Multireflection time-of-flight mass spectrometer

Abstract

A method of reflecting ions in a multireflection time of flight mass spectrometer is disclosed. The method includes guiding ions toward an ion mirror having multiple electrodes, and applying a voltage to the ion mirror electrodes to create an electric field that causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror and to exit the ion mirror, wherein the ion are spatially focussed by the mirror to a first location and temporally focused to a second location different from the first location. Apparatus for carrying out the method is also disclosed.

Claims

1. A multireflection time of flight mass spectrometer (MR TOF MS) comprising: a primary ion mirror arrangement (10) including a first primary ion mirror (10a) which has electrodes that define a cross section with a first, minor axis of the first primary ion mirror which lies generally in a direction of shift of ions and a second, major transverse axis of the first primary ion mirror, each axis orthogonal to a longitudinal axis of the first primary ion mirror (10a), wherein the first primary ion mirror (10a) extends a greater distance in its major axis than in its minor axis and the longitudinal axis being defined generally in the direction of TOF spread of ions in the first primary ion mirror (10a), the first primary ion mirror (10a) having a first plane of symmetry that contains the longitudinal axis of the first primary ion mirror (10a) and major axis of the first primary ion mirror (10a); a secondary ion mirror arrangement (20) including a first secondary ion mirror (20) which has electrodes defining a cross section with a first, minor axis of the first secondary ion mirror and a second, major axis of the first secondary ion mirror, each orthogonal to a longitudinal axis of the first secondary ion mirror (20) again defined generally in the direction of TOF separation of ions in the first secondary ion mirror; means for supplying a voltage to the electrodes of the primary and secondary ion mirror arrangements (10, 20) so as to establish electric fields therein such that the electric field in the first primary ion mirror (10a) is configured to cause: (a) ions to drift in a direction parallel to the minor axis of the first primary ion mirror (10a); (b) the mean trajectory of ions to intercept the first plane of symmetry of the first primary ion mirror (10a); (c) spatial focusing of the ions in a direction parallel to the direction of shift of ions in the mirror; and an ion guiding means (30, 150) configured to introduce ions from an ion acceleration region into the MR TOF MS in a direction which is non-parallel to the first plane of symmetry of the first primary ion mirror (10a) so as to cause ions so introduced to reflect between the primary and secondary ion mirror arrangements at least once prior to exiting them for subsequent processing or detection.

2. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 1 wherein the primary ion mirror arrangement (10) comprises a second primary ion mirror (10b) configured to receive ions reflected out of the secondary ion mirror arrangement (20), and wherein the means for supplying a voltage to the electrodes of the primary ion mirror arrangement (10) is so as to establish electric fields therein such that the electric field in the second primary ion mirror (10b) is configured to cause ions to drift in a direction parallel to the minor axis of the second primary ion mirror (10b).

3. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 2 wherein the primary ion mirror arrangement (10) comprises a third primary ion mirror (10c) and a fourth primary ion mirror (10d) each configured to receive ions reflected out of the secondary ion mirror arrangement (20), and wherein the means for supplying a voltage to the electrodes of the primary ion mirror arrangement (10) is so as to establish electric fields therein such that the electric fields in the third and fourth primary ion mirrors (10c, 10d) are configured to cause ions to drift in a direction parallel to the minor axis of the third primary ion mirror (10c) and the fourth primary ion mirror (10d).

4. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 2 wherein the secondary ion mirror arrangement (20) comprises a second secondary ion mirror configured to receive ions reflected out of the second primary ion mirror (10b).

5. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 4 wherein the secondary ion mirror arrangement (20) comprises a third secondary ion mirror and a fourth secondary ion mirror and wherein the ion mirrors are configured such that ions flow through the ion mirrors in the following order: first primary ion mirror (10a), first secondary ion mirror, second primary ion mirror (10b), second secondary ion mirror, third primary ion mirror (10c), third secondary ion mirror, fourth primary ion mirror (10d), and fourth secondary ion mirror.

6. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 2 wherein the major axis of each of the first and second primary ion mirrors (10a, 10b) is: (a) mutually parallel; and (b) orthogonal to the major axis of the secondary ion mirror.

7. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 1 wherein the major axis of the first primary ion mirror (10a) is parallel to the major axis of the first secondary ion mirror and offset in the direction of the minor axis of the primary ion mirror arrangement (10).

8. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 1 wherein the major axis of the first primary ion mirror (10a) is orthogonal to the major axis of the first secondary ion mirror (20).

9. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 5 wherein the ion mirrors are in a generally circular arrangement oriented towards a common center, the circular arrangement comprising a first semicircle and a second semicircle, wherein all primary ion mirrors occupy the first semicircle and all secondary ion mirrors occupy a second semicircle, the multireflection time of flight mass spectrometer comprising a circular lens at the center of the circular arrangement.

10. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 1 wherein all of the primary ion mirrors (10a, 10b, 10c, 10d) and/or all of the secondary ion mirrors have a cross section which has one of the following shapes: (a) rectangular; and (b) elliptical.

11. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 1 wherein the ion guiding means comprises a linear trap (150).

12. The multireflection time of flight mass spectrometer (MR TOF MS) of claim 1 and further comprising one or more deflectors (40, 43) configured to straighten the ion trajectories on their entrance into the secondary ion mirror as they exit a final primary ion mirror (10d) of the primary ion mirror arrangement (10) such that ions reflect in the secondary ion mirror (20) and return to the final primary ion mirror (10d) of the primary ion mirror arrangement (10) exactly on the incoming trajectory.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) The present invention may be put into practice in a number of ways and some embodiments will now be described by way of example only and with reference to the accompanying figures in which:

(2) FIG. 1A shows a third angle elevation of a preferred embodiment of a multireflection time of flight mass spectrometer, with Type 1 and Type 2 opposed ion mirror arrangements;

(3) FIG. 1B shows a third angle elevation of one of the ion mirrors of the Type 1 ion mirror arrangement shown in FIG. 1.

(4) FIG. 2 shows a part of the arrangement of FIG. 1, in the plane YZ thereof;

(5) FIG. 3 shows a section through the MR TOF MS of FIG. 1 in the plane YZ thereof, along with exemplary ion trajectories in that plane;

(6) FIG. 4 shows, in section in the XY plane, one possible arrangement of electrodes within a Type 2 ion mirror of FIG. 1, along with some suitable voltages;

(7) FIG. 5 shows, again in section in the YZ plane of FIG. 1, one possible arrangement of electrodes within a ion mirror of the Type 1 ion mirror arrangement in FIG. 1, along with some suitable voltages;

(8) FIG. 6 shows, again in section in the YZ plane, an alternative arrangement of ion mirrors embodying the present invention; and

(9) FIG. 7 shows, again in section in the YZ plane, a third embodiment of the present invention; and

(10) FIG. 8 shows a mass spectrometer system comprising an ion source, a linear trap and the MR TOF MS of FIG. 3.

(11) FIG. 9 shows, in section in the XZ plane, ion trajectories focussed on a time-focal point.

(12) FIG. 10 shows, in section in the XY plane, a further embodiment of the present invention.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

(13) FIG. 1A shows a third angle projection (perspective) view of a multireflection time of flight mass spectrometer (MR TOF MS). The MR TOF MS includes two separate ion mirror arrangements. The first ion mirror arrangement 10 forms one of a pair of systems of planar mirrors which are designated Type 1 in the following description. The MR TOF MS of FIG. 1 also includes a second ion mirror arrangement 20 which is generally orthogonal with the first ion mirror 10 and designated Type 2 in the following description.

(14) It will be noted that the first ion mirror arrangement 10 comprises, in the preferred embodiment of FIG. 1A, four ion mirrors stacked on top of each other in a direction parallel with the Y axis 300 as shown in FIG. 1A. FIG. 1B shows a single mirror of the first ion mirror arrangement. Each ion mirror comprises a set of electrodes (a preferred embodiment of which is shown in FIG. 5 below) which, when energized, create an electric field within each ion mirror. It will also be noted that the electrodes extend only part way along the longitudinal axis (in the Z direction 200 of FIG. 1) of each ion mirror so that there is a field free region between the second ion mirror arrangement 20 and the electrodes of the ion mirrors of the first ion mirror arrangement 10.

(15) While the mirrors appear from FIG. 1 to be closed at the ends this is not a requirement of the embodiment of the invention.

(16) Furthermore, while the Figure shows the Type 2 mirror to be rotated by 90 with respect to the Type 1 mirror, this is also not a requirement of the invention. Other degrees of rotation are contemplated in this invention.

(17) The intention is to provide inclined and preferably orthogonal mirror arrangements which cooperate in the generation of separated temporal and spatial foci. The simplest embodiment of the apparatus of the invention has orthogonal mirror arrangements.

(18) Each ion mirror of the first ion mirror arrangement has two planes of symmetry, a first containing the X and Z axes 400, 200, and a second containing the Y and Z axes. It is the first plane of symmetry, in the XZ direction, that is of most relevance for the ion mirrors in the first ion mirror arrangement 10, as will be explained in further detail in connection with FIGS. 2 and 3 in particular.

(19) Finally with regard to FIG. 1 it will be noted that the second ion mirror arrangement 20 comprises a single ion mirror which likewise has two planes of symmetry (in the XZ and YZ planes) but, here, it is the plane of symmetry in the YZ plane that is of most interest.

(20) Referring now to FIGS. 2 and 3, the mean trajectory of ions through the MR TOF MS will now be described. Ions are generated by an ion source 30 which is outside of the MR TOF MS. Following optional preprocessing in one or more stages of mass spectrometry, and/or ion cooling, for example, and storage in, for example, a linear trap, ions are ejected towards the MR TOF MS. In known manner, ions are accelerated through an electric field of known magnitude and are then allowed to drift without further acceleration towards the MR TOF MS. These ions are then directed towards the ion mirror arrangements 10, 20 and, after a first reflection in the second ion mirror arrangement 20, arrive at a slot 35a of a mirror 10a, seen best in FIG. 2, and which is formed in a front face of a first, upper (in the Y direction) ion mirror of the ion mirror arrangement 10. It will be seen that ions arrive at the aperture 35a at an angle to the plane of symmetry as identified above (that is, the plane of symmetry in the XZ plane). Thus, the ion trajectory passes through that plane of symmetry for a first time at or around the entrance slot of 35a the first ion mirror 10a.

(21) Ions continue generally in the direction that they enter the first ion mirror 10a since the first part of the ion mirror 10a in the longitudinal direction is a field free region without electrodes 47. Approximately one third of the way into the ion mirror (that is, approximately one third of the distance between the entrance slot 35a and the plane at which reflection occurs further along the longitudinal axis), ions enter an electric field established by a plurality of electrodes 37.

(22) The electric field has the effect of spatially focussing the ion for a first time at a saddle point 38. The ions then continue in a direction generally parallel with the longitudinal axis of the ion mirror 10a before being reflected back at a turning point 45 defining a plane of reflection. It is at this point 45, where the ions change direction, that they intersect the plane of symmetry in the XZ plane for a second time.

(23) The ions are then spatially focussed for a second time at a second saddle point 39 and then carry on again in a direction generally parallel with the longitudinal axis of the ion mirror 10a, before exiting the electric field of the ion mirror 10a into the field free region 47. The ions are deflected before leaving the electric field of the ion mirror 10a so that they once more have a component of movement in the Y direction. Thus they intersect the plane of symmetry in the XZ plane of the ion mirror 10a for a third and final time, again generally in the region of the elongate slot 35a as they pass back out of the ion mirror 10a.

(24) Thus the shape described by the ions may be likened, generally, to the Greek gamma and ions intersect the plane of symmetry three times.

(25) As an advantage and important effect the flight path is arranged such that a projection of the flight path onto the plane containing the longitudinal direction (Z) and the minor (Y) direction crosses over itself once for each entry into one of the first mirrors 10.

(26) Having passed back through the elongate aperture 35a, ions continue moving right to left in FIG. 3 and enter the orthogonal second ion mirror arrangement (Type 2). The ions remain generally in the plane of symmetry (YZ) of the second ion mirror arrangement 20 but intersect the longitudinal (Z) axis thereof at an acute angle which may or may not be the angle at which ions entering the first ion mirror arrangement 10 intersect the plane of symmetry of that mirror.

(27) Following the second reflection in the second ion mirror arrangement 20, ions travel generally in a straight line back towards the first ion mirror arrangement 10 where they enter an elongate slot 35b of a second ion mirror 10b of the first ion mirror arrangement 10 which is adjacent the first ion mirror 10a of it, but whose longitudinal axis is displaced in the Y direction. The second ion mirror 10b is preferably of a identical construction to the first ion mirror 10a and thus has a set of electrodes extending part way along the longitudinal axis to provide an electric field for reflection of ions entering the second ion mirror 10b.

(28) Ions again describe the gamma shape through the second ion mirror 10b so that they intersect the plane of symmetry of the second ion mirror 10b three times and so that ions leaving the second ion mirror 10b do so in a direction that has a component in the Y direction again.

(29) Ions then pass back into the second ion mirror arrangement 20 where they are reflected at an angle to the longitudinal axis and thus continue with a component in the Y direction downwards (when viewed in the orientation of FIGS. 1, 2 and 3). Ions then enter a third ion mirror 10c of the first ion mirror arrangement 10, execute the loop gamma trajectory in it and are directed back again into the second ion mirror arrangement 20 for a further time. Here they are reflected again, still with a component of drift in the Y direction downwards, into a fourth and final ion mirror 10d of the first ion mirror arrangement 10. After completing a final traverse through the fourth ion mirror 10d, ions exit the elongate slot 35d of the fourth ion mirror 10d after which they arrive at detector 52, for detection. Only after the fourth ion mirror 10d of the first ion mirror arrangement 10a do aberrations of 1st, 2nd and 3rd order achieve a minimum and thus provide an optimized quality of time of flight focussing.

(30) The second mirror arrangement 20 reduces spatial dispersion of ions in a second direction orthogonal or at least at an angle to the focusing direction of the mirror arrangement 10. Preferably the second mirror arrangement 20 provides focusing in that second direction.

(31) FIG. 9 shows a preferred configuration where the focal length of the second mirror assembly equals the Z-elongation of the ion flight path. That is an incident parallel beam is focused to a focal point at the turning point and vice versa. This configuration requires an even number of reflections to go from parallel to parallel beam or from focused to focused, so it is best suited for multi-reflection configurations. In exchange it carries the advantage of a maximised focal length, reducing errors.

(32) It is to be understood that the preferred configuration has the first mirror assembly orthogonal to the second in the sense that the respective other mirror assembly does not affect the behaviour of the former in its main focusing direction.

(33) It is not necessary that the Type 1 and Type 2 mirrors are orthogonal.

(34) Thus the arrangement of FIGS. 1, 2 and 3 significantly increases the total path length between the acceleration region upstream of the MR TOF MS and the detector. However, the flight path may be increased further (effectively doubled) by reversing the direction of ion travel in the ion mirror arrangements 10, 20 as shown in FIG. 3 by the lower dashed line opposite the fourth ion mirror 10d of the first ion mirror arrangement 10. Instead of proceeding to detector 52, a second deflector 40 may be used to straighten the trajectories on their entrance into the second ion mirror arrangement 20 as they exit the fourth ion mirror 10d of the first ion mirror arrangement 10, and then return ions exactly on the incoming trajectory. On the way back, ions may be deflected in the X direction by third deflector 41, and captured by a second detector 50 located above the plane of the drawing in the X direction. The third deflector 41 could be energized only after all the ions of interest have passed through the MR TOF MS on the forward pass, and this of course limits the mass range, since heavy ions are just passing the third deflector 41 when relatively lighter ions are already coming back. However, this becomes a problem only for ions with ratios of time of flights of about 8:1, that is, for ratios of M/Z:(M/Z).sub.max/(M/Z).sub.min>60. This limitation is of limited practical concern as RF transmission devices normally used in the ion source 30 impose much more stringent limitations on the mass range.

(35) The flight path may be increased still further by employing a fourth deflector 42 instead of the third deflector 41. The fourth deflector straightens up the path of the ions but keeps them generally in the YZ plane (in contrast to third deflector 41 which deflects ions up out of the YZ plane for detection at second detector 50)see the upper part of FIG. 3. Ions whose trajectories have been straightened relative to the longitudinal axis of the second ion mirror arrangement 20 are reflected within so as to return back along a path generally parallel with the direction in which they enter the field of the second ion mirror arrangement 20, following which they are deflected back into the first ion mirror arrangement 10 at an angle to the longitudinal axis of the first ion mirror 10a so as to traverse a path through the two ion mirror arrangements 10, 20 similar to the path traversed during the first pass there through. Since ions, in this embodiment, pass through the MR TOF MS three times, twice in the forward direction and once the reverse direction, they arrive at the elongate slot 35d of the fourth ion mirror 10d of the first ion mirror arrangement 10 and first deflector 43 is then activated to deflect the ions up out of the plane of the paper of FIG. 3 (in the X direction) towards the first detector 51. Preferably, the first deflector 43 is switched on once heavy m/z have passed it on their way back from deflection by the second deflector 40. Then ions are taken away from their second forward pass onto the first detector 51, with light m/z first followed by heavier m/z. In this case, the ratios of times of flight are about 2.4:1. This results in a much more modest (m/z).sub.max/(m/z).sub.min6. Any further increase in the flight path (for example, by passing the ions through two ion mirror arrangements 10, 20 a fourth time) further reduces the mass range of analysis though improves resolving power. Steeper deviation from the ion path, for example by locating the deflectors just before the detectors, or indeed integrating the deflectors with the detectors can improve this ratio by around 10-20%.

(36) Instead of the first and/or second detectors 50, 51, as the case may be, ions may instead be removed from the plane of transmission through the MR TOF MS in the X direction to another stage of mass analysis (not shown in the Figures). For example, a fragmentation device may be situated out of the plane of FIG. 3 (in the X direction) so that, following fragmentation, ions can be reinjected into the same MR TOF MS or into another mass analyser.

(37) A mass spectrometer incorporating the invention can comprise a first mass selector, which can be a multipole, an ion trap, or a time of flight instrument, including an embodiment of the invention, or an ion mobility device and any known collision, fragmentation or reaction device and a further mass analyzer which can preferably be an embodiment of the invention orespecially when the first mass analyzer is an embodiment of the inventionanother mass analyzer, like a reflectron TOF or an ion trapping mass analyzer, e.g. an RF-ion trap, or an electrostatic trap or any type of FT/MS. Both mass analyzers can have separate detection means. Alternatively a low cost version could have detection means only after the second mass analyzer.

(38) When the analyzer is not to be used re-entrant, as described above, also a combination of two embodiments of the invention can be advantageous.

(39) Operation modes include full MS.sup.1, as well as MS.sup.2 or MS.sup.n in the known fashions, as well as the wide and narrow mass range detection modes disclosed in this description.

(40) Advantageously an apparatus of the invention incorporates a chromatograph and an atmospheric pressure ion source or a laser desorption ion source.

(41) Although the ion mirrors 10a-10d of the first ion mirror arrangement 10 as shown in FIGS. 1, 2 and 3 are planar, there is no requirement that they should be so formed. In particular, elliptic or circular cross section ion mirrors could equally be employed. Though not essential, it is preferable that the cross section of each ion mirror has a major and minor axis (that is, the sections are, for example, rectangular or elliptical), with the gamma shaped ion trajectories in each ion mirror causing a drift direction of the ions to be established in the Y direction, which is the direction of the minor rather than the major axis.

(42) Preferably the major axes of the first set of mirrors (Type 1) and the second set of mirrors (Type 2) are different to each other.

(43) As shown in the figures, the mirrors preferably comprise elongated electrodes or electrode elements in the shape of rods or plates which are arranged along the respective major axis of the mirror. The mirrors can be closed at the minor sides with similar electrode arrangements to eliminate fringing fields. These closing elements could also be PCBs which mimic the ideal field as found in the centre of the arrangements. However the mirrors can be open at the minor sides if those sides are sufficiently far from the path of the ion beam.

(44) For non planar ion mirrors, electrodes may be formed by stamping or electrochemical etching. A preferred implementation employs flat plates on its edges to minimise fringing fields, so as to constitute a planar mirror. The flat plates are located, in preference, at least one mirror height away from the ion trajectories, and preferably more than 1.5 to 2 mirror heights.

(45) The second ion mirror arrangement 20 may likewise be a single planar mirror (as shown in FIG. 1) or it may be a single elliptical mirror. To increase the flight length even further, additional layers of Type 2 mirrors may be employed above or below the single second ion mirror arrangement 20 of FIG. 1 (that is, in the +Y and/or Y directions). Ions may be transferred from layer to layer using a pair of opposing deflector plates that allow ions to enter each Type 2 mirror arrangement always along the plane of symmetry. Furthermore, instead of a single ion mirror in each Type 2 mirror arrangement, multiple mirrors could instead be employed, which may be planar or non planar (e.g. elliptic or circular in cross section). Such an arrangement is shown in FIG. 6, where all mirrors in the first and second ion mirror arrangements are Type 1, with a single planar lens 60 formed between them. The planar lens 60 acts to focus ions in the X direction, that is, into the plane of paper of FIG. 6, since without the crossed planes of symmetry of earlier embodiments (FIG. 1, for example), there is no other source of ion focussing in that direction.

(46) Though focussing of this planar lens 60 is unlikely to be as strong as the arrangement of FIGS. 1 to 3, the construction of FIG. 6 does have an advantage of higher tolerance to space charge, because ion packets will be shielded from ions of other m/z moving in neighbouring mirrors, at their turning points where the influence of space charge is expected to be most significant. This shielding occurs whilst the ions are within the Type 1 mirrors and so in the embodiment of FIG. 6, the ions are shielded at all of their turning points. The arrangement of FIG. 6 may also be more straightforward to manufacture since the single Type 2 electrode of FIG. 1 can become difficult to maintain within suitable tolerances for longer path lengths.

(47) As with the arrangement of FIG. 3, the forward pass through the MR TOF MS of FIG. 6 could be reversed by using deflectors 40 and 41 to double the flight length as shown by the dashed linesdetector 50 is once again located above or below the plane of the drawing of FIG. 6. Still a further increase in the flight length may be achieved by passing ions back through the arrangement of FIG. 6 for a third time (in the forward direction once more) as has been described previously in connection with FIG. 3. Furthermore, multiple layers of the lens 60 could be employed.

(48) FIG. 7 shows still a further embodiment which extends the principles of FIG. 6 further. Instead of arranging the first and second ion mirror arrangements so that they are linearly opposed, as shown in FIGS. 3 and 6, the ion mirrors may instead be oriented towards a common centre with a circular lens 70 in the middle, so that ions move around a generally circular arrangement of ion mirrors.

(49) Although the arrangements of FIGS. 6 and 7 show planar mirrors, as previously, the mirrors may instead be elliptical in cross section, or of other geometric shape. This may be advantageous since an elliptical cross section mirror, for example, may provide spatial focussing also perpendicular to the plane of trajectory. Of course, it is necessary to organise that orthogonal focussing so that aberrations are not significantly increased. By employing elliptical cross section mirrors, it may be that the lens 60/70 of FIGS. 6 and 7 may not be necessary.

(50) Alternatively, as in the embodiment of FIG. 3, the space focusing in the transversal plane of FIG. 6 and especially 7 can be arranged by using two types or orientations of mirrors, each providing focusing in a different transversal direction, and both cooperating in creation of the desired longitudinal (time) focal points.

(51) FIG. 8 shows a mass spectrometer system 100, which includes an MR TOF MS as described above. The specific embodiment of MR TOF MS shown in FIG. 8 is that of FIG. 3 though the FIG. 6 or FIG. 7 embodiments could of course equally be employed.

(52) Only those parts of the system 100 that are relevant to an understanding of the invention are shown in FIG. 8. The system includes an ion source 110 such as an electrospray or MALDI source. This generates a quasicontinuous stream of ions that are guided via lens 120 into a collision cell 130. Here, ions are (optionally) fragmented and then guided via second lens 140 into a linear trap 150. The linear trap 150 may take various forms such as a linear quadrupole, hexapole or octapole trap with straight elongate rods, or it may be curved (that is, has curved elongate rods with a constant section and a constant rod separation along the direction of elongation). Most preferably, the linear trap 150 is curved but with a non-linear sectional area along the axis of elongation, such as is described in our co-pending application no. GB 0626025.1, the contents of which are incorporated herein entirely.

(53) In use, ions generated in the ion source 110 pass through the lens 120, and into the fragmentation cell 130. Here they may be fragmented or not depending upon the ions being analysed and the user's choice. They then pass via second lens 140 into the linear trap 150 where they are captured and cooled. Some crude mass selection may also take place within the linear trap 150. Ion packets are then ejected generally in a direction the curved axis of elongation of the linear trap, as is described in the above referenced GB 0626025.1, and are focussed downstream of the trap 150. They then pass into the second ion mirror arrangement 20 and continue onwards as described above in connection with FIG. 3.

(54) After one, two or three passages through the MR TOF MS, ions may be deflected out of the plane of the drawing such as for example by deflector 41 deflecting ions to detector 50 out of the plane of the paper.

(55) One specific embodiment of the Type 2 mirror is shown in XZ section in FIG. 4, and a specific embodiment of the Type 1 mirror also is shown in section in the YZ plane in FIG. 5. FIGS. 4 and 5 show the geometric and electric parameters of the ion mirrors in detail. A series of voltages are supplied from a power supply (not shown) to the electrodes of each, and potentials are applied to a set of precision-ground metallic rods. For example, the rods may be formed of stainless steel, invar or metal-coated glass, for example. Alternatively, a set of thin or thick metal plates, or printed circuit boards could be used to provide the same effect. The specific voltages employed in the preferred embodiment for the second and first ion mirror arrangements 20, 10 are shown in tables in FIGS. 4 and 5 respectively, for ions accelerated by 2 kV.

(56) FIG. 10 shows another preferred embodiment that allows use of the multi-reflection assembly in 1-pass, 3-pass, and 5- to (2*n1)-pass mode.

(57) Typically the 1-pass mode will allow quick low resolution mass analysis, 3-pass mode will provide higher resolution analysis over a mass range that approximately matches the mass range of an RF-ion trap operated at a fixed frequency and the higher pass modes providing high resolution zoom modes of operation of a smaller mass range.

(58) An injector trap 210 is preferably (but not necessarily) oriented parallel to one of the transversal directions and parallel to the elongation direction of at least one of the mirror sets. Advantageously it can be positioned outside the plane of ion movement, decoupling its properties from the longitudinal motion.

(59) The injector trap 210 may be a curved non-linear RF ion trap such as that disclosed in the applicant's co-pending application published as WO 2008 081334, the contents of which are incorporated herein by reference.

(60) Ions can enter the injector trap directly from an ion source, or through a first mass analyzer and an optional first reaction device which could also be part of the first mass analyzer.

(61) In this configuration a single detector 290 can be used for all single- and multi-pass analyzing modes.

(62) Y deflectors 221, 222, 223 organize entry, reflection and exit of ions in this device as shown in the figure.

(63) Preferably in this configuration the detector element 290 is again parallel to the injector trap 210 and a transversal main direction 230. The detector element 290 can be in the plane of ion movement or out of plane.

(64) While the Type 1 and Type 2 mirrors illustrated in the figures suggest that they are closed on three sides, this is not necessary.

(65) It is preferable to sustain a pressure lower than around 10.sup.9 . . . 10.sup.8 mbar within this system, preferably using split flow turbomolecular pumps. The preferable overall flight length of an MR TOF MS in accordance with preferred embodiments lies in the range of 10 to 200 meters, with an overall length of the system being between about 0.5 to 1 meter. The average ion acceleration is preferably in the range of 1 to 20 kv, 2 kv being used in the arrangements of FIGS. 4 and 5.

(66) The arrangements thus described provide a large increase in the path length relative to a single reflection time of flight mass spectrometer, but at the same time enhance spatial focussing, improved shielding of ion packets from each other to minimize space charge effects, and provide a simplified ion injection scheme due to the removal of spatial conflict between the ion source and the fringing fields of an ion mirror.

(67) While FIG. 9 does not explicitly show this, it is the case that the focal point lies at the turning point of the ions in the other mirror (the other mirror not being depicted). The mirror action that is depicted is mirror 20focusing in X.

(68) There are two X-focus points per complete passage. This means that if the entry beam into mirror 20 is parallel, it will focus the beam in X at the turning point of the next mirror 10 (say 10a). The beam crosses over in X at its turning point in Z in mirror 10a, and comes back out divergent again, mirrors 10 not having any X-focusing action. It enters mirror 20 and is brought parallel by that mirror. It travels parallel into mirror 10b, comes out parallel from 10b and then enters 20 again. Mirror 20 makes it focus at the turning point in mirror 10c. It crosses over, returns divergent to mirror 20 and is again brought parallel by mirror 20.

(69) There are ten Y-focus points per complete passage as shown in FIG. 3. Two lie in each mirror of the set 10, and there are in addition two more at the turning point of mirror 20.

(70) The mirror system depicted schematically in FIG. 10 has second order time of flight focusing at the detector, and if the beam is reversed, at the plane passing through the exit of the injector. That is to say, all energy and spatial aberration coefficients are zero to second order. It has a minimum (but not zero) 3.sup.rd order time focus coincident with the 2.sup.nd order time focusing point.

(71) The mirror system produces focal points in X and Y that are not coincident with the time focal points. This has benefits for the detector, as it spreads the ion beam over a larger surface, whist during its extended passage through the instrument it has been contained in X and Y, and not allowed to diverge so as to be too large to detect.

(72) Also the ions are not focused for the majority of their passage, reducing space charge effects, especially as the focus points in X are never the same as those in Y, giving line foci, never point foci.

(73) An odd number of passes through the mirror system is beneficial, because of the action of the Y-deflectors 221, 222, 223 in the embodiment of FIG. 10. Deflecting the beam produces aberrations, but a preferred embodiment utilises a system of deflectors whose aberrations largely cancel when there are an odd number of passes through the mirror system:

(74) When operating in 1-pass mode, the action of Y-deflector 223 cancels that of Y-deflector 221.

(75) When operating in 3, 5, 7 . . . -pass mode, the action of Y-deflector 222 cancels itself out.

(76) When operating in 3, 5, 7 . . . -pass mode the action of Y-deflector 221 cancels itself out except for the first action, which is cancelled by the final action before detection of Y-deflector 223.

(77) In the specific example where a single passage of flight through the mirror system gives about 4 meters of flight, typical resolutions achieved are approximately 20 k for 1 pass, 60 k for 3 passes and 100 k for 5 passes.

(78) This embodiment, as illustrated in FIG. 10, has time focus points at a Z-X plane at the exit of the injector, and at the detector plane. This is because when travelling in a forward direction only after the passage through the fourth ion mirror 10d of the first ion mirror arrangement do aberrations of 1.sup.st, 2.sup.nd and 3.sup.rd order achieve a minimum. Likewise, when the beam is reversed, only after the passage through mirror 10a are the aberrations minimised.

(79) The injector 210 is displaced in X so that it does not interfere with the ion beam path when performing more than one pass of the mirror system, and ions emitted from the injector are deflected into the Z-Y plane by an X-deflector. The detector is shown not displaced but having its centre plane lying in the Z-Y plane in this embodiment. Alternatively it may be out of the Z-Y plane, displaced in X in the same or opposite direction to the displacement of the injector 210 and collimator 220.

(80) In this arrangement, an additional X deflector is required (not shown in FIG. 10). If the detector 290 is displaced out of the plane in this way, any aberrations due to the action of the X deflector 240 may be substantially cancelled by the action of the additional X deflector, if suitably designed.

(81) The cancelling effect of the Y-deflectors 221, 222, 223 means the detector 290 lies perpendicular to the ion beam at best time-focus, and is not tilted. A single detector can be used when odd numbers of passes are performed. For these reasons this arrangement is preferred over that of FIG. 3.

(82) The collimator 220 comprises an entry lens and two button lenses (not shown for clarity) contained in a shielding enclosure. The collimator is coupled to the ion injector and is also out of the Z-Y plane. The injector and collimator produce a beam of ions suitable for injection into the mirror system, the beam being tilted with respect to the Z-Y plane, intersecting with it in the vicinity of the X-deflector 240. The X deflector deflects the ion beam into the plane of the mirror system.

(83) To switch from 1-pass mode to multiple pass mode, Y deflector 222 is energised so that it deflects the ion beam along the trajectory 250. Mirror 20 sends the beam back through Y deflector 222 and back through the mirror system. Y deflector 221 is energized so that it deflects the ion beam along trajectory 260. The beam then passes back through the mirror system substantially along the same trajectory as on the first forward pass. This deflection arrangement can be used one or more times to increase the flight path through the mirror system, the beam ultimately reaching detector 290.