mass analyzer of MS device 1000 may take numerous forms depending on the desired resolution and the nature of the introduced sample. In certain examples, the mass analyzer is a scanning mass analyzer, a magnetic sector analyzer (e.g., for use in single and double-focusing MS devices), a quadrupole mass analyzer, an ion trap analyzer (e.g., cyclotrons, quadrupole ions traps), time-of-flight analyzers (e.g., matrix-assisted laser desorbed ionization time of flight analyzers), and other suitable mass analyzers that may separate species with different mass-to-charge ratios. The CCP devices disclosed herein may be used with any one or more of the mass analyzers listed above and other suitable mass analyzers. In certain examples, the CCP device in an MS device is a helium-CCP that is sustained using a helium gas flow and one or more capacitive devices.
[0100] In certain other examples, the CCP devices disclosed here may be used with existing ionization methods used in mass spectroscopy. For example, electron impact sources in combination with a CCP device may be assembled to increase ionization efficiency prior to entry of ions into the mass analyzer. In other examples, chemical ionization sources in combination with a CCP device may be assembled to increase ionization efficiency prior to entry of ions into the mass analyzer. In yet other examples, field ionization sources in combination with a CCP device may be assembled to increase ionization efficiency prior to entry of ions into the mass analyzer. In still other examples, the CCP devices may be used with desorption sources such as, for example, those sources configured for fast atom bombardment, field desorption, laser desorption, plasma desorption, thermal desorption, electrohydrodynamic ionization/desorption, etc. In yet other examples, the CCP devices may be configured for use with thermospray ionization sources, electrospray ionization sources or other ionization sources and devices commonly used in mass spectroscopy. It will be within the ability of the person of ordinary skill in the art, given the benefit of this disclosure, to design suitable devices for ionization including CCP devices for use in mass spectroscopy and other applications.
[0101] In some embodiments, the MS devices disclosed here may be hyphenated with one or more other analytical techniques. For example, MS devices may be hyphenated with devices for performing liquid chromatography, gas chromatography, capillary electrophoresis, and other suitable separation techniques. When coupling an MS device that includes a CCP device with a gas chromatograph, for example, it may be desirable to include a suitable interface, e.g., traps, jet separators, etc., to introduce sample into the MS device from the gas chromatograph. When coupling an MS device to a liquid chromatograph, it may also be desirable to include a suitable interface to account for the differences in volume used in liquid chromatography and mass spectroscopy. For example, split interfaces may be used so that only a small amount of sample exiting the liquid chromatograph may be introduced into the MS device. Sample exiting from the liquid chromatograph may also be deposited in suitable wires, cups or chambers for transport to the CCP device of the MS device. In certain examples, the liquid chromatograph may include a thermospray configured to vaporize and aerosolize sample as it passes through a heated capillary tube. In some examples, the thermospray may include its own CCP device to increase ionization of species using the thermospray. Other suitable devices for introducing liquid samples from a liquid chromatograph into a MS device will be readily selected by the person of ordinary skill in the art, given the benefit of this disclosure. In certain examples, MS devices, at least one of which includes a CCP device, are hyphenated with each other for tandem mass spectroscopy analyses. For example, one MS device may include a first type of mass analyzer and the second MS device may include a different or similar mass analyzer as the first MS device. In other examples, the first MS device may be operative to isolate the molecular ions, and the second MS device may be operative to fragment/detect the isolated molecular ions. In additional embodiments, three or more MS devices may be coupled to each other. It will be within the ability of the person of ordinary skill in the art, given the benefit of this disclosure, to design hyphenated MS/MS devices at least one of which includes a CCP device.
[0102] In certain examples, the CCP devices described herein can be used in portable devices. In particular, the lower power requirements and reduced gas flow rates of certain embodiments can permit the use of CCP devices in settings not possible with most other plasma based devices. For example, the CCP can be powered using a portable power source such as a fuel cell, a battery, a photovoltaic (PV) cell or PV cell array, an electrochemical cell or other suitable power sources that are designed to be moved easily from one place to another place. In addition, the minimal gas requirements to sustain the plasma mitigates any requirements of large gas cylinders or other cumbersome gas storage devices. For example, a small portable gas cylinder similar to the size of a small propane tank, e.g., a 1 liter tank, a 1-gallon tank or a 5-gallon tank, can be filled with helium or other suitable gas. The gas cylinder can be fluidically coupled to a torch comprising a capacitive device to sustain a plasma in the torch. The sustained plasma can be used in field analyses such as soil analysis, hydrocarbon fluid analysis, or other chemical tests commonly performed in non-laboratory settings.
[0103] In some examples, the CCP device can be configured as a sensor that can detect the presence of a particular substance or if a particular substance is present above a certain level. For example, a CCP device can be placed in a desired area of an industrial facility and may periodically monitor gases to determine if species in the air are present above an unsafe level or certain non-desired species are present in the air. Similarly, in-line fluid analyses can be performed using the CCP devices where a small amount of fluid in an industrial facility is periodically sampled (either manually or automatically) and analyzed using a CCP device. The smaller size and power needs of the CCP devices permits the use of many CCP devices at reduced overall cost.
[0104] In addition to the uses of the CCP devices described herein, the CCP devices can be used in other settings where flames or plasmas are commonly encountered. For example, the CCP can be used in welding torches, in plasma cutters, in processing devices that use high temperatures, as a heat source, as a light source or other uses. In some embodiments, the CCP devices can be used as a reactor to promote chemical reactions, process exhaust gases, process spent fuels or the like. For example, partially combusted exhaust gases can be introduced into the reactor to promote further degradation or oxidation to a more environmentally friendly form. Similarly, spent nuclear fuels can be introduced into the reactor to promote formation of a more stable form. In certain embodiments, the reactor can include one or more inlets for introducing species in the reactor. For example, chemical reactants can be introduced into the reactor and a CCP in the reactor can promote reaction between the chemical reactants. The products from the reaction can flow out of the reactor in the plasma stream and be collected and isolated in one or more other containers.
[0105] In certain examples, a plasma can be produced by a process comprising introducing a gas flow into a torch body, e.g., a torch body comprising alumina, and sustaining the plasma using a capacitive device configured to provide capacitive coupling to the torch body. In some examples, the process can include sustaining the plasma in the absence of any substantial inductive coupling. In other examples, the process can include introducing the gas flow into the torch body at a flow rate of about 0.5 Liters/minute or less. In further examples, the process can include providing the capacitive coupling using a 110-120 Volts alternating current source. In additional examples, the process can include providing the capacitive coupling using a portable power source. In some examples, the portable power source can be a battery, a fuel cell, a photovoltaic cell, an electrochemical cell or other portable power sources. In some embodiments, the process can include providing the capacitive coupling using a capacitive device comprising a plate electrode. In additional embodiments, the process can include providing the capacitive coupling using an air-cooled oscillator electrically coupled to the capacitive device.
[0106] In certain embodiments, a kit can be used, for example, to sustain a CCP. The kit can include, for example, one or more desirable components to retrofit existing plasma devices such that those devices can be used to sustain a CCP. In some embodiments, the kit can include a capacitive device constructed and arranged to provide capacitive coupling to sustain a plasma in the metal oxide torch. In certain examples, the kit can also include torch such as, for example, a metal oxide torch. In some embodiments, the metal oxide torch can be an alumina torch. In other embodiments, the metal oxide torch can be a dielectric metal oxide torch. In certain examples, the capacitive device can include a wire coil, can be a plate electrode or can be other capacitive devices such as, for example, a substantially cylindrical device comprising a hollow cavity. In some examples, the kit can include at least one additional capacitive device. In other examples, the kit can include a portable power source. In further examples, the kit can include a detector.
[0107] In certain embodiments, a method of sustaining a capacitively coupled plasma can be performed. The method can include, for example, introducing a gas flow into a torch body, and providing radio frequency energy to the torch body using a capacitive device configured to sustain the capacitively coupled plasma. The capacitive device may take the form of any of the capacitive devices described herein. In some embodiments, the method can also include sustaining the capacitively coupled plasma in the absence of any substantial inductive coupling. In some examples, the method can include configuring the gas flow as a helium gas flow at a flow rate of about 0.5 Liters/minute or less. In other examples, the method can include configuring the torch body as an alumina torch. In further examples, the method can include sustaining the capacitively coupled plasma in the absence of an injector. In additional embodiments, the method can include configuring the capacitive device to be electrically coupled to an oscillator. In some instances, only a single electrode can be used. In other embodiments, the method can include cooling the oscillator using ambient air. In some examples, the method can include using a portable power source to power the capacitive device. In additional examples, the method can include using a power source of about 500 Watts or less to power the capacitive device. In yet other examples, the method can include using a 110-120 Volts alternating current source to power the capacitive device. In some examples, the method can include using an additional capacitive device to provide radio frequency energy to the torch. In further examples, the method can include configuring the additional capacitive device as a wire coil, a plate electrode or other types of capacitive devices. In some embodiments, the method can include electrically coupling the capacitive device and the additional capacitive device to the same oscillator. In further embodiments, the method can include electrically coupling each of the capacitive device and the additional capacitive device to a different oscillator.
[0108] In some examples, the method can include configuring the torch as an alumina torch, configuring the gas flow as a helium gas flow and configuring the capacitive device as a wire coil. In certain examples, only a single wire coil electrode may be present. In other examples, the method can include configuring the torch as an alumina torch, configuring the gas flow as a helium gas flow and configuring the capacitive device as a plate electrode. In certain examples, only a single plate electrode may be present.
[0109] In certain embodiments, a method of facilitating production of a capacitively coupled plasma can be performed. For example, the method can include providing a capacitive device configured to provide radio frequency energy to a torch to sustain the capacitively coupled plasma in the torch. In some examples, the capacitive device is configured to sustain the capacitively coupled plasma in the absence of any substantial inductive coupling. In some embodiments, the method can include providing an alumina torch. In other embodiments, the method can include configuring the capacitive device as a wire coil. In additional embodiments, the method can include configuring the capacitive device as a plate electrode. In further embodiments, the method can include configuring the capacitive device as a substantially cylindrical device comprising a hollow core to receive at least a portion of the alumina torch. In some examples, the method can include providing a detector. In other embodiments, the method can include providing an air-cooled oscillator configured to be electrically coupled to the capacitive device. In further embodiments, the method can include removing the injector from an inductively coupled plasma prior to installing the torch.
[0110] In certain embodiments, the CCPs described herein, and the devices used to generate them, can be used in combination with an inductively coupled plasma. For example, it may be desirable to use a first stage comprising an inductively coupled plasma and a second stage comprising a CCP. The first stage can be used to desolvate a sample, and the desolvated sample can be provided from the first stage to the CCP of the second stage for atomization and/or ionization. A schematic of such a system is shown in
[0111] In certain embodiments, the oscillators and devices described herein can be used in a dedicated element detector. For example, the oscillators described herein can be produced at substantially lower cost than an oscillator commonly used with inductively coupled plasma. The lower cost permits design of dedicated elemental analyzers which can be used to analyze one or a few elements. Illustrative elemental analyzers include those configured to detect one or more metals or non-metals, e.g., nitrogen, sulfur, halogens such as fluorine, chlorine, bromine and iodine, or other elements. In some instances, the CCP can be coupled to an element-selective detector to provide atomized and/or ionized elements to the element-selective detector, e.g., the CCP can be fluidically coupled to a pulsed flame photometric detector (PFPD) configured to measure one of sulfur or carbon or nitrogen, for example. The selective elemental analyzer may be fluidically coupled to a chromatography device, e.g. a gas chromatography device, a liquid chromatography device or other chromatography devices to separate the species in a sample.
[0112] Certain specific examples of CCP devices and configurations of devices used to sustain CCPs are described below to illustrate further some of the uses of the technology described herein.
EXAMPLE 1
[0113] A capacitively coupled plasma was generated and sustained using a modified Optima 7000 OES instrument. A 27 MHz oscillator, with an oscillator circuit as shown in
EXAMPLE 2
[0114] Numerous analytes were injected into the CCP device of Example 1 and detection limits were measured (see
[0115] It was observed that the ICP favored ionic lines and the CCP favored atomic lines. For comparison purposes, certain results were selected from the table of
EXAMPLE 3
[0116] To better understand the differences in the CCP and ICP detection limits, a plot of the CCP/ICP ratio of estimated detection limits versus excitation potential was created and is shown in
[0117] The ratio of magnesium ion to magnesium atoms for each of the plasmas was calculated and is shown in
[0118] To determine how precise the measurements were using a CCP, 4 sets of 10 replicates were analyzed using an ICP device and the CCP device at two different flow rates. The results are shown in the graph of
EXAMPLE 4
[0119] To determine whether the CCP performance was altered by matrix effects, measurements were performed to ascertain the percentage suppression of the signal by the matrix. 1 ppm of analyte in a 1% calcium solution was used. The results are shown in
EXAMPLE 5
[0120] Chlorine and bromine detection limits were determined using the CCP device. The results are shown in
EXAMPLE 6
[0121] To determine the long term stability of a CCP, 10 ppm of several analytes were injected into the CCP device and their signal intensities were monitored as a function of time. The plasma was run for 60 minutes prior to introduction of any analyte. Ideally, the relative intensity is between the 95-105% for stable performance (+/5% of 100% relative intensity), as shown by the two bars in the graph of
[0122] Similar measurements were performed using a different pump rate (1 mL/minute), and the results are shown in
EXAMPLE 7
[0123] The effect of concentration on signal was tested in the ICP and CCP instruments for aluminum. The results are shown in
EXAMPLE 8
[0124] The wavelength was scanned for aluminum at different concentrations to determine the background signal. The results are shown in
EXAMPLE 9
[0125] Different cadmium concentrations were scanned using an ICP (
EXAMPLE 10
[0126] A CCP device comprising a wire coil wrapped around a quartz tube was used to sustain a CCP within the quartz tube. A helium plasma gas was used along with the following parameters: voltage of 48 Volts, a current of 20 amps, and a frequency of 38.5 MHz was provided. The torch was kept at atmospheric pressure. The capacitively coupled plasma that was sustained is shown in
EXAMPLE 11
[0127] A CCP device comprising a wire coil wrapped around a quartz tube was used to sustain a CCP within the quartz tube. A helium plasma gas was used along with the following parameters: voltage of 35 Volts, a current of 20 amps, and a frequency of 38.5 MHz was provided. The torch was operated at a reduced pressure of 5 inches of mercury below atmospheric pressure. The capacitively coupled plasma that was sustained is shown in
EXAMPLE 12
[0128] A CCP device comprising a wire coil wrapped around a quartz tube was used to sustain a CCP within the quartz tube. A helium plasma gas was used along with the following parameters: voltage of 34 Volts, 20 amps, and a frequency of 38.5 MHz was provided. The torch was operated at a reduced pressure of 10 inches of mercury below atmospheric pressure. The capacitively coupled plasma that was sustained is shown in
EXAMPLE 13
[0129] A CCP device comprising a wire coil wrapped around a quartz tube was used to sustain a CCP within the quartz tube. A helium plasma gas was used along with the following parameters: voltage of 33 Volts, 20 amps, and a frequency of 38.5 MHz was provided. The torch was operated at a reduced pressure of 15 inches of mercury below atmospheric pressure. The capacitively coupled plasma that was sustained is shown in
EXAMPLE 14
[0130] A CCP device comprising a wire coil wrapped around a quartz tube was used to sustain a CCP within the quartz tube. A helium plasma gas was used along with the following parameters: voltage of 32 Volts, 20 amps, and a frequency of 38.5 MHz was provided. The torch was operated at a reduced pressure of 20 inches of mercury below atmospheric pressure. The capacitively coupled plasma that was sustained is shown in
EXAMPLE 15
[0131] A CCP device comprising a wire coil wrapped around a quartz tube was used to sustain a CCP within the quartz tube. A helium plasma gas was used along with the following parameters: voltage of 32 Volts, 20 amps, and a frequency of 38.5 MHz was provided. The torch was operated at a reduced pressure of 25 inches of mercury below atmospheric pressure. The capacitively coupled plasma that was sustained is shown in
[0132] When comparing the different pressures used in Examples 10-15, as the pressure decreased the overall length of the CCP increased along the longitudinal direction of the torch.
EXAMPLE 16
[0133] A CCP device configured as a plate electrode can be used with a 0.5 L/minute helium gas flow and an alumina tube as a torch to sustain a capacitively coupled plasma in the alumina tube. An oscillator having the circuit of
[0134] An oscillator having the circuit of
EXAMPLE 17
[0135] A CCP device configured with a capacitive device and can be used with a 0.5 L/minute helium gas flow and an alumina tube as a torch to sustain a capacitively coupled plasma in the alumina tube. The alumina tube can be placed in an Optima 7000 series instrument in place of the injector. A standard sample introduction system can be used.
[0136] An oscillator having the circuit of
EXAMPLE 18
[0137] A CCP device configured with a capacitive device and can be used with a 0.5 L/minute helium gas flow and an alumina tube as a torch to sustain a capacitively coupled plasma in the alumina tube. The alumina tube can be placed in an Optima 7000 series instrument in place of the injector. A standard sample introduction system can be used.
[0138] An oscillator having the circuit of
EXAMPLE 19
[0139] A CCP device configured with a capacitive device and can be used with a 0.5 L/minute helium gas flow and an alumina tube as a torch to sustain a capacitively coupled plasma in the alumina tube. The alumina tube can be placed in an Optima 7000 series instrument in place of the injector. A standard sample introduction system can be used.
[0140] An oscillator having the circuit of
EXAMPLE 20
[0141] A CCP can be sustained using many different types of plasma gases and an oscillator including the circuit of
EXAMPLE 21
[0142] A CCP can be sustained in a torch about the size of a capillary GC column.
[0143] When introducing elements of the examples disclosed herein, the articles a, an, the and said are intended to mean that there are one or more of the elements. The terms comprising, including and having are intended to be open-ended and mean that there may be additional elements other than the listed elements. It will be recognized by the person of ordinary skill in the art, given the benefit of this disclosure, that various components of the examples can be interchanged or substituted with various components in other examples.
[0144] Although certain aspects, examples and embodiments have been described above, it will be recognized by the person of ordinary skill in the art, given the benefit of this disclosure, that additions, substitutions, modifications, and alterations of the disclosed illustrative aspects, examples and embodiments are possible.