Compact dual ion composition instrument
09613789 ยท 2017-04-04
Assignee
Inventors
- Mihir I. Desai (Helotes, TX, US)
- Keiichi Ogasawara (San Antonio, TX, US)
- David J. McComas (San Antonio, TX, US)
- Stefano Livi (San Antonio, TX, US)
Cpc classification
H01J49/04
ELECTRICITY
H01J49/004
ELECTRICITY
International classification
Abstract
A relatively compact dual ion composition instrument and associated methodology for measuring plasma and ion populations in a variety of interplanetary and planetary environments. The unitary device can measure mass and ionic charge state compositions and 3D velocity distributions of 10 eV/q to 40 keV/q plasma and pick-up ions; and (2) mass composition, energy spectra and angular distributions of 30 keV to 10 MeV energetic ions.
Claims
1. A dual ion composition instrument for measuring plasma and ion populations comprising: a. a deflector/electrostatic analyzer subsystem and a time of flight versus energy subsystem wherein said deflector/electrostatic analyzer includes deflectors to bend a first collection of ions between greater than 1 eV/q to 100 keV/q into an electrostatic analyzer which focuses said ions onto carbon foil and wherein said carbon foil is positioned at an entrance of said time of flight versus energy subsystem and wherein said first collection of ions contact said carbon foil and generate secondary electrons and neutralized ions from said first collection of ions; b. entrance apertures in said deflector/electrostatic analyzer subsystem for introduction of a second collection of ions between 15 keV to 10 MeV/nucleon which contact said carbon foil and generate secondary electrons and ions from said second collection of ions; c. a start micro-channel plate in said deflector analyzer subsystem which detects said secondary electrons from said first and second collection of ions; d. one or more avalanche photo diodes in said time of flight versus energy subsystem which generates additional secondary electrons due to an impact of said neutralized ions from said first collection of ions; e. one or more solid state detectors in said time of flight versus energy subsystem which generate additional secondary electrons due to an impact of said ions from said second collection of ions; and f. a stop micro-channel plate in said time of flight versus energy subsystem, wherein said stop micro-channel plate detects additional secondary electrons due to impact of said ions from both of said first and second collection of ions.
2. The dual ion composition instrument of claim 1 wherein said first collection of ions are at 10 eV/q to 40 keV/q.
3. The dual ion composition instrument of claim 1 wherein said second collection of ions are at 30 keV to 10 MeV.
4. The dual ion composition instrument of claim 1 wherein said instrument has a mass of 2.0 kg to 4.0 kg.
5. The dual ion composition instrument of claim 1 wherein said instrument has a length of 150 mm to 250 mm, a width of 150 mm to 250 mm and a height of 250 mm to 350 mm.
6. The dual ion composition instrument of claim 1 wherein a distance from said carbon foil and said one or more avalanche photo diodes is less than the distance from said carbon foil and said solid state detector.
7. The dual ion composition instrument of claim 1 wherein said first collection of ions comprises H.sup.+, He.sup.+, O.sup.+, N.sup.+, Ne.sup.+, or Ar.sup.+.
8. The dual ion composition instrument of claim 1 wherein said second collection of ions comprises H.sup.+, He.sup.+, O.sup.+, N.sup.+, Ne.sup.+, or Ar.sup.+.
9. A method for measuring plasma and ion populations comprising: a. supplying a dual ion composition instrument including a dual ion deflector/electrostatic analyzer subsystem and a time of flight versus energy subsystem wherein said deflector/electrostatic analyzer includes: i. deflectors to bend a first collection of ions between greater than 1 eV/q to 100 keV/q into an electrostatic analyzer which focuses said ions onto carbon foil and wherein said carbon foil is positioned at an entrance of said time of flight versus energy subsystem and wherein said first collection of ions contact said carbon foil and generate secondary electrons and neutralized ions from said first collection of ions; ii. entrance apertures in said deflector/electrostatic analyzer subsystem for introduction of a second collection of ions between 15 keV to 10 MeV which contact said carbon foil and generate secondary electrons and ions from said second collection of ions; iii. a start micro-channel plate in said deflector analyzer subsystem which detects said secondary electrons from said first and second collection of ions; iv. said time of flight versus energy subsystem including 1. one or more avalanche photo diodes which generates additional secondary electrons due to an impact of said neutralized ions from said first collection of ions; 2. one or more solid state detectors in said time of flight versus energy subsystem which generate additional secondary electrons due to an impact of said ions from said second collection of ions; and 3. a stop micro-channel plate in said time of flight versus energy subsystem, wherein said stop micro-channel plate detects additional secondary electrons due to impact of said ions from both of said first and second collection of ions; b. identifying a start time of flight signal for said first collection of ions when said secondary electrons from said first collection of ions contact said start micro-channel plate in said deflector analyzer subsystem; c. identifying a start time of flight signal for said second collection of ions when said secondary electrons from said second collection of ions contact said start micro-channel plate in said deflector analyzer subsystem; d. identifying a stop time of flight signal for said first collection of ions when said additional secondary electrons from said impact of said neutralized ions with said avalanche photo diode impact said stop micro-channel plate in said time of flight versus energy subsystem; e. identifying a stop time of flight signal for said second collection of ions when said additional secondary electrons from said impact of said ions with said solid state detector impact said stop micro-channel plate in said time of flight versus energy subsystem.
10. The method of claim 9 wherein the difference in time between said start time of flight signal and said stop time of flight signal for said first collection of ions identifies ion speed.
11. The method of claim 9 wherein the difference in time between said start time of flight signal and said stop time of flight signal for said second collection of ions identifies ion speed.
12. The method of claim 9 wherein said instrument has a mass of 2.0 kg to 4.0 kg.
13. The method of claim 9 wherein said instrument has a length of 150 mm to 250 mm, a width of 250 mm to 250 mm and a height of 250 mm to 350 mm.
14. The method of claim 9 wherein said first collection of ions comprises H.sup.+, He.sup.+, O.sup.+, N.sup.+, Ne.sup.+, or Ar.sup.+.
15. The method of claim 9 wherein said second collection of ions comprises H.sup.+, He.sup.+, O.sup.+, N.sup.+, Ne.sup.+, or Ar.sup.+.
16. The method of claim 9 wherein said first collection of ions are at 10 eV/q to 40 keV/q.
17. The method of claim 9 wherein said second collection of ions are at 30 keV to 10 MeV.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) The above mentioned and other features of this disclosure, and the manner of attaining them, will become more apparent and better understood by reference to the following description of embodiments described herein taken in conjunction with the accompanying drawings wherein:
(2)
(3)
DETAILED DESCRIPTION
(4) The compact dual ion composition instrument 10 is illustrated in
(5) Accordingly, plasma ions between 10 eV/q and 40 keV/q with preferably within 45 are selected using a combination of opposite voltage settings on the indicated Up and Down deflectors and logarithmically-spaced voltage steps on the ESA. The deflectors bend the ion trajectories into the ESA which focuses those with the appropriate E/q onto a relatively thin carbon foil 15 located at the entrance of the TOF vs. E subsystem identified generally at 16. Using deflectors to bend ion trajectories into the ESA enables CoDICE-Lo, on a three axis-stabilized spacecraft, to measure angular distributions and provide 3-dimensional velocity distribution functions (3D VDFs) of plasma ions over a broad range of energies and angles.
(6) The ESA selected plasma ions generate secondary electrons off of a thin carbon foil at the entrance aperture of the TOF vs. E subsystem. Both the entrance foil and the TOF start assembly section will be biased to 15 kV bias which accelerates the ions entering the subsystem by 15 keV/q (
(7) The secondary electrons (
(8) The mostly neutralized ions shown at line 22 preferably travel 5.9 cm along a straight, collimated path and depending on which azimuthal angle it entered the ESA at and strike one or more avalanche photo diodes (APDs) shown at 24 and generate secondary electrons (curves 26) that are focused onto the center of the stop microchannel plate (Stop MCP) which in this case provides the Lo-Stop event. Reference to a mostly neutralized ion may be understood by the feature that there is an energy-dependence in the fraction of neutralized ions. At 20 keV, 65% of H+ ions passing through the carbon foil are neutralized. This fraction is larger for the lower (<20 keV H+) ions. Likewise, at 20 keV, 90% of He+, O+, C+, Ar+ ions are neutralized.
(9) An avalanche photodiode (APD) is understood herein as a relatively sensitive semiconductor electronic device that exploits the photoelectric effect to convert light to electricity and amount to photodetectors that provide a built-in first stage of gain through avalanche multiplication. The distance of travel of the mostly neutralized ions along line 22 may fall in the range of 5.90.12 cm. Each APD measures the ion's residual energy (E) and its location provides the ion's arrival direction. Each APD is preferably 150 m thick with a 35 mm.sup.2 active area.
(10) The time between Lo-Start and Lo-Stop yields the ion's TOF, and hence speed (v). The E/q selection, combined with v and E, determines the mass (M), incident energy, and charge state (q) of plasma ions, allowing for identification of ions with the same M/q (e.g., S.sup.2+ and O.sup.+) in all look directions. The ion mass is determined by M=2(/d).sup.2 (E/a), where is the TOF, d is the path length (5.9 cm), E is the measured residual energy, and a is the ratio between E and the incident ion energy. The incident energy E is determined by E=E/aqV, with the charge state q determined by E/(E/q). For example, when one measures 1 keV singly charged oxygen ions, a set of measured values will be: E/q=1 keV, =139 ns, E=5.4 keV where the term a is determined as 0.34 from the calibration table, and one can determine E, M, and q simultaneously: E=0.99 keV; M=16.89 AMU; q=0.99.
(11) The CoDICE-Hi TOF preferably begins with a separate set of 12 entrance apertures for detecting, in preferred embodiment, 0.03-10 MeV ions (
(12) Energetic ions (EIs) enter the TOF section after passing through a different thin carbon foil located at the start of the TOF entrance aperture and generate secondary electrons. These secondary electrons are focused onto the inner circular portion of the start MCP (
(13) The difference between Hi-Start and Hi-Stop signals yields the ion's TOF, and hence the ion speed. The longer path length allows CoDICE-Hi to measure relatively shorter TOFs of the faster EIs more accurately, thereby extending the upper energy range for EI measurements. Each SSD is preferably 500 m thick with a 510 mm.sup.2 active area. For each EI, CoDICE-Hi measures the speed (from TOF) and E in the SSD to determine its M and incident energy E, and the location of the SSD provides the arrival direction of the ion.
(14) By way of an exemplary calculation for the CoDICE-Hi, the ion mass is again determined by M=2(/d).sup.2 (E/a), where d is the path length (7.4 cm), is the TOF, and the ratio a between the incident energy E and measured residual energy E is again as follows: E=E/aqV. One may then measure 450 keV oxygen ions, a set of measured values will be: =32 ns, E=321 keV, and using a=0.69 from the calibration table, and we can determine E, M simultaneously. E=450.21 keV; M=16.67 AMU.
Working Example
(15) The TOF instrument illustrated in
(16)
(17) Accordingly, the present disclosure identifies a compact dual ion composition instrument and associated method which comprises a deflector/electrostatic analyzer and a common TOF vs. E subsystem for measuring plasma, pickup, and energetic ion populations in a variety of interplanetary and planetary environments. The instrument is designed to measure: (1) mass and ionic charge state compositions, and 3D velocity and angular distributions of 10 eV/q-40 keV/q plasma and pickup ions; and (2) Mass composition, energy spectra, and angular distributions of 30 keV-10 MeV energetic ions.
(18) The instrument herein as illustrated in
(19) While the instrumentation herein is contemplated to be suitable, e.g., for Jupiter's magnetosphere and possibly for other high radiation environments, the instrumentation is contemplated to also provide high quality plasma and energetic ion composition measurements on missions to Mercury, Venus, Mars, Neptune, and Uranus, as well as on in-situ inner and outer heliospheric missions.