LIBS SURFACE CLEANING AND ANALYSIS METHOD

Abstract

A LIBS analysis method and apparatus wherein multiple laser firings in a burst mode are produced to clean a location on the sample. Subsequently. for data collection, pumping the laser produces one or more analysis laser firings and when such a laser firing is detected, the laser pumping stops and the method includes initiating a delay period of time after which the spectrometer is triggered to begin analysis of the resulting plasma produced on the sample.

Claims

1. A LIBS analysis method comprising: producing multiple laser firings in a burst mode to clean a location on a sample; pumping the laser to produce one or more analysis laser firings; detecting an analysis laser firing; stopping the laser pumping; initiating a delay period of time; and at the end of the delay period of time, signaling a spectrometer to begin analysis of the resulting plasma produced on the sample.

2. The method of claim 1 in which the laser is a passive Q-switched laser.

3. The method of claim 1 in which pumping the laser terminates between the cleaning laser firings and the analysis laser firing.

4. The method of claim 1 in which, during the burst mode, N laser firings are produced, N-1 laser firings are cleaning laser firings, and the N.sup.th laser firing is an analysis laser firing.

5. A LIMB analyzer comprising: a passive Q-switched laser for creating a plasma on a sample; a detector configured to detect laser firings; a spectrometer configured to receive plasma radiation from the sample and to integrate the plasma spectrum; and a controller subsystem responsive to the detector and the spectrometer and configured to: control the laser to produce multiple laser firings in a burst mode to clean a location on the sample, pump the laser to produce one or more analysis laser firings, stop pumping the laser and initiating a delay after the detector signals the controller subsystem, and signal the spectrometer, after the delay, to integrate the plasma spectrum.

6. The analyzer of claim 5 in which the controller subsystem is configured to terminate pumping of the laser between the cleaning laser firings and the analysis laser firing.

7. The analyzer of claim 5 in which, during the burst mode, the controller subsystem s configured to produce N laser firings wherein N-1 laser firings are cleaning laser firings and the N.sup.th laser firing is an analysis laser firing.

Description

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

[0014] Other objects, features and advantages will occur to those skilled in the art from the following description of a preferred embodiment and the accompanying drawings, in which:

[0015] FIG. 1 is an illustration showing several cleaning laser firings followed by a spectral analysis laser firing in accordance with a prior art method;

[0016] FIG. 2 is an illustration showing laser firings in a prior art burst mode;

[0017] FIG. 3 is an illustration showing, in one example of the invention, several cleaning laser firings in a burst mode followed by an analysis laser firing with a delay imposed before signal integration of the spectrum detected;

[0018] FIG. 4 is an illustration showing several burst mode cleaning laser firings the last of which is used as a spectral analysis laser firing in accordance with another example;

[0019] FIG. 5 is a block diagram showing several of the primary components associated with a LIBS analyzer in accordance with an example of the invention;

[0020] FIG. 6 is a flow chart depicting the primary steps associated with one preferred method and also explaining the primary programming configuration of the controller subsystem shown in FIG. 5; and

[0021] FIG. 7 is flow chart depicting the primary steps associated with another analysis method and also associated with the primary programming configuration of the controller subsystem of FIG. 5.

DETAILED DESCRIPTION OF THE INVENTION

[0022] Aside from the preferred embodiment or embodiments disclosed below, this invention is capable of other embodiments and of being practiced or being carried out in various ways. Thus, it is to be understood that the invention is not limited in its application to the details of construction and the arrangements of components set forth in the following description or illustrated in the drawings. If only one embodiment is described herein, the claims hereof are not to be limited to that embodiment. Moreover, the claims hereof are not to be read restrictively unless there is clear and convincing evidence manifesting a certain exclusion, restriction, or disclaimer.

[0023] In FIG. 1, several cleaning laser firings 10a are directed to the sample as the passive Q switch laser is pumped as shown at 12, the laser flashes are detected (e.g., using a photodiode), and power to the pumping laser is stopped as shown at 14. For spectrum collection, a laser firing at 10b is directed to the sample and a delay may be imposed as shown at 16 before the spectrometer (including, for example, a CCD) begins integrating the resulting plasma spectral wavelengths. To allow for several spectrum collection firings, each such firing 10b must be delayed from between 10 and 100 milliseconds to allow for spectral data processing between the firings. Thus, 10 cleaning firings followed by 10 spectrum analysis firings at each location on a sample can take a second or more. In a burst mode system, see WO 2015/057784 incorporated herein by this reference, an active Q-switched laser may be continually pumped as shown at 12, FIG. 2 and detector integration starts and continues for typically one millisecond or more. 10 cleaning laser firings followed by 10 spectral analysis laser firings at a location (the spectrums collected from the cleaning firings may be discarded) will then only take less than a second.

[0024] But, because an active Q-switched laser is used, the result is a more expensive, more complex LIBS analysis system. The electronic subsystem associated with an active Q-switched laser may not be amenable to hand held lasers. Further, as spectrometer data collection continues without delay when an active Q-switched laser is used, Bremsstrahlung radiation is collected by the CCD resulting in excessive background noise and a poor signal.

[0025] In one example of the invention as shown in FIG. 3, laser cleaning firings are performed at a location on the sample (e.g., 10-20 firings) using the burst mode technique as shown for laser firings 20 to more quickly clean the sample location. During the operation of the pump laser of the passive Q-switched laser as shown at 12, the laser begins to fire at 50-500 microsecond intervals for a very fast and through cleaning.

[0026] Then, after cleaning, one or more spectral analysis firings 10b are performed where the pumping power 12 is stopped after the laser firing is detected as shown at 14. Also, there is a programmable delay, typically 250 nanoseconds up to 50 microseconds, depending on the application, as shown at 18 between the detection of the laser firing at 10b and when the CCD of the spectrometer is triggered to begin signal integration of the spectrum detected. The programmable delay allows the Bremsstrahlung or continuum radiation to dissipate and not be collected as part of the integrated signal.

[0027] Integration by the spectrometer CCD starts after the delay and continues for a time period (typically less than one millisecond). Additional spectral analysis firings at a given location occur in the same manner with typically a separation of spectral analysis firings of at least one millisecond but typically 10-100 milliseconds to allow for data processing between firings.

[0028] The laser focal spot may then be automatically moved to a new location on the sample for additional cleaning and spectral analysis firings. Focusing of the laser spot may also be automated. See U.S. patent application Ser. No. 14/874,726 filed Oct. 5, 2015 incorporated herein by this reference.

[0029] The result is a passive Q-switched laser system providing faster cleaning and yet at the same time a better analysis signal. Battery power is conserved and heat build-up is reduced which may be especially important in a portable LIBS analyzer.

[0030] In FIG. 4, N (e.g., 6) laser firings are produced while the pump laser is energized as shown at 12, N-1 laser firings are used for cleaning and the Nth laser firing is used for spectral analysis. After the Nth firing is detected, the pumping power is stopped, the delay is imposed as shown at 18 and the CCD of the spectrometer is then signaled to begin integration. This embodiment further shortens the time to clean and analyze the given location on a sample.

[0031] Laser 30, FIG. 5 is pumped by one or more pumping laser diodes 32 controlled by controller subsystem 34 to produce laser firings directed by an optical subsystem to sample S. Laser 30 may be a passive Q-switched laser, 5-7 MJ, with a pule width of 2 ns producing an output at 1064 nm. A detector 36, for example, a photodiode associated with laser 30, detects each laser firing and provides a corresponding signal to controller subsystem 34. Plasma radiation is directed to one or more spectrometers 38 and the CCD 40 thereof via an optical path typically including one or more optical fibers 42. See U.S. patent application Ser. No. 14/179,670 incorporated herein by this reference: Controller subsystem 34 signals CCD to begin signal integration of the spectrum detected.

[0032] In one version as shown in FIG. 3, controller subsystem 34, FIG. 5 controls pumping diode(s) 32 to operate in a burst mode, step 50, FIG. 6. The laser 30, FIG. 5 typically fires at 50-500 microsecond intervals for a very fast and through cleaning of sample S. The laser firings are detected by detector 36 and counted by controller subsystem 34, step 62, FIG. 6. When a predetermined number of cleaning laser firings have occurred, controller subsystem 34, FIG. 5 de-energizes pump diode(s) 32 and pumping stops, step 64, FIG. 6.

[0033] Then, controller subsystem 34, FIG. 5 signals pump diode(s) 32 to initiate pumping again, step 66, FIG. 6. When detector 36, FIG. 5 detects the spectral analysis firing 10-b, FIG. 3 as shown at step 68, FIG. 6, controller subsystem 34, FIG. 5 de-energizes the pumping diode(s) and pumping stops, step 70, FIG. 6. At the same time, a timer is started, step 72 to delay CCD signal integration until the count reaches a program delay (e.g., 250 nanoseconds to 50 microseconds), step 74, FIG. 6 after which controller subsystem 34, FIG. 5 signals CCD 40, FIG. 5, step 76, FIG. 6 to being signal integration, step 78 of the spectrum detected and delivered to the spectrometer 38, FIG. 5 via fiber optic 42. As noted previously, this delay allows for Bremsstrahlung radiation to dissipate.

[0034] Alternatively, controller subsystem 34, FIG. 5 may be programmed to produce the pulse train shown in FIG. 4. As depicted in FIG. 7, controller subsystem 34, FIG. 5 signals pump diode(s) 32 to begin pumping in a burst mode, step 90 FIG. 7. Laser cleaning firings 20, FIG. 4 are detected by detector 36, FIG. 5, step 92, FIG. 7 and controller subsystem 34, FIG. 5 tracks the number of firings until a preset number of firings occur, step 94, FIG. 7 after which controller subsystem 34 de-energizes pump diode(s) 32, FIG. 5, step 96, FIG. 7.

[0035] As shown, a delay is imposed, steps 98-100 (see delay 18, FIG. 4) before controller subsystem 34, FIG. 5 signals the CCD 40 to begin signal integration, steps 102 and 104, FIG. 7 of the spectrum delivered to spectrometer 38, FIG. 5 via fiber optic 42.

[0036] The controller subsystem may include one or more microcontrollers, microprocessors, application specific integrated circuits, field programmable gate arrays or similar electronic devices. The various power supplies of the system are not shown in FIG. 5 for clarity. The CCD output s typically provided to a processor of the controller subsystem 34 which performs signal analysis functions to output, typically to a user display, the elements present in the sample and their concentrations based on a spectral analysis of the plasma.

[0037] The result is a LIBS analysis system, typically configured as a handheld unit, where Bremsstrahlung or continuum radiation dissipates and is not collected as part of the integrated signal and yet cleaning at a given location on a sample occurs very quickly. Faster cleaning and yet, at the same time, a better analysis signal is provided, battery power is conserved, and heat build-up is reduced.

[0038] Although specific features of the invention are shown in some drawings and not in others, this is for convenience only as each feature may be combined with any or all of the other features in accordance with the invention. The words including, comprising, 'having, and with as used herein are to be interpreted broadly and comprehensively and are not limited to any physical interconnection. Moreover, any embodiments disclosed in the subject application are not to be taken as the only possible embodiments.

[0039] In addition, any amendment presented during the prosecution of the patent application for this patent is not a disclaimer of any claim element presented in the application as filed: those skilled in the art cannot reasonably be expected to draft a claim that would literally encompass all possible equivalents, many equivalents will be unforeseeable at the time of the amendment and are beyond a fair interpretation of what is to be surrendered (if anything), the rationale underlying the amendment may bear no more than a tangential relation to many equivalents, and/or there are many other reasons the applicant can not be expected to describe certain insubstantial substitutes for any claim element amended.

[0040] Other embodiments will occur to those skilled in the art and are within the following claims.